Abstract: A nonvolatile memory device is programmed by selectively scanning input data bits to detect data bits to be programmed, and programming the detected data bits. The detected data bits may be programmed in predetermined units. The input data bits may be selectively scanned by combining input data bits in groups, thereby generating combinational information, and generating address information in response to the combinational information.

Abstract: Circuits and methods are provided for controlling multi-page erase operations in flash memory. The page address of each address of a multi-page erase operation is latched in wordline decoders. A page select reset generator circuit processes the block addresses of each address of the multi-page erase operation. In the event the addresses relate to pages in different blocks, then previously latched page addresses are reset. This avoids the incorrect circuit operation that will result should a multi-page erase operation include multiple pages in different blocks.

Abstract: A high performance logic circuit optimizes a digital logic function by dividing the function into smaller blocks. Thus, the logic circuit is divided into smaller blocks. The smaller blocks are implemented with read-only memory (ROM), in which outputs corresponding to input combination are pre-stored. Inputs to each of the smaller blocks are used as an address to access the ROM.

Abstract: A DRAM chip with a data I/O-interface of an access width equal to a page size.

Abstract: Circuits and methods are provided for controlling multi-page erase operations in flash memory. The page address of each address of a multi-page erase operation is latched in wordline decoders. A page select reset generator circuit processes the block addresses of each address of the multi-page erase operation. In the event the addresses relate to pages in different blocks, then previously latched page addresses are reset. This avoids the incorrect circuit operation that will result should a multi-page erase operation include multiple pages in different blocks.

Abstract: A nonvolatile memory system includes a host system, a memory controller, and a flash memory chip including multi-level flash memory cells. The memory controller includes a backup memory adapted to store a backup copy of previously programmed data from the multi-level flash memory cells when the multi-level flash memory cells are further programmed. Where an error or malfunction occurs during the further programming of the multi-level flash memory cells, the backup copy of the previously programmed data is used to program different multi-level flash memory cells.

Abstract: A non-volatile memory device has the pages of a certain memory block reallocated to other blocks in order to increase decrease disturb and increase reliability. Each of the reallocation blocks that contain the reallocated pages from the desired memory block are coupled to a wordline driver. These wordline drivers have a subset of the global wordlines as inputs. The desired wordline driver is selected by an appropriate select signal from a block decoder and an indication on an appropriate global wordline. This causes the wordline driver to generate a local wordline to the desired block with the reallocated page to be accessed.

Abstract: An apparatus and method are provided for accessing a serial memory without knowing the required number of address bits. The apparatus comprises a pull circuit, a data out control circuit and a transition detector. The pull circuit causes the input terminal to be set to a first predetermined logic state in response to a read command being provided to the serial memory. The data out control circuit has an output terminal for providing the read command and a first predetermined number of address bits to the output terminal. The transition detector is coupled to an input terminal for detecting if the input terminal transitions from the first predetermined logic state to a second predetermined logic state in response to the first predetermined number of address bits. The transition detector will detect a transition of the input terminal when a correct number of address bits have been provided.

Abstract: A data transmission control device includes: a memory control unit that is connected to a DRAM, and accesses to the DRAM in accordance with a read/write request from various devices that request read/write of data from/into the DRAM; and a command control unit that issues an active command of designating a row address of the DRAM to start a memory access cycle when the read/write request is made, and issues a precharge command to the DRAM to end the memory access cycle, and that prohibits issuance of a precharge command in a previous memory cycle if the issuance of the precharge command is unnecessary.

Abstract: The present invention discloses methods for storing data in a flash-memory storage device, the method including the steps of: receiving, by the device, primary data to be stored in the device and to be read from the device at a primary reading speed; storing at least part of the primary data only in fast pages in the device, wherein the fast pages are located in multi-level cells of the device; designating, by the device, secondary data to be read from the device at a secondary reading speed, wherein the secondary reading speed is slower than the primary reading speed; and storing at least part of the secondary data only in slow pages in the device, wherein the slow pages are located in the multi-level cells. Preferably, the method further includes the step of: moving the secondary data from a previously-stored area in the device to the slow pages.

