Abstract: Systems, methods and apparatus to program a memory cell to have a threshold voltage to a level representative of one value among more than two predetermined values. A first voltage pulse is driven across the memory cell to cause a predetermined current to go through the memory cell. The first voltage pulse is sufficient to program the memory cell to a level representative of a first value. To program the memory cell to a level representative of a second value, a second voltage pulse, different from the first voltage pulse, is driven across the memory cell within a time period of residual poling in the memory cell caused by the first voltage pulse.

Abstract: A memory system includes a memory device including plural non-volatile memory blocks and a controller configured to determine whether a first memory block among the plural non-volatile memory blocks is re-usable after the first memory block is determined to be a bad block and copy second block information associated with a second memory block including a second program sequence number within a set range of a first program sequence number in the first memory block to first block information of the first memory block.

Abstract: Memory devices and methods for operating the same are described. The memory devices may include non-volatile memory having a plurality of memory cells, and a controller. The controller may be configured to begin a first programming operation configured to program a first one of the plurality of memory cells with more than one bit of information, terminate the first programming operation in response to detecting a power loss event, and program, with a second programming operation, second and third ones of the plurality of memory cells with the more than one bit of information.

Abstract: Embodiments for partitioning a non-volatile memory device is described. In one embodiment a memory system includes a first addressable range of memory blocks for storing different types of data. The memory system is partitioned to include a second addressable range of memory blocks capable of storing data indicating attributes of the first addressable range of memory blocks. The second addressable range of memory blocks may also be periodically updated such that the capacities of the first addressable range of memory blocks may be dynamically adjusted depending on application needs and changes to the non-volatile memory device over time. In some embodiments, one partition of a memory device may be configured for high reliability data storage while a second partition is configured for normal reliability storage.

Abstract: A two-port ternary content addressable memory (TCAM) and layout pattern thereof, and associated memory device are provided. The two-port TCAM may include a first storage unit, a second storage unit, a set of first search terminals, a set of second search terminals, a first comparison circuit, a second comparison circuit, a first match terminal and a second match terminal, wherein the first comparison circuit is respectively coupled to the first storage unit, the second storage unit, the set of first search terminals and the first match terminal, and the second comparison circuit is respectively coupled to the first storage unit, the second storage unit, the set of second search terminals and the second match terminal. First search data and second search data may be concurrently inputted into the two-port TCAM for determining whether the first search data and the second search data match content data within the two-port TCAM.

Abstract: According to one embodiment, a memory system includes a non-volatile semiconductor memory, a block management unit, and a transcription unit. The semiconductor memory includes a plurality of blocks to which data can be written in both the first mode and the second mode. The block management unit manages a block that stores therein no valid data as a free block. When the number of free blocks managed by the block management unit is smaller than or equal to a predetermined threshold value, the transcription unit selects one or more used blocks that stores therein valid data as transcription source blocks and transcribes valid data stored in the transcription source blocks to free blocks in the second mode.

Abstract: Techniques are provided for sensing a signal associated with a memory cell capable of storing three or more logic states. To sense a state of the memory cell, a charge may be transferred between a digit line and a node coupled with a plurality of sense components using a charge transfer device. Once the charge is transferred, one or more of the plurality of sense components may sense the charge with one of a variety of sensing schemes. Based on the charge being transferred using the charge transfer device and each sense component sensing the charge, a logic state associated with the memory cell may be determined. The number of sensed states may be correlated to the number of sense amplifiers. The ratio of the number of states read by the first sense component and the second sense component to the number of sense components may be greater than one.

Abstract: A system, computer program product, and computer-executable method for managing flash devices within a data storage environment utilized by an application of one or more applications, wherein the application accesses the managed flash devices through a pool of flash storage provided by the data storage, the system, computer program product, and computer-executable method comprising receiving a data I/O from the application, analyzing the data I/O directed toward the pool of flash storage in relation to the flash devices, and managing the flash devices based on data I/Os directed toward the pool of flash storage by the application.

Abstract: A method and system for controlling an MBC configured flash memory device to store data in an SBC storage mode, or a partial MBC storage mode. In a full MBC storage mode, pages of data are programmed sequentially from a first page to an Nth page for each physical row of memory cells. Up to N virtual page addresses per row of memory cells accompany each page to be programmed for designating the virtual position of the page in the row. For SBC or partial MBC data storage, a flash memory controller issues program command(s) to the MBC memory device using less than the maximum N virtual page addresses for each row. The MBC memory device sequentially executes programming operations up to the last received virtual page address for the row.

