Abstract: This disclosure is directed to apparatuses, systems, and methods that can quickly and reliably determine a stationary or non-stationary change in temperature. During a simulated test of, for example, the heater system of an automated and/or high-speed composite material placement machine may be evaluated at any single location along a course whether a lay down material is heated below, at, or beyond its particular temperature requirements. Temperature measurements can be of a heat source that is moving at a rate from zero to over 3000 inches/minute. Temperature measurements of a moving heat source are reliable within a variance of approximately plus or minus 3° F. In addition, temperature measurements of a moving heat source on a laminated material may be had with a plurality of sensors along at least one direction and to various depths.

Abstract: A non-contact infrared (IR) thermometer for measuring temperature from the surface of an object includes an IR radiation sensor attached to a heating element and a thermal shield having an interior surface positioned within the sensor's field of view that has a high emissivity. An electronic circuit controlling the heating element maintains the temperatures of the sensor and shield substantially close to an anticipated surface temperature of the object. The IR radiation sensor is further thermally coupled to a reference temperature sensor. An optical system positioned in front of the shield focuses thermal radiation from the object on the surface of the sensor, while the shield prevents stray radiation from reaching the sensor. Signals from the IR and reference sensors are used to calculate the object's surface temperature.

Abstract: Apparatus and method are provided for facilitating simulation of heated airflow exhaust of an electronics subsystem, electronics rack or row of electronics racks. The apparatus includes a thermal simulator, which includes an air-moving device and a fluid-to-air heat exchanger. The air-moving device establishes airflow from an air inlet to air outlet side of the thermal simulator tailored to correlate to heated airflow exhaust of the electronics subsystem, rack or row of racks being simulated. The fluid-to-air heat exchanger heats airflow through the thermal simulator, with temperature of airflow exhausting from the simulator being tailored to correlate to temperature of the heated airflow exhaust of the electronics subsystem, rack or row of racks being simulated. The apparatus further includes a fluid distribution apparatus, which includes a fluid distribution unit disposed separate from the fluid simulator and providing hot fluid to the fluid-to-air heat exchanger of the thermal simulator.

Abstract: A method of manufacturing three-dimensional objects by laser sintering is provided, the object is formed by solidifying powder material layer by layer at locations in each layer corresponding to the object by means of laser radiation, wherein an IR-radiation image in an applied powder layer is detected, characterized in that defects and/or geometrical irregularities in the applied powder layer are determined on the basis of the IR-radiation image.

Abstract: Methods for identifying chemical contrasts on a common surface are generally provided. The presence of a stain on a surface can be detected by applying a testing vapor, such as water, onto the surface and monitoring the surface with an infrared camera that detects wavelengths of about 700 nm to about 1 mm and/or a microbolometer that detects wavelengths of about 7.5 ?m to about 14 ?m. The surface may be at room temperature or preheated during the detection method.

Abstract: A method for detecting defect in a weld seam during laser welding. The method includes performing a two-dimensionally locally resolved detection of radiation that is emitted by a solidified molten mass that is adjacent to a liquid melting bath. The method also includes determining at least one characteristic value for heat dissipation in the solidified molten mass by evaluating the detected radiation along at least one profile-section of the solidified molten mass, and detecting a defect in the weld seam by comparing the at least one characteristic value with at least one reference value.

Abstract: The disclosure provides a system, tools and methods for estimating a property or characteristic of a fluid downhole. In one aspect, the method may include: heating the fluid at a selected or first location during a first time phase, taking temperature measurements of the fluid substantially at the selected location during a second time phase, and estimating the property of the downhole fluid using temperature measurements. Temperature measurements may also be taken at a location spaced apart from the first location and used to estimate the property of the fluid. The tool may include a device that heats the fluid during a first time phase and takes temperature measurements of the fluid during a second time phase. A processor uses the temperature measurements and a model to estimate a property of interest of the fluid.

Abstract: This invention provides an apparatus for nondestructive residential inspection and various methods for using a thermal imaging apparatus coupled to inspect exterior residential components, interior residential component, for mold. More specifically, this invention provided a computerized method to facilitate inspecting a residential building.

Abstract: A method for identifying the source of vermiculite insulation in situ using a portable spectrometer with a light-emitting contact probe and a personal computer. Identification is accomplished using NIR reflectance spectroscopy and absorption band depth ratios to differentiate between vermiculite sources and to test for the presence of amphibole, talc, or serpentine contaminants in vermiculite insulation.