Abstract: The present invention is a telecommunication device with an auto-configurable capability that supports both serial and parallel data interfaces. The telecommunication device can transfer configuration data through a serial interface such as I2C interface and a parallel interface such as UPI. The telecommunication device can auto-configure through the I2C interface in master mode. The selectable configuration data stored in a second memory device is fetched by the telecommunication device through the I2C interface.

Abstract: A flash memory device comprises an array of memory cells capable of storing different numbers of bits per cell. A page buffer circuit for the flash memory device comprises a plurality of page buffers, each operating during programming, erasing, and reading operations of the memory cells. A control logic unit controls functions of the page buffers in accordance with the number of bits stored in corresponding memory cells.

Abstract: A synchronous semiconductor memory device can perform an internal operation for an input address with reliability regardless of the frequency of a system clock. The semiconductor memory device includes an internal operation detecting unit for generating a flag signal in response to internal command signals; a delay unit for delaying the flag signal for a programmed time; and an enable signal generating unit for generating an enable signal activated in response to a transition timing of the flag signal and inactivated in response to a transition timing of the delayed flag signal, wherein an internal address derived from an external address is transferred to a core area while the enable signal is activated.

Abstract: A nonvolatile memory device and programming method and apparatus therefore are described that include operatively coupled first and second sense amplifiers having first and second data registers or latches, a storage circuit for storing a data of the second amplifier, a pass/fail check circuit for checking the content of the second data register whether a cell of the memory device has been sufficiently programmed and a restore circuit for resetting the second data register for reprogramming the device until sufficiently programmed.

Abstract: A method is provided for transferring data in a memory that includes memory cells forming memory pages, and a page buffer that includes a register, with signal lines selectively transferring data stored in the register to the memory cells of a selected one of the memory pages and an output interface of the memory. Data read from or to be written to the memory cells of the selected one of the memory pages is at least temporarily stored in the register, and outputs of the register are buffered so as to decouple the outputs of the register from the signal lines. The signal lines include bitlines that are each coupled to some of the memory cells and data lines that are coupled to the output interface of the memory. The buffering comprises selectively driving the bitlines or the data lines according to a data word that is stored in the register.

Abstract: A pseudo SRAM which can perform read and write operations of data in a continuous burst mode in such a manner that it continuously generates burst row and column address signals, which gradually rise, based on external address signals that have already been received until new external address signals are received.

Abstract: A sequential access memory (“SAM”) device, system and method is provided that includes a memory array configured to store a group of bytes on each of a plurality of rows. A plurality of bit-lines transfer each of the group of bytes into and out of the memory array, and a pre-charging unit is configured to pre-charge the plurality of bit-lines once per each transfer of one of the group of bytes into or out of one of the plurality of rows. The device operates by accessing a memory array in a SAM device by activating a selected row in the memory array, pre-charging a plurality of bit-lines that provide access to the memory array, and accessing the memory array before the plurality of bit-lines are pre-charged a second time.

Abstract: In a non-volatile memory, a selected page on a word line is successively programmed by a series of voltage pulses of a staircase waveform with verifications in between the pulses until the page is verified to a designated pattern. The programming voltage at the time the page is programmed verified will be to estimate the initial value of a starting programming voltage for the page. The estimation is further refined by using the estimate from a first pass in a second pass. Also, when the test is over multiple blocks, sampling of word lines based on similar geometrical locations of the blocks can yield a starting programming voltage optimized for faster programming pages.

