Abstract: An object of the present invention is to improve uneven coloring by polarization color due to birefringence of a polarization optical article. Disclosed is a polarization optical article in which uneven coloring by polarization color has been improved, the polarization optical article being a multi-layered polarization optical article including at least a linear polarization functional portion, a retardation functional portion and a back-up resin portion, characterized in that the linear polarization functional portion, the retardation functional portion and the back-up resin portion are arranged in order from an objective side toward an ocular side. The linear polarization functional portion is, for example, a linear polarizer, the retardation functional portion is, for example, a retardation sheet, and the retardation functional portion has, for example, a retardation of 1,000 nm or more. The back-up resin is a polycarbonate resin, a polyamide resin or the like.

Abstract: An apparatus for generating burst-mode laser includes: a trigger signal generator for generating a burst trigger signal; a first light source for generating a first optical signal in a form of pulse; a second light source for generating a second optical signal in the form of pulse; an optical switch for selecting between the first optical signal and the second optical signal according to the burst trigger signal to output the selected one; an optical amplifier for amplifying the optical signal output from the optical switch; and a wavelength tuner for tuning a wavelength of the optical signal amplified by the optical amplifier. An oscillation line-width and/or a polarization state of the first optical signal are different from an oscillation line-width and/or a polarization state of the second optical signal.

Abstract: Provided is a polarization analysis apparatus that can quickly measure the polarization properties of a sample. The polarization analysis apparatus includes a light source configured to emit light in a predetermined wavelength region, a polarizer configured to transmit the light emitted from the light source, a spatial phase modulator configured to transmit the light from the sample, an analyzer configured to transmit the light that has passed through the spatial phase modulator, and an imaging spectrometer configured to receive the light that has passed through the analyzer. The spatial phase modulator is formed of a birefringent material, and is configured to have different phase differences at respective positions in a first direction in a plane orthogonal to an optical axis. The imaging spectrometer disperses the received light in a second direction that is different from the first direction in the plane orthogonal to the optical axis.

Abstract: Methods and systems for performing broadband spectroscopic metrology with reduced sensitivity to grating anomalies are presented herein. A reduction in sensitivity to grating anomalies is achieved by selecting a subset of available system parameter values for measurement analysis. The reduction in sensitivity to grating anomalies enables an optimization of any combination of precision, sensitivity, accuracy, system matching, and computational effort. These benefits are particularly evident in optical metrology systems having large ranges of available azimuth angle, angle of incidence, illumination wavelength, and illumination polarization. Predictions of grating anomalies are determined based on a measurement model that accurately represents the interaction between the measurement system and the periodic metrology target under measurement. A subset of available system parameter values is selected to reduce the impact of grating anomalies on measurement results.

Abstract: Measuring the polarimetric response of an optical instrument includes the steps of: emitting light along an optical axis; receiving the light through first and second polarizers; and detecting the light received through the first and second polarizers, using a filter and a detector. A first set of measurements is obtained by measuring the intensity of light received through the first and second polarizers. A second set of measurements is obtained by placing an optical instrument along the optical axis in lieu of the filter and detector; and measuring the intensity of light received through the first polarizer, after the second polarizer has been removed. A third set of measurements is obtained using the optical instrument but having the second polarizer replace the first polarizer. The optical instrument may be characterized using the first, second and third sets of measurements. The characterization is completed without having to know the extinction ratios and the transmittance parameters of the polarizers.

Abstract: Apparatus is described for determining the optical quality of an optical element, the optical element having proximal and distal end portions. The apparatus also includes at least one non-polarizing beam splitter; at least one polarizing beam splitter; at least a first detector operatively associated with the at least one non-polarizing beam splitter; at least a second detector operatively associated with the at least one polarizing beam splitter.

