Abstract: A method for imaging of an object includes, for each of a plurality of surface-regions of the object, determining a corresponding image-sensor pixel group of a camera illuminated by light propagating from the surface-region via a lens of the camera. The method also includes, after the step of determining and for each surface-region: (i) changing a distance between the object and the lens such that the surface region intersects an in-focus object-plane of the camera and the lens forms an in-focus surface-region image on the corresponding image-sensor pixel group; (ii) capturing, with the corresponding image-sensor pixel group, the in-focus surface-region image of the surface-region; and (iii) combining the in-focus surface-region images, obtained by performing said capturing for each surface-region, to yield an all-in-focus image of the object.

Abstract: An optical measurement system comprises a polarization beam splitter for dividing an incident beam into a reference beam and a measurement beam, a first beam splitter for reflecting the measurement beam to form a first reflected measurement beam, a spatial light modulator for modulating the first reflected measurement beam to form a modulated measurement beam, a condenser lens for focusing the modulated measurement beam to an object to form a penetrating measurement beam, an objective lens for converting the penetrating measurement beam into a parallel measurement beam, a mirror for reflecting the parallel measurement beam to form an object beam, a second beam splitter for reflecting the reference beam to a path coincident with that of the object beam, and a camera for receiving an interference signal generated by the reference beam and the object beam to generate an image of the object.

Abstract: Surgical microscopes are provided including at least one ocular, an objective lens; a collimated space between the at least one ocular and the objective lens; an illumination system optically coupled into the collimated space of the surgical microscope, wherein an illumination from the illumination system is directed along a path at least partially contained within the collimated space of the surgical microscope and through the objective lens; and one of a field diaphragm and obscuration mask positioned within the illumination system, and outside of a field of view of the at least one ocular, wherein the one of the field diaphragm and the obscuration mask blocks, attenuates or diverts rays from the illumination system that reflect from a surface of the objective lens such that the reflected rays are not visible through the at least one ocular.

Abstract: A microscope apparatus includes a base, a support disposed upright on the base, and an objective lens unit supported by the support and including an objective lens holder that holds an objective lens. The objective lens unit includes a drive source that moves the objective lens holder up and down and a driver that transmits a drive force of the drive source to the objective lens holder.

Abstract: A projection lens for projecting an image onto a projection plane includes: a lens substrate; and an antireflective film disposed on a surface of the lens substrate. The antireflective film includes, in order starting from an air side of the antireflective film, a first layer, second layer, third layer, fourth layer, fifth layer, sixth layer, seventh layer, and eighth layer. The first layer is formed of MgF2. Each of the second layer, the fourth layer, the sixth layer, and the eighth layer has a refractive index of 2.0 to 2.3. Each of the third layer, the fifth layer, and the seventh layer is formed of SiO2.

Abstract: A phase object visualization apparatus includes: an illumination optical system 11 that illuminates a phase object; an image formation optical system 12 that forms an image from light from sample S that corresponds to the phase object; and light blocking unit 10 for blocking light, the light blocking unit 10 being disposed between the sample S and an image plane formed by the image formation optical system 12, and including an aperture at a position decentered from the optical axis of the image formation optical system 12. The position of the aperture is such that an area occupied on the aperture by 0-order diffraction light from the sample S illuminated by the illumination optical system 11 becomes smaller than the total area of the aperture.

Abstract: System and method for profiling of a surface with lateral scanning interferometer the optical axis of which is perpendicular to the surface. In-plane scanning of the surface is carried out with increments that correspond to integer number of pixels of an employed optical detector. Determination of height profile of a region-of-interest that is incomparably larger than a FOV of the interferometer objective is performed in time reduced by at least an order of magnitude as compared to time required for the same determination by a vertical scanning interferometer.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: The invention is a method for camera misalignment detection by means of processing images of a camera fixed to a vehicle and having a field of view containing a vehicle image area (11) imaging a portion of the vehicle and a remaining area (12), wherein in said processing step a plurality of reference locations (21) within an input image are used, said reference locations (21) being determined as edge locations along a boundary of the vehicle image area (11) in a reference image, and said processing step comprises checking at the reference locations (21) within the input image whether said reference locations (21) are edge locations by ascertaining at each reference location (21) whether a magnitude of an image gradient is above a gradient threshold limit, and alerting misalignment depending on an ascertained subset of the reference locations (21) where the gradient threshold limit is not reached.