Abstract: A memory control circuit that controls m (=L/k) memories (first to mth memories), each of which has a k-bit width, the m memories storing data having a data width (D bits) of an integral multiple of k bits up to L bits, the circuit comprising: an address input circuit that determines a memory (nth memory) storing a first k bits of the data among the m memories, based on a start-position specification address which is a predetermined j bits of an A-bit address indicating a storage destination of the data, and inputs to the nth to mth memories a first specification address for specifying a storage destination of the data, the first specification address being an A-j bits of the A-bit address, which is the A-bit address without the predetermined j bits thereof, and inputs to the first to (n?1)th memories a second specification address obtained by adding one to the first specification address; a data input circuit that inputs a plurality of pieces of divided data obtained by dividing the data into k-bit data to t

Abstract: A method and apparatus for testing correct operation of a page decoder in a memory is provided. In one implementation, the method includes erasing the memory to reset all memory cells associated with each of the N pages in the memory, and iteratively generating a unique bit sequence of M bits and programming the unique bit sequence into a plurality of the N pages at a given time until each of the N pages contains a unique bit sequence relative to other pages in the memory. Responsive to each of the N pages having a unique bit sequence, the method further includes using the page decoder to read out each unique bit sequence associated with the N pages to verify correct operation of the page decoder.

Abstract: A method and apparatus for parallelizing address-mapping and page referencing in a memory controller. The page referencing may apply an input address to two separate content addressable memory components along with masks from a configuration register identifying rank-bank bits, page status bits and non-column bits. The content addressable memories each determine if matching content is present generating a ‘hit’ or ‘miss.’ The hit and miss indicators are applied to combinational logic to determine whether to generate a CAS, RAS-CAS or PRE-RAS-CAS indicator.

Abstract: There is provided a flash memory device capable of manipulating multi-bit and single-bit data. The flash memory device can include a memory cell array with a plurality of memory blocks. The flash memory device can also include a judgment circuit for storing multi-bit/single-bit information indicating whether each of the memory blocks is a multi-bit memory block or not, determining whether or not a memory block of an inputted block address is a multi-bit memory block according to the stored multi-bit/single-bit information and outputting an appropriate flag signal. A read/write circuit for selectively performing multi-bit and single-bit read/program operations of the memory block corresponding to the block address is also included, as well as control logic for controlling the read/write circuit such that the read/write circuit can perform multi-bit or single-bit read/program operations based on the flag signal.

Abstract: A semiconductor memory having a plurality of memory cells coupled to bit lines includes a bit line selecting circuit, a latch circuit, and a switching circuit. The bit line selecting circuit is disposed in a cell area where the memory cells are formed. The bit line selecting circuit is configured to select one of the bit lines in response to a first control signal. The latch circuit is disposed in a surrounding circuit area. The latch circuit is configured to perform a program operation or a read operation on the memory cells corresponding to the bit line selected by the bit line selecting circuit. The switching circuit is disposed in the surrounding circuit area, and is coupled between the bit line selecting circuit and the latch circuit. The switching circuit is configured to switch between the bit line selecting circuit and the latch circuit in response to a second control signal.

Abstract: An apparatus and method are provided for using a page buffer of a memory device as a temporary cache for data. A memory controller writes data to the page buffer and later reads out the data without programming the data into the memory cells of the memory device. This allows the memory controller to use the page buffer as temporary cache so that the data does not have to occupy space within the memory controller's local data storage elements. Therefore, the memory controller can use the space in its own storage elements for other operations.

Abstract: A method of operating a non-volatile memory can include backing-up first data successfully programmed to a first target page of a non-volatile memory to provide local back-up data. A determination can be made that programming of second data to the first target page has failed and the local back-up data can be programmed to a second target page in a second block of the non-volatile memory.

Abstract: A semiconductor integrated circuit device includes even-numbered bit lines, odd-numbered bit lines, cell source lines, first memory elements electrically connected between the even-numbered bit lines and the cell source lines, and second memory elements electrically connected between the odd-numbered bit lines and the cell source lines and belonging to the same rows as the first memory elements. A potential corresponding to data to be programmed is applied to the first memory element via the even-numbered bit line and a potential which suppresses programming is applied to the second memory element via the cell source line while the odd-numbered bit lines are kept in an electrically floating state when data is programmed into the first memory element.

