Abstract: A photodiode device including a photosensitive diffusion junction within a single layer. The photodiode device further includes a resonant grating located within the single layer. The photosensitive diffusion junction is located within the resonant grating.

Abstract: Described are methods and systems for vicarious polarimetric calibration and performance validation of a remote sensor. The system includes a plurality of reflective mirrors configured and arranged to reflect radiation from a source of radiation onto the remote sensor with accurately known polarimetric properties. Each of the reflective mirrors are located so that the target images do not overlap. The remote sensor is configured to receive the radiation reflected from the plurality of reflective mirrors and store the received radiation as image data (e.g., the image of each mirror appears as a point target). The system includes a processor configured to process the received data to provide direct calibration and performance validation for each polarimetric or spectral channel of the remote sensor. In addition, the calibration method removes all atmospheric effects except for transmittance and provides reference targets that have high polarimetric contrast, full spectrum performance and easy to deploy.

Abstract: Methods and systems for determining material composition of a test sample may be provided. The test sample may be placed in a magnetic region having a magnetic field. A light beam may be directed at the test sample in the magnetic region. A birefringence in the light beam that has passed through the test sample may be detected. The material composition of the test sample may be determined based on the detected birefringence in the light beam.

Abstract: A cuvette comprising a cuvette wall for limiting a sample reception space for receiving a fluid sample is disclosed. The cuvette wall is adapted to allow a traversal of measurement radiation through the fluid sample situated within the sample reception space. An information presenter is fixed at the cuvette wall. The information presenter wirelessly provides data to be transferred to an external data reception module. The data to be transferred relates to the cuvette. Further, an optical measurement apparatus is described.

Abstract: A vehicle detection device having an imaging device to capture two respective polarized images from two polarized light beams having different polarization directions contained in light received from an imaging area including a road surface on which one's own vehicle is traveling and a vehicle traveling on the road surface and a polarization difference calculation device to calculate a polarization difference indicating the ratio of a luminance difference between the two respective polarized images to the luminance total thereof for respective identification processing areas formed by dividing the two respective polarized images taken by the imaging device, and a vehicle area detection device to conduct a vehicle area detection process of detecting a vehicle area displaying the vehicle in the imaging area based on the polarization difference of the respective identification processing areas calculated by the polarization difference calculation device.

Abstract: Embodiments generally relate to a light source and methods for minimizing temperature sensitivity of a light source light source. In one embodiment a light source includes a light-emitting diode, a light beam having an optical axis, a photodetector and a polarizer. The diode is operatively configured to emit the light beam. The beam splitter, positioned to intercept the light beam, includes a first optical surface operatively configured to reflect a first portion of the light beam and to transmit a second portion of the light beam therethrough. The photodetector is positioned to capture the first portion of the light beam after reflection by the beam splitter and operatively configured to generate photocurrent proportional to an intensity of that captured first portion. The polarizer is positioned between the diode and the beam splitter, and is operatively configured to polarize the light beam along a polarization direction perpendicular to its optical axis.

Abstract: An apparatus and method for determining the concentration of chiral molecules in a fluid includes a first polarizer configure to polarize light in substantially a first plane to provide initially polarized light. A second polarizer is capable of polarizing the initially polarized light in a plurality of planes, at least one of the plurality of planes being different from the first plane, to provide subsequently polarized light. One or more receivers are included for measuring an intensity of the subsequently polarized light in one or more of the plurality of planes.

Abstract: Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution of birefringence sample in real time. The device consists of a collimating light source, a circular polarizer, a diffractive beam-splitting component, a quarter-wave plate, an analyzer array, a charge coupled device (CCD) image sensor and a computer with an image acquisition card. The method can measure the phase retardation distribution and the fast axis azimuth angle distribution of the birefringence sample in real time and has large measurement range. The measurement result is immune to the light-intensity fluctuation of the light source.

Abstract: Systems and methods for discrete polarization scatterometry are provided.

Abstract: The disclosure conveys a device for measuring the rotating angle of two objects which rotate relative to each other around a rotating axis, with one transmitter, which is assigned to one of the objects and which emits light that is polarized, and with a polarization-sensitive polarizer, such that the transmitter and the polarizer rotate relative to each other, and such that the polarizer has a polarizing area and a non-polarizing area, where the non-polarizing area is positioned eccentric to the rotating axis, and such that the device has a first receptor and a second receptor which measure a portion of the luminosity passing through the polarizer producing signals that are dependent on the rotating angle, and where the first receptor has a first reception area, and the second receptor has a second reception area which is distinct from the first reception area.