Abstract: A method for measuring thickness or defect depth by pulsed infrared thermal wave technology is described. The method includes heating a measured object by pulsed heating devices, and at the same time, obtaining a thermal image sequence on the surface of the measured object by an infrared thermography device, and storing the thermal image sequence in a general-purpose memory. The method also includes multiplying a temperature-time curve at every point of the thermal image sequence by a corresponding time, thereby obtaining a new curve. The method also includes calculating a first-order differential and obtaining a peak time thereof. The method also includes use of one or more formulas to thereby determine the thickness or the defect depth of the measured object.

Abstract: A method of calibrating a heater system for heating a surface of a structure, the heater system including a heater element, a temperature sensor proximate the heater element for outputting a signal indicative of the temperature of the heater element, and a controller for controlling the supply of power to the heater element in dependence on the signal to maintain the temperature of the heater element at a first substantially constant temperature. The method comprises: immersing the structure in a fluid for maintaining the surface of the structure at a second substantially constant temperature; supplying an amount of power to the heater element; receiving the signal from the temperature sensor and determining a temperature at the temperature sensor; and determining a setpoint temperature for controlling the heater element in dependence on the signal and the second substantially constant temperature.

Abstract: The object is to provide a laser processing apparatus, a laser processing temperature measuring apparatus, a laser processing method, and a laser processing temperature measuring method which can highly accurately detect the processing temperature when carrying out processing such as welding with laser light. A laser processing apparatus 1A for processing members DR, UR to be processed by irradiating the members with laser light LB comprises a laser (semiconductor laser unit 20A) for generating the laser light LB; optical means for converging the laser light LB generated by the laser onto processing areas DA, UA; and a filter 30, disposed between the members DR, UR to be processed and the optical means, for blocking a wavelength of fluorescence generated by the optical means upon pumping with the laser light LB; wherein light having the wavelength blocked by the filter 30 is used for measuring a temperature of the processing areas DA, UA.

Abstract: A method for detecting a crystal defect in a silicon single crystal wafer doped with nitrogen, the silicon single crystal wafer whose initial oxygen concentration is 8 ppma (JEIDA) or lower. The method further includes the steps of: making a crystal defect of defect size of 25 nm or smaller apparent and detectable by implanting oxygen into the crystal defect by performing heat treatment on the silicon single crystal wafer in an oxygen atmosphere; and detecting the crystal defect of the silicon single crystal wafer after the heat treatment temperature is set such that, when the ratio between the oxygen solid solubility and the initial oxygen concentration of the silicon single crystal wafer heat treatment is set at ?=the oxygen solid solubility/the initial oxygen concentration, ? falls within a range from 1 to 3.

Abstract: Methods and systems are disclosed for determining an amount of bond between a structure and sensor. A method may include performing a process associated with a sensor bonded to a structure and generating measured data in response to the process. The method may further include comparing the measured data to known reference data to determine integrity of a bond between the sensor and the structure. A system may include a sensor system including at least one sensor bonded to a structure. The system may further include a sensing system configured to initiate an application of one or more stimuli to the at least one sensor and monitor a property associated with the at least one sensor. The sensing system may further be configured to determine an amount of bond between the at least one sensor and the structure based on the monitored property.

Abstract: An apparatus is provided for determining variable thickness of a coating on a surface of a substrate using in part a flash-lamp source, capable of generating a thermal pulse at the coating surface, and a image capture and processing device capable of capture sequential image frames of the coating surface, whereas each sequential image frame corresponds to an elapsed time and comprises a pixel array, and wherein each pixel of the array corresponds to a location on the coating surface. A method of calculating coating thickness is also provided.

Abstract: Methods and apparatus for wafer temperature measurement and calibration of temperature measurement devices may be based on determining the absorption of a layer in a semiconductor wafer. The absorption may be determined by directing light towards the wafer and measuring light reflected from the wafer from below the surface upon which the incident light impinges. Calibration wafers and measurement systems may be arranged and configured so that light reflected at predetermined angles to the wafer surface is measured and other light is not. Measurements may also be based on evaluating the degree of contrast in an image of a pattern in or on the wafer. Other measurements may utilize a determination of an optical path length within the wafer alongside a temperature determination based on reflected or transmitted light.

