Abstract: Methods and devices are disclosed, such methods comprising applying a verify pass-through voltage to unselected select lines of the floating-gate memory array that is greater than a read pass-through voltage applied to the unselected select lines. Other methods involve utilizing a cell current for reading a value from one or more memory cells in program-verify operations that is lower than a cell current for reading value from one or more memory cells in read operations.

Abstract: A test circuit includes an output control section for generating a plurality of output buffer control signals in response to a plurality of data masking signals when a test mode signal is activated in read operation; and a data output buffer for masking some of data input and output pins in response to the plurality of output buffer control signals.

Abstract: A cell array selection circuit, a cell array bit line precharge circuit, and a sense amplifier bit line precharge circuit are provided in a semiconductor storage apparatus. In a standby state of read/write operation, the cell array selection circuit is controlled to an inactive state, and the bit line precharge circuits are controlled to an active state. In an active state of read/write operation, the cell array selection circuit to be selected is controlled to an active state, and the cell array bit line precharge circuit and the sense amplifier bit line precharge circuit are controlled to an inactive state. Cell array selection transistors, sense amplifier bit line precharge transistors, and control signals supplied to gate electrodes of the transistors are set in which change in potential provided on a cell array bit line pair when the states of the transistors change is cancelled.

Abstract: In a multi-port memory device, a plurality of ports simultaneously access a plurality of banks through global data buses. A data conflict detector compares valid data signals input from the plurality of ports through the global data buses to the plurality of banks, and detects data conflict caused when the valid data signals are simultaneously input to the same bank.

Abstract: A method for dual I/O data read in an integrated circuit which includes a serial peripheral interface memory device. In an embodiment, the memory device includes a clock signal, a plurality of pins, and a configuration register. In an embodiment, the configuration register includes a wait cycle count. The method includes transmitting a read address to the memory device using a first input/output pin and a second input/output pin concurrently. In an embodiment, the read address includes at least a first address bit and a second address bit, the first address bit being transmitted using the first input/output pin, and the second address bit being transmitted using the second input/output pin. The method includes accessing the memory device for data associated with the address and waiting a predetermined number clock cycles associated with the wait cycle count. The method includes transferring the data from the memory device using the first input/output pin and the second input/output pin concurrently.

Abstract: In a semiconductor memory device provided with a redundancy circuit for conducting a repair of defective memory cells, the memory cell defects which are unevenly distributed can be efficiently repaired. The semiconductor memory device has a plurality of memory blocks, and the memory block includes a plurality of segments. A redundancy memory block which substitutes for defective data of a segment is physically provided to each of the plurality of memory blocks. A block address of the redundancy memory block is logically allocated to the plurality of memory blocks in common.

Abstract: Methods and apparatus provide for receiving a request from an initiating device to initiate a data transfer into a local memory for execution of one or more programs therein, the local memory being operatively coupled to a first of a plurality of parallel processors capable of operative communication with a shared memory; facilitating the data transfer into the local memory; and producing a synchronization signal indicating that the data transfer into the local memory has been completed.

Abstract: In an integrated circuit device, a data line driver block which drives data lines of a display panel based on data supplied from a RAM block from which data is read N times (N is an integer larger than one) in one horizontal scan period 1H of the display panel includes first to N-th divided data line driver blocks disposed along a first direction in which bitlines extend. When data supplied from the RAM block is M bits (M is an integer larger than 1) and grayscale of a pixel corresponding to the data line is G bits, each of the first to N-th divided data line driver blocks includes (M/G) (multiple of three) data line driver cells which drive (M/G) data lines. (M/3G) R data line driver cells are provided in a first subdivided driver, (M/3G) G data line driver cells are provided in a second subdivided driver, and (M/3G) B data line driver cells are provided in a third subdivided driver.