Abstract: Methods and systems for range matching. The system holds a definition of one or more ranges of Internet Protocol (IP) addresses. The definition may specify any desired number of ranges of any suitable size, and some ranges may overlap one another or be contained in one another. The definition may also specify certain returned values and/or relative priorities for the various ranges. In a pre-processing phase, a hash table that is subsequently queried with addresses to be range-matched. The hash table may be updated at run-time. During operation, the system receives addresses (e.g., extracts addresses from monitored communication traffic) and identifies by querying the hash table, for each address, whether the address falls within any of the ranges.

Abstract: A device with error correction is provided. The device includes a plurality of memory cells, and reference read write circuit, a plurality of sense amplifiers, and an error-correction code control block. The reference read write circuit is configured to generate a reference voltage in response to data stored in at least one of the plurality of memory cells. A plurality of sense amplifiers are each coupled to a respective memory cell of the plurality of memory cells. An error-correction code (ECC) control block may output an error signal when the ECC control block detects that it is unable to correct error data in one or more respective memory cells. The reference read write circuit may overwrite data in the at least one of the plurality of memory cells in response to the error signal.

Abstract: Some embodiments include apparatuses and methods for activating a signal associated with an access line coupled to different groups of memory cells during a memory operation of a device, and for sensing data lines of the device during different time intervals of the memory operation to determine the value of information stored in the memory cells. Each of the data lines can be coupled to a respective memory cell of each of the groups of memory cells. In at least one of such apparatuses and methods, the signal applied to the access line can remain activated during the memory operation.

Abstract: A semiconductor device includes an N number of sub-blocks each of including a memory cell array, a setting register specifying number of entry data for pre-searching, of first to N-th entry data divided and correspond respectively to the sub-blocks, and a search data changing unit changing a data arrangement order for search data input based on a value of the register. A sub-block for pre-searching searches for entry data matching with data for pre-searching in accordance with the arrangement order changed by the changing unit, in response to an instruction, and outputs a search result representing matching or non-matching. A sub-block for post-searching searches for entry data matching with data for post-searching other than the data for pre-searching, of entry data stored in association with each row of the array, based on a search result of the sub-block for pre-searching, and outputs a search result representing matching or non-matching.

Abstract: A semiconductor storage device includes a first memory cell electrically connected to a first bit line and a first word line, a second memory cell electrically connected to a second bit line and the first word line, and a first circuit configured to supply voltages to the first word line. During a reading operation to read a page of memory cells including the first memory cell and the second memory cell, the first circuit supplies a first voltage to the first word line while the first memory cell is selected as a read target during a first time period, and supplies a second voltage greater than the first voltage to the first word line while the second memory cell is selected as a read target during a second time period that is different from the first time period, and directly thereafter, supplies the first voltage to the first word line.

Abstract: Embodiments for partitioning a non-volatile memory device is described. In one embodiment a memory system includes a first addressable range of memory blocks for storing different types of data. The memory system is partitioned to include a second addressable range of memory blocks capable of storing data indicating attributes of the first addressable range of memory blocks. The second addressable range of memory blocks may also be periodically updated such that the capacities of the first addressable range of memory blocks may be dynamically adjusted depending on application needs and changes to the non-volatile memory device over time In some embodiments, one partition of a memory device may be configured for high reliability data storage while a second partition is configured for normal reliability storage.

Abstract: An integrated circuit that includes an array of random-access memory cells is provided. Each memory cell in the array may be a single-port or a multiport memory cell. Memory cells in the same column of the array are connected to shared bit lines, whereas memory cells in the same row of the array are connected to shared word lines. The memory cells in the same row may also be connected to a row control line. During normal operations, the row control line may provide a positive power supply voltage to each memory cell along that row. During write operations, the row control line may be driven to ground or tri-stated to help improve the write margin and the write performance of the selected memory cells. The aspect ratio of these memory cells may also be more square-like or balanced to help improve power delivery.