Abstract: It is possible to obtain the distance to an object with high precision, and it is also possible to obtain a high-quality image. Provided is an image-capturing apparatus including an image-capturing lens that focuses light from a subject; an aperture member disposed adjacent to the image-capturing lens; an image-capturing device that captures an image of the light focused by the image-capturing lens and passing through the aperture member; and a microlens array disposed between the image-capturing device and the image-capturing lens, with gaps therebetween in an optical-axis direction, wherein the aperture member includes at least one normal aperture portion having a substantially circular opening and at least two coded aperture portions having openings in a prescribed pattern.

Abstract: Described are methods and systems for vicarious polarimetric calibration and performance validation of a remote sensor. The system includes a plurality of reflective mirrors configured and arranged to reflect radiation from a source of radiation onto the remote sensor with accurately known polarimetric properties. Each of the reflective mirrors are located so that the target images do not overlap. The remote sensor is configured to receive the radiation reflected from the plurality of reflective mirrors and store the received radiation as image data (e.g., the image of each mirror appears as a point target). The system includes a processor configured to process the received data to provide direct calibration and performance validation for each polarimetric or spectral channel of the remote sensor. In addition, the calibration method removes all atmospheric effects except for transmittance and provides reference targets that have high polarimetric contrast, full spectrum performance and easy to deploy.

Abstract: Measuring the polarimetric response of an optical instrument includes the steps of: emitting light along an optical axis; receiving the light through first and second polarizers; and detecting the light received through the first and second polarizers, using a filter and a detector. A first set of measurements is obtained by measuring the intensity of light received through the first and second polarizers. A second set of measurements is obtained by placing an optical instrument along the optical axis in lieu of the filter and detector; and measuring the intensity of light received through the first polarizer, after the second polarizer has been removed. A third set of measurements is obtained using the optical instrument but having the second polarizer replace the first polarizer. The optical instrument may be characterized using the first, second and third sets of measurements. The characterization is completed without having to know the extinction ratios and the transmittance parameters of the polarizers.

Abstract: An embodiment of the present invention provides a method for aligning a phase retardation plate with a display panel comprising the following steps: S1: determining the positions of a first reference line on the phase retardation plate and a second reference line on the display panel, wherein the first reference line is the central line between the first and second ends of the phase retardation area, and the second reference line is the central line between the third and fourth ends of the display area; S2: obtaining a positional deviation between the first reference line and the second reference line by calculation; S3: adjusting the relative position between the phase retardation plate and the display panel according to the positional deviation.

Abstract: A terahertz time-domain spectroscopic ellipsometry system includes a sample stage, a terahertz emitter configured to provide pulses of terahertz radiation with preselected polarization components to illuminate a sample on the sample stage along an incident direction, and a coherent terahertz detection system arranged to coherently detect pulses of terahertz radiation from the terahertz emitter along an emerging direction after at least one of reflecting from or passing through the sample. The sample stage is rotatable to vary a relative angle between the incident direction and the emerging direction, and the coherent terahertz detection system substantially maintains alignment for amplitude and polarization detection as the relative angle is varied.

Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/?45 degrees relative to the first and second light source polarization axes.

Abstract: Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution of birefringence sample in real time. The device consists of a collimating light source, a circular polarizer, a diffractive beam-splitting component, a quarter-wave plate, an analyzer array, a charge coupled device (CCD) image sensor and a computer with an image acquisition card. The method can measure the phase retardation distribution and the fast axis azimuth angle distribution of the birefringence sample in real time and has large measurement range. The measurement result is immune to the light-intensity fluctuation of the light source.

Abstract: The present invention provides a polarizer that is motorized and rotates and is attached to the front of a digital camera. A series of images of a scene is acquired with the polarizer whose orientation is changed in a in a systematic sequence from 0 degrees to 180 degrees. The polarized images are processed to present a final image or set of images that amplify the net polarizations inherent in the light scattered or reflected by the various pixels in the scene. Multiple embodiments are given, including an embodiment implemented on a standard smartphone, one implemented on a miniature camera system mounted on a pair of glasses, and an embodiment on a system utilizing two synchronized camera systems mounted on a pair of eyeglasses.