Abstract: A non-volatile memory device has the pages of a certain memory block reallocated to other blocks in order to increase decrease disturb and increase reliability. Each of the reallocation blocks that contain the reallocated pages from the desired memory block are coupled to a wordline driver. These wordline drivers have a subset of the global wordlines as inputs. The desired wordline driver is selected by an appropriate select signal from a block decoder and an indication on an appropriate global wordline. This causes the wordline driver to generate a local wordline to the desired block with the reallocated page to be accessed.

Abstract: A write burst stop command function is provided for a semiconductor memory device, and in particular for a memory device having a write latency, such as is common in a low power double data rate (DDR) dynamic random access memory (DRAM) device. In the memory device, when a write stop command is received, pulses that are generated for a column address strobe signal are terminated so that no further data already in the memory device is transferred into a memory array. When the write stop command is received at the beginning of a write operation prior to generation of the pulses in the column address strobe signal, a first-in first-out (FIFO) circuit is reset. The FIFO circuit is used to introduce a predetermined write latency to the write operation. The column address strobe signal is supplied to a column decoder associated with the memory array and to a data path circuit that transfers data to the memory array based on pulses in the column address strobe signal.

Abstract: Source line bias is an error introduced by a non-zero resistance in the ground loop of the read/write circuits. During sensing the source of a memory cell is erroneously biased by a voltage drop across the resistance and results in errors in the applied control gate and drain voltages. This error is minimized when the applied control gate and drain voltages have their reference point located as close as possible to the sources of the memory cells. In one preferred embodiment, the reference point is located at a node where the source control signal is applied. When a memory array is organized in pages of memory cells that are sensed in parallel, with the sources in each page coupled to a page source line, the reference point is selected to be at the page source line of a selected page via a multiplexor.

Abstract: A semiconductor integrated circuit device is disclosed. The device includes a memory cell array, an I/O buffer, a read/write buffer, an error checking and correcting circuit, and an initialization checking circuit. N-bit data is input to the I/O buffer and the I/O buffer outputs N-bit data. The I/O buffer inputs N-bit data to the read/write buffer, and the read/write buffer outputs N-bit data to the I/O buffer. The memory cell array inputs up to M×N-bit data to the read/write buffer, and the read/write buffer outputs up to M×N-bit data to the memory cell array. The read/write buffer writes a variable number of bits to the memory cell array (N is a natural number equal to or larger than 1, and M is a natural number equal to or larger than 2).

Abstract: A memory system having a serial data interface and a serial data path core for receiving data from and for providing data to at least one memory bank as a serial bitstream. The memory bank is divided into two halves, where each half is divided into upper and lower sectors. Each sector provides data in parallel to a shared two-dimensional page buffer with an integrated self column decoding circuit. A serial to parallel data converter within the memory bank couples the parallel data from either half to the serial data path core. The shared two-dimensional page buffer with the integrated self column decoding circuit minimizes circuit and chip area overhead for each bank, and the serial data path core reduces chip area typically used for routing wide data buses. Therefore a multiple memory bank system is implemented without a significant corresponding chip area increase when compared to a single memory bank system having the same density.

Abstract: A search engine system (100) is disclosed that can include at least one content addressable memory (CAM) device (102) arranged in a cascade configuration with at least one memory device (104), such as a static random access memory (SRAM). A CAM device (102) and memory device (104) may be connected to one another by point-to-point unidirectional connections. Command data issued by a device, such as a network processing unit (NPU) (110), can flow through all devices beginning with a CAM device (102) and eventually to a memory device (104). A memory device (104) can compare its own current result data with that of a previous device in a flow (such as another RAM device), and generate an output response.

