Abstract: An -ray emitted from an incident optical system is incident on a sample supported by a sample support mechanism, and a diffracted X-ray is detected by a receiving optical system. The incident optical system includes an X-ray source and a multilayer-film mirror. An attitude controlling unit of the sample support mechanism switches a condition of the sample support mechanism from a state maintaining the sample to have a first attitude in which a normal line of the surface of the sample is parallel with a first axis of rotation to another state maintaining the sample to have a second attitude in which the normal line of the surface of the sample is perpendicular to the first axis of rotation. When the receiving optical system is rotated around the first axis of rotation while maintaining the sample in the first attitude, in-plane diffraction measurement is possible.

Abstract: An omni-positional camera mount for the photographing of small objects (24). The mount has a support (4) to hold an object to be photographed. A first frame (9) is pivotally mounted to the support such that the first frame can pivot on a first pivot axis (12). A second frame (15) is mounted to the first frame (9) such that the second frame can pivot on a second pivot axis (18) which is at right angles to and passing through the first pivot axis. A camera stage is on the second frame. The support (4) can include a turntable and a mounting post. The turntable (4) rotates on a axis which passes through the meeting point (20) of the first and second axes.

Abstract: A method for testing a surface of a sample includes irradiating the surface at a grazing incidence with a beam of radiation having a focal region, whereby the radiation is reflected from the surface. At least one of the focal region and the sample is adjusted through a plurality of adjustment stages within an adjustment range so as to vary a location of the focal region relative to the surface. Respective angular profiles of the radiation reflected from the surface are measured at the plurality of adjustment stages, and the angular profiles are compared in order to select an adjustment within the range at which the surface is in a desired alignment with the beam.

Abstract: An open beam x-ray diffraction system and method are provided including modular x-ray heads for being detachably connected to a base unit having a common drive assembly that shifts the heads in an arcuate path during an x-ray diffraction measurement operation. The heads can be tailored to different performance criteria depending on the needs of the measurement operation that is to take place. To this end, one of the heads can be a microhead that is adapted to take measurements from otherwise difficult to access surfaces, such as on the inside of tubular parts. Enhancements to the drive assembly for improved accuracy and speed are also disclosed.

Abstract: A low-cost, high precision goniometric stage, for use in x-ray diffractography or in optical systems, with a spherical sector supported on at least one bearing, a top surface of the spherical sector that is used for mounting an object, a center of rotation located within the object, a rod or other member that is disposed below the spherical bearing surface, preferably orthogonal to the rotational axes, stepper motors or other actuators to move the device and a mechanical linkage between the rod and the motors.

Abstract: An apparatus and method for performing rapid grain size analysis on a textured polycrystalline material, by generating average grain size and grain size distribution data from x-ray diffraction data of such material. Raw diffraction data is obtained by capturing a plurality of diffraction arcs within a single data capture frame. The raw diffraction data is digitally registered; (3) and the registered diffraction data is filtered to remove background noise, exclude diffraction overlaps or truncations, and compensate for biased data obtained from regions of highly preferred orientations. Average grain size and grain size distribution data are then correlated with the filtered diffraction data. The apparatus for acquiring raw diffraction data includes a collimated x-ray source having means for adjusting beam size and divergence of the x-ray generated, a 2-dimensional area detector for registering diffracted x-ray, and a sample motion assembly for moving the sample in the sample plane.

Abstract: A transmission mode x-ray diffraction screening system has a sample support that holds a sample tray with multiple samples to be tested. The sample support is connected to a translation stage that is movable in three dimensions, and that it offset from the location of the sample support. An x-ray source is located to one side of the sample support, and a detector is located to the other side, thereby allowing the detection of x-rays that are diffracted by the sample in a transmission mode. A retractable beamstop may be located between the sample and the detector to block at least part of the non-diffracted x-rays from the source. A video camera may also be provided for imaging the sample location, which may be illuminated by a laser. The entire system may be automated such that each sample in the sample tray may be sequentially analyzed.

