Abstract: A successive approximation analog to digital converter and a conversion method thereof are provided. The successive approximation analog to digital converter includes a sample circuit, a conversion circuit, and a filtering control circuit. The sample circuit is configured to sample an analog voltage from an analog signal. The conversion circuit is configured to convert the analog voltage into a digital voltage. The filtering control circuit is configured to transmit a filtering control signal to the sample circuit according to the digital voltage. The sample circuit further samples a next analog voltage from the analog signal and adjusts the next analog voltage into an adjusted analog voltage according to the filtering control signal. The conversion circuit further converts the adjusted analog voltage into a next digital voltage, wherein the next digital voltage is a filtered digital voltage.

Abstract: A method includes accepting an analog input signal including a sequence of pulses of a given pulse shape. The analog input signal is distributed to multiple processing channels (40) operating in parallel. The analog input signal is sampled by performing, in each of the multiple processing channels, the operations of: mixing the analog input signal with a different, respective modulating waveform to produce a mixed signal; filtering the mixed signal; and digitizing the filtered mixed signal to produce a respective digital channel output.

Abstract: A method and apparatus for detecting an event and sampling first value from a pin in response to the event. For example, the event is identified by a signal object of a plurality of signal objects stored in a memory. Each signal object of the plurality of signal objects identifies a single analog input pin and a trigger.

Abstract: A track-and-hold circuit comprises at least first and second amplifier stages, and switched capacitor circuitry coupled between the first and second amplifier stages. In a track mode of operation of the track-and-hold circuit, the switched capacitor circuitry is configured to decouple inputs of the second amplifier stage from respective outputs of the first amplifier stage and to couple the inputs of the second amplifier stage to a common mode voltage via respective first and second capacitors. In a hold mode of operation of the track-and-hold circuit, the switched capacitor circuitry is configured to couple the inputs of the second amplifier stage to the respective outputs of the first amplifier stage via the respective first and second capacitors. Multiple instances of the track-and-hold circuit may be implemented in parallel in a time-interleaved analog-to-digital converter.

Abstract: The present invention realizes reliably control so that, at the time of AD converting reference voltage, a low-voltage transistor in a reference voltage generating circuit is not destroyed by voltage held in a sample and hold circuit. In a semiconductor device, when an instruction of detecting a reference voltage value is received, a switch control unit controlling switching of an input signal of an internal AD converter temporarily automatically couples an input node of a sample and hold circuit and a ground node and, after that, couples the input node of the sample and hold circuit and an output node of a reference voltage generating circuit.

Abstract: A successive approximation (SAR) analog-to-digital converter for generating a digital signal of N bits is provided. The converter includes a capacitive digital-to-analog conversion circuit including an (N?1)-th conversion unit to a first conversion unit. Each of the first conversion unit to the (N?2)-th conversion unit includes a capacitor. The (N?1)-th conversion unit comprises a number of sub-capacitors. Each of the sub-capacitors of the (N?1)-th conversion unit has substantially the same capacitance with corresponding capacitor of the first conversion unit to the (N?2)-th conversion unit. During the conversion process, the SAR control circuit, after generating the value of the most significant bit (MSB) of the digital signal, generates the value of the next bit by controlling the (N?1)-th conversion unit. Then, the SAR control circuit repeatedly uses at least one of the sub-capacitors of the (N?1)-th conversion unit to generate the value of other bits to perform self linear compensation.

Abstract: A sampling circuit comprising: an input node; a first signal path comprising a first sampling capacitor and a first signal path switch in a signal path between the input node and a first plate of the first sampling capacitor; a second signal path comprising a second sampling capacitor and a second signal path switch in a signal path between the input node and a first plate of the second sampling capacitor, and a signal processing circuit for forming a difference between a signal sampled onto the first sampling capacitor and a signal sampled onto the second sampling capacitor.