Abstract: A semiconductor memory device includes a memory cell array to store data; a data input portion to output data to the memory cell array in response to a write control signal; a data output portion to output data from the memory cell array in response to a read control signal; a data I/O gate to transmit data outputted from the data input portion to the memory cell array in response to the write control signal, and transmitting data outputted from the memory cell array to the data output portion in response to the read control signal; and a data I/O controller to generate the read control signal and the write control signal having a smaller minimum cycle time than a minimum cycle time of the read control signal. The semiconductor memory device has an improved operation performance compared to one having a low operation frequency within an operable frequency range.

Abstract: A method for implementing a counter in memory, e.g., non-volatile memory such as flash memory. A first number of first binary values indicating a first portion of a current number of the counter in a binary field may be stored in a portion of memory. Storing the first number may also include increasing the number of first binary values in the binary field. Additionally, a second number indicating a second portion of the current number of the counter may be stored in another portion of memory. The second number may specify the number of times the first binary values has comprised the entirety of the binary field. Thus, the first number and second number may specify the current number of the counter. Storing the first and second number may be performed a plurality of times to implement a counting function of the counter.

Abstract: Methods of programming a non-volatile memory device having at least one memory block with a plurality of memory cells located at intersections of rows and columns is disclosed. Pursuant to these methods, at least two addresses that select corresponding rows of the memory block may be received and temporarily stored. Then, the rows selected by the temporarily stored addresses may be simultaneously activated, and at least some of the memory cells in the activated rows are simultaneously programmed. Corresponding non-volatile memory devices are also provided.

Abstract: A storage device including a ferroelectric memory cell array including a plurality of memory cells; sense amplifiers connected to the bit lines and selected by a column address; an internal counter able to generate the column address; and a control part controlling data access, wherein the control part accesses data by a first processing of reading out a plurality of words of data from memory cells of a word line and a plate line selected according to a row address and storing it in the sense amplifiers, a second processing of selecting sense amplifiers from the column address and inputting/outputting data with the outside, and a third processing of writing back the data of the sense amplifiers into the memory cells, with data being continuously input or output and transferred by repeatedly executing the second processing using the column address generated in the internal counter for a group of words read out to the sense amplifiers at the first processing, and a file storage device and a computer system util

Abstract: A page buffer is provided for an electrically programmable memory that includes multiple memory cells forming multiple memory pages. The page buffer includes a register for at least temporarily storing data read from or to be written to the memory cells of a selected memory page. The register includes multiple latches and multiple buffer elements. Each of the latches is coupled to at least one signal line for transferring the data bit that is stored in the latch. Each of the buffer elements decouples an output of a corresponding one of the latches from the signal line, with the buffer element driving the signal line according to the data bit stored in the corresponding latch. Also provided is a method of transferring data from a register to signal lines in an electrically programmable memory.

Abstract: A phase change memory device for use in a burst read operation and a data reading method are provided. The memory device includes a plurality of bit lines and a plurality of word lines. A memory cell array block has a plurality of phase change memory cells that are connected to cross points of the plurality of bit lines and the plurality of word lines. A sense amplifier block is connected to corresponding bit lines, and latches data of memory cells connected to the same word line simultaneously during a burst read operation, and then provides the latched data in response to a column address.

Abstract: For one or more disclosed embodiments, a plurality of rows of memory cells in a memory bank are activated, and a column of memory cells in the memory bank is selected to select memory cells common to activated rows and the selected column. At least one of the selected memory cells common to activated rows and the selected column is selectively accessed. The selecting and the selectively accessing are repeated to access memory cells common to activated rows and a plurality of selected columns.

Abstract: An data recording device according to an aspect of the present invention includes a memory cell array in a memory chip, a refresh circuit which executes a refreshing of the memory cell array, a refresh control circuit which executes refreshing at a time interval which is shorter than a data hold time and manages a data hold time, and an internal power source which supplies a power source electric potential to the refresh circuit and the refresh control circuit in a state in which the data recording device is removed from an external device.