Abstract: An optical assembly that is designed for positioning in a beam path of a light microscope having means for providing structured illuminating light in a sample plane of the light microscope, so that structured illuminating light can be generated in different orientations. The optical assembly has an adjustable deflector in order to deflect an incident light bundle onto one of several beam paths in a selectable manner. Beam splitting devices are located in the beam paths in order to split the light bundle of the respective beam paths into partial light bundles, which are spatially separated from each other. Beam guides are provided for each of the partial light bundles, and guide the partial light bundles to a pupil plane. The beam guides are arranged in such a way that the partial light bundles that belong to the same beam path form a light spot pattern in the pupil plane; and that the light spot patterns of different beam paths in the pupil plane are different from each other.

Abstract: An observation image capturing and evaluation device includes an imaging unit that captures an image of a cell and acquires an observation image, an evaluation unit that evaluates the observation image, and a maturity information acquisition unit that acquires information related to the maturity of the cell. The imaging unit changes a method for capturing the observation image on the basis of the information related to the maturity.

Abstract: Field diaphragms for use in surgical microscopes are provided. The field diaphragms are positioned along an optical axis of a microscope illumination system. The field diaphragms include a frame portion configured to be received by the surgical microscope; and a non-circularly symmetric mask portion integrated with the frame portion. The mask portion is aligned such that marginal rays from an edge of the field diaphragm along a meridian of minimum diameter that reflect from a surface of an objective lens of the microscope reflect outside of an acceptance angle for relay through any ocular channel of the microscope.

Abstract: A single-exposure ptychography system is presented. The system comprises an optical unit defining an light input plane, an imaging plane, and an object plane between the light input and output planes. The optical unit comprises at least a first focusing assembly, whose front focal plane defines a location of the light input plane; and a diffraction arrangement at a predetermined position with respect to the light input plane. The diffraction arrangement is configured to create from input plane wave light structured light in the form of an array of illuminating beams forming a predetermined illumination pattern in the object plane; thereby providing that each of the illuminating beams creates a different intensity pattern in a known region at the light output plane.

Abstract: A sample observation device includes an illumination optical system and an observation optical system, and the illumination optical system includes a light source, a condenser lens, and an aperture member, and the observation optical system includes an objective lens and an imaging lens, and the aperture member has a light-shielding part or a darkening part, and a transmission part, and the transmission part is located outside of an outer edge of the light-shielding part or the darkening part, and an image of an inner edge of the transmission part is formed inside of an outer edge of a pupil of the objective lens, and an image of an outer edge of the transmission part is formed outside of the outer edge of the pupil of the objective lens, and the following conditional expression is satisfied. 0.005?Ratio?0.9.

Abstract: An imaging device is presented for use in an imaging system capable of improving the image quality. The imaging device has one or more optical systems defining an effective aperture of the imaging device. The imaging device comprises a lens system having an algebraic representation matrix of a diagonalized form defining a first Condition Number, and a phase encoder utility adapted to effect a second Condition Number of an algebraic representation matrix of the imaging device, smaller than said first Condition Number of the lens system.

Abstract: A structured illumination microscope device includes acquisition unit that repeats a series of processing steps including controlling a combination of a wave vector and phase of fringes and acquiring N images; and computing unit in which processing for demodulating the image of the sample using a required M types of images from an image set of consecutive P images. The M types of images include: Q types (where Q?3) of modulated images; and one type of modulated image having the wave vector in common with and the phase differing from at least one among the Q types of modulated images, or one unmodulated image. An arrangement of the N images satisfies the uniformity condition, meaning “intensity distribution of the fringes is spatially uniform when accumulated between the N images” and the refresh condition, meaning “the M types of images are always included in the image set”.

Abstract: An image pickup apparatus includes an illumination optical system configured to illuminate a specimen, an imaging optical system configured to form an optical image of the specimen, a light modulator configured to generate at least one of a transmittance distribution and a phase distribution which are asymmetric with respect to an optical axis on a pupil plane of at least one of the illumination optical system and the imaging optical system, an image sensor configured to photoelectrically convert the optical image of the specimen formed by the imaging optical system, and a driver configured to change a relative position along an optical axis direction of the imaging optical system between a focal plane of the imaging optical system and at least one of the specimen and the image sensor. The driver changes the relative position in acquiring a plurality of images of the specimen.