Abstract: An analog to digital converter includes: a first pulse delay circuit forming a multi-stage delay unit of which each delay unit have a pulse signal delayed with a delay time responding to an input voltage; a first encoding circuit that detects the number of delay units in the first pulse delay circuit through which the pulse signal passes during a predetermined measurement period, and outputs the AD conversion data based on the number of delay units; and a timing generation circuit which, in response to receiving the start signal, generates an end signal when the input voltage of the first pulse delay circuit is a specified voltage within an allowable input voltage range, in order to determine the measurement period which is a time required for the pulse signal to pass through a predetermined number of the delay units which is specified in advance.

Abstract: An input circuit for an analog-to-digital converter (ADC) includes at least one bootstrap circuit, including at least one first switch for connecting electrical power to a first terminal of at least one capacitor; at least one second switch for connecting a second terminal of the at least one capacitor to a signal to be sampled; at least one third switch for connecting the first terminal of the at least one capacitor to the control gate of at least one sampling network input switch; at least one fourth switch for connecting the at least one sampling network input switch to a substrate; and at least one fifth switch for connecting the second terminal of the at least one capacitor to the substrate.

Abstract: A track-and-hold circuit comprises at least first and second amplifier stages, and switched capacitor circuitry coupled between the first and second amplifier stages. In a track mode of operation of the track-and-hold circuit, the switched capacitor circuitry is configured to decouple inputs of the second amplifier stage from respective outputs of the first amplifier stage and to couple the inputs of the second amplifier stage to a common mode voltage via respective first and second capacitors. In a hold mode of operation of the track-and-hold circuit, the switched capacitor circuitry is configured to couple the inputs of the second amplifier stage to the respective outputs of the first amplifier stage via the respective first and second capacitors. Multiple instances of the track-and-hold circuit may be implemented in parallel in a time-interleaved analog-to-digital converter.

Abstract: An A/D converter comprising: a sampling circuit including a continuous section, a sampling and holding section for intermittently sampling an input signal based on an analog signal input from the continuous section to hold and transfer the sampled signal, and a digital section for outputting a signal transferred from the sampling and holding section as a digital signal; and a control circuit for supplying a clock signal in which jitter is not added to the continuous section and supplying a clock signal in which the jitter is added to the sampling and holding section.

Abstract: A sampling circuit includes a continuous section which is a circuit for transmitting a continuous signal; a digital section for transmitting a signal which is sampled and quantized; and a sampling and holding section for transmitting a signal which is sampled but not quantized between the continuous section and the digital section. The sampling and holding section includes capacitors for accumulating charge generated by an input signal and plural switches for accumulating the charge in the capacitors. The plural switches receive plural clock signals having different operation timings and perform an ON/OFF operation in response to the supplied clock signals.

Abstract: Systems and methods in accordance with embodiments of the invention utilize a CS architecture based on a sub-linear time recovery process (with reduced memory requirements). In several embodiments, a novel structured measurement matrix is exploited during signal acquisition allowing the use of a recovery process based on relatively simple computational primitives making it more amenable to implementation in a fully-integrated form. One embodiment of the invention includes an analog front end configured to receive an analog input signal, and CS sampling circuitry connected to an output of the analog front end and configured to generate a plurality of measurements using a structured measurement matrix, where each row of the structured measurement matrix is generated using a different predetermined check node. In addition, the CS sampling circuitry is configured to generate the plurality of measurements at a rate that is less than the Nyquist rate of the analog input signal.

Abstract: A system including a sample-and-hold circuit for receiving a plurality of analog input signals; an analog-to-digital converter for converting each of the analog inputs to a digital signal; and a processor configured for implementing fractional delay recovery for the analog-to-digital converter. In some embodiments, the fractional delay recovery includes converting each of the plurality of analog input signals to a digital version in the predetermined order; upsampling each digital version in the predetermined order; digitally filtering each upsampled value in the predetermined order; and downsampling each filtered value in the predetermined order.

