Length, Distance, Or Thickness Patents (Class 702/97)
  • Patent number: 6778926
    Abstract: Methods and apparatus for calibrating volume measurement in a plethysmographic chamber are described. The present invention involves the use of a calibration volume chamber of known volume coupled to a plethysmographic measurement chamber in a plethysmographic measurement system for determining body composition, wherein a computer system calibrates the measurement system prior to conducting a volume measurement of a test subject, by measuring the chamber volume before and after opening an electronically controlled valve that connects the controlled calibration volume to the plethysmographic chamber, and comparing the measured chamber volumes based on the known reference volume.
    Type: Grant
    Filed: December 31, 2001
    Date of Patent: August 17, 2004
    Assignee: Life Measurement, Inc.
    Inventor: Philip T. Dempster
  • Patent number: 6772620
    Abstract: A metrology process, in accordance with the present invention, measures the dishing of a first feature made of a first material by determining the relative height of the first feature with respect to a second feature, where the first and second features have different dishing rates. The relative height of the first feature with respect to the second feature may be determined by measuring a first relative height of the first feature with respect to a reference location, measuring a second relative height of the second feature with respect to a reference location, and calculating the difference between the first and second relative heights. Alternatively, other methods may be used. The relative height is then correlated with calibration data to determine the amount of dishing of the first feature. The calibration data is generated by first providing a sample substrate with features approximately the same as the substrate to be measured, e.g.
    Type: Grant
    Filed: December 9, 2002
    Date of Patent: August 10, 2004
    Assignee: Nanometrics Incorporated
    Inventor: Jaime Poris
  • Patent number: 6772092
    Abstract: A computer program for correlating coatings' material usage and cost impact with coatings ranges evaluated against an industry Cpk standard. Optimum range values are selected from the process and/or coatings applicators' manufacturer guidelines.
    Type: Grant
    Filed: January 14, 2002
    Date of Patent: August 3, 2004
    Inventor: Stephen N. Gaiski
  • Patent number: 6772078
    Abstract: A length measuring apparatus is provided that combines upper data with lower data and then outputs the composite data. The apparatus monitors taking down or up a digit of upper data or lower data and synchronization of lower data, thus preventing an occurrence of reading error. When an A/D area showing an area of lower data matches with an upper area quadrant showing an area of upper data (R2, R3), the upper count value outputting the upper data is output without any change. When the quadrant (0, 1, 2, 3) of the A/D area does not match with the quadrant (0, 1, 2, 3) of upper area because of an erroneous timing of a digit-taking-up of upper data (R1, R4), +1 or −1 is added to the upper count value. Thus, the continuity of a measured value can be obtained when the scale is being moved.
    Type: Grant
    Filed: October 9, 2002
    Date of Patent: August 3, 2004
    Assignee: Futaba Corporation
    Inventor: Takahisa Uehira
  • Publication number: 20040102919
    Abstract: The invention relates inter alia to a sensor system (50) used for distance calculation. A setpoint selection unit (58) controls an amplifier unit (54) and/or a sensor unit (52) depending on selectable setpoints for a cycle of detection. Contrary to known sensor systems, different detection cycles can be carried out in a very simple manner.
    Type: Application
    Filed: August 8, 2003
    Publication date: May 27, 2004
    Inventors: Matthias Eckel, Juergen Hoetzel
  • Publication number: 20040078163
    Abstract: The invention relates to a device for measuring distances comprising a distance measurer (1) and a stop element (3; 3′; 3″) enabling precise and mechanically stabile fixed installation on any form of top surfaces. Interchangeable stop elements (3; 3′; 3″) are disposed on a distance measurer (1), and embodied on the side thereof which is orientated towards the object to be measured in such a way that exact installation can take place on the surface of the object. Another use of the stop element is that it can comprise a receiving element for securing a distance measurer (1), whereby the distance measurer is pivotally mounted about at least one horizontal rotational axis (12) whilst the distance measurer (1) is in use. The stop element (3″) is formed in such a way that it is possible to adjust the device and subsequently measure different measuring points (C,D) without having to take geometric changes into account as a result of said adjustment.
    Type: Application
    Filed: October 29, 2003
    Publication date: April 22, 2004
    Inventors: Gerhard Bogel, Thomas Boach
  • Patent number: 6725173
    Abstract: The present invention provides a digital signal processing method and system thereof for producing precision platform orientation measurements and local Earth's magnetic measurements by measuring threes axes gravity acceleration digital signals by an acceleration producer, detecting Earth's magnetic field vector measurement by an Earth's magnetic field detector to achieve digital three-axes Earth's magnetic field vector signals, and producing pitch, roll, and heading angles using said three-axes gravity acceleration digital signals and said digital three-axes Earth magnetic field vector signals by a Digital Signal Processor (DSP) chipset.