Abstract: An apparatus includes a temperature detector coupled to a conductive layer of an electrophoretic display device. The temperature detector is operable to measure a leakage current that is responsive to a temperature associated with the electrophoretic device and determine the temperature associated with the electrophoretic device based at least in part on the measured leakage current.

Abstract: An abnormality diagnosis apparatus for a cooling system includes a cooling portion that is formed in the component of the cooling system and has an internal flow path for flowing a coolant, a non-cooling portion that is formed in the component and has a closed flow path obtained by closing at least a part of the internal flow path, and an abnormality diagnosis portion that performs abnormality diagnosis of the cooling system based on temperature characteristics of the cooling portion and temperature characteristics of the non-cooling portion during flowing of the coolant.

Abstract: An apparatus determines cooling characteristics of an operational cooling device used for transferring heat from an electronic device. The operational cooling device is thermally coupled to a heat pipe. The heat pipe has an exposed surface for selective application of heat thereon. Heat from a localized heat source is selectively applied to at least one region of the exposed surface. The heat source is preferably capable of being varied both positionally relative to the exposed surface and in heat intensity. A heat shield is preferably positioned around the exposed surface of the heat pipe to isolate the operational cooling device from the heat from the localized heat source. A temperature detector repeatedly measures a temperature distribution across the exposed surface while the cooling device is in a heat transfer mode. The temperature distribution is then used to thermally characterize the operational cooling device.

Abstract: Thermal test apparatus comprising a specimen supported by a fixture, a thermal shroud comprising a flexible insulating fabric forming an enclosure around at least a portion of the specimen, and a temperature controlled air supply connected to an opening formed in the enclosure for delivering a supply of temperature controlled air into the enclosure. Also, a method of conducting a thermal test.

Abstract: A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device transporter. The test slot assembly also includes a temperature sensing assembly. The temperature sensing assembly is arranged to measure a temperature of a storage device by way of physical contact. The test slot assembly also includes a clamping mechanism operatively associated with the housing. The clamping mechanism is operable to move the temperature sensing assembly into contact with a storage device.

Abstract: The present invention relates generally to thermal imaging systems and methods and uses therefor, and in a particular though non-limiting embodiment, to a method of detecting corrosion under insulation, as well as corrosion-related material data associated therewith. The system utilizes advanced infrared imaging video cameras to detect characteristic signatures of wet thermal traits on process equipment. Various embodiments of the invention integrate equipment, automation, and algorithms to form a method for identifying wet thermal insulation by scanning multiple locations along insulated piping, tanks, or other manufacturing equipment. Such scans can occur individually, sequentially, or simultaneously, with the results then being stored and comparatively analyzed.

Abstract: A method for optimizing direct wafer bond line width for reduction of parasitic capacitance in a MEMS device by reducing the width of a bond line between a first and a second wafer, exposing the MEMS device to a water vapor for a predetermined time period and at a first temperature capable of evaporating water, cooling the MEMS device at a second temperature capable of freezing the water, and operating the MEMS device at a third temperature capable of freezing the water to determine if there is discontinuity during operation.

Abstract: A method for characterizing an anomaly in a material comprises (a) extracting contrast data; (b) measuring a contrast evolution; (c) filtering the contrast evolution; (d) measuring a peak amplitude of the contrast evolution; (d) determining a diameter and a depth of the anomaly, and (e) repeating the step of determining the diameter and the depth of the anomaly until a change in the estimate of the depth is less than a set value. The step of determining the diameter and the depth of the anomaly comprises estimating the depth using a diameter constant CD equal to one for the first iteration of determining the diameter and the depth; estimating the diameter; and comparing the estimate of the depth of the anomaly after each iteration of estimating to the prior estimate of the depth to calculate the change in the estimate of the depth of the anomaly.

Abstract: An apparatus evaluates a substrate mounting device adapted to hold a target substrate placed on a mounting surface and to control a temperature of the target substrate. The apparatus includes an evacuatable airtightly sealed chamber accommodating therein the substrate mounting device, a heat source, arranged in a facing relationship with the mounting surface, for irradiating infrared light. The apparatus further includes an evaluation-purpose substrate adapted to be mounted on the mounting surface in place of the target substrate, the evaluation-purpose substrate being made of an infrared light absorbing material, and having a unit for measuring temperatures at plural sites on a surface and/or inside of the substrate.

