Abstract: A multi-focal light-sheet structured illumination system that can be implemented as a part of a commercial fluorescence microscope or a module that is adaptable to fit a number of commercially available microscopes. The system provides simultaneous capture of 2D images from multiple planes within a 3D volume, which are resolved laterally and axially to provide improved resolution along the three dimensions (x,y,z). A Wollaston prism allows several axially-localized high-contrast structured illumination patterns to be generated.

Abstract: A diffractive optic reflex sight (DORS) is provided for aiming devices in which a virtual image, such as a reticle, is produced and appears in the distance of a user's view when looking through the reflex sight. A light source illuminates a diffractive optical element (DOE) that includes a modulation pattern that generates a patterned illuminations corresponding with the virtual image. A reflective image combiner then reflects the patterned illumination so that the virtual image appears in the distance of the viewer's view. The DORS optical design system is mechanically and optically stable for precision aiming across a range of environmental conditions and in different use scenarios or applications including use in rapidly changing temperatures, varying light conditions, and a wide range of user proficiencies. The DORS optical design system is a readily manufacturable aiming and sighting device for a wide range of applications from handguns to astronomical telescopes.

Abstract: The invention relates to an automatic focusing apparatus for the microscopic examination of a plurality of spatially distributed (biological) samples, whereby an object stage that is vertically movable relative to the microscope has a carriage that is translatable along the x-axis and y-axis and a sample stage that is translatable along the z-axis and is mounted on the carriage. Furthermore, the invention relates to a method for automatic focusing and microscopic examination of a plurality of spatially distributed biological samples, through a microscope having an object stage that is vertically movable relative to the microscope.

Abstract: A differential interference imaging system capable of rapidly changing shear direction and amount includes: a light source (101), a filter (102), a polarizer (103), a sample stage (104), an infinite imaging microobjective (105), a tube lens (106), a shear component, an analyzer (113), and an image sensor (114). After the light intensity and a polarization direction is adjusted, the linearly polarized light passes through a transparent sample, to be collected by the infinite imaging microobjective (105) and to implement imaging through the tube lens (106). An imaging beam is divided into two linearly polarized light fields which are perpendicular to each other in the polarization directions and have tiny shear amount, then they are further combined into an interference light filed by the analyzer (103) to form a differential interference image in the image sensor (114). The system may be flexibly assembled, is simple in structure and easy to implement.

Abstract: The illumination light condensing point PQ and the reference light condensing point PL are arranged as mirror images of each other with respect to the virtual plane VP, and each data of the object light O, being a reflected light of the spherical wave illumination light Q, and the inline spherical wave reference light L is recorded on each hologram. On the virtual plane VP, the reconstructed object light hologram hV for measurement is generated, and the spherical wave optical hologram sV representing a spherical wave light emitted from the reference light condensing point PL is analytically generated. The height distribution of the surface to be measured of the object 4 is obtained from the phase distribution obtained by dividing the reconstructed object light hologram hV by the spherical wave light hologram sV.

Abstract: Various methods, systems and apparatus are provided for imaging and sensing using interferometry. In one example, a system includes an interferometer; a light source that can provide light to the interferometer at multiple wavelengths (?i); and optical path delay (OPD) modifying optics that can enhance contrast in an interferometer output associated with a sample. The light can be directed to the sample by optics of the interferometer. The interferometer output can be captured by a detector (e.g., a camera) at each of the multiple wavelengths (?i). In another example, an apparatus includes an add-on unit containing OPD that can enhance contrast in an interferometer output associated with a sample illuminated by light at a defined wavelength (?i). A detector can be attached to the add-on unit to record the interferometer output at the defined wavelength (?i).

Abstract: A method for operating a light microscope with structured illumination includes: providing illumination patterns by means of a structuring device which splits impinging light into at least three coherent beam parts which correspond to a ?1., 0., and +1. diffraction orders of light; generating different phases of the illumination patterns by setting different phase values for the beam parts with phase shifters; and recording at least one microscope image for each of the illumination patterns and calculating a high resolution image from the microscope images. Phase shifters are provided not only for the beam parts of the ?1. and +1. diffraction orders but also at least one phase shifter for the beam part of the 0. diffraction order. At least two different phase values ?0 are set with the at least one phase shifter for the 0. diffraction order to provide a plurality of illumination patterns with different phases.