Abstract: An integrated circuit includes a current-based digital-to-analog converter (IDAC) including a clock input and including an output. The integrated circuit further includes a sample synchronization generator to provide a clock signal to a clock output terminal and a first timing signal related to the clock signal to the clock input of the IDAC. The sample synchronization generator controls the clock signal and the first timing signal to communicate a control signal to a peripheral module.

Abstract: An electric device includes first, second and third selectors. A first node connects to a first input of the first selector, a second node connects to a first input of the second selector, a third node connects to a second input of the first selector, and a fourth node connects to a second input of the second selector. A first switch connects to the first node, and a second switch connects to the second node. A first capacitor connects between the first switch and the third node, and a second capacitor connects between the second switch and the fourth node. A fifth node connects between an output of the first selector and a first input of the third selector, and a sixth node connects between an output of the second selector and a second input of the third selector. An A/D converter connects to an output of the third selector.

Abstract: The present invention is related to a sample and hold circuit and an A/D converter, and prevents an output saturation for an input voltage over a power supply voltage range in the sample and hold circuit. A first switch which is turned on when an input voltage is to be sampled; a sampling capacitor configured to sample the input voltage input via the first switch when the first switch is turned on, and sample a predetermined reference voltage when the first switch is turned off; an adding/subtracting part configured to perform an addition or a subtraction between the input voltage sampled by the sampling capacitor and the predetermined reference voltage sampled by the sampling capacitor; and a hold part configured to hold and output a voltage obtained by the addition or the subtraction by the adding/subtracting part are provided.

Abstract: A system and method for performing sample rate conversion and creating fractional delays to a signal is disclosed. The system comprises a filter, a look up table for storing coefficients for sample rate conversion and fractional delays, and control circuitry configured to use an indexing scheme to select one or more coefficients from the look up table for rate conversion and fractional delays. The coefficients stored in the look up table comprise the coefficients required to generate delays in desired increments of a sample rate. In the disclosed method, the one or more coefficients necessary for a desired sample rate and fractional delay are selected from a single look up table and provided to a filter to delay the signal based upon the input sample rate.

Abstract: Representative implementations of devices and techniques provide analog to digital conversion of multiple parallel analog inputs. An input interface is arranged to organize the parallel analog inputs and an analog-to-digital converter (ADC) is arranged to sequentially convert the multiple parallel analog inputs to digital results.

Abstract: A radio frequency (RF) receiver may comprise a first sampling module that is operable to sample in a first level at a particular main sampling rate; a plurality of second-level sampling modules, wherein each of the plurality of second-level sampling modules is operable to sample in a second level, an output of the first level, at a second sampling rate that is reduced compared to the main sampling rate; and a plurality of third-level modules, each comprising a plurality of third-stage sampling sub-modules that are operable to sample at a third sampling rate that is reduced compared to the second sampling rate, and a plurality of corresponding analog-to-digital conversion (ADC) sub-modules.

Abstract: A time-interleaved A/D converter apparatus has a primary signal A/D converter circuit group that is time-interleaved with a combination of N A/D converter circuits, a correction signal generation part operable to receive the input analog signal and a 1/m-sampling signal having a speed that is 1/m of a rate of the sampling signal inputted to the primary signal A/D converter circuit group, to extract a dispersion of a transmission line that is immanent in the input analog signal, and to output the dispersion as a dispersion compensation control signal used for digital signal compensation, and a signal processing part operable to convert the N digital signals into one digital signal based upon the dispersion compensation control signal and to compensate a dispersion included in the converted digital signal.

Abstract: An apparatus, comprising: a charge-pump; a sampler that samples an optical signal, including: a black sampler; a video sampler; and an analog to digital converter. The first aspect further provides a single clock that is coupled to and provides clocking signals to: a) the charge-pump logic that is coupled to the charge-pump; and b) the sampler logic that is coupled to the sampler that samples the optical signal.