Abstract: Systems and methods for inspecting a wafer are provided. One system includes an illumination subsystem configured to illuminate the wafer; a collection subsystem configured to collect light scattered from the wafer and to preserve the polarization of the scattered light; an optical element configured to separate the scattered light collected in different segments of the collection numerical aperture of the collection subsystem, where the optical element is positioned at a Fourier plane or a conjugate of the Fourier plane of the collection subsystem; a polarizing element configured to separate the scattered light in one of the different segments into different portions of the scattered light based on polarization; and a detector configured to detect one of the different portions of the scattered light and to generate output responsive to the detected light, which is used to detect defects on the wafer.

Abstract: To effectively utilize the polarization property of an inspection subject for obtaining higher inspection sensitivity, for the polarization of lighting, it is necessary to observe differences in the reflection, diffraction, and scattered light from the inspection subject because of polarization by applying light having the same elevation angle and wavelength in the same direction but different polarization. According to conventional techniques, a plurality of measurements by changing polarizations is required to cause a prolonged inspection time period that is an important specification of inspection apparatuses.

Abstract: An optical sensor arrangement for measuring an observable including at least one light source for generating a first light component of a first frequency including a first mode and a second light component of a second frequency including a second mode orthogonal to the first mode, an optical resonator having differing optical lengths for the first and second modes, at least one of the optical lengths being variable depending on the observable and a dependence of the respective optical length being different for the first and second modes, and a detector unit coupled to the optical resonator for coupling out the two light components and being configured for detecting a frequency difference between a resonance frequency of the optical resonator for the first mode and a resonance frequency of the optical resonator for the second mode.

Abstract: An apparatus for detecting a crystallizing stain includes a support unit, a crystallized substrate disposed on the support unit, a light source which irradiates polarized light in a predetermined wavelength range to a portion of the crystallized substrate, and a detector which detects the crystallizing stain in the portion of the crystallized substrate, to which the polarized light is irradiated.

Abstract: System to detect coking in at least one component of refinery equipment is provided. The system includes a fiber optic assembly having at least one optical fiber operably coupled with the component, the fiber optic assembly further including a light source to transmit light having a known parameter through the optical fiber and a receiver to receive the light from the optical fiber, and a processor in communication with the fiber optic assembly to identify a shift in the parameter received by the receiver, the shift corresponding to an operating characteristic of the component. Method also provided for detecting coking using the system to detect coking disclosed herein.

Abstract: Provided is a real-time spectroscopic ellipsometer capable of obtaining information on properties of a sample, a nano pattern shape, and the like, in real time by measuring and analyzing, for a plurality of wavelengths, a change in a polarization state of incident light generated while being reflected or transmitted due to the sample when light having a specific polarization component is incident to the sample. The real-time spectroscopic ellipsometer according to the exemplary embodiment of the present invention have the improved structure and function to solve problems such as polarization dependency of a light source and a photometric detector, wavelength dependency of a compensator, a limitation of a change in integration time due to a fixing of a measuring frequency of exposure, in a rotating-element multichannel spectroscopic ellipsometers of the related art, thereby measuring more accurately, precisely, and rapidly measuring the characteristics of the sample than the related art.

Abstract: A laser light deflection amount detecting apparatus detects an amount of deflection of laser light and includes a laser light source, a first polarizing beam splitter that splits the laser light emitted by the laser light source, an optical system that rotates at least one of linearly polarized components around an optical axis orthogonally and that acquires a combined light of the linearly polarized components at least one of which is rotated, a light blocking member, a second polarizing beam splitter, and two light receiving elements that measure an amount of light of the polarized components resulting from the splitting by the second polarizing beam splitter.

Abstract: A method for analyzing a sample with a light probe with a spatial resolution smaller than the wavelength of the light probe comprising the steps of: —illuminating the sample by a first light pulse saturating a vibrational and/or electronic transition, said light pulse presenting an intensity spatial distribution on the sample presenting at least one minimum wherein saturation does not occur, —measuring the local absorbance properties and/or the local second order non-linear susceptibility of the sample by using a second light pulse forming the light probe at a wavelength corresponding to said electronic and/or vibrational transition, wherein the second light pulse overlap said first light pulse intensity minimum.

