Patents Represented by Attorney Stallman & Pollock LLP
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Patent number: 7328609Abstract: A wireless tire pressure sensing system based upon a Schrader valve design is provided. The system includes a valve body, a valve pin and a compression element for sealing engaging the valve body and the valve pin to maintain tire pressure. A pressure sensing device mounted within the valve body and connected to valve pin senses the pressure within the tire and provides its signal to the valve pin. The valve pin is adapted as a component of an antenna that transmits a wireless pressure signal to a remote receiver/transmitter mounted on the vehicle. The receiver/transmitter transmits a corresponding signal to a vehicle control system that generates a warning signal when the tire pressure is below a threshold safety value.Type: GrantFiled: October 29, 2004Date of Patent: February 12, 2008Assignee: National Semiconductor CorporationInventors: Peter J. Hopper, Michael Mian, Kyuwoon Hwang, Robert Drury
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Patent number: 7330260Abstract: The repeatability of wafer uniformity measurements can be increased by taking spatially averaged measurements of wafer response. By increasing the time over which measurements are obtained, the amount of noise can be significantly reduced, thereby improving the repeatability of the measurements. These measurements can be taken at several locations on the wafer to ensure wafer uniformity. In order to get a stable and repeatable assessment of the wafer process, addressing uncertainties related to damage relaxation or incomplete anneal, an anneal decay factor (ADF) characterization can be performed at a distance away from the TW measurement boxes. From the ADF measurement and the spatially averaged measurements of wafer response, a repeatable assessment of the wafer process can be obtained.Type: GrantFiled: February 28, 2005Date of Patent: February 12, 2008Assignee: KLA-Tencor CorporationInventors: Lena Nicolaides, Mira Bakshi, Alex Salnik, Jon Opsal
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Patent number: 7330270Abstract: One embodiment of the present invention is a method for suppressing artifacts in frequency-domain OCT images, which method includes (a) providing sample and reference paths with a significant difference in their chromatic dispersion (b) correcting for the effects of the mismatch in chromatic dispersion, for the purpose of making artifacts in the OCT image readily distinguishable from the desired image.Type: GrantFiled: January 19, 2006Date of Patent: February 12, 2008Assignee: Carl Zeiss Meditec, Inc.Inventors: Keith E. O'Hara, Martin Hacker
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Patent number: 7326199Abstract: A system and method for providing light treatments to a patients skin, which could include both dermal and epidermal regions. The system and method utilize multiple hand pieces where each hand piece can deliver light from a different light source. The system and method provide for control over the different light source corresponding to the different hand pieces based on whether the hand pieces are held in storage positions in a hand piece management unit. A control unit of the system provides operates to cause a user interface display to communicate information to a user based on the positions of the different hand pieces. Further, the system and method can provide a user with access to different aspects of the systems operation based on the positions of the hand pieces.Type: GrantFiled: February 27, 2004Date of Patent: February 5, 2008Assignee: Cutera, Inc.Inventors: Dean A. MacFarland, Richard Canant, David A. Gollnick, Greg Spooner, Kevin P. Connors
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Patent number: 7327769Abstract: A CO2 laser reference oscillator (RO) can provide injection seeding to a Q-switched (QS) or Q-switched cavity dumped (QSCD) CO2 laser, where the output frequency of the RO laser is locked to the peak of the laser line by the use of appropriate electronics to dither one of the resonator mirrors of the reference oscillator. This injected radiation seeds the radiation building up within the Q-switched laser cavity, such that the oscillating frequency favors the wavelength of the injected radiation. An electronic feedback control circuit can be used to lock an axial mode of the Q-switched laser to line center. The change in build-up time of the pulses within the QS laser can be used to maintain cavity length at a value that enables oscillating at the peak of the same laser line that is injected into QS laser.Type: GrantFiled: October 3, 2006Date of Patent: February 5, 2008Assignee: Coherent, Inc.Inventors: Robert Henschke, Joel Fontanella, Anthony J. DeMaria