    Type: Grant
    Filed: September 4, 2001
    Date of Patent: April 20, 2004
    Assignee: American GNC Corporation
    Inventors: Dong An, Ching-Fang Lin
  • Patent number: 6715342
    Abstract: The present invention relates to an apparatus for pneumatic length measurement comprising a pre-nozzle and a measurement nozzle through which the medium used for the measurement is directed onto an impact plate, a first pressure sensor arranged in front of the pre-nozzle, a second pressure sensor arranged between pre-nozzle and measurement nozzle, means for the determination of the distance of the impact plate from the measurement nozzle from the change of the pressure between pre-nozzle and measurement nozzle taking account of the pressure measured by the first pressure sensor and means for the calibration of the apparatus in a given measurement range, wherein, in order to ease the calibration, the calibration means operate with a calibration function which is constructed on the assumption of constancy of the outflow number of the pre-nozzle and of the outflow number of the measurement nozzle.
    Type: Grant
    Filed: November 30, 1999
    Date of Patent: April 6, 2004
    Assignee: Stotz Feinmesstechnik GmbH
    Inventor: Milan Stamenkovic
  • Patent number: 6694276
    Abstract: There is described a method for controlling a navigation device, such as a satellite navigation device like a GPS, GLONASS, GALILEO or other receiver, and a navigation device allowing this control method to be implemented. According to the invention, the operation of the navigation device is adjusted as a function of a measurement of the velocity (v) of the navigation device for the purpose of saving energy. In particular, the operating frequency (fck) of the processing unit (18) with which the navigation device is fitted is adjusted to a plurality of so-called reduced operating frequencies (fck2, fck3, fck4, fck5) lower than the normal operating frequency (fck1) as a function of the value of the velocity measurement (v). The invention is intended in particular to allow a navigation device to be integrated in a portable object of small volume powered by a battery or a rechargeable accumulator, such as a timepiece.
    Type: Grant
    Filed: June 26, 2001
    Date of Patent: February 17, 2004
    Assignee: Asulab SA
    Inventors: Pierre-André Farine, Fanel Piccini, Thien Kim
  • Publication number: 20040015304
    Abstract: The object of the invention is to specify a fill level measurement device, in which a measurement sensor (MS) is connected to a measurement data converter (MW), which is connected to an electrical analytical device (EA), in such a way as to simplify and abbreviate maintenance and repair work. For this purpose, the measurement data converter (MW) contains a first non-volatile memory (S1), and the electronic analytical device (EA) contains a second non-volatile memory (S2). The same parameter data, which are necessary to start and operate the fill level measurement device, are redundantly stored in both memories (S1, S2). When the measurement data converter (MW) is replaced, the data stored in the second memory (S2) of the electronic analytical device (EA) are automatically read into the first memory (S1) of the newly installed measurement data converter (MW).
    Type: Application
    Filed: March 28, 2003
    Publication date: January 22, 2004
    Inventors: Herbert Auber, Martin Mellert, Martin Mosmann, Thomas Oehler
  • Patent number: 6671642
    Abstract: At step 1, a golf ball model is divided into a large number of elements composed of a large number of nodal points in the form of meshes; a physical property of a material for the golf ball is inputted; a simulation is executed by an analysis based on a finite element method, assuming that a golf club head collides with the golf ball; and a strain amount generated in the golf ball model at the time of the collision is computed. At step 2, a stress and a strain component of each element of the golf ball model and coordinate values of the nodal points of each element are outputted; and a value of a stress and a strain of each of six components of each element are computed momently. At step 3, the relationship between the stress and the strain of each component of each element is found from the value of the stress and the strain of each of the six components; and energy loss values of each element are computed.
    Type: Grant
    Filed: June 28, 2002
    Date of Patent: December 30, 2003
    Assignee: Sumitomo Rubber Industries, Ltd.
    Inventors: Kazuyoshi Miyamoto, Masaki Shiraishi
  • Patent number: 6651019
    Abstract: A method and apparatus by which accurate correction values for thermal displacement is calculated even when the rotation of the main spindle is restarted after interruption. The apparatus has means 2, 3 for measuring the temperature near the main spindle 15, means 5 for estimating the thermal displacement of the main spindle 15 on the basis of the measured temperature and a predetermined thermal displacement calculation expression, means 7 for calculating the correction value, and means 6 which estimates the displacement delay in re-rotation caused by the interruption of the rotation of the main spindle 15, and calculates an adjusting displacement on the basis of the estimated displacement delay. The correction value calculating means 7 calculates a correction value on the basis of the thermal displacement estimated by the thermal displacement estimating means 5 alone when the main spindle 15 is started up and rotated.
    Type: Grant
    Filed: September 12, 2001
    Date of Patent: November 18, 2003
    Assignee: Mori Seiki Co., Ltd.