Abstract: Methods for controlling light transmission through a medium by transmitting light from a single spatial portion of an input optical field through the medium creating an output optical field, superposing the output optical field with a reference optical field creating an optical interference field, detecting an intensity of a spatial portion of a polarization component of the optical interference field and using the detected intensity to determine a value of an optical field amplitude and of an optical field phase for each of a plurality of spatial portions of the input optical field and for each of first and second orthogonal input polarization states of transmitted light entering the medium. The method may be used in the control of the transmission of light 1) through a medium, which is randomizing in amplitude, phase and/or polarization or 2) through a multi-mode fiber or for beam shaping, optical trapping and/or optical manipulation.

Abstract: An ellipsometer for detecting a surface including a light source irradiating a substrate with light, a polarization unit polarizing the light irradiated from the light source and analyzing the polarized light, a detector measuring a light quantity of the polarized light passing through the polarization unit, and a driver rotating the detector by an azimuth angle as the substrate rotates in a direction of the azimuth angle direction may be provided.

Abstract: Provided is a quantum encryption communication apparatus of a transmission side which performs a communication process based on quantum encryption, including: a light source unit which generates a light pulse; a polarization modulating unit which performs polarization modulation of the light pulse by using a variable wavelength plate; and a controller which drives the variable wavelength plate to convert a polarization state of the light pulse to one of a plurality of predetermined polarization bases at random.

Abstract: The invention relates to a device for the analysis of a liquid sample by way of light, comprising a transparent sample carrier, a movable upper mirror, which can be moved between a closed position, in which the mirror encloses a measurement space between itself and the sample carrier, and an open position, in which the sample carrier can be accessed so as to apply a sample, and a beam path, which guides incident measurement light between a light entrance into the measurement space and a light exit out of the measurement space from the sample carrier to the upper mirror reflecting the light. The beam path guides measurement light at an oblique angle of incidence through the sample carrier to the upper mirror.

Abstract: A method and a system for the enhancement of the sensitivity in surface plasmon resonance (SPR) sensors based metallic grating by exploiting the conical configuration is presented. We consider the propagation of surface plasmon polaritons (SPPs) excited by light from the visible to infrared spectrum range, incident on a plasmonic grating at different directions by varying both the zenith and azimuthal angles. For specific azimuthal angles, SPPs propagate in the grating plane perpendicular to the incident light momentum. This is the condition that allows increasing the number of different excited SPPs modes largely. We exploit this effect to increase the sensor sensitivity with the change of refractive index of thin film on the plasmonic grating surface. Polarization effects also contribute to a further modes enhancement and increase the sensitivity. A scheme for a lab-on-chip implementation of a system that allows a parallel detection in microfluidic channels has been shown.

Abstract: An alignment method for optical axes of a composite waveplate includes rotating a rotatable waveplate, which rotates about a central axis with respect to a fixed waveplate, and adjusting the rotation angle thereof until the differences between the spectral parameters of the composite waveplate and ideal spectral parameters are smaller than preset values.

Abstract: A light beam generated by a light source having a wavelength corresponding to the ethanol absorption spectrum, preferably in the wavelength range of 3.28-3.52 ?m or in one or more wavelength ranges 6.49-7.46 ?m, 7.74-8.33 ?m, 8.84-10.10 ?m, 10.7-12.00 ?m, is sent through a measuring space containing a sample of exhaled breath, and then the intensity of the light beam passing through the measuring space is measured. Based on the spectral analysis of the dependence of the light intensity to the alcohol concentration, the concentration of ethanol vapor is determined and the information about the level of the ethanol content is provided to a suitable display or device.

Abstract: A dual scanning and FTIR system for application in the Terahertz and broadband blackbody frequency range including sources for providing Thz and broadband blackbody range and electromagnetic radiation, at least one detector of electromagnetic radiation in the THZ and broadband blackbody ranges, and at least one rotating element between the source and detector.