Abstract: A method and system for inspecting an object is provided. In accordance with embodiments of the method, a thermal excitation pulse is applied to an object undergoing evaluation. A transient thermal signal from the object is detected in response to the thermal excitation pulse. Two or more orthogonal functions are applied to the transient thermal signal based on a defined time interval to generate two or more orthogonal components. The object is assessed for defects at different depths using the two or more orthogonal components.

Abstract: Tools and methods for creating isolated or localized temperature changes on components in an electric circuit. By isolating temperature changes to individual components or small sets of components, the tools and methods allow greater control over the analysis of interactions within a board. This may allow clearer understanding of the effects of temperature on circuit component behavior. The tools and analysis advances analysis such as failure analysis and design testing.

Abstract: Various embodiments provide systems and methods for detecting defects in components of a fuel cell. Embodiment methods and systems for detecting a defect in an interconnect for a fuel cell system include thermally exciting the interconnect using optical radiation and/or inductive stimulation, detecting a thermal response of the interconnect, and based on the thermal response, determining the presence or absence of a defect in the interconnect, such as a lateral or through crack in the interconnect.

Abstract: A defect on the surface or in the surface layer of a moving material can be detected by using a method comprising steps of: heating the surface of the material, obtaining thermal image data of the surface of the material using an infrared thermography camera while the surface of the material is being heated up at the heating step or being cooled down after heating, and detecting the defect by calculating Laplacian with respect to temperature of the surface represented by the thermal image data. When the thermal image data is obtained while the material is being heated up, a heating device and the camera is arranged so that thermal energy emitted from the heating device is reflected by the material to come into the camera.

Abstract: A test specimen having a to-be-photographed surface and an attachment surface which is a back side thereof is produced, and attached to a structure. An artificial abnormal portion is provided between a to-be-inspected surface of the structure and the to-be-photographed surface of the test specimen. The to-be-photographed surface of the test specimen is photographed by the infrared camera. When a surface temperature difference between the abnormal and the sound portions increases to a certain level on the to-be-photographed surface, it is capable of discriminating between the abnormal and the sound portions by an infrared thermal image of the test specimen. In a time zone in which discriminating between the abnormal and the sound portions is capable, the to-be-inspected surface of the structure is photographed by the infrared camera. If there is a damage in the surface layer of the structure, a damaged position can be discriminated by an infrared thermal image.

Abstract: Non-destructive testing system performs accurate testing as to whether lamination joining portion of different metal materials is in strong joining state by secure metal joining. The system sets a lamination joining portion of different metal materials of a work to a certain position and angle. Laser light in certain waveform is applied to lamination joining portion surface to capture images by infrared camera, and data processing device obtains infrared images. Based on infrared images, Fourier transform is performed on each pixel of infrared images, and phase image is created by console device. Based on created phase image, effectiveness/defectiveness of joining is determined. In this non-destructive testing, whether reflection by vertical wall in vicinity is significant is determined, based on intensity of infrared images obtained immediately after irradiation with laser and angle between laser light optical axis and testing part surface is finely adjusted to obtain infrared images with less noise.

Abstract: The invention relates to a process for controlling the corrosion of a concrete structure, in which said structure includes at least one sensor comprising a metal element located at a determined depth between the surface of the concrete and the first reinforcement bed, said process including the measurement of the corrosion of said metal element by implementing: the induction heating of said metal element, by applying magnetic excitation above the surface of the structure, the production of at least one thermographic image of the surface of the structure, and the deduction, on the basis of the thermographic image, of the degree of corrosion of the metal element. The invention also relates to a process for producing a concrete structure, in which at least one sensor including a metal element is placed in the concrete in order to subsequently implement said corrosion inspection process.

Abstract: A testing device for testing thermal detectors includes a hollow sleeve, open on at least one end, configured to receive a thermal detector. The hollow sleeve can have a length greater than a diameter. A heater is positioned is in proximity to the hollow sleeve, and is configured to provide heat for testing the thermal detector. The heater can be a flexible foil heater. A power source is provided to supply power to the heater. A power control module can be provided for variably adjusting a set point temperature or a rate of temperature rise for the heater.

Abstract: A method for processing thermographic data is disclosed including thermally disturbing a specimen of unknown quality, collecting thermal data from said specimen, converting the collected data into a measure of variance and comparing the variance from the sample of unknown quality against the variance of a sample of known quality in order to determine if the quality of the specimen of unknown quality is acceptable.