    Inventors: Hiroshi Mizuguchi, Masaaki Yokoyama, Kazutada Hashimoto, Mikio Iwakiri, Munetaka Wakizaka
  • Patent number: 6618689
    Abstract: A method for non-destructively inspecting the wall thickness of a component, where the dimensions of the component or of the component surface are measured, substantially without making any contact, and are described by digital data. In accordance with the present invention, a multiplicity of the component's surface points, which substantially completely describe the component, is automatically calculated in a three-dimensional coordinate system. Starting from each of the surface points, going out in one direction that runs perpendicularly to the surface point into the material, one scans for at least one opposite surface point. The wall thickness of the component at the surface point is ascertained as the distance between the surface point and the at least one opposite surface point. The component is visually displayed and, in the visual display, surface points are highlighted for which the wall thickness falls below and/or exceeds one or more predefined values.
    Type: Grant
    Filed: September 5, 2001
    Date of Patent: September 9, 2003
    Assignee: DaimlerChrysler AG
    Inventors: Ralph Knorpp, Dimitri Vitkin
  • Publication number: 20030125891
    Abstract: Methods and apparatus for calibrating volume measurement in a plethysmographic chamber are described. The present invention involves the use of a calibration volume chamber of known volume coupled to a plethysmographic measurement chamber in a plethysmographic measurement system for determining body composition, wherein a computer system calibrates the measurement system prior to conducting a volume measurement of a test subject, by measuring the chamber volume before and after opening an electronically controlled valve that connects the controlled calibration volume to the plethysmographic chamber, and comparing the measured chamber volumes based on the known reference volume.
    Type: Application
    Filed: December 31, 2001
    Publication date: July 3, 2003
    Inventor: Philip T. Dempster
  • Patent number: 6584428
    Abstract: A position sensor for motor vehicle is described that generates a varying pulse-width-modulated, position-dependent signal as a sensor signal, wherein an overall measuring range of the position sensor is divided into several similar,sequential measuring ranges. The position sensor according to the invention makes it possible to transfer sensor alignment to a receiver(s), so that alignment in or on the position sensor can be inexpensively replaced, without negatively influencing the resolution of the position sensor.
    Type: Grant
    Filed: June 14, 2000
    Date of Patent: June 24, 2003
    Assignee: Hella KG Hueck & Co.
    Inventors: Henning Irle, Norbert Kost, Franz-Josef Schmidt
  • Publication number: 20030110831
    Abstract: The present invention relates to an apparatus for pneumatic length measurement comprising a pre-nozzle and a measurement nozzle through which the medium used for the measurement is directed onto an impact plate, a first pressure sensor arranged in front of the pre-nozzle, a second pressure sensor arranged between pre-nozzle and measurement nozzle, means for the determination of the distance of the impact plate from the measurement nozzle from the change of the pressure between pre-nozzle and measurement nozzle taking account of the pressure measured by the first pressure sensor and means for the calibration of the apparatus in a given measurement range, wherein, in order to ease the calibration, the calibration means operate with a calibration function which is constructed on the assumption of constancy of the outflow number of the pre-nozzle and of the outflow number of the measurement nozzle.
    Type: Application
    Filed: November 30, 1999
    Publication date: June 19, 2003
    Inventor: STAMENKOVIC MILAN
  • Patent number: 6539321
    Abstract: Method for effecting edge bias correction of topography-induced linewidth variations which are encountered in printed or integrated circuits on substrates or semiconductor devices for electronic packages. The method modifies data for current levels which is predicated on prior level data and models, as to the manner in which topography will affect the resist and/or antireflective coating (ARC) thicknesses, so as to improve upon linewidth (LW) control and, in general, imparting improved processing windows. The method can be implemented in the form of computer-executable instructions which are embodied in one or more program modules stored on computer-usable media.
    Type: Grant
    Filed: July 17, 2001
    Date of Patent: March 25, 2003
    Assignee: International Business Machines Corporation
    Inventors: James A. Bruce, Orest Bula, Edward W. Conrad, William C. Leipold
  • Patent number: 6535794
    Abstract: A novel, portable coordinate measuring machine comprises a multijointed (preferably six joints) manually positionable measuring arm for accurately and easily measuring a volume, which in a preferred embodiment, comprises a sphere ranging from six to eight feet in diameter and a measuring accuracy of 2 Sigma +/−0.005 inch. In addition to the measuring arm, the present invention employs a controller (or serial box) which acts as the electronic interface between the arm and a host computer. The coordinate measuring machine of this invention is particularly useful in a novel method of generating an error map and thus correcting and/or programming the tool path for multi-axis machining centers, particularly robots.
    Type: Grant
    Filed: May 3, 1995
    Date of Patent: March 18, 2003
    Assignee: Faro Technologoies Inc.
    Inventor: Simon Raab
  • Patent number: 6532428
    Abstract: The present invention provides for a method and an apparatus for performing automatic calibration of a critical dimension metrology. A process run of semiconductor devices is performed. Critical dimension measurements are performed upon at least one the processed semiconductor device. A calibration adjustment procedure is performed using the critical dimension measurements.