Abstract: A digital-to-analog converter (DAC) and memory device includes an array of memory cells including resistive memory elements programmable between a high resistive and low resistive state. In implementations the array of memory cells is segmented into unary and binary coded sub-arrays. The device includes a binarizer configured to couple to the memory array to assign binary weights, or segmented unary and binary weights, to currents through a plurality of memory cells or voltages across a plurality of memory cells. The memory device further includes a summer to sum the weighted outputs of the binarizer. A current to voltage converter coupled with the summer generates an analog output voltage corresponding with digital data stored in a plurality of memory cells.

Abstract: Data storage circuits are connected to the bit lines in a one-to-one correspondence. A write circuit writes the data on a first page into a plurality of 5 first memory cells selected simultaneously by a word line. Thereafter, the write circuit writes the data on a second page into the plurality of first memory cell. Then, the write circuit writes the data on the first and second pages into second memory cells adjoining 10 the first memory cells in the bit line direction.

Abstract: The consumption current of a TCAM device is reduced. A semiconductor device includes multiple sub-arrays each including a TCAM cell array. Each sub-array searches the corresponding part of the input search data. Each sub-array outputs the search result indicative of a match for every entry without searching, when the corresponding first control signal is activated.

Abstract: A ternary content addressable memory (TCAM) is disclosed. The TCAM includes a memory array, a data match module, and compare circuitry. The memory array stores a data entry for a data word and a corresponding duplicate data entry for the data word. The data match module compares the data entry to an input word to produce a first match output, and compares the duplicate data entry to the input word to produce a second match output. The compare circuitry compares the first match output and the second match output.

Abstract: A method of writing image data to a pixel array includes decoding an address and activating, based on the decoded address, two or more row selection signals. The address may be a ternary address having at least one trit. The method further includes providing the two or more row selection signals to the pixel array to select two or more rows of the pixel array, the activation of which writes the image data to pixels in the two or more rows of the pixel array.

Abstract: A technique for sensing a data state of a data cell. A comparator has a first input at a node A and a second input at a node B. A first n-channel transistor is connected to a first p-channel transistor at the node A. A second n-channel transistor is connected to a second p-channel transistor at the node B. A multiplexer is configured to selectively connect a first reference cell or the data cell to the first n-channel transistor and configured to selectively connect the data cell or a second reference cell to the second n-channel transistor. The comparator outputs the data state of the data cell based on input of a node A voltage at the node A and a node B voltage at the node B.

Abstract: A system and method of refreshing a nonvolatile memory having memory cells. The method includes identifying one or more of the memory cells that do not satisfy a data retention test; remapping the one or more identified memory cells from original memory addresses to spare memory addresses; and refreshing the identified memory cells.

Abstract: A logic design may include control and datapath circuitry. The datapath circuitry may be implemented in a double modular redundancy arrangement that generates respective first and second data signals. The control circuitry may be implemented in a triple modular redundancy arrangement. Storage circuitry may be used to buffer the first and second data signals. Real-time error detection circuitry may perform real-time error detection operations on the first and second data signals. Background error checking circuitry may perform background error checking operations such as cyclic redundancy check calculations on configuration data. In response to an error detected by the real-time error detection circuitry, the circuitry may select between the buffered first and second data signals to produce the output data signal. The selection may be performed based on the background error checking operations and may be delayed relative to the real-time detection of the error.

Abstract: A driver circuit with device variation compensation function and an operation method thereof are provided. The driver circuit includes a pull-up switch unit, an isolating switch and a pull-down switch unit. A first terminal of the pull-up switch unit is coupled to a first voltage. A second terminal of the pull-up switch unit is coupled to an output terminal of the driver circuit. A first terminal of the isolating switch is coupled to the second terminal of the pull-up switch unit. A first terminal of the pull-down switch unit is coupled to a second terminal of the isolating switch. A second terminal of the pull-down switch unit is coupled to a second voltage. The pull-down switch unit has a device variation compensation function.

Abstract: The specification and drawings present a new method, apparatus and software related product (e.g., a computer readable memory) for implementing power control for uplink orthogonal and non-orthogonal resources for an uplink channel, e.g. for PUCCH or PUCSH, when CoMP is utilized in a wireless network (e.g., LTE).