Abstract: In order to create a method for the automatic relative adjusting of the position coordinates (xp, yp, zp) of at least one sample with respect to the center coordinates (xm, ym, zm) of a goniometer (200) determined by the intersection point of the tilting axles (&ohgr;, &khgr;, &phgr;) as well as an associated device (100) through which the construction of goniometric systems is considerably simplified and moreover the costs for multiple circle systems are considerably reduced, it is proposed that, during a variation of the sample orientation or tilting, the trajectory of the sample which is taking place, in particular the precession trajectory of the sample, can be dynamically compensated about the center coordinates (xm, ym, zm) and the sample can be dynamically held at the measuring point, while [a] the trajectory of the sample about the center coordinates (xm, ym, zm) is recorded and exploited by digital image processing, [b] correction coordinates (xm−xp, ym−yp, zm&minu

Abstract: The present invention relates to a method for the wet chemical preparation of materials libraries consisting of a large number of solids, the solids being deposited from reaction mixtures in microreaction chambers onto a bottom plate which simultaneously serves as the library substrate. Depending on the material selected for the library substrate, the solids can subsequently be examined non-destructively, for example, by reflecting or penetrating microarea X-ray diffraction.

Abstract: An attachment 3 mounted on a specimen support portion 2 of an X-ray apparatus 1 includes a cover member 9 covering a specimen S and a scattered ray excluding member 8 provided between the cover member 9 and the specimen S. The scattered ray excluding member 8 takes in the form of a box, a case or enclosure defined by a wall 16. The enclosure has a large opening 14a on the side of the cover member 9 and a small opening 14b on the side of the specimen S. The scattered ray excluding member 8 functions to prevent scattered X-ray emitted from the cover member when X-rays from an X-ray source passes through the cover member 9 and traveling toward an X-ray detector.

Abstract: A low-cost, high precision goniometric stage, for use in x-ray diffractography or in optical systems, with a spherical sector supported on at least one bearing, a top surface of the spherical sector that is used for mounting an object, a center of rotation located within the object, a rod or other member that is disposed below the spherical bearing surface, preferably orthogonal to the rotational axes, stepper motors or other actuators to move the device and a mechanical linkage between the rod and the motors.

Abstract: In one embodiment, a portable apparatus adapted to be battery powered is used to scan an object in situ with x-rays and measure the intensity of the diffracted x-rays. The apparatus includes a scanning head having an x-ray source that is battery powered and an x-ray detector. The x-ray source and the x-ray detector are aligned in one of a plurality of predetermined alignments such that x-rays from the x-ray source are incident upon an object at a specific angle and the x-ray detector is aligned to detect x-rays that are diffracted at a specific angle, wherein the specific angle is a Bragg angle for a particular plane of atoms in the object.

Abstract: The present invention is directed to a x-y-axis device and a x-y-z-axis device for micro-manipulating or positioning a crystal for x-ray diffraction. More specifically, the devices which may be placed on the head on a goniometer have small footprints (small in size). The sample may be moved and recorded in step resolutions of 1 micron over an extended range of motion.

Abstract: In order to create a method for the automatic relative adjusting of the position coordinates (xp, yp, zp) of at least one sample with respect to the center coordinates (xm, ym, zm) of a goniometer (200) determined by the intersection point of the tilting axles (&ohgr;, &khgr;, &phgr;) as well as an associated device (100) through which the construction of goniometric systems is considerably simplified and moreover the costs for multiple circle systems are considerably reduced, it is proposed that, during a variation of the sample orientation or tilting,

Abstract: Methods are included for determining deviations from &phgr;=0° in test resonators based on the quasi-pure modes' displacement ratio variations with &phgr; angle. A direct relationship between deviation from &phgr;=0° and the c-mode displacement ratio has been observed, so that the larger the deviation from &phgr;=0°, then the larger is the change in the normalized frequency of the c-mode upon immersion in, or contact with, a fluid. The method includes measuring &thgr; and &phgr; angles in reference resonators with different small &phgr; angles and quasi-pure mode frequencies of reference resonators in both air and a test fluid at ambient temperatures, calculating the normalized frequency changes between the air and fluid measurements as a reference point, measuring the test resonator in air then in the fluid and comparing the results.