    Type: Grant
    Filed: October 7, 1999
    Date of Patent: March 11, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Anthony J. Toprac
  • Publication number: 20030033114
    Abstract: A method for making a determination of a required separation distance between each of a plurality of potential explosive sites and its associated exposed site. When an actual separation distance is less than the required separation distance mitigation procedures or options are available to resolve a separation distance violation between a potential explosive site and an exposed site.
    Type: Application
    Filed: May 9, 2002
    Publication date: February 13, 2003
    Inventors: Phillip C. Wager, Frank R. Johnson
  • Patent number: 6519542
    Abstract: The present invention provides a method of testing an unknown sample with an analytical tool The method may include calibrating an analytical tool to a calibration standard having a known concentration of an element therein and obtained with a focused beam, thereby to achieve a calibrated analytical tool, determining an unknown concentration of the element within the unknown sample with the calibrated analytical tool, and correcting the unknown concentration with the calibration standard.
    Type: Grant
    Filed: May 9, 2000
    Date of Patent: February 11, 2003
    Assignee: Agere Systems Inc
    Inventors: Lucille A. Giannuzzi, Frederick A. Stevie, Cathrine Vartuli
  • Publication number: 20030018443
    Abstract: Method for effecting edge bias correction of topography-induced linewidth variations which are encountered in printed or integrated circuits on substrates or semiconductor devices for electronic packages. The method modifies data for current levels which is predicated on prior level data and models, as to the manner in which topography will affect the resist and/or antireflective coating (ARC) thicknesses, so as to improve upon linewidth (LW) control and, in general, imparting improved processing windows. The method can be implemented in the form of computer-executable instructions which are embodied in one or more program modules stored on computer-usable media.
    Type: Application
    Filed: July 17, 2001
    Publication date: January 23, 2003
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: James A. Bruce, Orest Bula, Edward W. Conrad, William C. Leipold
  • Patent number: 6505129
    Abstract: A panel tester and grader includes a main frame including a plurality of rollers and defining a substantially S-shaped testing path. A substantially linear bypass path extends below the testing path and a bypass assembly is coupled to the main frame and is operable to move the main frame between a testing position in which panels are received by the testing path, and a bypass position in which panels are received by the bypass path. A load cell providing a load output is coupled to a deflector roller to measure a load applied to the panel by the deflector roller. The load output is monitored as the panels are guided through the panel tester and the load output is selectively recorded based upon the monitored load output.
    Type: Grant
    Filed: April 16, 2002
    Date of Patent: January 7, 2003
    Assignee: Timberco, Inc.
    Inventors: Edward J. Starostovic, Justin M. Janisch
  • Patent number: 6505090
    Abstract: Semiconductor device manufacturing method for processing condition described as function of metrology process name, and performing semiconductor device measurement, generating new processing condition by linking the measurement result with the processing condition, and manufacturing the semiconductor device itself under the new processing condition is provided. Moreover, manufacturing support system for assisting this manufacturing method, a manufacturing system for execution, and further, a recording medium wherein a program and data for executing this manufacturing method are stored are provided.
    Type: Grant
    Filed: December 14, 1999
    Date of Patent: January 7, 2003
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Shoichi Harakawa
  • Publication number: 20020166374
    Abstract: The present invention provides a method for analysing a well completion system, wherein the method includes receiving data representative of physical characteristics of the completion system and calculating a first change in length of a tube string resulting from a helical buckling effect. The method further includes calculating a second change in length of the tube string resulting from a ballooning effect and calculating a third change in length of the tube string resulting from a slackoff force effect. Upon completion of the calculating steps, the method may output predetermined results therefrom.
    Type: Application
    Filed: February 8, 2001
    Publication date: November 14, 2002
    Inventors: Andronikos S. Demarchos, Johnny Dale Fain, Patrick Charles Hyde
  • Patent number: 6463393
    Abstract: A transmitter emits high-frequency modulated optical radiation which is reflected by an object and is received by a measurement receiver. Part of the transmitter radiation is decoupled as reference radiation and guided via a calibration path to a reference receiver whose electrical signals are fed to a frequency mixer. The frequency mixer and avalanche photodiodes acting as measurement receivers of the measuring radiation are interconnected directly via an electrical connection line upon which a mixer frequency acts. As a result thereof, optoelectronic calibration which completely compensates for the temperature-dependent phase shifts of the avalanche photodiodes is possible. Additionally, the phase shifts generated in the reference and receiver signals by the temperature drifts of the transmitter compensate one another. The overall accuracy of the distance measurement can be increased, particularly for short measuring times and immediately after the apparatus has been switched on.