Abstract: A lighting device includes a light source generating a beam of illumination light, a ring-shaped aperture shielding a central portion of the illumination light and transforming the beam of illumination light into ring-shaped illumination light, and an object lens focusing the ring-shaped illumination light such that a specimen can be illuminated with the ring-shaped illumination light. An inspection apparatus including the light device also has a beam splitter and an image sensor picking up light reflected and/or diffracted from the specimen through the beam splitter. Because a central portion of the illumination light is shielded, lens flare of light transmitted by the beam splitter and the object lens is prevented thereby preventing speckles in the image produced by the image sensor.

Abstract: A three-dimensional (3D) microscope includes various insertable components that facilitate multiple imaging and measurement capabilities. These capabilities include Nomarski imaging, polarized light imaging, quantitative differential interference contrast (q-DIC) imaging, motorized polarized light imaging, phase-shifting interferometry (PSI), and vertical-scanning interferometry (VSI).

Abstract: A multi-focal light-sheet structured illumination system that can be implemented as a part of a commercial fluorescence microscope or a module that is adaptable to fit a number of commercially available microscopes. The system provides simultaneous capture of 2D images from multiple planes within a 3D volume, which are resolved laterally and axially to provide improved resolution along the three dimensions (x,y,z). A Wollaston prism allows several axially-localized high-contrast structure illumination patterns to be generated.

Abstract: The invention relates to a method for recording images with a light microscope, wherein a specimen container with a specimen is arranged on a specimen holder of the light microscope, and wherein illuminating light is guided onto the specimen. The illuminating light can hereby be cut in a cross-section transversely to an optical axis of the light microscope through a wall of the specimen container to a limited cross-sectional region. First and second diaphragm settings are determined and set, for the limited cross-sectional region of the illuminating light defined by the wall of the specimen container, in which the diaphragm covers equal sized portions of the limited cross-sectional region. In addition the invention relates to a light microscope which is adapted in particular to carry out the method.

Abstract: A moving speed control method of an optical element switching device including a fixing member, a moveable member having a plurality of recess portions configured to hold one or more optical elements, a driving device supported to the fixing member and configured to move the moveable member, and an engaging mechanism supported to the fixing member and configured to be engaged to the recess portion to thereby position each of the one or more optical elements on an optical axis, the moving speed control method includes: starting to move the moveable member from a state where the recess portion is engaged to the engaging mechanism; accelerating a moving speed of the moveable member; decelerating the moving speed when the engaging mechanism is to be engaged to the next recess portion; and making the moving speed zero when the engaging mechanism is engaged to the recess portion.

Abstract: An observation device including: a stage having a transparent pedestal surface; an illumination system under the pedestal surface, the illumination system emitting illumination light toward the pedestal surface; and an object system under the pedestal surface for capturing transmission light generated from the illumination light, reflected off a reflection surface and transmitted through a sample. Wherein a first light path in the illumination system is different from a second light path in the object system, in a first pupil surface of the illumination system, the illumination system generates the illumination light by restricting light in a first transparent region, in a second pupil surface of the object system, the object system restricts the transmission light in a second transparent region, and the second transparent region has first and second subregions with different transmittance, the second subregion located between the first subregion and an edge of the second transparent region.

Abstract: The inspection system includes an illumination source, a TDI-CCD sensor, and a dark field/bright field sensor. A polarizer receives the light from the light source. The light from the polarizer is directed at a Wollaston prism, such as through a half wave plate. Use of the TDI-CCD sensor and the dark field/bright field sensor provide high spatial resolution, high defect detection sensitivity and signal-to-noise ratio, and fast inspection speed.

Abstract: An observation device where a first light path in an illumination optical system is different from a second light path in an object optical system, the illumination optical system includes a light source that emits the illumination light in a first direction, and an illumination deflector that deflects the illumination light from the first direction to a second direction, a pre-reflected illumination angle between a pedestal surface holding the sample and the first direction is smaller than a post-reflected illumination angle between the pedestal surface and the second direction, the object optical system includes a transmission deflector that deflects the transmission light transmitted through the sample from a third direction to a fourth direction, and a post-reflected transmission angle between the pedestal surface and the fourth direction is smaller than a pre-reflected transmission angle between the pedestal surface and the third direction.

Abstract: A culture vessel that houses a culture liquid and a specimen is irradiated with pattern light having a pattern that is previously set for the culture vessel. Transmitted light transmitted through the culture liquid in the culture vessel because of the irradiation with the pattern light is detected. Optical characteristics of an adjusting optical system that adjusts refraction of light caused by the shape of the liquid surface of the culture liquid in the culture vessel are adjusted, on the basis of a detection signal based on the detected transmitted light. After the adjustment, the culture vessel is irradiated with illumination light for phase-contrast measurement, and the specimen irradiated with the illumination light is imaged.