Abstract: An x-ray diffraction apparatus for qualitatively analyzing a sample uses a fixed or variable divergence slit to irradiate a portion of its surface and intensity data are collected at different angles of diffraction. When measured data thus obtained are compared with reference data for the qualitative analysis, the measured data, the reference data or both of these data are corrected in part according to whether the reference data were taken by measurements using a fixed or variable divergence slit such that the comparison can be carried out on the same intensity level and the qualitative analysis can be carried out more accurately.

Abstract: An apparatus and method for performing rapid grain size analysis on a textured polycrystalline material, by generating average grain size and grain size distribution data from x-ray diffraction data of such material. Raw diffraction data is obtained by capturing a plurality of diffraction arcs within a single data capture frame. The raw diffraction data is digitally registered; (3) and the registered diffraction data is filtered to remove background noise, exclude diffraction overlaps or truncations, and compensate for biased data obtained from regions of highly preferred orientations. Average grain size and grain size distribution data are then correlated with the filtered diffraction data. The apparatus for acquiring raw diffraction data includes a collimated x-ray source having means for adjusting beam size and divergence of the x-ray generated, a 2-dimensional area detector for registering diffracted x-ray, and a sample motion assembly for moving the sample in the sample plane.

Abstract: The present invention is directed to a x-y-axis device and a x-y-z-axis device for micro-manipulating or positioning a crystal for x-ray diffraction. More specifically, the devices which may be placed on the head on a goniometer have small footprints (small in size). The sample may be moved and recorded in step resolutions of 1 micron over an extended range of motion.

Abstract: An X-ray spectrometer having a curved crystal monochromator which diffracts a continuous X-ray beam from an X-ray source to produce a monochromatic X-ray beam. An angle of incidence of the continuous X-ray beam can be changed with respect to the monochromator so as to change the wavelength of the monochromatic X-ray beam which is focused on and taken out from a receiving slit. The X-ray source, the monochromator and the receiving slit must be positioned always on a Rowland circle. The X-ray source and the monochromator can be moved so that the angle of incidence changes, while the receiving slit remains always stationary and the direction of an X-ray path from the center of the monochromator to the receiving slit remains always constant. Such an X-ray spectrometer is usable as an X-ray irradiation system of XAFS (X-ray Absorption Fine Structure) apparatus so that XAFS measurements require no movement of the sample.

Abstract: A space-efficient imaging-plate-type X-ray diffraction apparatus featuring an expanded 2&thgr; goniometry range, high speed, high resolution, and design for convenient use is provided. The imaging-plate-type X-ray diffraction apparatus includes an X-ray measurement device composed of an X-ray optical system (5) and a goniometer (1) and is adapted to cause a single-crystal sample (3) to diffract X-rays. A cylindrical imaging plate (21) is disposed vertically so as to record X-rays diffracted by the sample (3), and covering a 2&thgr; goniometry range of −60° to +144°. A drive motor (11) and a transmission mechanism (12) transfer the cylindrical imaging plate vertically; and a rotary reader (20) is disposed so as to be coaxial with the transferred cylindrical imaging plate (21) and is adapted to read data of diffracted X-rays from an inner cylindrical surface of the cylindrical imaging plate (21).

Abstract: An X-ray diffractometer has an X-ray source (10), a double pinhole collimator (14), a sample (22) mounted on a rotatable sample stage (20), an analyser crystal (30) and a detector (34). The analyser crystal and detector are arranged to rotate together about an axis (21) that is coaxial with the axis of rotation of the sample stage. Very few scattered X-rays (26) reach the detector (34). The diffractometer has particular use for routine quality control measurements.