Abstract: An optical parameter measuring apparatus for measuring optical parameters of an object includes a light source, a polarizing module, a Stokes polarimeter and a calculating module. The light source emits a light which is polarized by the polarizing module and received by the Stokes polarimeter. According to the light information generated by the Stokes polarimeter, Mueller matrixes of linear birefringence, circular birefringence, linear dichroism, circular dichroism and linear/circular depolarization of the object, and Stokes vector established according to the Mueller matrixes, the calculating module calculates the optical parameters.

Abstract: The present invention provides a measuring apparatus which measures a shape of an object to be measured, comprising an emitting unit configured to emit pattern light, an optical system configured to irradiate the object with the pattern light emitted from the emitting unit, a deflection unit configured to deflect light emitted from the optical system, an image sensing unit configured to sense an image of the object irradiated with the pattern light, and a processing unit configured to determine the shape of the object based on the image of the object sensed by the image sensing unit, wherein the deflection unit includes a deflection element, wherein the measuring apparatus irradiates the object with light deflected by the deflection element, and a direction deflected by the deflection element differs depending on a polarization state of incident light in the deflection element.

Abstract: An optical module of an atomic oscillator includes: a surface emitting laser adapted to emit light; a depolarization element irradiated with the light emitted from the surface emitting laser, and adapted to dissolve a polarization state of the light irradiated; a polarization element irradiated with light having been transmitted through the depolarization element; a ?/4 plate irradiated with light having been transmitted through the polarization element, and having a fast axis disposed so as to rotate by 45 degrees with respect to a polarization transmission axis of the polarization element; a gas cell encapsulating an alkali metal gas, and irradiated with light having been transmitted through the ?/4 plate; and a light detection section adapted to detect intensity of light having been transmitted through the gas cell.

Abstract: A method for detecting ultra-fine features of an integrated circuit (IC) on a semiconductor substrate is disclosed. The semiconductor substrate comprises an IC fabricated by 22 nanometer or smaller scale semiconductor micro-fabrication process. The integrated circuit includes circuit features parallel to a circuit horizontal direction or a circuit vertical direction. The method includes focusing an incident light to produce a focused light spot on a portion of the IC. The incident light is linearly polarized in a linear polarization substantially parallel to the circuit horizontal direction. The method includes detecting reflected light from the portion of the IC, producing a relative movement between the focused light spot and the IC to allow the focused light to illuminate different portions of the IC, obtaining an image of the IC using signals of the reflected light detected from different locations of the integrated circuit, and detecting IC features in the image.

Abstract: The disclosed device, which, using an electron microscope or the like, minutely observes defects detected by an optical appearance-inspecting device or an optical defect-inspecting device, can reliably insert a defect to be observed into the field of an electron microscope or the like, and can be a device of a smaller scale. The electron microscope, which observes defects detected by an optical appearance-inspecting device or by an optical defect-inspecting device, has a configuration wherein an optical microscope that re-detects defects is incorporated, and a spatial filter and a distribution polarization element are inserted at the pupil plane when making dark-field observations using this optical microscope.

Abstract: The present invention relates to a system and method for measuring a wavelength-resolved state of polarization, for calculating differential group delay of an optical signal under analysis (1) by means of taking multiple measurements of the spectrum of the signal under analysis (1) with spectral filtering means (3) with an optical output the power of which depends on the polarization of the input. The polarization at the input of the spectral filtering means (3) is modified by means of a polarization transformer (2) which sequentially selects a plurality of output states of polarization. The spectral filtering means (3) can comprise a filter based on stimulated Brillouin scattering amplification (10) simultaneously combining wavelength discrimination and polarization discrimination.

Abstract: There is provided a sample analysis element capable of uniting a propagating surface plasmon resonance with a localized surface plasmon resonance while increasing the surface density of the hot spots. The sample analysis element is provided with a plurality of metal nanobody lines. Each of the metal nanobody lines includes a plurality of metal nanobodies arranged in a line on a dielectric surface at a first pitch smaller than a wavelength of incident light, and the plurality of metal nanobody lines is arranged in parallel to each other at a second pitch larger than the first pitch.