Abstract: Two dimensional (2D) optical spectroscopy, wherein the spectrum has an excitation and an emission axis, reveals information formerly hidden in one-dimensional (1D) optical spectroscopy. However, current two dimensional optical spectroscopy systems are complex laboratory arrangements and accordingly limited in deployment. According to embodiments of the invention a monolithic platform providing significantly reduced complexity and increased robustness is provided allowing for “black-box” modules allowing commercial deployment of 2D optical spectroscopy instruments. Additionally, the invention supports high pulse repetition rates as well as one quantum and two quantum measurements under electronic control.

Abstract: The present disclosure describes security screening systems and methods for identifying a suspect material in a sample. In general terms, the system and method disclosed herein provide collection optics configured to collect a first plurality of interacted photons from an illuminated sample and generating a first optical signal. The first optical signal is separated into a plurality of optical components where the plurality of optical components are filtered by a plurality of filters. Each filter of the plurality of filters is configured to filter the plurality of optical components into a passband wavelength to generate a plurality of filtered components. The plurality of filtered components are detected by one or more detectors and one or more wavelength specific spectral images are generated. A processor is configured to analyze the one or more wavelength specific spectral images in order to identify the suspect material in the sample.

Abstract: Systems and methods for measuring a profile of a glass sample (300) are disclosed. The method includes scanning a polarization-switched light beam (112PS) through the glass sample and a reference block (320) for different depths into the glass sample to define a transmitted polarization-switched light beam. The method also includes measuring an amount of power in the polarization-switched light beam to form a polarization-switched reference signal (SR), and detecting the transmitted polarization-switched light beam to form a polarization-switched detector signal (SD). The method further includes dividing the polarization-switched detector signal by the polarization-switched reference signal to define a normalized polarization-switched detector signal (SN). Processing the normalized polarization-switched detector signal determines the profile characteristic.

Abstract: A wavefront sensing technique using Polarization Rotation INTerferometry (PRINT) provides a self-referencing, high-resolution, direct measurement of the spatially dependent phase profile of a given optical beam. A self-referencing technique is used to create a reference beam in the orthogonal polarization and a polarization measurement to measure the spatial-dependent polarization parameters to directly determine the absolute phase profile of the beam under test. A high-resolution direct measurement of the spatially-resolved phase profile of one or more optical beams is realized.

Abstract: An analysis system comprises a transmitting device (1.1) and a receiving device (1.2). The transmitting devices comprises means for illuminating an object (1.3), or a part of the object, by a first light beam (1.8) consisting of signals with two distinct frequencies and first orthogonal polarisation states. The receiving device comprises means (1.6) for detecting, in a second light beam with second polarisation states and resulting from the illumination of the object to be analysed by the first light beam, a signal at a beat frequency equal to a difference between the two frequencies of the first light beam; and means (1.7) for obtaining information relating to the depolarising or dichroic character of the object, or of the part of the object, according to the detection or not of a signal at the beat frequency.

Abstract: In a first optical measurement device, light which is output from a light source is subject to linear polarizing in a polarizing unit, and is input to a test object A. Transmitted light which has passed through the test object A is orthogonally separated in an orthogonal separation unit, and the light which is orthogonally separated in the orthogonal separation unit is received in two light receiving units. In addition, amount of light of the transmitted light is determined by a control unit, and a difference between received light levels which are received in the light receiving unit is normalized using the amount of light which is determined in a transmitted amount of light determination unit, and then the angle of optical rotation is calculated by the angle of optical rotation calculation unit.

Abstract: Disclosed is a volume sensor having first, second, and third laser sources emitting first, second, and third laser beams; first, second, and third beam splitters splitting the first, second, and third laser beams into first, second, and third beam pairs; first, second, and third optical assemblies expanding the first, second, and third beam pairs into first, second, and third pairs of parallel beam sheets; fourth, fifth, and sixth optical assemblies focusing the first, second, and third beam sheet pairs into fourth, fifth, and sixth beam pairs; and first, second, and third detector pairs receiving the fourth, fifth, and sixth beam pairs and converting a change in intensity of at least one of the beam pairs resulting from an object passing through at least one of the first, second, and third parallel beam sheets into at least one electrical signal proportional to a three-dimensional representation of the object.