Abstract: Wafer temperature is measured as a function of time following removal of a heat source to which the wafer is exposed. During the wafer temperature measurements, a gas is supplied at a substantially constant pressure at an interface between the wafer and a chuck upon which the wafer is supported. A chuck thermal characterization parameter value corresponding to the applied gas pressure is determined from the measured wafer temperature as a function of time. Wafer temperatures are measured for a number of applied gas pressures to generate a set of chuck thermal characterization parameter values as a function of gas pressure. A thermal calibration curve for the chuck is generated from the set of measured chuck thermal characterization parameter values and the corresponding gas pressures. The thermal calibration curve for the chuck can be used to tune the gas pressure to obtain a particular wafer temperature during a fabrication process.

Abstract: Thermal test apparatus comprising a specimen supported by a fixture, a thermal shroud comprising a flexible insulating fabric forming an enclosure around at least a portion of the specimen, and a temperature controlled air supply connected to an opening formed in the enclosure for delivering a supply of temperature controlled air into the enclosure. Also, a method of conducting a thermal test.

Abstract: A system for cooling and holding a testpiece in an effective manner while the testpiece is subjected locally to high heat flux. The testpiece includes an inside face extended by parallel strips that leave between them channels for passing a cooling fluid, and parallel fins of an intermediate part are inserted between the strips.

Abstract: An inspection device and method, the device comprising a thermoelectric module (3) with first and second conducting parts (31, 32) and a control unit (4) electrically connected to the thermoelectric module for selectively applying an electric potential to the thermoelectric module to create a temperature difference between the first and second conducting parts. The control unit comprises measuring means configured to measure transiently, in use, a voltage potential across the thermoelectric module. The control unit includes memory means for recording a measured voltage profile and further comprises comparing means (41) for comparing the measured profile with a predetermined voltage profile stored in the memory means.

Abstract: A heating furnace for testing middle and long span structures including a modular partition structure to adjust an inner volume of the heating furnace, effectively performing a load-coupled heating test of full scale members such as a beam, a short column, a slab, a conjunction frame, and a deck plate. The heating furnace for testing middle and long span structures includes a partition unit formed of a refractory material and partitioning a heating space in a main body to block transfer of heat generated from one space to the other space. A test sample is installed in the heating space of the main body partitioned by the partition unit according to a size of the test sample, and then, heat and a compression force are applied to the test sample to perform a fireproof performance test. The fireproof performance test of structure members having various lengths of 4 m, 6 m and 10 m can be performed, and consumption of various utilities consumed during the test can be optimized.

Abstract: A thermographic test method locally resolves detection and identification of defects near the surface in a test object. A surface area of the test object is heated up. A series of thermographic images following one after another at a time interval is recorded within a heat propagation phase, each image representing a local temperature distribution in a surface region of the test object recorded by the image. Positionally correctly assigned temperature profiles are determined from the images, each positionally correctly assigned temperature profile being assigned to the same measuring region of the test object surface. Variations over time of temperature values are determined from the temperature profiles for a large number of measuring positions of the measuring region. These variations are evaluated on the basis of at least one evaluation criterion indicative of the heat flow in the measuring region.

Abstract: A method for identifying types of flaws in a composite object includes: a) rapidly heating the surface of the object; b) recording pixel intensities in a sequence of IR images; c) determining temperature-versus-time data for each of the pixels from the IR images; and d) determining what type of flaw if any corresponds to each of the pixels using the temperature-versus-time data determined in step (c). A contrast curve derived from the temperature-versus-time data may be used in determining what type of flaws if any corresponds to each of the pixels. The contrast curve may be determined by subtracting a synthetic reference curve from a temperature time curve from the temperature-versus-time data. The types of flaws may be determined from size and/or shapes of peaks in the contrast curves. Some flaws are delaminations, layers of porosity, and uniformly distributed porosity.