Abstract: An A/D conversion unit performs an A/D conversion operation twice during a hold period of an analog value. In a first conversion operation, the A/D conversion unit compares the analog value with a first reference voltage and outputs a comparison result as first converted data. In a second conversion operation, the A/D conversion unit compares the analog value with a second reference voltage and outputs a comparison result as second converted data. The second reference voltage is a voltage obtained by adding or subtracting a minimum resolution voltage to or from the first reference voltage. A digital processing unit averages errors of the first and second converted data by digital processing to detect an A/D conversion error, and feeds back a detection result to the A/D conversion unit as a control value to perform voltage control.

Abstract: An image sensor is provided. A first storage unit stores an image information value corresponding to an image signal provided from a pixel, and a second storage unit stores a reset information value corresponding to a reset signal provided from the pixel. A differential signal comparison unit receives image information value and the reset information value, compares the two values, and outputs a difference value therebetween. A switch unit is switched so that the two input values are transferred in a crossed manner in a first operation period and a second operation period. A digital value providing unit combines a first digital value, which corresponds to an output timing of a first comparison signal in the first operation period, and a second digital value, which corresponds to an output timing of a second comparison signal in the second operation period, and output a digital value corresponding to image information received at the pixel.

Abstract: An Analog to Digital Converter (ADC), an analog-to-digital conversion method, and an integrated circuit including the ADC. The ADC includes an input adjustment buffer stage, a sub-ADC, and a sample switch. The sample switch is coupled between the output node of the input adjustment buffer stage and the input node of the sub-ADC. When the sample switch is opened, the input adjustment buffer stage is configured to switch between a first work state and a second work state according to a predetermined rule, and to adjust an input voltage signal of the input adjustment buffer stage based on transitions between the first and second work states. When the sample switch is closed, the input adjustment buffer stage is configured to provide an adjusted voltage signal to the input node of the sub-ADC, and the sub-ADC is configured to perform an analog-to-digital conversion onto the adjusted voltage signal.

Abstract: An interpolation circuit includes: a first node to receive a first current; a second node to receive a second current; a third node to receive a third current; a first capacitor circuit including: first capacitors; a first switch to couple one end of each of first capacitors to one of first and second nodes; and a first output coupled to the other end of each of first capacitors; a second capacitor circuit including: second capacitors; a second switch to couple one end of each of second capacitors to one of second and third nodes; and a second output node coupled to the other end of each of second capacitors; and a third capacitor circuit including: a third capacitor whose one end is coupled to the second node; and a third switch to couple the other end of the third capacitor to one of first and second output nodes.

Abstract: One embodiment relates to an interpolator-based clock and data recovery circuit which includes a de-multiplexer and a voting circuit. The de-multiplexer is arranged to de-multiplex a feedback signal from a sampler, and the voting circuit is arranged decimate the de-multiplexed feedback signal. The decimated feedback signal may be provided to a digital filter. Another embodiment relates to a method for clock and data recovery from a data signal. The method includes de-multiplexing and decimation of a feedback signal. Other embodiments and features are also disclosed.

Abstract: Techniques to reduce correlated errors in a multi-channel sampling system. A plurality of clock signals may be generated from a master clock signal, each with edges offset from each other. The offset clock signals may be distributed to a plurality of sampling devices. Each sampling device may capture a respective input signal according to its offset clock. In this manner, the sampling units may sample their inputs signals over a distributed window of time rather than sampling in response to a common clock edge. By distributing the switching operations performed by the sampling units, noise effects are likely to be reduced.

Abstract: A time-interleaved Analog-to-Digital Converter (ADC) includes a set of time multiplexed sub-ADC circuits, each sub-ADC circuit comprising a sample-and-hold circuit. Each sample-and-hold circuit includes a bootstrap circuit for maintaining a constant voltage level between an input terminal of a switch and a gate terminal of the switch, the switch for switching between a track mode and a hold mode, and a capacitor bank associated with the bootstrap circuit such that a setting of the capacitor bank affects the voltage level.