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Patent number: 7327518Abstract: A method for attenuating an unpolarized laser beam includes separating the laser beam into two plane-polarized beams. The plane-polarized beams are polarization rotated. Each of the polarization-rotated beams is separated into two plane-polarized portions. One of the portions of one polarization-rotated beam is combined with one of the portions of the other polarization-rotated beam to provide an attenuated output-beam.Type: GrantFiled: May 14, 2007Date of Patent: February 5, 2008Assignee: Coherent, Inc.Inventors: Norman Hodgson, H. Yang Pang
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Patent number: 7323670Abstract: The performance of a laser scanner is optimized in the field by automatically determining appropriate laser parameters for the scan location. A laser control system uses information such as the environmental temperature to select an appropriate range of start points for various laser parameters, such as pump temperature and laser currents. Test pulses over that range can be used to determine optimal operating parameters. In order to also meet safety regulations, the laser control system can use information such as range and pulse timing information to fire regularly spaced pulses that do not exceed acceptable exposure limits. Alternatively, the laser can be operated at a regular speed of about 24 Hz, or can be operated in burst mode where a burst of pulses creates what appears to be a brighter scan spot, but the time delay between bursts allows time for a blink reflex.Type: GrantFiled: March 16, 2005Date of Patent: January 29, 2008Assignee: Leica Geosystems HDS LLCInventors: Gregory C. Walsh, Ralph Storz, Alan Aindow
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Patent number: 7321427Abstract: An ellipsometric apparatus provides two impinging focused probe beams directed to reflect off the sample along two mutually distinct and preferably substantially perpendicular directions. A rotating stage rotates sections of the wafer into the travel area defined by two linear axes of two perpendicularly oriented linear stages. As a result, an entire wafer is accessed for measurement with the linear stages having a travel range of only half the wafer diameter. The reduced linear travel results in a small travel envelope occupied by the wafer and, consequently, a small footprint of the apparatus. The use of two perpendicularly directed probe beams permits measurement of periodic structures along a preferred direction while permitting the use of a reduced motion stage.Type: GrantFiled: October 10, 2006Date of Patent: January 22, 2008Assignee: Tokyo Electron LimitedInventors: Martin Ebert, Li Chen
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Patent number: 7313506Abstract: A laser scanning system can be used in construction projects to generate a field survey. An architect or engineer can use the field survey to create construction drawings. In addition, relevant points from the construction drawings can be identified at the construction site with the scanning system. Further, earth moving equipment can be controlled using the same information. The laser scanning system can be used to determine if two parts can be mated together by scanning and comparing the parts that are to be mated. The laser scanning system can further be used to determine if an object can be moved through an opening in a structure by comparing scan points of the structure with scan points from the object. The laser scanning system can be used to identify objects within the site, to build databases that have relevant information about the objects, and to guide reproducing machines.Type: GrantFiled: July 2, 2004Date of Patent: December 25, 2007Assignee: Leica Geosystems HDS, Inc.Inventors: Ben K. Kacyra, Jerry Dimsdale, Christopher Robin Thewalt
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Patent number: 7308013Abstract: A Master Oscillator (MO)—Power Amplifier (PA) configuration (MOPA) can be used advantageously in an excimer laser system for micro-lithography applications, where semiconductor manufacturers demand powers of 40 W or more in order to support the throughput requirements of advanced lithography scanner systems. The timing of discharges in discharge chambers of the MO and PA can be precisely controlled using a common pulser to drive the respective chambers. The timing of the discharges further can be controlled through the timing of the pre-ionization in the chambers, or through control of the reset current in the final compression stages of the pulser. A common pulser, or separate pulser circuits, also can be actively controlled in time using a feedback loop, with precision timing being achieved through control of the pre-ionization in each individual discharge chamber. Yet another system provides for real-time compensation of time delay jitter of discharge pulses in the chambers.Type: GrantFiled: November 3, 2003Date of Patent: December 11, 2007Assignee: Lambda Physik AGInventors: Dirk Basting, Sergei Govorkov, Rainer Paetzel, Igor Bragin, Andreas Targsdorf