Abstract: A memory cell including an access transistor coupled to a first storage node and a read port coupled to one of the first storage node or a second storage node is provided. The memory cell further includes a first inverter having an input terminal coupled to the first storage node, an output terminal, and a first power supply voltage terminal for receiving a first power supply voltage. The memory cell further includes a second inverter having an input terminal coupled to the output terminal of the first inverter, an output terminal coupled to the input terminal of the first inverter at the first storage node, and a second power supply voltage terminal for receiving a second power supply voltage, wherein the second power supply voltage is varied relative to the first power supply voltage during a write operation to the memory cell.

Abstract: Provided are a memory device where data may be recorded one time and/or reproduced repeatedly, and a method and display apparatus for operating the memory device. The memory device may include a program area having a plurality of memory cells and a spare area having a plurality of memory cells. The memory device may include a memory cell layer having the program area and the spare area. The memory cell layer may include a plurality of vertically stacked memory cell layers. Each of the plurality of memory cell layers may include the program area and the spare area. The program area and the spare area may be either vertical or horizontal to one another.

Abstract: A memory cell includes transistors and two read ports. Each read port is configured to be connected to a read line. The memory cell is configured such that in a read operation of the memory cell an information stored in the memory cell is readable by a differential reading including an evaluation of an electric current between the two read ports.

Abstract: A non-volatile storage element includes a first data terminal and a second data terminal, a first MOS transistor and a second MOS transistor, the first MOS transistor and the second MOS transistor having a first conductivity type, a third MOS transistor and a four MOS transistor, the third MOS transistor and the fourth MOS transistor having floating gates and having a second conductivity type, and a fifth MOS transistor and a sixth MOS transistor having the second conductivity type.

Abstract: There are many inventions described herein as well as many aspects and embodiments of those inventions, for example, circuitry and techniques for reading, writing and/or operating semiconductor memory cells of a memory cell array, including, for example, electrically floating body transistors in which an electrical charge is stored in the body of the transistor. In one aspect, the present inventions are directed to one or more independently controllable parameters of a memory operation (e.g., restore, write, refresh), to program or write a data state into a memory cell. In one embodiment, the parameter is the amount of time of programming or writing a predetermined data state into a memory cell. In another embodiment, the controllable parameter is the amplitude of the voltage of the control signals applied to the gate, drain region and/or source region during programming or writing a predetermined data state into a memory cell. Indeed, the controllable parameters may be both temporal and voltage amplitude.

Abstract: A design structure for a static random access memory (SRAM) circuit includes first SRAM cell and a second SRAM cell that are configured to operate in a shared mode and/or an independent mode. In one example, a shared mode includes the sharing of a memory node of a first SRAM cell. In another example, an independent mode includes isolating a first SRAM cell from a second SRAM cell such that they operate independently.

Abstract: The invention is directed to largely improve reliability by surely protecting data on the basis of an emergency stop request even during a data transfer process. The invention provides a data memory system taking the form of a memory card or the like. When an emergency stop signal requesting an emergency stop is received from an information processor of a host during a read/write data transfer process, a control circuit immediately stops the transfer process and notifies the information processor of end of the read data transfer. At this time, the end of read data transfer is notified irrespective of whether the transfer is finished normally or abnormally. Even when a read data transfer request is received again from the information processor after notifying the information processor of the end of read data transfer, without transferring data, a controller notifies the information processor of an untransferable state of read data.

Abstract: A semiconductor memory device includes: a global input/output line; a first global core line; a second global core line; a global core line controller disposed between the first global core line and the second global core line; a first bank coupled to the global core line controller through the first global core line; and a second bank coupled to the global core line controller through the second global core line.

Abstract: A nonvolatile semiconductor device includes a plurality of word lines, a plurality of bit lines, a plurality of memory cell arrays having a plurality of electrically reprogrammable memory cells which are connected to said word lines and said bit lines, a data program control section which programs a plurality of first multi-bits data each having a first number of bits, or a plurality of second multi-bits data each having a second number of bits twice that of said first multi-bits data, to said plurality of memory cell arrays, a page buffer circuit which stores said plurality of first multi-bits data or said plurality of second multi-bits data which is read for each of said word lines from said plurality of memory cell arrays, a data transfer section which transfers said plurality of first multi-bits data or said plurality of second multi-bits data which is read for each of said second number of bits from said page buffer circuit synchronized with a second clock signal having a cycle which is twice that of a f

Abstract: A memory hub control block may be configured to decode a command packet received from a host and determine whether the command packet has designated the memory hub. If the command packet does not designate the memory hub control block, the memory hub control block may transmit a temperature information request signal to at least one of a plurality of semiconductor memory devices coupled to the memory hub, and receive temperature information from one of the plurality of semiconductor memory devices.