Abstract: A signal sample trigger apparatus (206) comprises an input (302, 304), a processing resource (300, 500) coupled to the input (302, 304), and an output (306) coupled to the processing resource (300, 500). The processing resource (300, 500) is arranged to generate, when in use, a trigger signal (400, 600) in response to location increment information. The location increment information (402, 404, 602, 604) is received via the input (302, 304), and the trigger signal (400, 600) is provided via the output for triggering execution of a sample of an analogue signal.

Abstract: A method and apparatus for analog-to-digital conversion. An Analog-to-Digital Converter (ADC) includes M ADCj, j=1, 2, . . . , M. Each ADCj comprises a number of cells each of which comprises a first switch, a second switch, a current sink and an inverter. An inverter of a cell in an ADCj changes state in response to a current associate with an input signal of the ADCj exceeding a threshold, thus switching on the next cell. Each ADCj is enabled to perform analog-to-digital conversion on a residual current of a previous ADCj-1 after the previous ADCj-1 has completed its analog-to-digital conversion and has been disabled.

Abstract: Compressive sensing is an emerging field that attempts to prevent the losses associated with data compression and improve efficiency overall, and compressive sensing looks to perform the compression before or during capture, before energy is wasted. Here, a reconstruction algorithm is proposed for a compressive sensing successive approximation register (SAR) analog-to-digital converter (ADC). Accordingly, an analog signal is converted to a first digital signal at a sampling frequency that is less than a Nyquist frequency for the analog signal, and a second digital signal is constructed from the first digital signal with a box constrained linear optimization process such that the second digital signal is approximately equal to an analog-to-digital conversion of the analog signal at the Nyquist frequency for the analog signal.

Abstract: A sensing and recovery system includes a sensing unit and a recovery unit coupled together. The sensing unit includes a sensor to generate a bandlimited continuous time analog signal, and a modulator coupled to the sensor to generate a modulated analog signal based upon modulation of the bandlimited continuous time analog signal at a modulating rate at least equal to a Nyquist rate for the bandlimited continuous time analog signal. A compressive sensing circuit is coupled to the modulator to generate a compressed sensed signal based upon conversion of the modulated analog signal at a sampling rate less than the Nyquist rate. The recovery unit recovers the bandlimited continuous time analog signal from the compressed sensed signal.

Abstract: Providing for a two-stage single-slope analog to digital converter (ADC) exhibiting high resolution in conjunction with reduced power consumption is described herein. The ADC can achieve a digital resolution of at least 13 bits according to one or more disclosed embodiments, with significantly lower power consumption than conventional high resolution analog to digital converters. In operation, bias current supplied to one or more components of the ADC can be ramped up to a high magnitude during high accuracy or high speed processes of the ADC. Upon completion of these processes, the bias current can be sharply reduced for at least a portion of a clock cycle. During a residue amplification process associated with a second stage of the ADC, bias current can be increased to a moderate level. Average power consumption can be reduced significantly, while maintaining peak power requirements.

Abstract: A time-interleaved sample-and-hold system includes a first sample-and-hold circuit and a second sample-and-hold circuit. The first sample-and-hold circuit and the second sample-and-hold circuit share a common sampling switch. A method of remediating a timing offset between a first sample-and-hold circuit and a second sample-and-hold circuit in a time-interleaved sample-and-hold system includes switching at least one shunt capacitor disposed between two logic gates in a timing circuit to adjust a delay between a timing signal for a common sampling switch electrically coupled to the first and second sample-and-hold circuits and a timing signal for at least one of the sample-and-hold circuits.

Abstract: A track and hold circuit has a main transistor for which the gate voltage is provided by a buffer circuit which is supplied with a different voltage supply than the circuit of the main transistor. This avoids the need for a bootstrap circuit.