    Type: Grant
    Filed: April 21, 1999
    Date of Patent: October 8, 2002
    Assignee: Leica Geosystems AG
    Inventor: Kurt Giger
  • Publication number: 20020124628
    Abstract: A system and method of calibrating a vehicle odometer (12) includes a controller (18) receiving signals from the odometer (12) indicative of movement of the vehicle (10) and a receiver (26) indicative of distance traveled. The controller (18) obtains information indicative of movement of the vehicle (10) in response to travel at a constant speed. The receiver (26) provides signals indicative of the distance traveled to the controller (18). The controller (18) determines an average number of signals relative to distance and compares the average number to a current number of signals relative to distance. Odometer calibration updates if the average and current number of signals relative to distance differs by a predetermined amount. The number of signals relative to the distance is only recorded when the vehicle (10) is traveling at a constant speed, eliminating aberrant data from odometer calibration. (FIG.
    Type: Application
    Filed: March 8, 2002
    Publication date: September 12, 2002
    Inventors: Steven Paul Price, Todd Alan Biegler
  • Patent number: 6434847
    Abstract: Apparatus and methods for measuring the amount by which the centerline of a shaft disposed in a vessel is offset from the central vertical axis of the vessel, and for measuring the height of such shaft above the inside bottom of the vessel. Apparatus includes a shaft centerline offset measurement device, a shaft height measurement device, and a control/display console. Each measurement device includes a transducer or optical encoder for sensing a displaced position of a biased plunger to which a code strip is mounted. The devices may be combined into a single shaft offset and height measurement device. Improved methods include calculating shaft offset based on a plurality of readings from the transducer, and applying trigonometric relationships. The apparatus and methods are particularly useful in the verification of paddle or basket shafts utilized in dissolution testing stations, so that the dissolution testing protocol complies with government agency guidelines.
    Type: Grant
    Filed: November 2, 1999
    Date of Patent: August 20, 2002
    Assignee: Varian, Inc.
    Inventors: Gregory S. Duckett, C. J. Anthony Fernando, Michael F. Haw
  • Patent number: 6434510
    Abstract: A vehicle mileage tracking system including an input device mounted in the vehicle for receiving one of a first and second door unlock signals, and a vehicle tripmeter. The vehicle tripmeter is coupled to the input device and to a vehicle odometer sensor for accumulating a first accumulated travel distance during vehicle travel following receipt by the input device of the first door unlock signal, and for accumulating a second accumulated travel distance during vehicle travel following receipt by the input device of the second door unlock signal. The tripmeter does not accumulate the first accumulated travel distance during vehicle travel following receipt by the input device of the second door unlock signal. The vehicle mileage tracking system also preferably includes a display coupled to the vehicle tripmeter for selectively displaying the first and second accumulated travel distance. The input device is preferably a receiver for receiving a signal from a remote transmitter.
    Type: Grant
    Filed: July 21, 1999
    Date of Patent: August 13, 2002
    Inventor: Terry S. Callaghan
  • Patent number: 6393370
    Abstract: The invention discloses an evaluation method for the quality of measuring sensors of an autonomous mobile system. To this end, the plurality of sensors per cell that have surveyed this cell when surveying obstacles for producing a cellularly structured environment map are stored and it is identifiably indicated thereto which sensors have classified this cell in which way. For example, a occupied probability and a free probability is [sic] employed for the classification. The measuring quality is determined with reference to the results that the individual sensors have supplied or the respective cell. The extent to which the classifications of the individual sensors confirm one another is evaluated thereto. Sensors whose measured results deviate from a great number of other sensors are classified as faulty.
    Type: Grant
    Filed: April 5, 1999
    Date of Patent: May 21, 2002
    Assignee: Siemens Aktiengesellschaft
    Inventor: Martin Soika
  • Patent number: 6381546
    Abstract: There is provided an improved panel tester and grader which is used for determining the strength and stiffness values for individually tested panels. In one aspect of the present invention, an improvement resides in providing an apparatus and method which more accurately determines when a panel is properly located within a test load zone such that certain measurements regarding the panels characteristics may be properly measured. These variables ultimately contribute to the calculated overall strength and stiffness values. Pairs of opposing rolls are provided to process the panels therebetween along a processing line. The opposing rolls each include a groove extending completely around their outer surfaces. The grooves of the opposing rolls are aligned so as to define respective channels extending between the pairs of opposing rolls. Individual location sensors are positioned relative to the channels to determine where the panels are located along the processing line at any given moment.
    Type: Grant
    Filed: November 2, 1999
    Date of Patent: April 30, 2002
    Assignee: Timberco, Inc.
    Inventor: Edward J. Starostovic
  • Patent number: 6351717
    Abstract: A method for determining measurements of a surface includes determining a trend for a plurality of measurements and determining, for each of at least one of the plurality of measurements, an associated residual between the trend and the measurement and determining, for each of at least one of the associated residuals, an interpolated value for the residual. The method also includes comparing, for each of the at least one associated residuals, the residual to the interpolated value of the residual to determine whether a measurement associated with the residual is anomalous. In response to determining that a measurement associated with the residual is anomalous, the anomalous measurement is discarded. The remaining measurements then represent the surface of interest. The system includes a processor for executing a program of the method. Further, the system includes memory, an input device, and an output device.