Abstract: A computer-aided design (CAD) tool may identify don't care bits in configuration data. The don't care bits in the configuration data may change polarity without affecting the functionality of the circuit design. The CAD tool may compute an error check code (e.g., parity bits for a two-dimensional parity check) and insert the error check code into the configuration data. As an example, the CAD tool may replace don't care bits in the configuration data with the error code. The configuration data may be stored in configuration memory cells on a programmable integrated circuit, thereby implementing the circuit design with the error code on the programmable integrated circuit. During execution, the programmable integrated circuit may execute error checking and detect and correct errors in the configuration data based on the embedded error code.

Abstract: A nonvolatile memory system includes a nonvolatile memory device including a plurality of memory cells, and a memory controller. The memory controller is configured to count a clock to generate a current time, program dummy data at predetermined memory cells among the plurality of memory cells at a power-off state, detect a charge loss of the predetermined memory cells when a power-on state occurs after the power-off state, and restore the current time based on the detected charge loss.

Abstract: A resonant inter-band tunnel diode (RITD) can be fabricated using semiconductor processing similar to that used for Complementary Metal-Oxide-Semiconductor (CMOS) device fabrication, such as can include using silicon. A memory cell (e.g., a random access memory (RAM) cell) can be fabricated to include one or more negative differential resistance device, such as tunneling diodes, such as to provide a single-bit or multi-bit cell. In an example, a “hybrid” memory cell can be fabricated, such as including one or more negative resistance devices, a MOS transistor structure, and a capacitor structure, such as including an integrated capacitor configuration similar to a generally-available dynamic RAM (DRAM) structure, but such as without requiring a refresh and offering a higher area efficiency.

Abstract: A technique for sensing a data state of a data cell. A comparator has a first input at a node A and a second input at a node B. A first n-channel transistor is connected to a first p-channel transistor at the node A. A second n-channel transistor is connected to a second p-channel transistor at the node B. A multiplexer is configured to selectively connect a first reference cell or the data cell to the first n-channel transistor and configured to selectively connect the data cell or a second reference cell to the second re-channel transistor. The comparator outputs the data state of the data cell based on input of a node A voltage at the node A and a node B voltage at the node B.

Abstract: A bitline circuit for embedded Multi-Time-Read-Only-Memory including a plurality of NMOS memory cells coupled to a plurality of wordlines in each row, bitlines in each column, and a source-line. More specifically, the bitline circuit controls a charge trap behavior of the target NMOS memory array by mode-dependent bitline pull-down circuit, thereby discharging the bitline strongly to GND to trap the charge effectively in a Programming mode, and discharge the bitline weakly to GND to develop a bitline voltage to detect the charge trap state. The mode dependent circuit is realized by using at least two NMOS to switch the device strength, using a pulsed gate control in a Read mode, or using analog voltage to limit the bitline current. The proposed method further includes a protection device, allowing all bitline control circuit using thin oxide devices.

Abstract: Systems and methods are described for transmitting data over physical channels to provide a high speed, low latency interface such as between a memory controller and memory devices with significantly reduced or eliminated Simultaneous Switching Output noise. Controller-side and memory-side embodiments of such channel interfaces are disclosed which do not require additional pin count or data transfer cycles, have low power utilization, and introduce minimal additional latency. In some embodiments of the invention, three or more voltage levels are used for signaling.

Abstract: A technique for sensing a data state of a data cell. A comparator has a first input at a node A and a second input at a node B. A first n-channel transistor is connected to a first p-channel transistor at the node A. A second n-channel transistor is connected to a second p-channel transistor at the node B. A multiplexer is configured to selectively connect a first reference cell or the data cell to the first n-channel transistor and configured to selectively connect the data cell or a second reference cell to the second n-channel transistor. The comparator outputs the data state of the data cell based on input of a node A voltage at the node A and a node B voltage at the node B.

Abstract: A method and system are disclosed for improved block erase cycle life prediction and block management in a non-volatile memory. The method includes the storage device tracking information relating to a first erase cycle count at which the block erase time exceeded a predetermined threshold relative to a first erase cycle at which this occurred in other blocks. Blocks having a later relative erase cycle at which the erase time threshold is exceeded are assumed to have a greater erase cycle life than those that need to exceed the erase time threshold at an earlier erase cycle. This information is used to adjust wear leveling in the form of free block selection, garbage collection block selection and other block management processes. Alternatively or in combination, the predicted erase cycle life information is used to adjust program and/or erase parameters such as erase voltage and time.