Abstract: An optical element includes an optical block through which object light is transmitted along a light transmission axis direction, a first wavelength selection filter provided on a first filter surface set such that a normal line forms an angle ? with the light transmission axis, and a second wavelength selection filter located on a rear side with respect to the first wavelength selection filter, and provided on a second filter surface set such that a normal line forms an angle ? with the light transmission axis, the second filter surface being in non-parallel, having an opposite inclination direction, and forming an angle 2? with the first filter surface. The optical block is constituted by combining an incidence-side block, a first filter block, a second filter block, and an emission-side block, formed of the same material and in the same shape.

Abstract: A microscope with at least one illumination beam that is phase modulated in a section along its cross-section with a modulation frequency and a microscope lens for focusing the illumination beam into a test as well as a detection beam path and at least one means of demodulation, wherein at least one polarization altering item is scheduled in the illuminating beam path, for which a phase plate is subordinated that exhibits at least two areas with different phase influence.

Abstract: A three-dimensional (3D) microscope includes various insertable components that facilitate multiple imaging and measurement capabilities. These capabilities include Nomarski imaging, polarized light imaging, quantitative differential interference contrast (q-DIC) imaging, motorized polarized light imaging, phase-shifting interferometry (PSI), and vertical-scanning interferometry (VSI).

Abstract: An optical device can be used for circularly polarizing light and/or removing reflected light from an optical system (optical isolation). The optical device can have a polarizing-cube including a pair of prisms and a polarizer. Each prism can have two ends linked by an inner face and two outer faces. The prisms can be attached together at the inner face of each with the polarizer sandwiched between the prisms. Fresnel rhomb(s) can be attached to outer face(s) of the prisms.

Abstract: A differential polarization interferometer is provided. An interferometer performs direct measurement of phase shift of a light wave passed under an arbitrary angle through a sample composed of a transparent substrate holding a thin deposited test film, for metamaterial testing. An example apparatus has a laser source and a first polarizer, and two optically connected arms. A first arm creates orthogonally polarized components of a single output beam for a broadband non-polarizing beam splitter. A second arm has a controllable phase retarder to introduce a phase shift into one polarization component of the reflected single output beam, and a second polarizer to equalize and mix the polarization components of the reflected single output beam. This transforms the reflected single output beam into a beam resulting from interference of polarization components of the reflected single output beam. A photodetector transforms an intensity of the beam into an electric signal for output.

Abstract: A microscope has an objective, a light source illuminating a sample over an illumination beam path, an arrangement producing a flat illumination pattern which is structured in both spatial directions on the sample, a surface detector detecting light coming over one picture beam path, an arrangement shifting the illumination pattern on the sample in one displacement direction, and a control unit taking one picture at a time of the light which was detected by the detector as phase picture in different positions of the pattern along the displacement direction and to computationally reconstruct from these phase pictures an overall picture of the illuminated sample region. The displacement direction is oblique to the main axes of symmetry of the illumination pattern and depending on the illumination pattern is chosen such that the number of phase pictures which is necessary for the picture reconstruction corresponds to the theoretically minimally required value.

Abstract: A system for obtaining spectral images from polarized light comprising a polarization sensitive filter; the polarization sensitive filter being configured to receive light at at least one predetermined polarization orientation; and an achromatic waveplate operatively associated with the polarization sensitive filter; the achromatic waveplate being rotatable; whereby rotation of the achromatic waveplate enables light to enter the polarization sensitive spectral filter at at least two predetermined polarization orientations.

Abstract: An optical microscope system and method having a birefringent material for decomposing light from a light source into ordinary and extraordinary waves, a first prism for directing the decomposed light sequentially through a specimen and an objective along a light path and a second prism positioned in the light path of the decomposed light, said second prism positioned subsequent the objective and prior to an ocular assembly.

Abstract: A cell grabber has a unitary structure including a transparent grabber head at a terminus thereof and an elongated mounting portion extending therefrom for attachment to a force transducer. The grabber head has a planar or concave bonding surface which is coated with an adhesive film to secure the specimen, especially single cells, for tensile measurements. The cell grabber may be used in connection with auxotonic, isometric or isotonic force measurement systems.