Abstract: An apparatus and method for imaging a section of a medium is disclosed. The apparatus or method receives and returns light from the section and from sites adjacent to the section. A microscope using this apparatus or method can be telecentric in pinhole space at the detection end of the system.

Abstract: The present invention relates to a method, computer program product, and system for preventing an inadvertent configuration of an electrical device provided with an infrared interface (30). The method, computer program product, and system include activation of one or more infrared buttons (31, 32, 33, or 34) provided on the infrared interface (30) in order to configure the electrical device. The method, computer program product, and system include a display (40) that indicates an infrared button sequence), wherein said button sequence is entered before the configuration occurs and includes activation of at least a first infrared button (31, 32, 33, or 34) and at least a second infrared button (31, 32, 33, or 34).

Abstract: Novel systems and methods for performing treatment (e.g., coloration) of keratinous fibers are disclosed. The methods and systems utilize one or more of a dispensing device which is configured to provide customized composition for treating keratinous fibers (e.g., a coloring composition), optionally formed from tablets; an optical reader, for obtaining sufficient characteristics of the keratinous fibers to make a realistic prediction of the outcome of a treatment (e.g., coloring treatment); a computational units for predicting an outcome of a treatment, optionally being interfaced with the dispensing device and for selecting a customized treatment; and tablet formulations which are useful in preparing customized composition for treating keratinous fibers. Further disclosed are rapidly disintegrating tablets for use in the preparation of compositions for treating keratinous fibers.

Abstract: An ellipsometer for detecting a surface including a light source irradiating a substrate with light, a polarization unit polarizing the light irradiated from the light source and analyzing the polarized light, a detector measuring a light quantity of the polarized light passing through the polarization unit, and a driver rotating the detector by an azimuth angle as the substrate rotates in a direction of the azimuth angle direction may be provided.

Abstract: An inspection system includes: an automated optical inspection device detecting a defect of an inspection object by using a light; a scanning electron microscope device for inspecting the defect of the inspection object by using an electron beam and including a vacuum chamber; a stage positioned below and spaced from the scanning electron microscope device and supporting the inspection object; and a transferring device connected to the scanning electron microscope chamber and the automated optical inspection and transferring the scanning electron microscope device and the automated optical inspection device to positions over the stage. Air is in a gap between the chamber and the inspection object. Accordingly, an inspection object of a large size may be inspected for analysis without damage to the inspection object.

Abstract: A system for measuring the rotation angle of optical active substances has a light source, a polarization generation unit; a polarization analyzing unit; a signal generating unit, respectively and electrically coupled to the polarization generation unit and the polarization analyzing unit; a signal processing unit, electrically coupled to the electric signal generating unit; wherein the light source is enabled to emit a beam toward the polarization generation unit for enabling the beam to be polarized into an incident polarized beam while being projected and traveled in an optical path passing through an optical active substance so as to be converted into a emerging beam; and the polarization analyzing unit is positioned to receive and analyze the emerging beam so as to generate a signal to be received and processed by the signal processing unit.

Abstract: Technologies are generally described for systems and methods for detecting chiral properties of materials and separating materials based on their chiral properties. A chiral vector is constructed from anisotropy properties of a polarization-dependent output signal from a sample. Different types of molecules from the sample can be differentiated based on a magnitude of the chiral vector. Chiral properties of the sample can be detected based on an angle of the chiral vector. The output signal can be a fluorescent emission from the sample and can be used to detect chiral properties of a substantially opaque sample.

Abstract: An optical apparatus has a light detecting section which detects light and emits transmitted light where linearly polarized light, which is converted by a polarizing section, is transmitted through a subject. In addition, the optical apparatus has an orthogonal separating section which orthogonally separates the emitted light from the light detecting section and a light reception section which receives light which is orthogonally separated by the orthogonal separating section. A calculation apparatus outputs a rotation control signal to a rotation apparatus and rotation controls the light detecting section so that the rotation plane is orthogonal with regard to an optical path of the transmitted light. Then, the calculation apparatus measures the polarization state of the transmitted light, which is transmitted through the subject S using the intensity with which the light, is received by the light receiving section.