Abstract: A sense amplifier circuit includes first and second lines and first and second inverters. Each inverter includes an input terminal, an output terminal, and a power source terminal. A second signal line potential is supplied to the first inverter input terminal. The second inverter input terminal is connected to the first inverter input terminal. A first signal line potential is supplied to the second inverter input terminal. A first switch transistor is connected to the first inverter power source terminal and has a gate connected to the second signal line. A switch second transistor is connected to the second inverter power source terminal and has a gate connected to the first signal line.

Abstract: Disclosed is a system and method for reading flash memory cells with dynamically adjusted probability values (e.g., log-likelihood ratios). In connection with reading bit values from flash memory cells, one or more predetermined first probability values are adjusted relative to one or more predetermined second probability values. The one or more predetermined first probability values are associated with reading one or more memory cells programmed to a first binary value, and the one or more predetermined second probability values are associated with reading one or more memory cells programmed to a second binary value. The plurality of bit values read from the plurality of non-volatile memory cells and the one or more adjusted first probability values are provided to a decoder for use in decoding the plurality of bit values.

Abstract: In one embodiment, rule-based virtual address translation is performed for accessing data (e.g., reading and/or writing data) typically stored in different manners and/or locations among one or more memories, such as, but not limited to, in packet switching devices. A virtual address is matched against a set of predetermined rules to identify one or more storing description parameters. These storing description parameters determine in which particular memory unit(s) and/or how the data is stored. Thus, different portions of a data structure (e.g., table) can be stored in different memories and/or using different storage techniques. The virtual address is converted to a lookup address based on the identified storing description parameter(s). One or more read or write operations in one or more particular memory units is performed based on the lookup address said converted from the virtual address.

Abstract: The 4T2R cell comprises a write transistor, a first variable resistive element, a first transistor, a second variable resistive element, a second transistor, and a charge control transistor. The first transistor is electrically coupled to the first variable resistive element in series, and the second transistor is electrically coupled to the second variable resistive element in series, for providing search paths. For operating in a search phase, a pulse voltage is applied across the gate electrode and the source electrode of the first transistor (or across the gate electrode and the source electrode of the second transistor) for determining whether the gate voltage of the charge control transistor changes larger than a match threshold during the period of the pulse. Different RC-delay of the variable resistive elements controlling the voltage change speed of the gate voltage of the charge control transistor determines the matching result.

Abstract: A method for converting a measured physical level of a cell into a logical value, in an array of memory cells storing physical levels which diminish over time, the method may include: determining extent of deterioration of the physical levels and determining thresholds accordingly for at least an individual cell in the array; and reading the individual cell including reading a physical level in said cell and converting said physical level into a logical value using at least some of said thresholds, wherein said determining extent of deterioration comprises storing predefined physical levels rather than data-determined physical levels in each of a plurality of cells and determining extent of deterioration by computing deterioration of said predefined physical levels.

Abstract: A method for operating a memory includes storing data in a plurality of analog memory cells that are fabricated on a first semiconductor die by writing input storage values to a group of the analog memory cells. After storing the data, multiple output storage values are read from each of the analog memory cells in the group using respective, different threshold sets of read thresholds, thus providing multiple output sets of the output storage values corresponding respectively to the threshold sets. The multiple output sets of the output storage values are preprocessed by circuitry that is fabricated on the first semiconductor die, to produce preprocessed data. The preprocessed data is provided to a memory controller, which is fabricated on a second semiconductor die that is different from the first semiconductor die. so as to enable the memory controller to reconstruct the data responsively to the preprocessed data.

Abstract: A method (and structure) of quantum computing. Two independent magnitudes of a three-state physical (quantum) system are set to simultaneously store two real, independent numbers as a qubit. The three-state physical (quantum) system has a first energy level, a second energy level, and a third energy level capable of being degenerate with respect to one another, thereby forming basis states for the qubit.

Abstract: A method and system for extending the life span of a flash memory device. The flash memory device is dynamically configurable to store data in the single bit per cell (SBC) storage mode or the multiple bit per cell (MBC) mode. In the MBC storage mode, the cell can have one of multiple possible states, where each state is defined by respective threshold voltage ranges. In the SBC mode, the cell can have states with threshold voltages corresponding to states of the MBC storage mode which are non-adjacent to each other to improve reliability characteristics of the cell.

