Abstract: Disclosed is a method for generating psuedo-noise (PN) sequences utilizing a system comprised of a quantizer, and N directly quantized output/input map containing chaotic map cells, each in functional combination with combiner means and an m-bit shift register.

Abstract: Disclosed is the application of a functional equivalent to a spatial filter in ellipsometer and the like systems. Included are demonstrated multi-element converging lens systems which focus an electromagnetic beam onto a fiber optic. The purpose is to eliminate a radially outer annulus of a generally arbitrary intensity profile, so that electromagnetic beam intensity is caused to quickly decay to zero, rather than, for instance, demonstrate an irregular profile as a function of radius.

Abstract: A chain saw which includes chain tensioning and braking systems. Tensioning and braking are caused by the presence and control of longitudinal and lateral slits in an elongated support which provides a continuous chain channel guide in its outer circumference.

Abstract: Disclosed is application of oblique angle of incidence, reflection and/or transmission mode spectroscopic ellipsometry PSI and/or DELTA, (including combinations thereof and/or mathematical equivalents), vs. wavelength data to monitor and/or control fabrication of multiple layer high/low refractive index band-pass, band-reject and varied attenuation vs. wavelength filters, either alone or in combination with transmissive non-ellipsometric electromagnetic beam turning point vs. layer data obtained at an essentially normal angle of incidence.

Abstract: Disclosed are system and method for characterizing a system consisting of a fluid sample on a two sided stage, utilizing data obtained by applying, from both sides thereof, beams of electromagnetic radiation to a fluid coated surface in a containing cell volume. The beams can have the same or different wavelength content and/or polarization state, and can be applied at the same or different magnitude angles-of-incidence, and a third typically unpolarized beam can be applied at a normal angle-of-incidence.

Abstract: Disclosed is the application of spatial filters and beam energy homogenizing systems in ellipsometer and the like systems prior to a sample system. The purpose is to eliminate a radially outer annulus of a generally arbitrary intensity profile, so that electromagnetic beam intensity is caused to quickly decay to zero, rather than, for instance, demonstrate an irregular profile as a function of radius.

Abstract: Disclosed is a system and method providing immediate monitoring of physiological parameters, such as cardiac function, during or after application of electric shock to temporarily incapacitate a subject via at least one electrode ballistically implanted into the subject's skin, including altering of energy characterized parameters based upon said monitored physiological parameters.

Abstract: Disclosed is a system and method for joint source-channel encoding, symbol decoding and error correction, preferably utilizing an arithmetic encoder with operational error detection space; and a combination sequential, and arithmetic, encoded symbol decoder structure.

Abstract: A system and method of providing electrical energy to houses and buildings and the like, which reduces cable length requirements, is disclosed. The system comprises essentially continuously accessible bus duct system and polarized electric receptacle providing baseboard systems in combination. Practice of the method of installation of the present invention requires that only short runs of cabling are required.

Abstract: Disclosed are systems and methods for reducing the adverse effects of particles which become dislodged by scribing and laser machining of materials, which dislodged particles otherwise accumulate on laser machined material surfaces and cause adverse effects.

Abstract: Disclosed is a system for enabling easy sequential setting of different Angles-of-Incidence of a beam of electromagnetic radiation to a surface of a sample system, and to regression based methodology for evaluating and compensating the effects of the presence of electromagnetic beam intercepting angle-of-incidence changing systems, including where desired, parameterization of calibration parameters.

Abstract: Disclosed are spectrophotometer systems and methodology for obtaining data of improved precision therefrom, including replacement of data determined to be suspect based on comparison of multiple baselines.

Abstract: Disclosed is a spectroscopic Ellipsometer having pseudo-achromatic compensator(s) having fast axes which vary with wavelength and which provide, a range of retardations, (that is, maximum retardance minus minimum retardance), of less than 90 degrees over a range of wavelengths, said range of retardations being bounded by a minimum of preferably at least 30 degrees, to a maximum of less than 135 degrees. Calibration is achieved by a Mathematical Regression based technique involving, where desirable, Parameterization of Calibration Parameters. Various Dimensional Data Set(s) obtained with the Spectroscopic Ellipsometer configured in a Sample, present” or in a Straight-through” configuration, are variously normalized to D.C., A.C. or combination D.C. and A.C. components. Sample analysis using a detector provided intensity signal simultaneously comprising 2&ohgr; and 4&ohgr; signals simultaneously, and use of un-normalized A.C. and/or D.C. signals in reflectance monitoring are also disclosed.

Abstract: A method of precisely determining velocity of propagation and the location of a fault on an electric transmission line, using a system of high frequency transmitter and receiver combinations to monitor and detect high frequency bursts produced by the transmitters and by faults, including memory and analysis capability to store and analyze high frequency data before and after a detected fault.

Abstract: Disclosed are multi-element lenses which demonstrate reduced achromatic focal length and reduced electromagentic beam spot size dispersal effects in ellipsometer and polarimeter systems. Also disclosed is methodology for evaluating parameters in parameterized equations which enables calculating retardance entered to, or between, orthogonal components in a beam of electromagnetic radiation which is caused to pass through input and/or output optical elements and interact with a material system, by each of the input and output optical elements, substantially uncorrelated with retardation entered by the material system.

Abstract: A method of evaluating mathematical model parameters which describe directions and magnitudes of real and imaginary components of orthogonally related Kramers-Kroenig consistent dielectric functions or complex refractive indicies in an optically thick material system which presents with an optical axis oriented either in-plane or out-of-plane, with respect to an alignment surface of the optically thick material system. The method is particularly applicable to investigation of optically thick material systems which are uniaxial or biaxial using IR range wavelengths.

Abstract: Disclosed is an odd bounce image rotating system with a sequence of an odd number of reflecting elements, such that a polarized electromagnetic beam caused to enter, reflectively interacts with the odd number of reflecting elements and exits along an essentially non-deviated, non-displaced locus, but with an azimuthally rotated polarization state. Application to, and methodology of application to set azimuthal angles of polarization in spectroscopic ellipsometer, polarimeter and the like systems is also disclosed.

Abstract: A modified suspension bridge which comprises a continuous cable in which tension is developed by operation of turnbuckles or the like, instead of hanging weights.

Abstract: A chain saw chain braking system, positioned in a continuous channel guide through which chain linking elements slide freely during use, unless the slidability is impeded by its operation.

Abstract: Disclosed is methodology for determination of parameters which characterize parameters such as thickness, color or quality of films deposited onto objects of arbitrary shapes, utilizing spectroscopic ellipsometry applied to standard shaped objects.