Abstract: An X-ray micro-diffraction measuring method for detecting X-rays diffracted at a minute portion of a specimen upon irradiating the minute portion with X-rays is disclosed. A cylindrical stimulation type fluorescent member is arranged around the specimen. A sample facet of the specimen is tilted by, for example, 45° with respect to the stimulation type fluorescent member such that the stimulation type fluorescent member can receive both diffracted X-rays passing along a direction tangential to the sample facet and diffracted X-rays passing along a direction perpendicular to the sample facet. Diffracted X-ray images can be obtained on the stimulation type fluorescent by merely rotating the specimen about only the &phgr; axis thereof so as to perform the in-plane rotation without a rotation about the &khgr; axis. By eliminating a rotation about one axis from rotations about two axes for the specimen, it may be possible to avoid a degradation of measurement preciseness due to a crossing error of the two axes.

Abstract: In accordance with the present invention, a compound refractive lens for focusing, collecting and collimating x-rays comprising N individual unit lenses numbered i=1 through N, with each unit lens substantially aligned along an axis such that the i-th lens has a displacement ti orthogonal to said axis, with said axis located such that the sum of the displacements ti equals zero, and wherein each of said unit lenses comprises a lens material having a refractive index decrement less than 1 at a wavelength less than 100 Angstroms.

Abstract: An X-ray analysis apparatus having a curved paraboloid-shaped curved graded multilayer Bragg reflector (5) is characterized in that the layers of the reflector (5) are directly introduced onto a concave curved surface of a paraboloid-shaped hollow substrate and a maximum allowable shape deviation for the concave substrate surface facing the reflector is &Dgr;p={square root over (2px)} &Dgr;&thgr;R, and having a maximum allowable waviness Δ ⁢   ⁢ y Δ ⁢   ⁢ x = 1 2 ⁢ Δθ R and a maximum allowable roughness &Dgr;y=d/2&pgr;, preferentially &Dgr;y≦0.

Abstract: A novel method and novel apparatus that are capable of selecting, with a computer, reference Bragg reflections pc1 and pc2, which form a basis for determination of the crystallographic orientation of a crystal sample by the two-reflection method, automatically and easily and accurately, wherein; firstly, x-ray intensities and diffraction conditions of all Bragg reflections which are measurable are calculated using the crystallographic information, secondly, a weight-point according to both the x-ray intensity and the angle between the sample normal and the scattering vector is obtained for each of the Bragg reflections, thirdly, two Bragg reflections having the two largest weight-points are selected as the reference Bragg reflections pc1 and pc2, respectively.

Abstract: A sample changer (2) for the automatic intake of a multitude of samples into the measurement position on the goniometer axis (a) of an X-ray diffractometer (20) in which the individual samples--each showing a surface, which meets the goniometer axis at a tangent in the measurement position--are linearly arranged on an insertable magazine (3). The samples on the magazine (3) can be moved in the direction of the goniometer axis (a) in order to transport each sample translationally into the measurement position. Furthermore the sample changer (2), the magazine (3) and the mountings (10) show recesses, which allow the refracted X-ray beams from the sample in transmission mode to pass through to the detector (14) unimpeded. The sample changer is suitable for reflection mode as well as transmission mode measurements without having to redesign the system.

Abstract: An x-ray diffractometer system comprising an x-ray optic which directs x-rays, a sample placed into said directed x-rays, wherein said sample diffracts said directed x-rays, creating a diffraction pattern, a translation stage coupled to said sample for moving said sample within said directed x-rays, whereby the resolution, angular range, and intensity of said diffraction pattern may be adjusted, and an x-ray detector for registering said diffraction pattern.