Abstract: A rotation angle measuring device provided with a fixed unit and a movable unit relatively rotating with respect to the fixed unit, comprising a light source installed on either one of the fixed unit or the movable unit and for emitting a detection light and a reference position signal light, a polarizing plate for converting a detection light emitted from the light source to a polarized light, a polarized light rotating unit for rotating the polarized light around an optical axis of the light source as the center, a reference position signal light emitted at a reference rotating position of the polarized light, a stationary polarizing plate provided on either one of the fixed unit or the movable unit and to stand still with respect to a rotation of the polarized light, a photodetection sensor provided on the fixed unit or on the movable unit and for receiving the polarized light passing through the stationary polarizing plate and the reference position signal light, and an arithmetic unit for calculating a d

Abstract: Described are methods and systems for vicarious polarimetric calibration and performance validation of a remote sensor. The system includes a plurality of reflective mirrors configured and arranged to reflect radiation from a source of radiation onto the remote sensor with accurately known polarimetric properties. Each of the reflective mirrors are located so that the target images do not overlap. The remote sensor is configured to receive the radiation reflected from the plurality of reflective mirrors and store the received radiation as image data (e.g., the image of each mirror appears as a point target). The system includes a processor configured to process the received data to provide direct calibration and performance validation for each polarimetric or spectral channel of the remote sensor. In addition, the calibration method removes all atmospheric effects except for transmittance and provides reference targets that have high polarimetric contrast, full spectrum performance and easy to deploy.

Abstract: A method and system are presented for use in characterizing properties of an article having a structure comprising a multiplicity of sites comprising different periodic patterns, where method includes providing a theoretical model of prediction indicative of optical properties of different stacks defined by geometrical and material parameters of corresponding sites, said sites being common in at least one of geometrical parameter and material parameter; performing optical measurements on at least two different stacks of the article and generating optical measured data indicative of the geometrical parameters and material composition parameters for each of the measured stacks; processing the optical measured data, said processing comprising simultaneously fitting said optical measured data for the multiple measured stacks with said theoretical model and extracting said at least one common parameter, thereby enabling to characterize the properties of the multi-layer structure within the single article.

Abstract: A device for determining the volume fraction of at least one component of a multi-phase medium on the basis of the running time of an electromagnetic desired signal emitted in the multi-phase medium, having at least one emitting device for emitting the desired signal into the multi-phase medium, having at least one receiving device for receiving the desired signal, and having an evaluation device for determining the running time of the desired signal between the emitting device and the receiving device, and at least one polarization device arranged between the emitting device and the receiving device. The desired signal is emitted at least indirectly from the emitting device through the multi-phase medium to the polarization device, the polarization device influences the polarization of the desired signal and the polarization-influenced desired signal is emitted at least indirectly from the polarization device to the receiving device which receives it.

Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/?45 degrees relative to the first and second light source polarization axes.

Abstract: A dual-modulation Faraday rotation spectroscopic (FRS) system is disclosed. The FRS system uses an FRS sample cell configured to subject a sample to a low frequency modulated magnetic field. The system includes a polarized laser light source configured to generate a high frequency wavelength-modulated light beam incident on the sample, the high frequency wavelength-modulated light beam being modulated at a higher frequency than the low frequency modulated magnetic field. A polarizer is configured to receive from the sample a transmitted light beam having a modulated polarization having a polarization rotation and translate the modulated polarization of the transmitted light beam into an intensity modulated beam. A photodetector is configured to detect the intensity modulated beam and generate a photodetector signal. A dual demodulator is coupled to the photodetector and is configured to demodulate the photodetector signal.