    Type: Grant
    Filed: February 1, 2001
    Date of Patent: February 26, 2002
    Assignee: Raytheon Company
    Inventor: Mark A. Lambrecht
  • Publication number: 20020019718
    Abstract: Calibration and resolution-determining apparatus for dial indicators is disclosed. In this apparatus, a dial indicator to be tested is rigidly mounted in an upper frame member, with a plunger of the dial indicator bearing against a movable gage block having upper and lower parallel surfaces. A reference indicator of a higher accuracy than the dial indicator under test is mounted to the frame below the gage block, with a plunger thereof bearing against the lower surface thereof. The gage block is mounted to a distortable structure connected to the frame by living hinges so that distortion of the structure causes the gage block to move, causing corresponding movement of the respective plungers of the dial indicator and reference indicator. A readout of the reference indicator may then be compared to a reading on the dial indicator, allowing determination of accuracy and resolution of the instrument under test.
    Type: Application
    Filed: May 10, 2001
    Publication date: February 14, 2002
    Inventor: Ilmar Luik
  • Patent number: 6324168
    Abstract: The location of a termination in a properly terminated LAN can be remotely detected. The cable's skin effect produces a detectable signature at the sending-end when a step function, for example, reaches the termination. Accordingly, a network analysis device is connected to the network to inject the step function onto the network cabling. The voltage response of the cabling to this is first digitally sampled and then analyzed in a system controller. The system controller reviews the sampled data for an inflection point and then locates the termination by reference to the delay between when the signal was placed on the cable and the detection of the inflection point.
    Type: Grant
    Filed: September 22, 1999
    Date of Patent: November 27, 2001
    Assignee: Vigilant Networks LLC
    Inventor: William M. Richardson
  • Patent number: 6264793
    Abstract: The invention relates to a method and apparatus for measuring the caliper of paper substantially continuously during papermaking. A sensor (3a, 3b) is arranged above and/or under the paper (2), the sensor (3a, 3b) measuring the caliper of the paper (2) at least on one side of the paper (2) mainly without contacting the surface of the paper (2). At given intervals the sensor (3a, 3b) measuring mainly without contact is brought into momentary contact with the surface of the paper (2).
    Type: Grant
    Filed: August 25, 2000
    Date of Patent: July 24, 2001
    Assignee: Metso Paper Automation Oy
    Inventors: Mauri Ojala, Hannu Moisio
  • Patent number: 6243661
    Abstract: A coating thickness gauge is provided with a facility to store one or more zero offset values and to automatically subtract a chosen zero offset value from a measured coating thickness value. The gauge may be used to conveniently determine the thickness of coatings applied to rough surfaces using the zero offset calibration method where the gauge is provided with a key or keys. In order to prevent accidental adjustment of the calibration or any other important operational parameter of the gauge said key or keys must be depressed and held for a predetermined period of time.
    Type: Grant
    Filed: February 12, 1998
    Date of Patent: June 5, 2001
    Assignee: Elcometer Instruments Ltd.
    Inventors: Peter I Baldwin, Brian L Williams
  • Patent number: 6185512
    Abstract: A method for determining measurements of a surface includes determining a trend for a plurality of measurements and determining, for each of at least one of the plurality of measurements, an associated residual between the trend and the measurement and determining, for each of at least one of the associated residuals, an interpolated value for the residual. The method also includes comparing, for each of the at least one associated residuals, the residual to the interpolated value of the residual to determine whether a measurement associated with the residual is anomalous. In response to determining that a measurement associated with the residual is anomalous, the anomalous measurement is discarded. The remaining measurements then represent the surface of interest. The system includes a processor for executing a program of the method. Further, the system includes memory, an input device, and an output device.
    Type: Grant
    Filed: October 13, 1998
    Date of Patent: February 6, 2001
    Assignee: Raytheon Company
    Inventor: Mark A. Lambrecht
  • Patent number: 6148270
    Abstract: A distance measuring device includes first and second cameras, first and second Fourier pattern data generating sections, a pattern processing section, and a distance measuring section. The two cameras are spaced apart from each other by a predetermined distance. The first Fourier pattern data generating section generates first two-dimensional Fourier pattern data by performing two-dimensional discrete Fourier transform for image data picked up by the first camera as first pattern data. The second Fourier pattern data generating section generates second Fourier two-dimensional pattern data by performing two-dimensional discrete Fourier transform for image data picked up by the second camera as second pattern data. The pattern processing section synthesizes the first and second Fourier two-dimensional pattern data, and performs either two-dimensional discrete Fourier transform or two-dimensional discrete inverse Fourier transform for the synthesized data.
    Type: Grant
    Filed: October 30, 1997
    Date of Patent: November 14, 2000
    Assignee: Yamatake-Honeywell Co., Ltd.