Abstract: A random access memory (RAM) device for use in a high-speed pipelined Reed-Solomon decoder, a method of accessing the memory device, and a Reed-Solomon decoder having the memory device are provided. The memory device, which data is written to and read from at the same time during decoding of one frame of data, includes a random access memory (RAM) having a plurality of banks; and a control circuit for setting a first bank pointer, which selects a first bank among the plurality of banks, and a second bank pointer which selects a second bank among the plurality of banks, wherein the first and second bank pointers are set to banks with a predetermined offset every frame of data.

Abstract: A memory devices provide signals indicating when refresh operations are complete. The signals from a number of memory devices can be combined, such as by Oring, to provide a refresh complete signal to a power management controller. Dynamic factors can affect the refresh operation and the memory may be refreshed without restoring the entire system to a high power state. The time required to perform a refresh operation can be determined dynamically, allowing the system to be returned to a low power state as soon as refresh is complete. Ambient temperatures can be monitored to dynamically determine when to perform a refresh operation.

Abstract: A semiconductor memory device includes plural ports for transmitting an input data serial-interfaced with an external device into a global data bus, plural banks for parallel-interfacing with the plural ports through the global data bus, plural input signal transmission blocks, responsive to a mode register enable signal, for transmitting an input signal parallel-interfaced with the external device into the global data bus, and a mode register set for determining one of a data access mode and a test mode based on the input signal inputted through the global data bus.

Abstract: A memory system is provided. The memory system includes a volatile memory having a number of banks, each bank having a number of rows, and a memory controller configured to direct the volatile memory to engage in an auto-refresh mode, the memory controller further configured to provide a target bank address to the volatile memory. The volatile memory is configured to perform an auto-refresh operation in the auto-refresh mode, the auto-refresh operation being performed on a target bank identified by the target bank address. Remaining banks in the plurality of banks other than the target bank are available for memory access while the auto-refresh operation is being performed on the target bank.

Abstract: A semiconductor memory device includes: static memory cells arranged in a matrix; a read bit line for transmitting data read from one of the memory cells; a write bit line for transmitting data to be written to one of the memory cells; an input data line for transmitting data which is received from outside and is to be written in one of the memory cells; and a selector for selectively transmitting data of the read line or the input data line to the write bit line.

Abstract: A semiconductor memory device and a self-refresh method in which the semiconductor memory device includes a plurality of input/output ports having respective independent operation, a period of self-refresh through one of the plurality of input/output ports being subordinate to a kind of operation through another input/output port. Whereby, a refresh characteristic in a multi-port semiconductor memory device including a dual-port semiconductor memory device may be improved.

Abstract: A memory device includes an array portion of resistive memory cells comprising a plurality of bit line pairs. The device further includes a read circuit operably associated with a first charged line, wherein the read circuit comprises a precharge circuit configured to charge a first line at a first rate, and to charge a second line at a second rate, the first and second charge rates based on a state of a memory cell coupled between the respective lines. The read circuit may further include a ground circuit configured to pull the respective lines to a ground potential, and a sense circuit coupled to the line pair configured to sense a differential voltage between the line pair in response to the state of the memory cell.

Abstract: In a multi-bank memory system such as a synchronous dynamic random access memory (SDRAM), a method of writing data to the banks is provided. This method allows for writing to any number of banks. More particularly, this method allows for writing to a selected number of banks between one and all banks. In addition, the method retains the discrete nature of the selected banks by allowing any row in each bank to be accessed regardless of the rows activated in other banks. As a result, rows of different memory banks that are intended to store similar data may be accessed simultaneously for purposes of writing the data in test and non-test modes. This allows for quicker writing to the SDRAM without the errors that may be created by other fast writing modes, such as data compression.