Abstract: A dual-modulation Faraday rotation spectroscopic (FRS) system is disclosed. The FRS system uses an FRS sample cell configured to subject a sample to a low frequency modulated magnetic field. The system includes a polarized laser light source configured to generate a high frequency wavelength-modulated light beam incident on the sample, the high frequency wavelength-modulated light beam being modulated at a higher frequency than the low frequency modulated magnetic field. A polarizer is configured to receive from the sample a transmitted light beam having a modulated polarization having a polarization rotation and translate the modulated polarization of the transmitted light beam into an intensity modulated beam. A photodetector is configured to detect the intensity modulated beam and generate a photodetector signal. A dual demodulator is coupled to the photodetector and is configured to demodulate the photodetector signal.

Abstract: An apparatus and method for imaging a section of a medium is disclosed. The apparatus or method receives and returns light from the section and from sites adjacent to the section. A microscope using this apparatus or method can be telecentric in pinhole space at the detection end of the system.

Abstract: A spectral radiation detector employs at least one lenslet with a circular blazed grating for diffraction of radiation at a wavelength at nth order to a focal plane A detector is mounted at the focal plane receiving radiation passing through the at least one lenslet for detection at a predetermined order. At least one order filter associated with the at least one lenslet passes radiation at wavelengths corresponding to the predetermined order. In additional embodiments a polarizing filter is associated with the lenslet for additional discrimination of the radiation.

Abstract: An inspection apparatus for a display substrate includes a reflection plate, a liquid crystal layer, an electrode layer, a ¼ wavelength retardation plate and a polarization plate. The liquid crystal layer is disposed on the reflection plate and includes liquid crystal molecules which have a retardation value of about 140 nanometers to about 200 nanometers and are operated in a twisted nematic mode. The electrode layer is disposed on the liquid crystal layer and generates an electric field in cooperation with an electrode of the display substrate. The ¼ wavelength retardation plate is disposed on the electrode layer and the polarization plate is disposed on the ¼ wavelength retardation plate.

Abstract: A light weight, portable spectroradiometer device has an optical system that directs incoming wavelengths of light to impinge upon a three-dimensional sensor comprised of a linear variable filter in direct contact with a photodiode array. The linear variable filter can be a specific band pass filter coating that has been geometrically wedged in one direction. The incoming wavelengths of light are transmitted through the three-dimensional sensor and differentiated into the pixels to be further processed into digital signals. A standard light source, either external or internal to the device, and emitting specified intensities over wavelengths may also be used to calibrate the spectroradiometer device, and samples of light with unknown intensities may be compared to the standard light source. The compact geometry of the optical system and sensor allows the device to be a compact, light weight three-dimensional spectroradiometer containing no moving parts and having a rapid measurement time.

Abstract: A method for imaging skin includes illuminating a subject with at least one light source of one or more light sources. The method includes acquiring a first image of the subject in a first polarization with a respective photodetector of one or more photodetectors configured to acquire images of the subject as illuminated by the at least one light source, and acquiring a second image of the subject in a second polarization with the respective photodetector. The method also includes generating a subtraction image by subtracting at least a portion of the first image from a corresponding portion of the second image, and providing at least a portion of the subtraction image for display.

Abstract: The invention relates to an optoelectronic sensor element (20) having at least one reception element (22, 22a, 22b, 22c, 22d) in front of which a polarizing structure (24, 24a, 24b, 24c, 24d) is arranged which is manufactured from an electrically conductive material, with the polarizing structure (24, 24a, 24b, 24c, 24d) having a contact connection (26) for the application of a defined tension and with the polarizing structure (24, 24a, 24b, 24c, 24d) being configured as a screen of the sensor element (20).

Abstract: Multi-layer articles are disclosed which include, a polypropylene-based film, and a layer on at least one surface of the polypropylene-based film including an ethylene-based material containing a copolymer of ethylene and at least one alpha-olefin comomoner with a density of no greater than 0.90 g/cm3 and a polydispersity index of between 1 and 4, wherein the multi-layer article is biaxially stretched. In some embodiments the multi-layer article exhibits desirable optical properties.

