Abstract: An inspection system using penetrating radiation wherein pixels corresponding to transmitted radiation which has been attenuated to at least a predetermined level are displayed in a first color. Pixels which correspond to radiation which has been backscattered to a least predetermined level are displayed in a second color, and pixels which correspond to the remainder of the transmitted radiation are displayed in a third color. Additionally, the brightness of the color of each pixel is controlled in dependence on how far above or below the predetermined level the detected transmitted or scattered signal is.
Abstract: A total reflection X-ray fluorescence apparatus comprises a base material having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector such as an SSD for detecting fluorescent X-rays emerging from a specimen located near the optically flat surface of the base material and a second detector such as a scintillation counter for detecting an intensity of an X-rays coming from the base material.
Type:
Grant
Filed:
October 15, 1990
Date of Patent:
September 28, 1993
Assignees:
Sumitomo Electric Industries, Ltd., Technos Co., Ltd.
Abstract: A highly reliable apparatus and method of measuring bone mineral density and bone strength simultaneously is provided. Pleochromatic X-rays emitted from an X-ray tube are incident upon an object to be measured. Transmitted X-rays and diffracted X-rays, generated during the time period when the X-rays are passed through the object, are separately detected to simultaneously measure the bone mineral density and the bone strength.
Abstract: A total reflection X-ray fluorescence apparatus comprises a base material having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector such as an SSD for detecting fluorescent X-rays emerging from a specimen located near the optically flat surface of the base material and a second detector such as a scintillation counter for detecting an intensity of an X-rays coming from the base material.
Abstract: A method for determining the element concentration in electron beam melting is used for the continous measurement during the melting process especially for melting alloys. According to the invention, the X-radiation generated during melting is utilized by concurrently measuring the intensity of the characteristic radiation of the element to be determined and the intensity of another portion of the X-ray spectrum from the same location of the melt. The quotient of both measurands then is a function of the concentration of the element to be determined.
Type:
Grant
Filed:
August 31, 1990
Date of Patent:
October 15, 1991
Assignee:
Bakish Materials Corporation
Inventors:
Alexander von Ardenne, Eckehard Madler, Bernd Wehner, Kurt Richter, Nicolas Schiller, Josef Tobisch, Gunter Hahnel
Abstract: A method of measuring a coating thickness applied on a target of constant base material, such coating containing a non-radioactive labelling material having an atomic number higher than 20.
Abstract: The present invention provides an apparatus and method for dynamically measuring the density of soil, asphaltic material and the like during the compaction of the material. The gauge includes a nuclear radiation source and a nuclear radiation detector means which are mounted in spaced relation from the surface of the test material to form an air gap therebetween. The gauge also includes means for measuring the size of the air gap between the test material and the source and detector system, and means to compensate for the effect of the size of the air gap to thereby obtain the density of the test material.
Abstract: A system and related method are provided for radiographically inspecting an object, located in a radiation path at an inspecting location, using backscattered radiation to obtain a radiographic representation of the object. Radiation, from a source, is transmitted to the selected location. A portion of the transmitted radiation passes through the object and is backscattered by an illuminator to a radiation detecting device. Another portion of the transmitted radiation interacts with and is backscattered by the object to the detecting device. The detecting device generates response signals in response to both portions of the backscattered radiation. The response signals are used to obtain the radiographic representation of the object.
Abstract: An x-ray scanner for detecting plastic articles has an x-ray source which generates a fan-shaped x-ray beam through which an article to be examined is moved. A primary radiation detector array is disposed at a side of the article opposite to the x-ray source and functions to provide a normal x-ray image identifying metal articles. Additional detectors, which detect scatter radiation are disposed around the examination space at a distance from the primary radiation detector. The scatter radiation detectors detect scattered radiation characteristic of that produced by plastic articles. Signals from the scatter radiation detectors are processed, by which the presence of a plastic article can be identified.
Abstract: An article inspection system has separate detectors for primary radiation and scattered radiation which are generated by an article upon being irradiated with X-radiation. The scattered radiation detector is disposed so that no primary radiation is incident thereon. The primary radiation detector is scanned at a frequency to produce a primary radiation image. The scattered radiation incoming to the scattered radiation detector is modulated at a frequency synchronized with the scanning frequency for the primary radiation detector, so that only scattered radiation is incident on the scattered radiation detector which emanates from the region of the article which is currently being scanned for primary radiation.
Abstract: The invention relates to a method of determining the Compton profile of an object to be examined which is situated in an examination zone. The examination zone is irradiated by a monochromatic primary beam whose energy is chosen so that the attenuation of the primary radiation is due essentially only to the Compton Scattering. The scattered radiation is measured in an energy resolving manner and therefrom, as well as from the attenuation in the primary beam, the Compton profiles for the individual pixels in the examination zone are determined.
Abstract: An apparatus for measuring the thickness of a sheet of metal by irradiating the sheet with x-rays. The intensity of the initial x-rays, the transmitted x-rays, and the backscattered x-rays are detected and the detector signals are processed to produce a signal representing the thickness of the metal sheet.
Abstract: A procedure and means for non-destructively measuring the distribution of the filler and/or coating materials in the thickness direction of paper or cardboard. Radiation from a radio-isotope source is used to excite in the material component its characteristic X-ray radiation, the intensity of this radiation being observed. Measurements are made on both sides of the paper and the contents of other filler components are also determined by X-ray absorption in order to eliminate the effects of these components disturbing the distribution measurement. The base weight of the paper is measured e.g. by beta radiation absorption. Measurements are made both by measuring the characteristic radiation of the material components excited in the paper with different radiator sources and with the aid of absorption measurements of radiation directly from the source or produced with its aid in transformation targets, thus eliminating the effects of these components.
Abstract: A procedure and means for non-destructive measuring of the distribution in the thickness direction of the filler and/or coating materials in paper or cardboard. Radiation emitted by an x-ray tube is used to excite in the material component to be examined, its characteristic x-ray radiation, the intensity of this radiation being observed. Measurements are made on both sides of the specimen. The contents of other filler components are also determined by x-ray absorption measurements, and the base weight of the paper, e.g. by beta radiation absorption. Measurements of the characteristic radiation, elicited with constant energy x-ray radiation as well as absorption measurements of radiation obtained directly from the x-ray tube and of radiation produced in transformation targets are made in order to eliminate by calculation the disturbing interaction of the filler components.