Abstract: The discrete time analog circuit (100) is provided with: a rotate capacitor circuit (150); an amplifier (141) that is connected to the input line or the output line of the rotate capacitor (150), and amplifies the input potential or input charge; a coefficient circuit (140) that is positioned in series with the amplifier (141), and has two history capacitors (143-1, 143-2) positioned parallel to each other; a first active capacitor among the two history capacitors (143-1, 143-2) that is connected to and charges the amplifier (141); and a clock generation circuit (110) that is connected to the input line or the output line without the involvement of the amplifier (141), and that sequentially changes the pairing of the rotate capacitor circuit (150) a second active capacitor, which shares a charge with the rotate capacitor circuit (150).

Abstract: A device including a sample and hold circuit for providing a signal related to an input analogue current signal, by sampling the input analogue current signal and integrating it on capacitive means, thereby charging the capacitive means to a charge value. The capacitive means being configurable to dynamically change its effective capacitance value in order to shape a voltage signal present on the capacitive means such that the charge value remains unchanged. The device also including an analogue-to digital conversion (ADC) and control circuit arranged for performing an ADC of the at least one related signal at the output of the sample and hold circuit into an output digital signal, the ADC and control circuit including successive approximation ADC means for considering the value of the voltage signal on the capacitive means and converting the charge value present in the capacitive means into the digital output signal.

Abstract: A single-ended to differential buffer circuit is is disclosed, adapted to couple at least an input analog signal to a receiving circuit. The buffer circuit comprises an output section comprising a differential amplifier having a first and a second input, a first and a second output. The buffer circuit further comprises an input section comprising a first and a second switched capacitor, each adapted to sample said input analog signal and having a first side and a second side, the first sides of the first and second switched capacitors being controllably connectable/disconnectable to/from said first and second outputs respectively. In the buffer circuit the second sides of said first and second switched capacitors are controllably connectable/disconnectable to/from said first and second inputs of the differential amplifier respectively.

Abstract: Methods and apparatus are provided for pseudo asynchronous testing of receive paths in serializer/deserializer (SerDes) devices. A SerDes device is tested by applying a source of serial data to a receive path of the SerDes device during a test mode. The receive path substantially aligns to incoming data using a bit clock. A phase is adjusted during the test mode of the bit clock relative to the source of serial data to evaluate the SerDes device. The source of serial data may be, for example, a reference clock used by a phase locked loop to generate the bit clock. The phase of the bit clock can be directly controlled during the test mode, for example, by a test phase control signal, such as a plurality of interpolation codes that are applied to an interpolator that alters a phase of the bit clock.

Abstract: Examples are provided for converting an analog signal to a digital output signal using serial-ripple analog-to-digital conversion (ADC). An ADC circuit may include conversion stages coupled in series. Each conversion stage may generate a bit for the digital output signal. A data latch may receive bits for the digital output signal from the conversion stages and to provide the digital output signal based on the bits. A conversion stage may include a comparator circuit and a multiplexer circuit. The comparator circuit may compare a sampled input signal with a reference signal and to generate the associated bit of the digital output signal based on a result of the comparison. The multiplexer circuit may provide an associated reference signal to a comparator circuit of a next conversion stage, where the next conversion stage is subsequent to the conversion stage.

Abstract: A sensor circuit for obtaining physical quantities with a small margin of error even when the temperature varies is provided. The sensor circuit includes a sensor, a sampling circuit for obtaining a voltage value or a current value of a signal output from the sensor during a predetermined period and holding the value, and an analog-to-digital converter circuit for converting the held analog voltage value or current value into a digital value. The sampling circuit includes a switch for obtaining the voltage value or the current value and holding the value. The switch includes a transistor including an oxide semiconductor in a channel formation region.

Abstract: A pipelined analog-to-digital converter is provided that has advantages of both a high input sample rate as well as low power consumption due to having all but the first pipeline stage operate at a frequency that is a fraction of the input sample rate. The first stage of the pipelined ADC has an internal operating frequency that is the full ADC sample rate, and samples the input signal on the same clock edge for each sample. Subsequent pipeline stages have parallel input sampling circuitry that samples provided input signals at a reduced rate. Since the input sampling circuitry operates at a reduced frequency, power consumption is reduced by those stages. Further, by virtue of sampling the input signal on the same clock edge for each sample, frequency response image generation issues associated with ADC architectures that sample the input signal on more than one clock edge are avoided.