Abstract: A method and system for extending the life span of a flash memory device. The flash memory device is dynamically configurable to store data in the single bit per cell (SBC) storage mode or the multiple bit per cell (MBC) mode. In the MBC storage mode, the cell can have one of multiple possible states, where each state is defined by respective threshold voltage ranges. In the SBC mode, the cell can have states with threshold voltages corresponding to states of the MBC storage mode which are non-adjacent to each other to improve reliability characteristics of the cell.

Abstract: A method and system for extending the life span of a flash memory device. The flash memory device is dynamically configurable to store data in the single bit per cell (SBC) storage mode or the multiple bit per cell (MBC) mode, such that both SBC data and MBC data co-exist within the same memory array. One or more tag bits stored in each page of the memory is used to indicate the type of storage mode used for storing the data in the corresponding subdivision, where a subdivision can be a bank, block or page. A controller monitors the number of program-erase cycles corresponding to each page for selectively changing the storage mode in order to maximize lifespan of any subdivision of the multi-mode flash memory device.

Abstract: A memory bit cell suitable for use in semiconductor integrated circuits that utilizes pushed design rules and layout geometries optimized by a semiconductor foundry for standard memory bit cells and edge-cell structures that provides a different functionality from that provided by the foundry standard bit cell. This different functionality is achieved by interconnecting the elements of one or a plurality of standard foundry bit cells and edge cells to implement a different circuit with different operation from the original bit cells and edge cells. The positioning and interconnection of the standard bit cells and edge cells are implemented in a manner so as to maintain the same periodic geometric proximity effects to the maximum degree possible. A preferred embodiment of this invention is to interconnect two standard foundry six-transistor SRAM bit cells and two edge cells to create a Ternary Content Addressable Memory bit cell with mask and compare functionality in addition to bit storage functionality.

Abstract: An embodiment of the invention relates to a memory comprising a strained double-heterostructure having an inner semiconductor layer which is sandwiched between two outer semiconductor layers, wherein the lattice constant of the inner semiconductor layer differs from the lattice constants of the outer semiconductor layers, the resulting lattice strain in the double-heterostructure inducing the formation of at least one quantum dot inside the inner semiconductor layer, said at least one quantum dot being capable of storing charge carriers therein, and wherein, due to the lattice strain, the at least one quantum dot has an emission barrier of 1.15 eV or higher, and provides an energy state density of at least three energy states per 1000 nm3, all said at least three energy states being located in an energy band of 50 meV or less.

Abstract: Provided are a luminescent device and a method of manufacturing the same. The luminescent device includes a charge trapping layer having bistable conductance and negative differential resistance (NDR) characteristics, and an organic luminescent layer electrically connected to the charge trapping layer. The charge trapping layer comprise a nanocrystal layer intervened in an organic layer, and the nanocrystal layer comprises a plurality of nanocrystals.

Abstract: A content addressable memory (CAM) device includes an array of memory cells arranged in rows and columns; compare circuitry configured to indicate match results of search data presented to each row of the array; and compare circuitry configured to indicate match results of search data presented to each column of the array, thereby resulting in a two-dimensional search capability of the array.

Abstract: A content addressable memory device with a plurality of memory cells storing ternary data values of high, low, and don't care. An aspect of the content addressable memory device is the use of first memory elements and second memory elements in the memory cells. The first and second memory elements are electrically coupled in parallel circuit to a match-line. The first memory elements are coupled to first word-lines and the second memory elements are coupled to second word-lines. The first memory elements are configured to store low resistance states if the ternary data value is low and high resistance states if the ternary data value is either high or don't care. The second memory elements are configured to store the low resistance states if the ternary data value is high and the high resistance states if the ternary data value is either low or don't care.

Abstract: A method and system for extending the life span of a flash memory device. The flash memory device is dynamically configurable to store data in the single bit per cell (SBC) storage mode or the multiple bit per cell (MBC) mode, such that both SBC data and MBC data co-exist within the same memory array. One or more tag bits stored in each page of the memory is used to indicate the type of storage mode used for storing the data in the corresponding subdivision, where a subdivision can be a bank, block or page. A controller monitors the number of program-erase cycles corresponding to each page for selectively changing the storage mode in order to maximize lifespan of any subdivision of the multi-mode flash memory device.