Abstract: An x-ray diffractometer has an x-ray detector and an x-ray source mounted on vehicles traveling along an arc-shaped track around a sample. The vehicles move independently. Alternatively, the vehicles can move independently on separate parallel tracks.

Abstract: An x-ray diffractometer has an x-ray detector and an x-ray source mounted on vehicles traveling along an arc-shaped track around a sample. The vehicles move independently. Alternatively, the vehicles can move independently on separate parallel tracks.

Abstract: In a goniometer having several axes around which a crystal specimen to be examined can be rotated, a radiation source, a detector for Bragg reflections and a detector for fluorescence radiation, with the detector making it possible to measure lattice geometry and chemical composition at the same time. The detector for the fluorescence radiation is secured in a holder, and is oriented with its surface parallel to the specimen and is pivotably secured together with the specimen to the specimen table. As such, reflexes can be simultaneously observed using the Bragg detector which is secured in a pivotable arm, and the fluorescence radiation using the fluorescence detector.

Abstract: An X-ray analyzing apparatus having high sensitivity and high position resolving power in which an X-ray fluorescent screen made of Gd.sub.2 O.sub.2 S:Tb as a material and having a surface density ranging from 5 mg/cm.sup.2 to 30 mg/cm.sup.2 is used, and an image intensifier and a charge coupled device (CCD) are combined to form an X-ray diffraction two-dimensional detector; and the image intensifier and the CCD are combined with a tapered fiber plate, and an alignment section of a mirror mount tube and a vacuum flexible tube are separated by an X-ray window ambient atmosphere and a vacuum.

Abstract: A motion system or goniometer for moving a sample supported by the system has a triangular plate supported at each apex by actuators that can extend or retract axially independently from one another. The actuators are mounted on x-y translation stages and a .theta. rotation stage. The movement of the actuators, translation stages and rotation stage is controlled by a computer. When it is desired to create a rocking curve at a particular position on the sample, the translation stages and rotation stage can remain stationary while moving only the plate and actuators. The goniometer is much more efficient and less expensive than previous devices which require movement of the entire goniometer when creating a rocking curve.

Abstract: An X-ray diffractometer has an X-ray source for producing an X-ray beam; a position sensitive detector for detecting diffracted X-rays over a wide angle; and means for effecting controlled relative rotation between the detector and the X-ray source incident beam. A sample holder is capable of rotation about three mutually perpendicular axes and is also capable of providing rotation of the sample relative to the sample holder about two perpendicular axes. Thin films or substrates under investigation can be individually aligned into selected diffraction geometries by such a diffractometer. The X-ray source itself may be rotatable about the axis of the X-ray beam.

Abstract: A nondestructive method, and associated apparatus, are provided for determining the grain flow of the grains in a convex curved, textured polycrystalline surface. The convex, curved surface of a polycrystalline article is aligned in a horizontal x-ray diffractometer and a monochromatic, converging x-ray beam is directed onto the curved surface of the polycrystalline article so that the converging x-ray beam is diffracted by crystallographic planes of the grains in the polycrystalline article. The diffracted x-ray beam is caused to pass through a set of horizontal, parallel slits to limit the height of the beam and thereafter. The linear intensity of the diffracted x-ray is measured, using a linear position sensitive proportional counter, as a function of position in a direction orthogonal to the counter so as to generate two dimensional data. An image of the grains in the curved surface of the polycrystalline article is provided based on the two-dimensional data.

Abstract: A displacement measuring system includes means for focusing x-rays into a narrow, intense beam which can be used to excite targets that fluoresce secondary x-rays. By precisely measuring the focused image position as the focused image is caused to overlap the fluorescing target, relevant changes in target position can be determined. The x-rays are focused using a novel Johansson ground and bent crystal which, along with the x-ray tube, is mounted on a common base for lineal scanning. This common base preferably comprises a linear translation table. By scanning the beam onto fluorescing targets, edge detection can be accomplished by monitoring subsequent x-ray fluorescing using an appropriate detector whose output is measured and recorded. In a preferred embodiment, the detector is formed integral with an enclosure for enclosing the x-ray tube and bent crystal on the linear translation table.

