Abstract: A shredder feeder has a first receiving post configured to receive a roll of first material, second and third receiving posts respectively configured to receive first and second rolls of second material, and a pair of guideposts that form an outlet of the shredder feeder therebetween. The respective guideposts are positioned to respectively direct the second material from the first and second rolls toward the first material from the roll of first material so that the first material is interposed between the second material from the first roll of second material and the second material from the second roll of second material when the first material and the second materials from the first and second rolls of second material pass concurrently through the outlet.

Abstract: An assembly for thickening hair has a first adhesive tape, apt to be reversibly adhered on hair, having an adhesive face onto which there are arranged connecting elements of hair extensions of a first plurality of the hair extensions at their respective distal end, and a second adhesive tape, apt to be reversibly adhered on hair, having an adhesive face onto which there are arranged connecting elements of hair extensions of a second plurality of the hair extensions at their respective distal end, the tapes having positioning elements such that the connecting elements of the extensions of said first and second plurality of the hair extensions overlap when the positioning elements are in turn overlapped.

Abstract: Methods for programming a memory array, memory devices, and memory systems are disclosed. In one such method, the target reliability of the data to be programmed is determined. The relative reliability of different groups of memory cells of the memory array is determined. The data is programmed into the group of memory cells of the array having a relative reliability corresponding to the target reliability.

Abstract: Methods for segmented programming, program verify, and memory devices are disclosed. One such method for programming includes biasing memory cells with a programming voltage and program verifying the memory cells with a plurality of ramped voltage signal segments, wherein each ramped voltage signal segment has a different start voltage and a different end voltage than the other ramped voltage signal segments.

Abstract: Memory devices and methods of programming memory cells including selecting a voltage to apply to a control gate of the memory cell during programming of a data value of a sense amplifier to the memory cell in response to at least a data value contained in a data latch that is in communication with the sense amplifier.

Abstract: A PCRAM cell has a high resistivity bottom electrode cap to provide partial heating near the interface between the cell and the bottom electrode, preventing separation of the amorphous GST region from the bottom electrode, and reducing the programming current requirements.

Abstract: A method of forming a memory array includes forming first and second strings of serially-coupled memory cells respectively on first and second sides of a conductive pillar. Forming the first string of memory cells includes forming a first control gate on the first side of the conductive pillar and interposing a first charge trap between the first side of the conductive pillar and the first control gate. Forming the second string of memory cells comprises forming a second control gate on the second side of the conductive pillar and interposing a second charge trap between the second side of the conductive pillar and the second control gate. The first and second charge traps are electrically isolated from each other, and the first and second control gates are electrically isolated from each other.

Abstract: A system and methods for controlling operation of hydraulic cylinders includes monitoring position of the cylinders relative to one another, and correction of misalignment of the cylinders should they become misaligned. Further, monitoring can be of a swing-type door operated using the cylinders, which can operate the door at different speeds. Further, as the door creeps open from a closed position or closed from an open position, correction is also made.

Abstract: A method for programming that biases a selected word line with a programming voltage. An unselected word line on the source side and an unselected word line on the drain side of the selected word line are biased at a pass voltage that is less than the normal pass voltage. These unselected word lines are both located a predetermined distance from the selected word line. The remaining word lines are biased at the normal pass voltage.

Abstract: Methods for data recovery and memory systems are provided. According to at least one such method, when defective data is read from a memory location, the data is recovered by an XOR operation on the remaining good data and associated RAID data to reconstruct the defective data. The defective data is excluded from the XOR operation.

Abstract: A fast data access circuit that has both a standard clock mode and a fast data access mode. The mode is selectable through a mode/configuration register. A configuration word loaded into the register has bits to indicate the desired mode and the input clock frequency. In the fast data access mode, a clock delay circuit uses the clock frequency setting bits to select a delay to be added to the input clock. The higher the clock frequency, the less the added delay. The delayed clock generates FIFO control signals to control a data FIFO register. During the fast data access mode, the data is output from the data FIFO register at a faster rate than in the standard clock mode.