Abstract: The present invention relates to an object information obtaining apparatus that obtains information about a phase image of an object using information about an interference pattern produced by a shearing interferometer, the interference pattern being formed by an electromagnetic wave or electron beam passed through or reflected by the object. The apparatus includes a first obtaining unit configured to obtain information about a differential phase image of the object using the information about the interference pattern, a second obtaining unit configured to obtain information about contrast in each region of the interference pattern, a third obtaining unit configured to weight the information about the differential phase image using the information about the contrast to obtain information about a weighted differential phase image, and a fourth obtaining unit configured to integrate the information about the weighted differential phase image to obtain the information about the phase image of the object.

Abstract: A multiple mode evaluation system that includes a multiple mode imager that is arranged to perform a single scan of a substrate while alternating between different optical modes thereby producing different sets of images of areas of the substrate, each set of images being associated with a single optical mode of image acquisition; wherein the different optical modes differ from each other by at least one optical characteristic.

Abstract: In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than t

Abstract: A microscope includes a light source; a condenser lens irradiating a sample with a light from the light source; an objective facing the condenser lens across the sample; a first polarization plate placed between the light source and the condenser lens; a condenser turret placed between the first polarization plate and the condenser lens and having a plurality of optical elements placed inside; a polarization plate placed on the image side with respect to the objective; and a compensator placed between the first polarization plate and the polarization plate. In the microscope, according to the observation method, an optical element to be placed in an optical path among the plurality of optical elements placed inside the condenser turret is switched by rotation of the condenser turret.

Abstract: A microscope includes an objective lens, an imaging lens projecting light passing through the objective lens to form an image of a specimen, an image sensor located at an imaging position where the image of the specimen is formed, an illumination light source, and a reflecting fluorescence illumination optical system including a dichroic mirror introducing light from the illumination light source into an optical to illuminate the specimen with the light. The microscope further includes a relay optical system forming an intermediate image of the specimen between the objective lens and the imaging lens to relay it to the imaging lens. The dichroic mirror of the reflecting fluorescence illumination optical system is located between the relay optical system and a pupil conjugate position that is conjugate with a pupil position of the objective lens, formed between the relay optical system and the imaging lens.

Abstract: An assembly for the generation of a differential interference contrast image (DIC) of an object in an imaging plane, comprising a radiation source; a Köhler illuminating optical assembly for illuminating the object with light from the radiation source; an objective for imaging the object plane in an imaging plane, wherein the objective is provided with an exit pupil and an entrance pupil, and wherein the entrance pupil of the objective is positioned in the illuminating pupil of the Köhler illuminating optical assembly; and a component for the generation of an interference is characterized in that the component for the generation of an interference is positioned in the exit pupil of the objective, and the component for the generation of an interference is formed by an amplitude filter with an amplitude transmission factor FDIC(x,y), which complies with the equation: 2 · F DIC ? ( x , y ) = F + ? ( x , y ) · ? + ? ? ? P 0 + F - ? ( x , y ) = 2 · T 0 · cos ? (

Abstract: The invention relates to image analysis of dark field images obtained at low magnification below 10:1. Image analysis of dark field images obtained at low magnification can be combined with analyzes of images obtained in respect of the same section of a sample and same magnification but with other techniques such as fluorescent microscopy. The system and method can be used e.g. for particle counting, particle size measurement, particle size distribution, morphology measurement, where the particles can be cells and/or cell parts. The invention also relates to a compact dark field light source unit, a system or apparatus including a microscope which by itself is compact and comprises the mentioned dark field light source unit.

Abstract: Accurate localization of isolated particles is important in single particle based super-resolution microscopy. It allows the imaging of biological samples with nanometer-scale resolution using a simple fluorescence microscopy setup. Nevertheless, conventional techniques for localizing single particles can take minutes to hours of computation time because they require up to a million localizations to form an image. In contrast, the present particle localization techniques use wavelet-based image decomposition and image segmentation to achieve nanometer-scale resolution in two dimensions within seconds to minutes. This two-dimensional localization can be augmented with localization in a third dimension based on a fit to the imaging system's point-spread function (PSF), which may be asymmetric along the optical axis. For an astigmatic imaging system, the PSF is an ellipse whose eccentricity and orientation varies along the optical axis.