Abstract: An inspection apparatus comprising, a light source configured to illuminate a sample, a half-wavelength plate configured to transmit light transmitted through or reflected from the sample, a polarization beamsplitter, a first and second sensor configured to receive the light as a first and second optical image respectively transmitted through the beamsplitter, an image processor configured to obtain a gradation value of each pixel of the first sensor, a defect detector configured to detect a defect of the first optical image, using the gradation value, and a comparator configured to compare the second optical image to a reference image based on design data, and to determine that the second optical image is defective when at least one difference of position and shape between the optical image and the reference image exceeds a predetermined threshold, and an angle adjusting unit configured to adjust an angle of the half-wavelength plate.

Abstract: Provided is a method wherein a multi-anode detector is used for the purpose of detecting scattered light from a wafer, data obtained from the detector (multi-anode) for detecting defects is used, the shape of a beam radiated to the wafer, a rotational shift between the radius direction and the beam long side, and the like are calculated, and the optical axis of the irradiation beam is adjusted. Furthermore, the method is provided with a technique which feeds back the correction quantities for rotation and amplitude to inspection signal data, on the basis of the correction data, and corrects inspection data. Since fine correction with the adjustment of an optics system and signal processing is made possible, positional accuracy of defect inspection and accuracy of defect level (defect size) are improved.

Abstract: The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up to, and higher than 100 THz, including: a source such as a backward wave oscillator; a Smith-Purcell cell; a free electron laser, or an FTIR source and a solid state device; and a detector such as a Golay cell; a bolometer or a solid state detector; and preferably including at least one odd-bounce polarization state image rotating system, and optionally including a polarizer, at least one compensator and/or modulator, in addition to an analyzer.

Abstract: Systems and methods for determining a customized cosmetic formulation. In one method, a user is guided to capture an image of a skin region with known lighting and color characteristics, and the image is processed to provide calibrated skin color information. A customized cosmetic formulation is automatically determined for the user based on the calibrated skin color information. In another method, a user is interactively guided through capture of one or more skin region images using a device having an image sensor. The skin region images are processed to provide calibrated skin color information, which is compared to a ground truth data set to identify a set of closest known values in the ground truth data set. A customized cosmetic formulation is automatically determined for the user based on the comparison.

Abstract: A multichannel polarization stabilizer including a mixing device responsive to a sample beam and a reference beam that provides an in-phase signal including the mixed sample beam and reference beam having a relative phase of 0° and a quadrature phase signal including the mixed sample beam and reference beam having a relative phase of 90°. The stabilizer also includes a photodetector responsive to the quadrature phase signal that converts the quadrature phase signal to a quadrature phase electrical signal. A polarization demultiplexer circuit receives the quadrature phase electrical signal and measures the amplitude of a frequency tone in the sample beam and provides a polarization amplitude signal. A polarization controller receives the polarization amplitude signal and controls the reference beam to maximize the polarization amplitude signal.

Abstract: A multichannel optical system including a mixing device responsive to a sample beam and a reference beam that provides an in-phase signal including the mixed sample beam and reference beam having a relative phase of 0° and a quadrature phase signal including the mixed sample beam and reference beam having a relative phase of 90°. The system also includes a photodetector responsive to the quadrature phase signal that converts the quadrature phase signal to a quadrature phase electrical signal. A polarization demultiplexer circuit receives the quadrature phase electrical signal and measures the amplitude of a unique time-dependent phase dither profile having a zero time-averaged mean and a zero time-averaged correlation to the other phase dither profiles and provides a polarization amplitude signal. A polarization controller receives the polarization amplitude signal and controls the reference beam to maximize the polarization amplitude signal.

Abstract: A system and method for polarimetry are disclosed in which a polarimeter may include a light source for transmitting a light beam through a sample within a container; a wavelength selector configured to specify a target wavelength at which the polarization rotation of the light beam emerging from the sample will be evaluated; a polarization rotator configured to be selectively moved into and out of a path of the light beam from the light source; and a detector for obtaining a first measurement of the light beam polarization rotation with the polarization rotator outside the path of the light beam, and a second measurement of the light beam polarization rotation with the polarization rotator within the path of the light beam, with both measurements occurring at the wavelength resulting from the configuration of the wavelength selector.