Abstract: The invention relates to an optical assembly that can be interposed into the observation beam path of a microscope, comprising a first mount. In the first mount, a stack of optical elements for a polarization optical, differential interference contrast method, is arranged to facilitate a first observation method. The stack comprises, inter alia, a polarizer, polarization-optical shearing elements, and an analyzer. The analyzer is arranged in the stack with regard to its polarization direction in a predetermined orientation relative to the polarization direction of the polarizer. The stack of optical elements in the first mount is arranged such as to be interchangeable. Further, the assembly comprises at least one additional mount for receiving optical elements for at least one additional observation method.

Abstract: Provided is a small-sized quantitative phase measurement apparatus. The quantitative phase measurement apparatus 1 includes a reflective polarization splitting element 17. The reflective polarization splitting element 17 is disposed at a focusing position of the converging light L4, and performs splitting of the converging light L4 into two polarized beams having different polarization directions and reflection of the two polarized beams to form a first polarized beam L5 and a second polarized beam L6 both travelling toward the converging optical system 16.

Abstract: A microscope is provided for space-resolved measurement of a predetermined structure. The microscope includes a source of radiation, which emits electromagnetic radiation of a predetermined wavelength, an optical system, which irradiates the electromagnetic radiation onto the structure to be measured and images the structure, irradiated with the electromagnetic radiation, onto a detector. The optical system has two eigen polarization conditions, and the optical system includes a polarization module by which a polarization condition can be set for the electromagnetic radiation of the source of radiation, the polarization conditions corresponding to the eigen polarization conditions.

Abstract: A microscope system that performs structured illumination includes a light source configured to emit illumination light, an objective lens that irradiates a specimen with the illumination light, a phase-modulation spatial light modulator that has a two-dimensional pixel structure, that is arranged at the pupil conjugate position of the objective lens on an illumination light path between the light source and the objective lens, and that is configured to modulate a phase of the illumination light for each pixel so as to form a fringe illumination pattern on the specimen on the basis of an optical parameter of at least one of the light source and the objective lens.

Abstract: A microscope apparatus includes an electromagnetic wave source configured to generate an illuminating electromagnetic wave, a first beam splitter configured to split the illuminating electromagnetic wave into a first component along a first path and a second component along a second path, a movable reflector module configured to adjust a portion of the second path, and a second beam splitter configured to recombine the first component and the second component. An observing device is configured to receive the recombined first component and second component and the microscope apparatus is configured acquire a phase image from the observing device based on positioning of the movable reflector module and representative of an electric field distribution near an object located along the first path between the first beam splitter and the second beam splitter.

Abstract: A microscope apparatus includes a condenser lens to make an illuminating electromagnetic wave relatively homogeneous, a first beam splitter splitting the illuminating electromagnetic wave after the condenser lens, a movable reflector module, a second beam splitter, an objective lens to project the illuminating electromagnetic wave propagating after an object to be observed toward an observing device. The object is loaded between the first beam splitter and the second beam splitter. The microscope apparatus is configured to split the illuminating electromagnetic wave into two paths at the first beam splitter. A first path goes through the first and the second beam splitters, and a second path goes through the movable reflector module to rejoin the first path at the second beam splitter. The microscope apparatus is configured acquire phase images with interferences of the electromagnetic wave from the two paths with at least two distance settings of the movable reflector module.

Abstract: A 4-Pi microscope for imaging a sample, comprising a first objective for focusing a first light beam on the sample at a spatial point one or more Digital Optical Phase Conjugation (DOPC) devices, wherein the DOPC devices include a sensor for detecting the first light beam that has been transmitted through the sample and inputted on the sensor; and a spatial light modulator (SLM) for outputting, in response to the first light beam detected by the sensor, a second light beam that is an optical phase conjugate of the first light beam; and a second objective positioned to transmit the first light beam to the sensor and focus the second light beam on the sample at the spatial point, so that the first light beam and the second light beam are counter-propagating and both focused to the spatial point.

Abstract: The invention relates to an optical assembly that can be interposed into the observation beam path of a microscope, comprising a first mount. In the first mount, a stack of optical elements for a polarization optical, differential interference contrast method, is arranged to facilitate a first observation method. The stack comprises, inter alia, a polarizer, polarization-optical shearing elements, and an analyzer. The analyzer is arranged in the stack with regard to its polarization direction in a predetermined orientation relative to the polarization direction of the polarizer. The stack of optical elements in the first mount is arranged such as to be interchangeable. Further, the assembly comprises at least one additional mount for receiving optical elements for at least one additional observation method.