Abstract: A microscope apparatus includes an electromagnetic wave source configured to generate an illuminating electromagnetic wave, a first beam splitter configured to split the illuminating electromagnetic wave into a first component along a first path and a second component along a second path, a movable reflector module configured to adjust a portion of the second path, and a second beam splitter configured to recombine the first component and the second component. An observing device is configured to receive the recombined first component and second component and the microscope apparatus is configured acquire a phase image from the observing device based on positioning of the movable reflector module and representative of an electric field distribution near an object located along the first path between the first beam splitter and the second beam splitter.

Abstract: A microscope and method for high resolution scanning microscopy of a sample, having: an illumination device for the purpose of illuminating the sample, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device for detecting the single image in the detection plane for various scan positions is also provided. An evaluation device for the purpose of evaluating a diffraction structure of the single image for the scan positions is provided. The detector device has a detector array which has pixels and which is larger than the single image.

Abstract: A microscope includes a first imaging optical system that images light beams from a cell tissue sample, a second imaging optical system having a light beam splitting element which splits a portion of the light beams from the cell tissue sample from the first imaging optical system, an imaging element which captures phase contrast images of a portion of the light beams, which have been split, from the cell tissue sample, and one or a plurality of optical elements which forms the phase contrast images on the imaging element, and a filter inserting unit that inserts an optical filter absorbing light of a predetermined wavelength into an optical path of the second imaging optical system, wherein the filter inserting unit inserts the optical filter absorbing light of a wavelength corresponding to a complementary color of a color of an observed target according to the color of the observed target.

Abstract: A method for imaging a microscopic object with improved resolution including the steps of measuring a complex wavefield scattered by the microscopic object with an instrument or microscope, the complex wavefield being represented by phase and amplitude or by real and imaginary parts; and computing an image of the microscopic object with a resolution better than given by the Abbe diffraction limit, including deconvolving the complex wavefield scattered by the microscopic object with a complex coherent transfer function (CTF) applied to the complex wavefield.

Abstract: Systems and methods described herein employ multiple phase-contrast images with various relative phase shifts between light diffracted by a sample and light not diffracted by the sample to produce a quantitative phase image. The produced quantitative phase image may have sufficient contrast for label-free auto-segmentation of cell bodies and nuclei.

Abstract: A microscope apparatus includes a condenser lens to make an illuminating electromagnetic wave relatively homogeneous, a first beam splitter splitting the illuminating electromagnetic wave after the condenser lens, a movable reflector module, a second beam splitter, an objective lens to project the illuminating electromagnetic wave propagating after an object to be observed toward an observing device. The object is loaded between the first beam splitter and the second beam splitter. The microscope apparatus is configured to split the illuminating electromagnetic wave into two paths at the first beam splitter. A first path goes through the first and the second beam splitters, and a second path goes through the movable reflector module to rejoin the first path at the second beam splitter. The microscope apparatus is configured acquire phase images with interferences of the electromagnetic wave from the two paths with at least two distance settings of the movable reflector module.

Abstract: A 4-Pi microscope for imaging a sample, comprising a first objective for focusing a first light beam on the sample at a spatial point one or more Digital Optical Phase Conjugation (DOPC) devices, wherein the DOPC devices include a sensor for detecting the first light beam that has been transmitted through the sample and inputted on the sensor; and a spatial light modulator (SLM) for outputting, in response to the first light beam detected by the sensor, a second light beam that is an optical phase conjugate of the first light beam; and a second objective positioned to transmit the first light beam to the sensor and focus the second light beam on the sample at the spatial point, so that the first light beam and the second light beam are counter-propagating and both focused to the spatial point.

Abstract: Certain examples provide optical contact micrometers and methods of use. An example optical contact micrometer includes a pair of opposable lenses to receive an object and immobilize the object in a position. The example optical contact micrometer includes a pair of opposable mirrors positioned with respect to the pair of lenses to facilitate viewing of the object through the lenses. The example optical contact micrometer includes a microscope to facilitate viewing of the object through the lenses via the mirrors; and an interferometer to obtain one or more measurements of the object.

Abstract: In one embodiment, an apparatus comprises an optical system with multiple detectors and a processor. The optical system is configured to produce images of an optical source in a first dimension and a second dimension substantially orthogonal to the first dimension at each detector at a given time. Each image from the images is based on an interference of an emission from the optical source in a first direction and an emission from the optical source in a second direction different from the first direction. The processor is configured to calculate a position in a third dimension based on the images. The third dimension is substantially orthogonal to the first dimension and the second dimension.