Abstract: Provided are a nonvolatile memory and an apparatus and method for deciding data validity for the same, in which validity of data stored in the nonvolatile memory can be decided. The nonvolatile memory includes a memory cell storing data bits in a plurality of pages included in a predetermined block through a plurality of states realized by at least two bits. The block includes a first page in which data bits for determining validity of data bits written by a user are stored, and a second page in which the data bits written by the user are stored.

Abstract: A bitline selection network is composed of a plurality of bitlines and a plurality of global bitlines. The bitlines are grouped into bytes with eight bitlines per byte. The bitlines provide access to memory cells for read and write operations. A bitline is connected to a global bitline through a bitline select transistor. Each of the bitline select transistors is activated one at a time by a bitline select controller. Activation of each bitline select transistor provides a connection to a source line, which in turn connects to a sense amplifier and a write data loading logic block. The sense amplifier and the write data loading logic block are used in read and write operations respectively.

Abstract: A verify operation is performed on the one time programmable memory block to determine if it has been programmed. If any bits have been programmed, further programming or erasing is inhibited. In another embodiment, the memory block can be programmed and erased until a predetermined page or lock bit in the block is programmed. Once that page/bit is programmed, the one time programmable memory block is locked against further programming or erasing.

Abstract: A single flash memory device has selectable read modes for either a segment mode or a page mode. The desired mode is selected by writing a control word to a mode control register. Selecting the segment mode causes the device to output selected memory segments. Selecting the page mode causes the device to output selected memory pages.

Abstract: With the objective of providing a semiconductor memory device which is made identical in usability to a static RAM by use of dynamic memory cells and realizes a high-speed memory cycle time, there is provided a pseudo static RAM having a time multiplex mode which, when instructions for a memory operation for reading memory information from each of memory cells each requiring a refresh operation for periodically holding the memory information, or writing the same therein is issued, carries out an addressing-based autonomous refresh operation different from the memory operation before or after the memory operation. The pseudo static RAM includes address signal transition detectors for a row and a column, and a page mode which independently performs a column address selecting operation according to an address signal transition detect signal of the second address signal transition detector.

Abstract: In a packet addressing method, one or more memory blocks are selected from a plurality of memory blocks and one or more data I/O pads are selected from a plurality of data I/O pads via which data input or output to/from the selected memory blocks are loaded, memory cell data output from the selected memory blocks are sequentially output to the selected data I/O pads, and data input to the selected data I/O pads are sequentially input to the selected memory blocks, so that read and write operations are independently accomplished in each of data I/O pads. The data I/O width can be adjusted according to the word length which is selectively set up, and power consumption can be reduced due to partial activation of the memory block.

Abstract: The content of a few pages of the dynamic random access memory is backed up, then one tries to refresh them less quickly, for example two times less quickly, and one observes whether this does or does not cause errors. The operation is repeated on the entire memory. Depending on the number of errors that have appeared on the pages refreshed less often, the refresh period is decreased or increased. Thus, the memory self-adjusts its refresh period to what is necessary for it.

Abstract: Shifts in the apparent charge stored on a floating gate (or other charge storing element) of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge stored in adjacent floating gates (or other adjacent charge storing elements). The problem occurs most pronouncedly between sets of adjacent memory cells that have been programmed at different times. To compensate for this coupling, the read process for a given memory cell will take into account the programmed state of an adjacent memory cell.

Abstract: A semiconductor memory device has common terminals shared between a part or all of address terminals for receiving n bits of an address signal and data terminals for outputting a data signal with its bit width of n bits or less and dedicated address terminals for receiving m bits of the address signal, wherein at the time of a read, after the n bits of the address signal have been input, a plurality of data signals within a selected page are consecutively read out through the common terminals using the m bits of the address signal input from the dedicated address terminals.

Abstract: A sense amplifier and a latch for sense data output the former 4 words of sense data to a latch for page data, and during a page mode reading period of the former 4 words of data as external data by the latch for page data, a selector circuit and an output buffer, perform a sense amplifying operation and a latch operation on the latter 4 words of memory cell information output from a Y gate under control of a sense signal and a latch signal.