Abstract: Circuits and methods are described for decoding exemplary memory arrays of programmable and, in some embodiments, re-writable passive element memory cells, which are particularly useful for extremely dense three-dimensional memory arrays having more than one memory plane. In addition, circuits and methods are described for selecting one or more array blocks of such a memory array, for selecting one or more word lines and bit lines within selected array blocks, for conveying data information to and from selected memory cells within selected array blocks, and for conveying unselected bias conditions to unselected array blocks.

Abstract: Provided is a nonvolatile semiconductor memory device which can enhance a stable control of a voltage applied to a memory cell and has excellent capability of controlling a drain voltage. The nonvolatile semiconductor memory device includes: a plurality of memory cells; a write buffer receiving data to be written to the plurality of memory cells; a count circuit searching data input to the write buffer and determining bit number of data to be simultaneously programmed to the plurality of memory cells; a write circuit supplying a write voltage to the plurality of memory cells according to the data; and a voltage regulator supplying a control voltage (Vpb) to the write circuit, wherein the voltage regulator includes a controller Counting write bit number and supplying the control voltage (Vpb) according to the counted write bit number.

Abstract: In various embodiments, a plurality of non-volatile memory devices, such as NAND flash memory device, may be connected to a host controller device in a fanned out configuration that allows each of the plurality of memory devices to perform read and/or write operations simultaneously. Each non-volatile memory device may include high speed input circuitry and high speed output circuitry so that transfers to and from memory are not limited by the speed of the flash memory read/write interface.

Abstract: The present invention is a method of writing information to a synchronous memory device by examining a present word of N bits to be written, where each bit has a high or low value. The present word is compared to a previous word also having N bits to identify the number of bit transitions from a low value to a high value of vice versa. The present bit is inverted when the number of transitions is greater than N/2. To avoid the need for having an extra bit accompany data bytes to indicate the presence or absence of inversion, the present invention takes advantage of a data mask pin that is normally unused during writing operations to carry the inversion bit. Non-inverted data is written directly into the memory device while inverted data is first inverted again before writing to storage locations, so that true data is stored in the memory device.

Abstract: A double-rate memory has an array of single word line memory cells arranged in rows and columns. The single word line memory cells provide and store data via a first port. Addressing and control circuitry is coupled to the array of single word line memory cells. The addressing and control circuitry receives an address enable signal to initiate an access of the array whereby an address is received, decoded, and corresponding data retrieved or stored. Edge detection circuitry receives a memory clock and provides the address enable signal upon each rising edge and each falling edge of the memory clock to perform two memory operations in a single cycle of the memory clock. A memory operation includes addressing the memory and storing data in the memory or retrieving and latching data from the memory. In another form a double-rate dual port memory permits two independent read/write memory accesses in a single memory cycle.

Abstract: A memory includes an access control portion performing an internal access operation on the basis of an external access operation, a refresh control portion performing a refresh operation, a refresh division control portion dividing the refresh operation into a read operation and a rewrite operation and an address determination portion determining whether or not an address to be subjected to the refresh operation and an address to be subjected to the external access operation during the refresh operation coincide with each other.

Abstract: A method for controlling a semiconductor storage device including memory cells each configured to hold data of 2 bits or more, the method includes starting first signal processing, and inputting lower bits into the semiconductor storage device in a ready state, writing the lower bits to the memory cells, changing the semiconductor storage device from the ready state into a busy state, changing the semiconductor storage device from the busy state into the ready state, and finishing the first signal processing, starting second signal processing, and inputting upper bits into the semiconductor storage device in the ready state, and writing the upper bits to the memory cells. A period for the writing the upper bits is longer than a period for the writing the lower bits. A period for performing the second signal processing is longer than a period for performing the first signal processing.