Abstract: Image resolution enhancement techniques are implemented using a single image an unstructured broadband illumination. By placing an axicon and a convex lens pair in an optical path of a microscope, telescope, or the object system, between the system and an image capture pickup device (e.g., a camera) the maximum resolution of the system may be increased through the formation of an interference pattern at the image capture device.

Abstract: An assembly for the generation of a differential interference contrast image (DIC) of an object in an imaging plane, comprising a radiation source; a Köhler illuminating optical assembly for illuminating the object with light from the radiation source; an objective for imaging the object plane in an imaging plane, wherein the objective is provided with an exit pupil and an entrance pupil, and wherein the entrance pupil of the objective is positioned in the illuminating pupil of the Köhler illuminating optical assembly; and a component for the generation of an interference is characterized in that the component for the generation of an interference is positioned in the exit pupil of the objective, and the component for the generation of an interference is formed by an amplitude filter with an amplitude transmission factor FDIC(x,y), which complies with the equation: 2 · F DIC ? ( x , y ) = F + ? ( x , y ) · ? + ? ? ? P 0 + F - ? ( x , y ) = 2 · T 0 · cos ? (

Abstract: Systems and methods described herein employ multiple phase-contrast images with various relative phase shifts between light diffracted by a sample and light not diffracted by the sample to produce a quantitative phase image. The produced quantitative phase image may have sufficient contrast for label-free auto-segmentation of cell bodies and nuclei.

Abstract: The present invention discloses a microscopy imaging structure with phase conjugated mirror and the method thereof. The afore-mentioned imaging structure produces a reverse focusing conjugated probe beam together with an original probe beam. These two probe beams meet at the focal point in the object body to be probed, and an interference pattern is produced. The interval between any two consecutive wave fronts in the interference pattern is then half of the wavelength of the original probe beam, and hence the vertical resolution of the image is improved. The present invention also applies a light modulator module on the probe beam to easily adjust the depth of the focal point of the probe beam and the phase conjugated reverse focusing probe beam in the object body. With the adoption of this invention, the size or position limitation of the target object is eliminated and the imaging resolution is also improved.

Abstract: A modulation contrast microscope that affords good view of sperm in ICSI, in particular, good view during sperm manipulation in ICSI, by improving contrast of the end portion of the tail includes the modulation contrast microscope comprises an aperture member having a partial aperture disposed at or near the front focal plane of a condenser lens, and a modulator disposed at a plane substantially conjugate with the aperture member, at or near the rear focal plane of a first objective lens or a conjugate plane thereof. The transmittance T(%) of a region of the modulator, corresponding to the partial aperture, satisfies the condition 1 £ T £ 8. Good viewing for ICSI sperm manipulation can be obtained as a result.

Abstract: In a microscope having a plurality of optical units each including a filter block between an objective and a tube lens, the optical unit closest to the objective among the plurality of optical units includes a first filter block provided with an optical filter having a first effective diameter. The optical unit closest to the tube lens among the plurality of optical units includes a second filter block provided with an optical filter having a second effective diameter larger than the first effective diameter.

Abstract: Disclosed is a transmission interference microscope that provides a degree of freedom to a region being observed while obtaining pure transmission information, and obtains highly-accurate interference images at high magnification under optimized radiation conditions. An electron beam emitted from an electron source 1 is split by a biprism 11 positioned under a converging lens 3, and enters objective lenses 4 as an electron beam 6 passing through a sample and an electron beam 7 passing through a vacuum. The electron beams are bent at the front magnetic fields of the objective lenses 4, and are emitted as a collimated beam in a state in which the sample location and vacuum are each appropriately are left a space.

Abstract: A microscope apparatus includes a condenser lens to make an illuminating electromagnetic wave relatively homogeneous, a first beam splitter splitting the illuminating electromagnetic wave after the condenser lens, a movable reflector module, a second beam splitter, an objective lens to project the illuminating electromagnetic wave propagating after an object to be observed toward an observing device. The object is loaded between the first beam splitter and the second beam splitter. The microscope apparatus is configured to split the illuminating electromagnetic wave into two paths at the first beam splitter. A first path goes through the first and the second beam splitters, and a second path goes through the movable reflector module to rejoin the first path at the second beam splitter. The microscope apparatus is configured acquire phase images with interferences of the electromagnetic wave from the two paths with at least two distance settings of the movable reflector module.