Abstract: Measuring polarization profile along an input optical beam cross-section using an optical system includes a polarization beam splitting assembly for splitting the input beam into a predetermined number of beam components with a predetermined polarization relation between them, and including a polarization beam splitter in an optical path of the input beam splitting it into beam components having a polarization relationship and a birefringent element in an optical path of the beam components for splitting each of them into a pair of beams having ordinary and extraordinary polarizations, thereby producing the predetermined number of output beam components. The pixel matrix is located in substantially non-intersecting optical paths of the output beam components and generates a number of output data pieces indicative of intensity distribution within the output beam components and data contained therein being indicative of the polarization profile along the input beam cross-section.

Abstract: A depolarizer includes a pair of wedge-shaped plates made of an optically isotropic material, laid one on top of another such that the total thickness is constant and wedge-plate holding means for holding the pair of wedge plates separately. The wedge-plate holding means includes a pressure-applying section for applying pressure to each of the pair of wedge plates in a direction perpendicular to the thickness direction of the pair of wedge plates. The pressure-applying direction for one of the pair of wedge plates and the pressure-applying direction for the other of the pair of wedge plates intersect at an angle of 45 degrees.

Abstract: A system and method for detecting at least one target of interest using at least two conformal filters in a dual polarization configuration. A plurality of interacted photons are collected from a sample comprising at least one analyte of interest. The plurality of interacted photons are separated into at least a first and second optical component. The first optical component is passed through a first conformal filter and the second optical component is passed through a second conformal filter. A Data set corresponding to each filtered optical component is generated and an optical computation is applied to assess at least one characteristic of the analyte.

Abstract: A spectroscopy system comprising at least two laser modules, each of the laser modules including a laser cavity, a quantum cascade gain chip for amplifying light within the laser cavity, and a tuning element for controlling a wavelength of light generated by the modules. Combining optics are used to combine the light generated by the at least two laser modules into a single beam and a sample detector detects the single beam returning from a sample.

Abstract: An apparatus for quantifying unknown stress and residual stress of a material to be tested, the material being a birefringent or temporary birefringent material, which includes a light source, a polarizer in front of the light source for converting a light beam from the light source into a beam with linear polarization, a first quarter-wave plate in front of the polarizer for generating circular polarization, a standard material, a second quarter-wave plate, an analyzer, a loading unit, a spectrometer for obtaining transmissivity spectrum of the standard material under the wavelength of the light source and a detecting module connected to the spectrometer to have the transmissivity spectrum of the material to be tested and consequently a stress quantifying formula for the standard material.

Abstract: A method of microscopy and an illumination optical device with a hollow cone for a microscope, the illumination device includes a first conical lens (1) able to receive a collimated incident light beam (10) and form a conical light beam (20), a second conical lens (5) arranged in such a way as to receive the conical light beam (20, 40) and to form a cylindrical light beam with a black background (50) and an optical lens (6) having an image focal plane (12) arranged in such a way as to receive the cylindrical light beam with a black background (50), to form a hollow cone light beam (60) and to focus the hollow cone light beam (60) into a point (18) in the image focal plane (12).

Abstract: A luminous unit for an optical gas detector, an optical gas detector including the luminous unit, and a method of recording an absorption spectrum in an optical gas detector include a light source for linearly polarised light radiation and a housing with an exit window. A wavelength of the light radiation radiated from the light source is tunable. The light source is arranged in the housing such that the main emission direction (OA) of the light source encloses an inclination angle (?) of between 10° and 50° with a normal (N) to the main extension plane (HE) of the exit window. The direction of polarisation (P) of the light radiation encloses a rotation angle (?) of between 22.5° and 67.5° with the plane of incidence on the exit window.

Abstract: A highly efficient vacuum ultraviolet circular dichroism spectrometer is provided; the spectrometer suitable for laboratory use or for integration into a beam line at a synchrotron radiation facility. In one embodiment, a spectroscopic circular dichroism instrument is provided; the instrument configured so as to enable circular dichroism data to be simultaneously obtained for multiple wavelengths of light. The instrument may be further configured to operate in at least a portion of the vacuum ultraviolet wavelength region.