    Inventors: Hiroshi Nakajima, Koji Kobayashi
  • Patent number: 6062062
    Abstract: The object of present invention is to provide a sensitivity calibrating method for a detector of a comparator, which enables easy and highly accurate sensitivity calibration for a first and a second detector for measuring opposing position of an object. Heights of two pairs of reference gauge blocks, a first reference gauge block W1 and a second reference gauge block W2, and the second reference gauge block W2 and a third reference gauge block W3 is first measured, and thereafter, sensitivity coefficients for calibrating the sensitivity of an upper detector 10 and a lower detector 20 are calculated by applying the measured value to a predetermined formula. The calculation is repeated three times, and each value is renewed for the upper and the lower detector 10 and 20 respectively.
    Type: Grant
    Filed: June 22, 1998
    Date of Patent: May 16, 2000
    Assignee: Mitutoyo Corporation
    Inventors: Yoichi Toida, Toshiro Horikawa
  • Patent number: 6055488
    Abstract: A device for calculating a correction factor for correcting an output of a rotational velocity detecting device for detecting the rotational velocities of right and left tires mounted on a vehicle. Discrimination between a state where the vehicle is traveling linearly and a state where the vehicle is traveling on a curved path is made on the basis of the output of the rotational velocity detecting device. Only when it is judged that the vehicle is traveling linearly, an initial correction factor for eliminating the effect of a difference in effective rolling radius between the tires, depending on an initial difference on the rotational velocities of the tires, is calculated.
    Type: Grant
    Filed: February 9, 1998
    Date of Patent: April 25, 2000
    Assignees: Sumitomo Electric Industries, Ltd., Sumitomo Rubber Industries, Ltd.
    Inventor: Yoshio Nakajima
  • Patent number: 6052627
    Abstract: An apparatus for detecting a pallet full load state determines a pallet full load state while switching the upper limit value of the mounting height of workpieces according to workpiece size. The cell controller of an apparatus for controlling a sheet metal machining line estimates an occurrence or non-occurrence of a pallet full load state defined as a function of the overall height or the total weight of the workpieces loaded on the carrier pallet by analyzing the machining schedule when a machined workpiece is loaded on the carrier pallet and has a replacing carrier pallet good for the next workpiece to be loaded stand-by whenever appropriate.
    Type: Grant
    Filed: September 10, 1998
    Date of Patent: April 18, 2000
    Inventor: Kaoru Nakamura
  • Patent number: 6048743
    Abstract: A submicron level dimension reference for use with a scanning electron microscope in a semiconductor device fabrication apparatus. The reference has a first insulating layer with a first pattern formed on a semiconductor wafer substrate. A plurality of contacts are formed between the first pattern of the first insulating layer such that the contacts directly communicate the wafer substrate. The contacts are capable of carrying an electrical charge. An electrically conductive layer is formed over the contacts and the first insulating layer. A second insulating layer with a second pattern is formed over the conductive layer. Electrical charges generated by radiating the scanning electron microscope on the submicron level dimension reference are transferred from the first and second insulating layers to the wafer substrate via the conductive layer and the plurality of contacts.
    Type: Grant
    Filed: August 6, 1997
    Date of Patent: April 11, 2000
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kyoung-mo Yang, Sang-kil Lee
  • Patent number: 6032108
    Abstract: A system, a signal bearing medium embodying a program of machine-readable instructions, and a method employing Global Positioning System (GPS) satellites to determine the current pace, the distance traveled and speed of a person, for example a runner, are disclosed. A GPS receiver for receiving signals from GPS satellites is attached to the person. A processor processes the signals received at a plurality of points from sub-sets of GPS satellites to determine the Earth Centered Earth Fixed (ECEF) fix in the x, y, and z planes relative to the center of the earth of each point. The processor detects when the signals are received from a different sub-set of satellites and corrects for the resulting fix error. The processor calculates the relative distance of the segment between the ECEF fixes of each pair of sequentially adjacent points, and adds together the distances of the segments to determine the distance of the path traveled by the person, which is defined by the points.
    Type: Grant
    Filed: July 8, 1998
    Date of Patent: February 29, 2000
    Inventors: Ronald Seiple, R. B. Seiple
  • Patent number: 5966678
    Abstract: A computer software program for replacing drop-out pixels and erroneous re values in the range channel of a laser detection and ranging system with a median pixel value in a moving square window centered about a pixel being processed whenever a co-registered intensity pixel value in the intensity channel falls below an intensity threshold. During the processing of each range pixel of the target, the computer software program will not alter the range value of the pixel if its corresponding intensity pixel has an intensity value above the intensity threshold. When the intensity value of the corresponding intensity pixel is below the threshold, the intensity guided filter replaces the range value with the median value of all the "good" pixels within a moving window the size of a kernel having X and Y dimensions. This results in the intensity guided filter smoothing out noisy pixels in the range channel of while retaining edge pixel values for the image.
