Abstract: A goniometric device particularly for X-ray or neutron diffractometry on monocrystals or any other sample comprises a sample-holder to maintain the monocrystal to be analyzed in the axis of the incident X-ray or neutron beam. Means for driving this sample-holder on itself, about a first axis, and also in rotation about a second axis perpendicular to the first and a third axis perpendicular to the second. The sample-holder is borne by a slave-goniometer comprising a transverse bar made of ferromagnetic material fast with the sample-holder, therefore perpendicular to the first axis of rotation of the sample-holder on itself. The sample-holder is rotatably mounted onto a support forming part of a universal joint mounted on a fixed base and of which the two perpendicular axes correspond respectively to the second and third axes of rotation.
Type:
Grant
Filed:
June 19, 1985
Date of Patent:
April 14, 1987
Assignee:
Centre National de la Recherche Scientifique (CNRS).
Abstract: An Euler's goniometer for low-temperature diffractometry is rotatable about two turning circles and is arranged within a chamber filled with a coolant. Each of the turning circles - that is the chi-circle and the phi-circle - is constituted by a worm wheel which is driven in a stepwise manner by a worm and a stepper motor driving the worm. For providing a compact construction, the stepper motors and the actuated worms are arranged within the chamber as well.
Type:
Grant
Filed:
February 8, 1985
Date of Patent:
February 24, 1987
Assignee:
Kernforschungsanlage Julich Gesellschaft mit beschrankter Haftung
Inventors:
Johann Chatzipetros, Bernhard Dujka, Frank Elf, Georg Will
Abstract: A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.
Type:
Grant
Filed:
April 23, 1985
Date of Patent:
February 3, 1987
Assignee:
The United States of America as represented by the United States Department of Energy
Abstract: In an X-ray analysis apparatus, a moving mechanism is provided by a main guide member along which a main slide device can be displaced. Rotatably connected with the main slide device is a detector guide member along which a detection slide device is displaced. The main slide device, as well as the detection slide device, and an axis of rotation relative to an end of the main guide member are connected to a common central axis by respective arms which can be mutually rotated with them. The main slide device and the detection slide device can each be equipped with a drive motor where the motor for the main slide device is preferably driven first, and the motor for the detector slide device is driven by signals derived from displacing the main slide device.
Type:
Grant
Filed:
March 12, 1984
Date of Patent:
January 13, 1987
Assignee:
Technische Hogeschool Eindhoven
Inventors:
Peter Brinkgreve, Diederik C. Koningsberger
Abstract: An X-ray diffraction camera which rotates a sample about two generally normal axes while simultaneously rotating the sample about a third axis which changes in angular relationship relative to the two normal axes, said camera further providing linear reciprocation of the sample along said third axis.
Abstract: In an X-ray analysis apparatus, there is provided between a test specimen (5) or an analyzing crystal and a detector (9) a stray radiation slit (15) that can be adjusted in dependence on the goniometer angle. By an optimum adjustment of this slit in correspondence with the variation in the goniometer angle it can be achieved that the detector will always see the same portion of the surface of the test sample or analyzing crystal. Especially, the adjustment of the slit is coupled to the adjustment of an automatic divergence slit (11) so that the portion of the surface which is irradiated, remains unaltered. Especially for small goniometer angles, that is to say for the analysis of a substance in which there is a large distance between crystal planes, a considerably improved signal-to-noise ratio in the measurement signal is thus obtained.
Abstract: An X-ray goniometer is provided which comprises, a pair of wooden endplates held in a parallel, adjustably spaced relationship by a plurality of connecting dowel rods, a rotatable support mounted to each endplate, each support being rotatable about a common axis perpendicular to the endplates, for supporting each end of the specimen, and means to position the supports in any given angular orientation about the axis. Means may be included to adjust the spacing between endplates and between each support and the axis.
Type:
Grant
Filed:
December 9, 1982
Date of Patent:
August 6, 1985
Assignee:
The United States of America as represented by the Secretary of the Air Force
Abstract: An X-ray diffraction camera having a hypocycloidal gear train adapted to cause rotation of the sample within the camera about two generally normal axes.
Abstract: An apparatus and method for precisely measuring the angles of cut of single nd doubly rotated cuts of quartz crystal blanks on a high volume production basis.
Type:
Grant
Filed:
August 3, 1981
Date of Patent:
October 25, 1983
Assignee:
The United States of America as represented by the Secretary of the Army
Inventors:
S. Thomas Workman, John L. Chambers, Myron A. Pugh, Roger W. Ward
Abstract: A monochromator for use with synchrotron x-ray radiation comprises two diffraction means which can be rotated independently and independent means for translationally moving one diffraction means with respect to the other. The independence of the rotational and translational motions allows Bragg angles from 3.5.degree. to 86.5.degree., and facilitates precise and high-resolution monochromatization over a wide energy range. The diffraction means are removably mounted so as to be readily interchangeable, which allows the monochromator to be used for both non-dispersive and low dispersive work.
Type:
Grant
Filed:
April 23, 1986
Date of Patent:
July 7, 1987
Assignee:
The United States of America as represented by the United States Department of Energy
Inventors:
Jean-Louis Staudenmann, Gerald L. Liedl