Abstract: A system for sensing the position of a movable object includes a polarization maintaining fiber configured to receive light from a light source; an optical system configured to rotate an angle of polarization of the light by a first predetermined angle; a low birefringence fiber connected to the optical system at a first end and having a mirror connected to a second end configured to reflect the light and rotate the angle of polarization at a second predetermined angle, the second end being configured to overlap a magnetic field of the a magnet attached to the object. The angle of polarization is rotated to a third predetermined angle proportional to at least one of the strength of the magnetic field and an amount of the overlap. The optical system is configured to decompose the third predetermined angle into a first component and a second component. A detector is configured to detect a differential between the first and second components indicative of the amount of the overlap.

Abstract: A novel technique for model-based metrology. A geometry of structure to be measured on a surface of a substrate is received. A tessellation of the geometry of the structure is produced. The tessellation is used to determine a vertical discretization and a horizontal discretization so as to generate a discrete model for the geometry, and scatterometry computations are performed using the discrete model. Other embodiments, aspects and features are also disclosed.

Abstract: A method of providing a user interface according to a user characteristic and a mobile terminal using the same are provided. The mobile terminal includes: a display unit for displaying data on a screen thereof with different screen sizes corresponding to a horizontal mode and a vertical mode; an input unit for providing different input key arrangements corresponding to the vertical mode, a left hand horizontal mode, and a right hand horizontal mode; a detection unit for detecting a mode conversion between the horizontal mode and the vertical mode and a mode conversion between the left hand horizontal mode and the right hand horizontal mode; and a controller for controlling to display data to correspond to a screen size corresponding to the detected mode and to provide a corresponding input key arrangement.

Abstract: A unit for measuring a power of randomly polarized light beam is configured with spaced first and second beam splitters having respective reflective surfaces which face one another and configured to sequentially reflect a fraction of randomly polarized beam which is incident upon the first splitter. The beam splitters are dimensioned and shaped so that an output beam, reflected from the second beam splitter, has a power independent from the state of polarization of the randomly polarized beam.

Abstract: A method for detecting ultra-fine features of an integrated circuit (IC) on a semiconductor substrate is disclosed. The semiconductor substrate comprises an IC fabricated by 22 nanometer or smaller scale semiconductor micro-fabrication process. The integrated circuit includes circuit features parallel to a circuit horizontal direction or a circuit vertical direction. The method includes focusing an incident light to produce a focused light spot on a portion of the IC. The incident light is linearly polarized in a linear polarization substantially parallel to the circuit horizontal direction. The method includes detecting reflected light from the portion of the IC, producing a relative movement between the focused light spot and the IC to allow the focused light to illuminate different portions of the IC, obtaining an image of the IC using signals of the reflected light detected from different locations of the integrated circuit, and detecting IC features in the image.

Abstract: A circular dichroism (CD) spectrometer includes an alignment mechanism that automatically adjusts the elements thereof at appropriate positions. The spectrometer has a focusing-lens position-and-orientation adjustment mechanism which adjusts the position and the orientation of the detector-side focusing lens. It also has a detector rotation mechanism which adjusts the orientation of the detector. Firstly, a control PC monitors the CD spectrum of D form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum matches the reference spectrum related to the D form. Next, the control PC moniters CD spectrum of L form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum of the D and L forms become symmetrical. And, the rotation mechanism adjusts the orientation of the detector such that the intensity of the detector signal is maximized.

Abstract: A system for measuring the rotation angle of optical active substances has a light source, a polarization generation unit; a polarization analyzing unit; a signal generating unit, respectively and electrically coupled to the polarization generation unit and the polarization analyzing unit; a signal processing unit, electrically coupled to the electric signal generating unit; wherein the light source is enabled to emit a beam toward the polarization generation unit for enabling the beam to be polarized into an incident polarized beam while being projected and traveled in an optical path passing through an optical active substance so as to be converted into a emerging beam; and the polarization analyzing unit is positioned to receive and analyze the emerging beam so as to generate a signal to be received and processed by the signal processing unit.

Abstract: A method of controlling a light beam in an optical system includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. The method includes the step selectively moving a lens into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector. The detector, therefore, is held stationary. Adjustment means are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.

Abstract: An SPR or other optical resonance based analysis system in which, light is provided at multiple angles to a specimen and then the light modified by the specimen is processed to select only some of the light. Optionally, the processing selects light at a particular incidence angle. Optionally, the detection is by imaging of the light on a 2D imager array.