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Patent number: 7304735Abstract: An optical filter for the selective attenuation of specific wavelengths of light includes at least one spectrally dispersive element, such as a diffraction grating or prism, in combination with an optical filter. A dispersive element separates broadband light into a constituent wavelength spread in angle space. An optical filter, or filter array, can block and/or attenuate specific wavelengths or wavelength ranges of interest while the light is angularly dispersed. A second dispersive element can recombine this filtered, separated wavelength fan of light into a coaxial broadband beam having a smoother intensity profile than the unfiltered beam.Type: GrantFiled: April 1, 2005Date of Patent: December 4, 2007Assignee: KLA-Tencor TechnologiesInventors: David Y. Wang, James L. Hendrix, Adam E. Norton
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Patent number: 7301644Abstract: A system, method and apparatus for anatomical mapping utilizing optical coherence tomography. In the present invention, 3-dimensional fundus intensity imagery can be acquired from a scanning of light back-reflected from an eye. The scanning can include spectral domain scanning, as an example. A fundus intensity image can be acquired in real-time. The 3-dimensional data set can be reduced to generate an anatomical mapping, such as an edema mapping and a thickness mapping. Optionally, a partial fundus intensity image can be produced from the scanning of the eye to generate an en face view of the retinal structure of the eye without first requiring a full segmentation of the 3-D data set. Advantageously, the system, method and apparatus of the present invention can provide quantitative three-dimensional information about the spatial location and extent of macular edema and other pathologies.Type: GrantFiled: September 6, 2005Date of Patent: November 27, 2007Assignee: University of MiamiInventors: Robert W. Knighton, Shuliang Jiao, Giovanni Gregori, Carmen A. Puliafito
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Patent number: 7300809Abstract: A multilayer semiconductor laser includes a substrate on which is formed a semiconductor multilayer heterostructure divided into a plurality of electrically pumped regions and an elongated optically pumped region. The electrically pumped regions generate and deliver optical pump radiation laterally into the elongated optically pumped region. Output radiation is generated and delivered by the optically pumped region.Type: GrantFiled: July 29, 2005Date of Patent: November 27, 2007Assignee: Coherent, Inc.Inventors: Serguei G. Anikitchev, Hailong Zhou, R. Russel Austin
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Patent number: 7291140Abstract: The invention comprises a system and method for providing for pulses or relatively low energy light to an area of skin being treated. Typically, these low energy pulses will include shorter wavelength light, and will provided for multiple pulses of light for the area being treated. The pulse width is determined by the characteristics of a storage capacitor and the flashlamp. The overall system design can be relatively simple, and the operation of such a system can allow for operation by relatively inexperienced users. Due to the low energy pulse, it can be necessary to apply a greater overall amount of energy per treatment area relative to other previous systems, but due to the relatively long period of time between pulses the operation is such that risk of injury is significantly reduced relative to prior systems.Type: GrantFiled: March 5, 2004Date of Patent: November 6, 2007Assignee: Cutera, Inc.Inventors: Dean A. MacFarland, Greg J. Spooner, Kevin P. Connors, David A. Gollnick
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Patent number: 7289219Abstract: An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polarized illumination beam at non-normal incidence onto a periodic structure on a sample, can measure optical properties of the periodic structure. An E-O modulator in the illumination path can modulate the polarization. The head optics collect light reflected from the periodic structure and feed that light to a spectrometer for measurement. A beamsplitter in the collection path can ensure both S and P polarization from the sample are separately measured. The measurement head can be mounted for rotation of the plane of incidence to different azimuthal directions relative to the periodic structures. The instrument can be integrated within a wafer process tool in which wafers may be provided at arbitrary orientation.Type: GrantFiled: April 13, 2005Date of Patent: October 30, 2007Assignee: Tokyo Electron LimitedInventors: Adam E. Norton, Abdurrahman Sezginer, Fred E. Stanke