Abstract: A microscope device for inspecting structured objects, including: a camera; an optical imager capable of producing, on the camera, an image of the object according to a field of view, and including a distal lens arranged on the side of the object; and a low-coherence infrared interferometer including a measurement beam capable of producing measurements by means of interferences between retroreflections of the measurement beam and at least one separate optical reference. The device also includes coupler for injecting the measurement beam into the optical imaging means in such a way that the beam passes through the distal lens, and the low-coherence infrared interferometer is balanced in such a way that only the measurement beam retroreflections, taking place at optical distances close to the optical distance covered by the beam to the object, produce measurements.

Abstract: An optical configuration for a digital holographic microscope and a method for digital holographic microscopy are presented. In one embodiment, digital off-axis holograms are obtained using a cube beam splitter (110) to both split and combine a diverging spherical wavefront emerging from a microscope objective (108). When a plane numerical reference wavefront is used for the reconstruction of the recorded digital hologram, the phase curvature introduced by the microscope objective (108) together with the illuminating wave to the object wave can be physically compensated.

Abstract: In order to furnish an optical component and a phase contrast microscope which can indicate difference of phases of a specimen including information of frequency and color, at least two optical mediums are arranged side by side so that a constant difference of the phases is generated.

Abstract: A control system and apparatus for use with an ultra-fast laser is provided. In another aspect of the present invention, the apparatus includes a laser, pulse shaper, detection device and control system. A multiphoton intrapulse interference method is used to characterize the spectral phase of laser pulses and to compensate any distortions in an additional aspect of the present invention. In another aspect of the present invention, a system employs multiphoton intrapulse interference phase scan. Furthermore, another aspect of the present invention locates a pulse shaper and/or MIIPS unit between a laser oscillator and an output of a laser amplifier.

Abstract: The invention relates to a structured illumination system (8) for the three-dimensional microscopy of a sample (14), that comprises: beam generation means (9, 10) adapted for generating coherent light beams (IN, I?N, I0); a lens (12) having a rear focal plane (PFA), and arranged so that the sample (14) can be placed in the focalisation plane (PMP) of the lens; focalisation means (19) arranged for focusing the light beams in the rear focal plane (PFA) so that the beams interfere in a collimated manner in the focalisation plane (PMP) of the lens (12); characterised in that the beam generation means (9, 10) includes a light space modulator (10) programmed for diffracting a light signal (22) in order to generate at least two different diffracted beams ((IN, I0), (I?N, I0)) that are not symmetrical relative to the lens optical axis, wherein the light space modulator includes a calculator adapted for applying a constant phase term to each of said at least two coherent beams.

Abstract: A multi-mode optical fiber delivers light from a radiation source to a multi-focal confocal microscope with reasonable efficiency. A core diameter of the multi-mode fiber is selected such that an etendue of light emitted from the fiber is not substantially greater than a total etendue of light passing through a plurality of pinholes in a pinhole array of the multi-focal confocal microscope. The core diameter may be selected taking into account a specific optical geometry of the multi-focal confocal microscope, including pinhole diameter and focal lengths of relevant optical elements. For coherent radiation sources, phase randomization may be included. A multi-mode fiber enables the use of a variety of radiation sources and wavelengths in a multi-focal confocal microscope, since the coupling of the radiation source to the multi-mode fiber is less sensitive to mechanical and temperature influences than coupling the radiation source to a single mode fiber.

Abstract: Certain examples provide optical contact micrometers and methods of use. An example optical contact micrometer includes a pair of opposable lenses to receive an object and immobilize the object in a position. The example optical contact micrometer includes a pair of opposable mirrors positioned with respect to the pair of lenses to facilitate viewing of the object through the lenses. The example optical contact micrometer includes a microscope to facilitate viewing of the object through the lenses via the mirrors; and an interferometer to obtain one or more measurements of the object.

Abstract: Microscope with heightened resolution and linear scanning wherein the sample is illuminated with a first and a second illuminating light, whereby the first illuminating light excites the sample, and the second illuminating light is generated through the refraction of coherent light at a periodic structure and displays a periodic structure in a lateral beam direction and in axial beam direction.