Abstract: Embodiments of the present invention include a data output circuit that can read data in parallel from a plurality of latches in a pipeline circuit. Even-numbered data and odd-numbered data are simultaneously output over a single clock cycle, and are then converted into DDR data and are then serially output. By moving data in this manner, embodiments of the invention can reduce the number of necessary control signals by as much as 50% over conventional data output circuits.

Abstract: The invention provides methods and apparatus. A NAND flash memory device receives command and address signals at a first frequency and a data signal at a second frequency that is greater than the first frequency.

Abstract: Circuits and methods are described for decoding exemplary memory arrays of programmable and, in some embodiments, re-writable passive element memory cells, which are particularly useful for extremely dense three-dimensional memory arrays having more thane one memory plane. In addition, circuits and methods are described for selecting one or more array blocks of such a memory array, for selecting one or more word lines and bit lines within selected array blocks, for conveying data information to and from selected memory cells within selected array blocks, and for conveying unselected bias conditions to unselected array blocks.

Abstract: A data processing system comprising a memory array having a plurality of memory cells (240-246) and read circuitry (310,320) for reading a logic value stored in one of the plurality of memory cells. The read circuitry (310,320) is operable perform two substantially simultaneous reads of the stored logic value. A voltage controller is provided and is operable to selectively vary a level of a supply voltage to the memory array. Detection circuitry is provided (330) for detecting, in dependence upon the two substantially simultaneous reads, when the supply voltage level causes the read result to be unreliable.

Abstract: A non-volatile memory device using a variable resistive element is provided. The non-volatile memory device includes a memory cell array having a plurality of non-volatile memory cells, a first voltage generator generating a first voltage, a voltage pad receiving an external voltage that has a level higher than the first voltage, a sense amplifier supplied with the first voltage and reading data from the non-volatile memory cells selected from the memory cell array, and a write driver supplied with the external voltage and writing data to the non-volatile memory cells selected from the memory cell array.

Abstract: A semiconductor memory device arranged for minimizing the duration of time required for conducting a batch verify action and thus speeding up a buffer write action is provided. The device which conducts a write action to memory cells in an address area, a batch verify action for collectively conducting verify action for a plurality of addresses, and repeats the batch verify action and the write action, comprises a detecting means for detecting whether or not each address contains an unwritten memory cell, and conducts a verify action at least at a part of the batch verify action excluding at least a part of addresses judged not to contain unwritten memory cells by the verify action at one or more cycles before.

Abstract: Methods for setting a read voltage in a memory system which comprises a flash memory device and a memory controller for controlling the flash memory device, comprise sequentially varying a distribution read voltage to read page data from the flash memory device; constituting a distribution table having a data bit number and a distribution read voltage, the data bit number indicating an erase state among the page data respectively read from the flash memory device and the distribution read voltage corresponding to the read page data; detecting distribution read voltages corresponding to data bit numbers each indicating maximum points of possible cell states of a memory cell, based on the distribution table; and defining new read voltages based on the detected distribution read voltages.

Abstract: Flash memory devices and methods of programming the same are provided. The flash memory devices include a plurality of memory cells storing multi-bit data representing at least one of first through fourth states and including most significant bits and least significant bits. The method includes programming the plural memory cells into a provisional state according to the least significant bit, and programming the plurality of memory cells into the second through fourth states from the first and provisional states according to the most significant bit. Programming the plurality of memory cells into the second through fourth states includes simultaneously programming the plurality of memory cells at least partially into at least two states during one programming operation period.

Abstract: A method for controlling a threshold value in a nonvolatile semiconductor memory device, includes: performing writing at least once on at least one of the memory cells to be adjusted to a state other than an erased state with an applied voltage that does not cause excess writing, with verify reading being not performed; and performing verify reading by applying a verify voltage corresponding to a target threshold value of the memory cell after the writing is performed on the at least one of the memory cells to be adjusted to the state other than the erased state, and, when the threshold value of the memory cell is determined to be lower than the target threshold value, repeating the writing with the applied voltage that does not cause excess writing and the verify reading until the threshold value of the memory cell becomes equal to or higher than the target threshold value.