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Patent number: 7289263Abstract: Several examples of double-pass fiber amplifiers including a polarization maintaining (PM) gain-fiber are disclosed. In each example, input and twice-amplified output are separated by an all-fiber, polarization-maintaining polarization splitter combiner. The examples include double-pass fiber amplifiers not including any bulk components and double pass fiber amplifiers including a bulk component or a Faraday rotating mirror located in a position in the amplifier wherein the component is exposed only to radiation amplified on the first pass through the gain-fiber.Type: GrantFiled: August 2, 2006Date of Patent: October 30, 2007Assignee: Coherent, Inc.Inventors: Andrei Starodoumov, Paul Crittenden
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Patent number: 7287855Abstract: A scanning laser polarimetry (SLP) system that measures retinal nerve fiber layer (RNFL) retardance in a single scan image with improved sensitivity. An external bias retarder in combination with the anterior segment retardance forms a nonzero joint retardance adapted to enhance the signal-to-noise ratio (SNR) of the SLP system. With such a simple bias retarder, the effects of anterior segment retardance (?C, ?C) may be removed from a single polarimetric image of the retina without a direct cancellation by a variable corneal compensator (VCC) by the method of this invention. Using a single polarimetric image is particularly advantageous for simplicity and accurate corneal compensation. The simple bias retarder may be embodied as a VCC or any useful external retarder, for example.Type: GrantFiled: May 26, 2004Date of Patent: October 30, 2007Assignee: Carl Zeiss Meditec, Inc.Inventors: Qienyuan Zhou, Xiangrun Huang
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Patent number: 7286283Abstract: Apparatus for optically pumping a clad amplifier fiber includes one or more transmission fibers arranged and configured to insert pump-light from a pump light source such as a diode-laser into the cladding of the amplifier fiber. The pump light propagates through the cladding and a portion of the pump light is absorbed in the doped core of the amplifier fiber. At least one of the transmission fibers is arranged to receive an unabsorbed portion of the propagated pump light from the amplifier cladding and re-insert the unabsorbed portion of the pump-light into the cladding for re-propagation through the cladding. This provides that pump light that would otherwise be wasted is circulated through the amplifier fiber for further absorption by the amplifier core.Type: GrantFiled: March 15, 2006Date of Patent: October 23, 2007Assignee: Coherent, Inc.Inventor: Andrei Starodoumov
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Patent number: 7286227Abstract: A scanning laser polarimetry (SLP) system that measures in vivo retinal nerve fiber layer (RNFL) retardance (?N, ?N) in a single measurement without a variable corneal compensator (VCC). The diagnostic signal is biased so that the detected RNFL retardance orientation angles are sufficiently similar at adjacent pixels in the retinal polarimetric image to permit resolution of the orientation angle ambiguity in a single polarimetric image without repeating the measurement at another signal polarization state. With a simple bias retarder, the effects of anterior segment retardance (?C, ?C) can be removed from a single polarimetric image of the retina without a VCC. Alternatively, from two single polarimetric images obtained at two different bias retarder positions, the anterior segment retardance magnitude ?C and orientation ?C and the RNFL retardance magnitude ?N and orientation ?N can all be determined from the peripapillary RNFL image region alone.Type: GrantFiled: September 30, 2002Date of Patent: October 23, 2007Assignee: Carl Zeiss Meditec, Inc.Inventors: Qienyuan Zhou, Xiangrun Huang
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Patent number: 7283226Abstract: Systems and methods are disclosed for measuring semiconductor wafers in a fabrication process using one or more of a plurality of measurement systems. A measurement system cluster is provided having a plurality of such measurement systems, along with a system for transferring wafers to one or more of the measurement systems according to one or more selection criteria. Measurement systems may be selected for use based on availability and throughput capabilities, whereby overall system throughput and efficiency may be improved within the required accuracy capabilities required for measuring process parameters associated with the wafers.Type: GrantFiled: July 28, 2006Date of Patent: October 16, 2007Assignee: Tokyo Electron LimitedInventor: Talat Fatima Hasan