Abstract: A non-volatile memory data address translation scheme is described that utilizes a hierarchal address translation system that is stored in the non-volatile memory itself. Embodiments of the present invention utilize a hierarchal address data and translation system wherein the address translation data entries are stored in one or more data structures/tables in the hierarchy, one or more of which can be updated in-place multiple times without having to overwrite data. This hierarchal address translation data structure and multiple update of data entries in the individual tables/data structures allow the hierarchal address translation data structure to be efficiently stored in a non-volatile memory array without markedly inducing write fatigue or adversely affecting the lifetime of the part. The hierarchal address translation of embodiments of the present invention also allow for an address translation layer that does not have to be resident in system RAM for operation.

Abstract: A device has a controller and a function module configured to be in communication with the controller as a result of the controller receiving a pass-through vendor specific command. In some embodiments, the controller is configured to receive the pass-through vendor specific command from an application software module of a host through an interface that is configured in accordance with a standard that does not allow communication to occur between the controller and the function module.

Abstract: In one or more embodiments, a memory device is disclosed as having an adjustable programming window having a plurality of programmable levels. The programming window is moved to compensate for changes in reliable program and erase thresholds achievable as the memory device experiences factors such as erase/program cycles that change the program window. The initial programming window is determined prior to an initial erase/program cycle. The programming levels are then moved as the programming window changes, such that the plurality of programmable levels still remain within the program window and are tracked with the program window changes.

Abstract: Methods of forming memory and memory devices are disclosed, such as a memory device having a memory cell with a floating gate formed from a first conductor, a control gate formed from a second conductor, and a dielectric interposed between the floating gate and the control gate. For example, a select gate may be coupled in series with the memory cell and has a first control gate portion formed from the first conductor and a second control gate portion formed from a third conductor. A contact may be formed from the third conductor and coupled in series with the select gate. Other methods and devices are also disclosed.

Abstract: A controller circuit is coupled to a memory device over a data/IO bus and a control bus. The controller circuit generates a read enable signal that is transmitted to the memory device to instruct the memory device to drive data onto the data/IO bus. The read enable signal is fed back to the controller circuit that then uses the fed back signal to read the data from the data/IO bus.

Abstract: Methods for programming, memory devices, and memory systems are disclosed. In one such method for programming, a target memory cell is partially programmed to a final target programmed state where the partial programming is verified by applying a ramped voltage having a first voltage range (e.g., where the first voltage range is selected in response to program coupling effects from memory cells adjacent to the target memory cell.) A programming operation following the partial programming operation is performed on one or more adjacent memory cells which is then followed by additional programming of the target memory cell to adjust the memory cell from the partially programmed state to the final programmed state. A ramped voltage having a second voltage range different from the first voltage range is utilized to verify the programming of the target memory cell to the final programmed state.

Abstract: Methods for sensing, memory devices, and memory systems are disclosed. In one such memory device, a local sense circuit provides sensing of an upper group of memory cells while a global sense circuit provides sensing of a lower group of memory cells. Data sensed by the local sense circuit is transferred to the global sense circuit over local data lines or a global transfer line that is multiplexed to the local data lines. An alternate embodiment uses the local sense circuit to sense both upper and lower groups of memory cells.

Abstract: In one embodiment of the present invention, a memory device is disclosed to include memory organized into blocks, each block having a status associated therewith and all of the blocks of the nonvolatile memory having collectively a capacity status associated therewith and a display for showing the capacity status even when no power is being applied to the display.

Abstract: A NAND architecture non-volatile memory voltage sensing data read/verify process and sense amplifier has been described that senses data in floating gate or floating node field effect transistor memory cells using a voltage sensing data read/verify process. The voltage sensing process utilized a reference NAND string and reference memory cell that is coupled to a reference bit line. A voltage is precharged onto a bit line to be read and an associated reference bit line. The bit line is then coupled to a NAND string and selected memory cell while the reference bit line is coupled to a reference NAND string and selected reference memory cell. The relative voltage level of the bit line and reference bit line are then set by the relative currents flowing through the coupled NAND string and reference NAND string, and the voltage differential read by a coupled voltage sense amplifier.