Abstract: An illumination optical system includes: a beam splitter located near a conjugate position of a specimen and configured to split beams from a light source into a plurality of groups of beams having different splitting directions around an optical axis; a beam selector configured to select and transmit one group of beams from the plurality of groups of beams and that is rotatable with respect to the optical axis; and a ½ wavelength plate located near the beam selector and rotatable about the optical axis. The rotation angles of the ½ wavelength plate and of the beam selector about the optical axis are respectively set so that the polarization direction of the beam which has passed through the ½ wavelength plate is perpendicular to the splitting direction of the one group of beams that has been selected by the beam selector and split by the beam splitter.

Abstract: A microscope includes a light source; a condenser lens irradiating a sample with a light from the light source; an objective facing the condenser lens across the sample; a first polarization plate placed between the light source and the condenser lens; a condenser turret placed between the first polarization plate and the condenser lens and having a plurality of optical elements placed inside; a polarization plate placed on the image side with respect to the objective; and a compensator placed between the first polarization plate and the polarization plate. In the microscope, according to the observation method, an optical element to be placed in an optical path among the plurality of optical elements placed inside the condenser turret is switched by rotation of the condenser turret.

Abstract: We describe methods and apparatus for high-speed high-contrast imaging one-, two- and three-dimensional imaging enabled by differential interference contrast time encoded amplified microscopy of transparent media without the need for chemical staining, that are suitable for a broad range of applications from semiconductor process monitoring to blood screening. Our methods and apparatus build on a unique combination of serial time-encoded amplified microscopy (STEAM) and differential interference contrast (DIC) microscopy. These methods and apparatus are ideally suited for identification of rare diseased cells in a large population of healthy cells and have the potential to revolutionize blood analysis and pathology including identification of cancer cells, such as Circulating Tumor Cells (CTC) in early stage disease.

Abstract: A microscope apparatus includes a condenser lens to make an illuminating electromagnetic wave relatively homogeneous, a first beam splitter splitting the illuminating electromagnetic wave after the condenser lens, a movable reflector module, a second beam splitter, an objective lens to project the illuminating electromagnetic wave propagating after an object to be observed toward an observing device. The object is loaded between the first beam splitter and the second beam splitter. The microscope apparatus is configured to split the illuminating electromagnetic wave into two paths at the first beam splitter. A first path goes through the first and the second beam splitters, and a second path goes through the movable reflector module to rejoin the first path at the second beam splitter. The microscope apparatus is configured acquire phase images with interferences of the electromagnetic wave from the two paths with at least two distance settings of the movable reflector module.

Abstract: A microscope apparatus includes an illumination optical system that illuminates a sample with illumination light from a light source; an imaging optical system that converges light emitted from the sample to form a sample image by an objective lens; an aperture member disposed in the illumination optical system in the vicinity of a conjugate plane of a rear focal plane of the objective lens and having an aperture for limiting illumination light; and a filter member that includes a phase plate disposed in the imaging optical system in the vicinity of the objective lens rear focal plane or in the vicinity of the conjugate plane of the objective lens rear focal plane and having first and second phase areas introducing a 180-degree phase difference into the light from the sample; a phase boundary portion between the first and second phase areas being disposed in a conjugate aperture of the aperture.

Abstract: An extended depth of field microscope system for phase object detection includes an imaging optical module and a phase/intensity converting module. The imaging optical module has an object lens group, in which an axial symmetric phase coding is added, to produce an axial symmetric spherical aberration. A point spread function (PSF) and an image with extended depth of field can be obtained with a predetermined level of similarity. The phase/intensity converting module converts the phase change of the light passing the phase object, into an image light with change of light intensity.

Abstract: A microscope device having dual emission capability, wherein detrimental effects of image-aberrations and -distortions are reduced. By providing the means for reflecting the one beam in a manner so as to invert its handedness and the means for reflecting the second beam in a manner so as to preserve its handedness, a fully symmetrical configuration is obtained, where corresponding image points in both color/polarisation channels all experience the same field-dependent aberrations.

Abstract: A method and system for three-dimensional polarization-based confocal microscopy are provided in the present disclosure for analyzing the surface profile of an object. In the present disclosure, a linear-polarizing structured light formed by an optical grating is projected on the object underlying profile measurement. By means of a set of polarizers and steps of shifting the structured light, a series of images with respect to the different image-acquired location associated with the object are obtained using confocal principle. Following this, a plurality of focus indexes respectively corresponding to a plurality of inspected pixels of each image are obtained for forming a focus curve with respect to the measuring depth and obtaining a peak value associated with each depth response curve. Finally, a depth location with respect to the peak value for each depth response curve is obtained for reconstructing the surface profile of the object.