Abstract: An x-ray diffractometer is equipped with a position sensitive detector and a collimator preceding the detector. The lamellae of the collimator are radially aligned to the specimen, which is arranged in the center of a measurement circle along which the detector and collimator move during a measurement. Therefore, only the x-radiation scattered at the specimen contributes to the measured signal. An elliptically deformed multi-layer mirror is provided at the primary beam side, which deflects the source radiation in the direction of the specimen without great intensity loss and focuses it at a point lying on the measurement circle. Analysis of powdered specimens that are enclosed in glass capillaries can be undertaken. A low-background measurement of diffraction diagrams in an x-ray diffractometer given efficient use of the primary beam is achieved.

Abstract: An X-ray diffractometer having a simple yet accurate means for locating the surface of the sample to be examined with respect to the zero point of the X-ray (RS) is disclosed. Briefly stated, a laser (LA) and camera (KA) are positioned at preferably 90.degree. with respect to each other such that the intersection of the optical axis of the camera and the laser passes through the zero point of the diffractometer. In this fashion, the camera will see at its center, the zero point of the X-ray despite the fact that the X-ray is of course invisible to the naked eye. Accordingly, by movement of the sample (P) with respect to this camera image, the true and correct zero point of the X-ray with respect to the surface of the sample to be examined may be determined without the need for experimental and unnecessary X-ray or examination runs being taken.

Abstract: An X-ray analysis apparatus includes angle encoders for the determination of angular positions of at least two rotary shafts, for example the .theta. shaft for a specimen holder, the 2.theta. shaft of an X-ray detector arm or the rotary shaft of an X-ray source. Because the angles are directly or indirectly measured relative to a fixed point, preferably coupled to a goniometer frame of the apparatus, accurate angle detection is ensured. The encoders can also be used as adjusting mechanisms for exact, flexible angular adjustment.

Abstract: A goniometer for needle placement in connection with a computer tomograph to direct a needle at a proper angle to reach an area for biopsy or other surgical procedures in the human body. One embodiment of the device includes a double ring, the outer ring having arcuate graduations and a level mounted thereon, and the inner ring being rotatable in the outer ring to various angle positions and including a needle carrier for receiving a needle holder.The outer ring has serrations on a continuous arcuate surface and the inner ring has resilient detents to contact and rid on the serrations. A lever operated needle holder has a cam to lock a detent into a serration when the needle holder is moved to a position to retain a needle.

Abstract: An oscillation radiography camera, and method for oscillation radiography, is provided with a generator adapted to generate a collimated beam of quantum fields, such as X-ray or gamma ray photons, or neutrons. Two or more motors are constructed and arranged to position a sample for exposure to the collimated beam. Each of the motors rotates the sample about an axis, with the motors providing a precise net rotation of the sample to within a degree. A detector is constructed and arranged to detect the quantum fields scattered from the sample.

Abstract: A sample holder for use with X-ray diffractometers with the capability to rotate the sample, as well as to adjust the position of the sample in the x, y, and z directions. Adjustment in the x direction is accomplished through loosening set screws, moving a platform, and retightening the set screws. Motion translators are used for adjustment in the y and z directions. An electric motor rotates the sample, and receives power from the diffractometer.

Abstract: A diffractor for energetic electromagnetic radiation has diffracting planes oriented parallel to the surface of steps which have a doubly curved surface. The steps are configured so that the resulting diffractor approximates the Johansson geometric conditions in the plane of the focal circle of radius r. The steps are additionally curved in a direction perpendicular to the focal circle in order to provide for satisfying Bragg's law for diffraction over the maximum area of the diffractor. The curvature of the planes perpendicular to the focal circle corresponds to rotating the stepped approximation to the Johansson geometry about an axis passing through the source and image points.