    Type: Grant
    Filed: May 18, 1998
    Date of Patent: October 12, 1999
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: Chi-Kin Lam
  • Patent number: 5943639
    Abstract: A displacement detecting apparatus includes an error correcting circuit through which a pair of sine wave signals detected by a detecting head unit are corrected. A signal detecting circuit receives the pair of sine wave signals whose phases are shifted by about 90.degree., and detects a magnitude of one of the two sine wave signal when the other one of the two sine wave signals crosses with a reference voltage level. The error correcting circuit calculates an error correction amount of each sine wave signal according to the detected magnitude of the signal and eliminates the calculated error correction amount from the signals. Therefore, the sine wave signals of position information are accurately corrected in direct-current component, voltage ratio and phase difference.
    Type: Grant
    Filed: October 19, 1995
    Date of Patent: August 24, 1999
    Assignee: Sony Magnescale Inc.
    Inventors: Takashi Tanaka, Masaaki Kusumi
  • Patent number: 5930734
    Abstract: The invention relates to a method for measuring the thickness of non-circular elongated workpieces in which the thickness of the workpiece is measured along three measuring axis, the measurements are fed into a computer to determine minimum and maximum values and associated angular positions of the measuring axis, the measuring systems are rotated to a zero measuring position and the measured thicknesses are correlated by an algorithm, and the computer computes the degree for which angular position of the mimimum and maximum changes when the workpiece is advanced.
    Type: Grant
    Filed: November 4, 1997
    Date of Patent: July 27, 1999
    Assignee: Lap GmbH Laser Applikationen
    Inventors: Karsten Hofmann, Henning Steinfadt
  • Patent number: 5918196
    Abstract: The invention provides a method for visually monitoring the radius of an item which is rotating about a fixed axis and which has a trackable contour known to lie in a plane normal to the rotation, such as a part turned on a lathe. The present invention can also estimate the cross-sectional diameter of a growing crystal, and the height of the cross-section above the melt surface. In addition, the height and radius of the meniscus at the crystal/melt interface can be tracked by the system of the invention. The present makes it possible to further automate crystal growing processes in a manner that increases manufacturing efficiency, consistency, and overall quality. In general, the invention provides a machine vision method for estimating both a longitudinal position and a radius of a circular cross-sectional feature of a solid of revolution.
    Type: Grant
    Filed: November 29, 1996
    Date of Patent: June 29, 1999
    Assignee: Cognex Corporation
    Inventor: Lowell D. Jacobson
  • Patent number: 5913182
    Abstract: A take-up device of an image forming sheet material, in which a plurality of sheet materials used for formation of images is sequentially wound, comprises: a core member formed in the shape of a cylinder and supported rotatably, the core member being provided such that the plurality of sheet materials can be wound around an outer periphery of the core member; an endless belt entrained across a plurality of rollers and moved in a circulating manner in a predetermined direction with an outer periphery of the endless belt contacting by pressure an outer periphery of the core member so as to rotate the core member and the endless belt nipping the sheet material together with the core member to sequentially wind the plurality of sheet materials around the core member; and tension maintaining means for maintaining tension of the endless belt substantially fixedly irrespective of a change of a winding diameter of the sheet material wound around the core member.
    Type: Grant
    Filed: May 28, 1997
    Date of Patent: June 15, 1999
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Yuji Inoue, Yasuhiko Kachi, Toshiya Kojima, Yasuyuki Mochizuki
  • Patent number: 5893050
    Abstract: A method for correcting a thin-film formation program of semiconductor device includes the steps of measuring a thin-film thickness formed by thin-film formation equipment controlled by a thin-film formation program while cooling a wafer on which a thin-film has been formed; transforming the measured thickness into an electrical signal (d.sub.m); transforming a target thickness into a standard electrical signal (d.sub.0); comparing the electrical signal (d.sub.m) with the standard electrical signal (d.sub.0), and outputting a first signal to the thin-film formation equipment if the electrical signal (d.sub.m) is less than the standard electrical signal (d.sub.0) and outputting a second signal to the thin-film formation equipment if the electrical signal (d.sub.m) is greater than the standard electrical signal (d.sub.0). The first signal increases, and the second signal decreases the process variables of thin-film formation program.
    Type: Grant
    Filed: November 8, 1996
    Date of Patent: April 6, 1999
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Byung-suk Park, Ill-hwan Jeoun
  • Patent number: 5878383
    Abstract: The invention relates to automated testing of equipment items of the electronic, electrical, and optical type over a range of environmental conditions. A testing apparatus operates to vary an operating environment of an item of test equipment between a lower extreme and an upper extreme, and iteratively searches each test parameter for a peak response. The peak response is compared with a response limit specified in a customer specification or an international standard. The apparatus assesses a design robustness of the equipment item by comparing a set of measured responses with a maximum range of responses specified in the customer specification or international standard. The apparatus produces a data output for each performance parameter tested, identifying performance parameters which are outside the customer specification, or which have insufficient design robustness.
    Type: Grant
    Filed: October 29, 1996
    Date of Patent: March 2, 1999
    Assignee: Northern Telecom Limited
    Inventor: Malcolm Edward Carter