Abstract: A time-interleaved track-and-hold circuit includes a clock generator adapted to receive a global sine-wave clock signal and to generate therefrom multiple square-wave output clock signals of different phases. The track-and-hold circuit includes a switching array operative in at least a track mode or a hold mode. The switching array includes multiple switch circuits, each switch circuit adapted to receive an analog input signal, a corresponding one of the output clock signals, and the global sine-wave clock signal. Each switch circuit is operative to utilize the corresponding one of the output clock signals during the track mode for tracking the analog input signal, and is operative during the hold mode to store the input signal sampled during the track mode as an output of the switch circuit and to utilize the global sine-wave clock signal during the hold mode for synchronizing sampling instants of the respective outputs of the switch circuits.

Abstract: An apparatus, comprising: a charge-pump; a sampler that samples an optical signal, including: a black sampler; a video sampler; and an analog to digital converter. The first aspect further provides a single clock that is coupled to and provides clocking signals to: a) the charge-pump logic that is coupled to the charge-pump; and b) the sampler logic that is coupled to the sampler that samples the optical signal, wherein if the clock for the charge pump is running faster than an analog front end (“AFE”) video sampling clock, a state-machine control is configured to: skip the charge pump clock period right before a video sample signal falling edge, thereby recovering to a normal operation the next charge-pump clock period, wherein this duty cycle modulation of charge pump clock will not substantially impact charge pump output.

Abstract: Circuits and methods that improve the performance of electronic sampling systems are provided. Impedances associated with sampling semiconductor switches are maintained substantially constant during sample states, at least in part, by compensating for encountered input signal variations in order to reduce or minimize signal distortion associated with sampled signals that pass through the sampling switch.

Abstract: Sample-and-hold circuits typically operate at maximum speed when the sampling phase is much shorter than the holding phase. Thus, a device driving the sampling capacitor is disconnected most of the time. Methods and apparatus use the holding phase to store the full charge required by the sampling capacitor to track the amplifier output in at least two “boost” capacitors configured such that when the sampling capacitor is switched to the driver, the boost capacitors are also switched to the driver. Thus, the sampling capacitor is almost instantly charged to the required voltage, and the driver needs to supply only any remaining “error” charge, avoiding delays due to driver output slewing.

Abstract: A time-interleaved Analog-to-Digital Converter (ADC) includes a set of sub-ADC circuits. Each sub-ADC circuit comprises a sample-and-hold circuit. Each sample-and-hold circuit includes a bootstrap circuit for maintaining a constant voltage level between an input terminal of a switch and a gate terminal of the switch, the switch for switching between a sample mode and a hold mode. Each sample and hold circuit also includes a capacitor bank associated with the bootstrap circuit such that a setting of the capacitor bank affects an ON state intrinsic resistance of the switch by affecting the voltage level.

Abstract: For analog to digital conversion with correlated double sampling in an image sensor, a pixel signal from a given pixel is sampled to generate a respective sampled signal N-times, with N>1 within a horizontal scan time period. A ramp signal is generated with a respective ramping portion for each respective sampled signal. Each respective sampled signal is compared with a respective ramping portion to generate a respective comparison signal that determines a respective digital code. The N respective digital codes are summed to generate a final digital code with reduced random noise.

Abstract: A time-interleaved Analog-to-Digital Converter (ADC) includes a set of sub-ADC circuits. Each sub-ADC circuit comprises a sample-and-hold circuit. Each sample-and-hold circuit includes a bootstrap circuit for maintaining a constant voltage level between an input terminal of a switch and a gate terminal of the switch, the switch for switching between a sample mode and a hold mode. Each sample and hold circuit also includes a capacitor bank associated with the bootstrap circuit such that a setting of the capacitor bank affects an ON state intrinsic resistance of the switch by affecting the voltage level.