Abstract: An X-ray analysis apparatus comprises an adjustable entrance slit which consists of two laminations which are rotatable about axes extending parallel to a .theta.-axis. By choosing the radius of the laminations and their position in the X-ray beam, a substantially more accurate adjustment can be achieved notably for small .theta.-values. Moreover, asymmetry in the beam path can be simply compensated for and improved shielding against scattered radiation is achieved.

Abstract: The invention discloses a method and an apparatus for measuring lattice spacings in particular of a single crystal during the growth thereof by vapor deposition while located in a heating furnace.

Abstract: A goniometer in an X-ray diffraction device comprises a sample table rotatably provided about a center axis of a sample for holding a sample, an X-ray source rotatably provided about the center axis of the sample for irrdiating first X-ray onto a sample, and an X-ray detector rotatably provided about the center axis of the sample for detecting second X-rays resulting from the irradiation of the first X-rays, the second X-rays being diffracted X-rays depending upon a sample. The sample table, the X-ray source an the X-ray detector are rotatable independently of one another, and a component to be fixed can be freely selected in accordance with a purpose of measurement and sample attachments employed. As such, various kinds of measuring methods are available to perform X-ray diffraction analysis by a single goniometer.

Abstract: A method of measuring the lattice parameter in an unknown single crystal by omparing its diffraction angle to a standard single crystal, on a double-crystal diffractometer is disclosed.

Abstract: An X-ray analyzer for performing both X-ray fluorescence and X-ray diffraction analysis is provided with an X-ray source, an X-ray guide tube for collimating X-rays from the source, a vacuum tank in which the guide tube is partially disposed, a rotatable sample table for holding a sample adjacent the guide tube, and an X-ray detector movable away from and towards the sample table, and also rotatable independently of the sample table.

Abstract: Device for measuring the orientation of bulk monocrystalline materials with respect to the crystallographic parameters using the Laue method, consisting, on the one hand, of a Laue chamber including a polychromatic x-ray source, a photographic film support and a collimator placed in the path of the x-rays between the source and the film in the vicinity of the latter defining the optical axis of the Laue chamber, and consisting, on the other hand, of means of support for a bulk specimen, of means of alignment for the chamber and the means of support, and means of determining the orientation of the specimen with respect to the crystallographic axes, characterized in that the means of support comprise at least one specimen-carrier which has a first planar face to receive the specimen, a second planar space perpendicular to the first for immobilizing the specimen, a first reference plane parallel to the first planar face, a second reference face parallel to the second planar face and a third reference plane perpe

Abstract: In an X-ray analysis apparatus, a specimen to be examined is mounted on the circumference of a focusing cylinder, which can be rolled along an auxiliary cylinder arranged concentrically around the beam focus of an X-ray beam. Independently of the movement mechanism used, a fixed part of the specimen then remains continuously in the beam path. Invariably the same surface area of the specimen is irradiated by the X-ray beam. The movement mechanism may have added to it a device by means of which during the movement of the specimen and the detector the detector is continuously optimally directed to the specimen. The specimen holder may have added to it a device for rotating and/or tilting a specimen included therein.

Abstract: A detector slit for .theta. rotation in an X-ray examination apparatus utilizing the Seemann-Bohlin focusing principle is suspended on a mechanical arm which is capable of rotating about a shaft through the center of the focusing circle. The Seemann-Bohlin system is for .psi. adjustment tiltable about an axis through an irradiated area on an object to be examined. The readjustment of the detector during the .theta. rotation is controlled by a device which provides detector rotation with with a 1:2 gear wheel transmission. For automatic limitation of a .theta. path to be chosen, the detector housing comprises an abutment pin which cooperates with switching elements connected to the mechanical arm. The X-ray tube has a construction reduced length and is connected to a high-voltage source via a rotatable right-angled connector.