Abstract: Disclosed is testing multi-port array macros where latches and logic are used to control the relationship between the write and read port of the array. This makes allowance for many different configurations of reading and writing the array. This also allows for greater test coverage than the previous method, which simply inverted one of the write address bits to form the read address.

Abstract: A non-volatile memory system is formed of floating gate memory cells arranged in blocks as the smallest unit of memory cells that are erasable together. The system includes a number of features that may be implemented individually or in various cooperative combinations. One feature is the storage in separate blocks of the characteristics of a large number of blocks of cells in which user data is stored. These characteristics for user data blocks being accessed may, during operation of the memory system by its controller, be stored in a random access memory for ease of access and updating. According to another feature, multiple sectors of user data are stored at one time by alternately streaming chunks of data from the sectors to multiple memory blocks. Bytes of data in the stream may be shifted to avoid defective locations in the memory such as bad columns. Error correction codes may also be generated from the streaming data with a single generation circuit for the multiple sectors of data.

Abstract: The SRAM cells of a semiconductor storage device each comprise first and second inverter circuits loop-connected with each other to form a hold circuit; two access transistors; and a hold control transistor connected in series with a drive transistor of the second inverter circuit. While the memory cell is not accessed, the hold control transistor causes the first and second inverter circuits to form the loop connected hold circuit for statically holding data. When the memory cell is accessed, the hold control transistor causes the first and second inverter circuits to be disconnected from the loop connection for dynamically holding data, thereby preventing data corruption that would otherwise possible occur due to a read operation. Moreover, a sense amplifier circuit that uses a single bit line to read data from a memory cell is disposed in a space appearing in the memory cell array, thereby effectively using the area.

Abstract: A semiconductor memory device can reduce a data writing time. The semiconductor memory device includes a bit line sense amplifier connected to a pair of bit lines. A pair of first local lines id connected to the pair of bit lines by a first switching unit. A pair of second local lines is connected to the pair of first local lines by a second switching unit. A writing driver drives the second local lines using a normal-driving voltage in response to a data signal through a global line. The writing driver drives the second local lines using an over-driving voltage having a higher level than that of the normal-driving voltage during a predetermined period.

Abstract: A SRAM cell write performance evaluation circuit includes a SRAM core where each wordline is connected to only one bit column. A ring oscillator circuit is used to generate wordline pulses. A state machine controls operations for the SRAM cell write performance evaluation circuit including the ring oscillator circuit and the SRAM core. A control signal is applied to the state machine to select a first write operation, where the circuit simultaneously writes all the cells to a known state with wide wordlines to ensure all cells are written. Then a second write operation is selected, and all the wordlines are launched simultaneously to write the cells to the opposite state. From these write operations, a required wordline pulse width to write the cell is identified.

Abstract: An internal signal generator for use in a semiconductor memory device includes an internal read address generation unit and an internal write address generation unit. The internal read address generation unit generates a plurality of read delay addresses by delaying an external address for a predetermined latency shorter than an additive latency set by the semiconductor memory device and selects one of the read delay addresses to thereby output an internal read address. The internal write address generation unit generates a plurality of write delay addresses by delaying the internal read address for a preset latency shorter than a column address strobe (CAS) latency set by the semiconductor memory device and selects one of the write delay addresses to thereby output an internal write address.

Abstract: A semiconductor memory includes a memory cell as a resistance change element and a switching element which are connected in series and a read word line connected to a control terminal of the switching element. In addition, the semiconductor memory includes a circuit which executes an auto-close operation for causing which makes a read word line RWL to be subjected to non-activation automatically after a fixed period from start of a read operation.

Abstract: The present invention is related to a composite flash memory device comprises a plural sector flash memory array which is divided to plural sector that is a minimum erasing unit of the flash memory device, a flash memory array storing control commands which control a total system of the composite flash memory device and/or the only composite flash memory device in and sharing I/O line of the plural sector flash memory array, the read operation of the flash memory array is enable when the plural sector flash memory array is gained access.