Abstract: Two vertically offset thermistors for sensing a fluid such as oil and refrigerant in a compressor shell are monitored by a method that takes into account rapidly changing conditions within the shell. The system can determine the fluid's sump temperature, high/low liquid levels, and can determine whether the thermistors are sensing the fluid as a liquid, gas, or a mixture of the two, such as a foam or mist of liquid and gas. For greater accuracy, thermistor readings can be dithered and filtered to provide temperature or voltage values having more significant digits than the readings originally processed through a limited-bit A/D converter. For faster response, limited microprocessor time is conserved by sampling thermistor readings at strategic periods that enable the microprocessor to identify certain conditions and temperatures via simple delta-temperature ratios and undemanding equations rather than resorting to exponential functions or lookup tables to determine time constants.

Abstract: Systems and methods can produce thermal images of the mounting of a thermally-enhanced integrated circuit (IC) upon a circuit board. The system includes a thermal imaging camera that is operable to image the thermal dissipation and/or conduction through the heat sink into a mounting pad on the substrate. In testing the thermally-enhanced IC, the substrate or IC is connected to a power source, and the IC is operated such that the IC begins to generate heat. As the heat is conducted or dissipated through the heat sink into the mounting pad, a thermal imaging camera can detect the heat conduction and/or dissipation through the heat sink into the substrate. If there are voids or other types of failures in the mounting of the IC, the thermal imaging camera can detect cooler or colder spots in the image.

Abstract: Embodiments of the present invention provide for a system and method for flow assurance and pipe condition monitoring in a pipeline for flowing hydrocarbons using at least one thermal sensor probe, which at least one thermal sensor probe may be used in conjunction with one or more other sensors to manage the sensing process and for data fusion to accurately determine flow properties and/or pipeline condition. By way of example, but not by way of limitation, in an embodiment of the present invention, a network of noninvasive sensors may provide output data that may be data-fused to determine properties of the pipeline and/or flow through the pipeline.

Abstract: The invention relates to a method for testing a rotor blade (13.1) of a wind power plant (1), which sweeps across a rotor blade surface to be covered during operation of the wind power plant, comprising the following steps: emitting a target light beam (20), in particular a target light beam having a power density, in a direction of the target light beam onto the rotor blade surface to be covered; detecting a possible reflection of the target light beam by a detection device at a point of incidence (16) on the rotor blade; electrically controlled emission of a measurement laser beam (21) which has a power density that is larger than the power density of the target light beam immediately after detection of the reflection at the point of incidence so that the rotor blade is heated at the point of incidence; measuring a temperature distribution at the point of incidence; and repeating the steps (a) to (d) for several points of incidence.

Abstract: An apparatus for single-side, thermal shock testing of a specimen may comprise a base and thermal insulation. The base may comprise an internal cavity disposed within the base. The internal cavity may extend through a first outer surface of the base. A specimen-supporting surface may be recessed within the first outer surface for supporting a specimen within the base to substantially close the internal cavity. The thermal insulation may not substantially cover the first outer surface, but may substantially cover other outer surfaces of the base.

Abstract: A system for testing electrical devices under varying thermal conditions is disclosed. The system includes a fixture that comprises two vertically arranged rails, into which horizontally arranged electrical devices are inserted. The rails are in contact with two thermal plates whose temperatures are controlled by controller or controllers. Target temperatures for the two thermal plates are communicated to the controller or controllers, and the electrical output of the electrical devices under test are monitored under varying thermal conditions.

Abstract: The present invention relates to a simulation test system for thermal impact ageing of a power transmission insulator which simulation tests an influence of a forest fire on the power transmission insulator.

Abstract: A method of detecting wrinkles in a fiber reinforced laminated structure is provided. In this method, the structure is locally heated or cooled, the location of the heating or cooling being moved along a defined path, the temperature of the structure is measured at a measuring location being different from the location of the heating or cooling, the measuring location being moved along the same path as the location of the heating or cooling, and wrinkles are detected from temperature anomalies found along the defined path.

Abstract: Multilayer articles such as thin-film solar cells can be effectively tested under thermal load in a mini-module that includes a chamber or enclosure in which one or more laminated multilayer articles are housed. The inner dimensions of the chamber, at least along the axis that is perpendicular to the plane defined by the laminated solar cells, are configured to remain substantially constant during testing. Cooling the laminated solar cells in the mini-module device causes the encapsulant material to shrink and thereby induces accelerated failures in the laminated solar cells and associated structures. A technique of detecting the presence of defects or failures is near infrared radiation thermography wherein NIR images of the laminated solar cells are taken during the cooling process. The color patterns manifested from the cooled laminated solar cells can reveal the location, nature and extent of the defect or failure.