Abstract: An image generating apparatus includes: a correction unit configured to correct point information indicating correspondence between a plurality of pieces of point information indicating feature points of subjects in an image and a plurality of pieces of distance information of the respective pieces of point information so as to reduce the pieces of distance information belonging to a distance range that is longer than a distance indicated by a specific distance information included in the pieces of distance information; an image information generation unit configured to generate image information for expressing a three-dimensional image based on the point information corrected by the correction unit; and a display unit configured to display the three-dimensional image based on the image information generated by the image information generation unit.

Abstract: A microscope includes a condenser lens that is provided in an illumination light path and in which at least one optical device is insertable into and removable from an illumination light axis for switching an observation method. The microscope also includes a first polarizing plate that is provided in a same light axis as the optical device and is insertable into and removable from the illumination light axis integrally with the optical device, and a second polarizing plate that is provided in the illumination light axis independently from insertion and removal of the optical device into and from the illumination light axis.

Abstract: A three-dimensional (3D) microscope includes various insertable components that facilitate multiple imaging and measurement capabilities. These capabilities include Nomarski imaging, polarized light imaging, quantitative differential interference contrast (q-DIC) imaging, motorized polarized light imaging, phase-shifting interferometry (PSI), and vertical-scanning interferometry (VSI).

Abstract: A microscope includes a condenser lens that is provided in an illumination light path and in which at least one optical device is insertable into and removable from an illumination light axis for switching observation method. The microscope also includes a first polarizing plate that is provided in the same light axis as the optical device and is insertable into and removable from the illumination light axis integrally with the optical device; and a second polarizing plate that is provided in the illumination light axis independently from insertion and removal of the optical device into and from the illumination light axis.

Abstract: An imaging method and system are presented for use in sub-wavelength super resolution imaging of a subject. The imaging system comprises a spatial coding unit configured for collecting light coming from the scanned subject and being spaced from the subject a distance smaller than a wavelength range of said light; a light detection unit located upstream of the spatial coding unit with respect to light propagation from the object, and configured to define a pixel array and a spatial decoding unit, which is associated with said pixel array and is configured for applying spatial decoding to a magnified image of the scanned subject, thereby producing nanometric spatial resolution of the image.

Abstract: Apparatus and methods are provided which allow the rapid collection of image data in situations where ancillary equipment must be controlled and co-ordinated as part of an image formation process, such as confocal microscopy for example. The apparatus includes control means (20?) for co-ordinating the operation of the apparatus, and operable to receive a first trigger signal (33, 33?, 37) indicating the completion of an operation from one component and transmit a second trigger signal (27, 27?) to start an operation by another component in response to the first trigger signal. Such a configuration is operate to reduce delays encountered in operation of the apparatus.

Abstract: A laser microscope (10) having a laser light source (22) which generates laser light pulses (23) for the purpose of examining a sample (16). An optical element (25) is arranged in the beam path of the laser light pulses (23). The optical element (25) disperses the wavelength spectrum of the laser light pulses (23). Fractions (46, 48, 60, 62) of the broad-band laser light pulses (32) having different wavelengths travel different path lengths upon passing through a compensation device (30), such that the different fractions (46, 48, 60, 62) arrive at the sample (16) at the same time.

Abstract: The present invention relates to a high-resolution surface plasmon microscope including a heterodyne interferometer (6) for splitting an excitation light beam into at least one reference beam and at least one measurement beam directed toward a coupling medium (7) to generate a surface plasmon, said heterodyne interferometer consists essentially of guide optical fibers (12, 13, 14, 15) optically connected at a first of their ends to an optical coupler (16) and each also optically connected at their second end to a light source (1), an optical coupling medium (7), an element (17) for reflecting the reference beam, and means (28) for detecting an interferometer beam, respectively.

Abstract: There is provided a microscope device comprising: means for creating a collimated beam of light collected from a sample and comprising at least a first spectral range and a second spectral range, means for separating the collimated beam into a first beam containing a higher percentage of light of the first spectral range than light of the second spectral range and a second beam containing a lower percentage of light of the first spectral range than light of the second spectral range, means for reflecting the first beam, means for reflecting the second beam, means for combining the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample on the detector, wherein the means for reflecting the first beam and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, w