Abstract: A pre-driver for large I/O pull-up and pull-down transistors is provided so that the I/O pull-up and pull-down transistors do not experience crowbar current, and the pre-driver circuit likewise does not experience crowbar current or require large driver transistors. One pre-driver circuit includes two NAND gates and two NOR gates with delay circuitry provided by two series inverters from a data input to a first node, and two additional series inverters from the first node to a second node. A further pre-driver circuit includes feedback from the pre-driver outputs to ensure its NMOS and PMOS transistors do not turn on together to create crowbar, while allowing faster switching. With the pre-driver circuit embodiments, a conventional level shifter can be used. Further with the pre-driver circuitry, slew rate control can be provided in the pull-up and pull-down driver circuitry, rather than in the pre-driver circuitry.

Abstract: A Built-in Self Test (BIST) system is provided in a Field Programmable Gate Array (FPGA) that can adjust test signal patterns provided for testing after partial reconfiguration of the FPGA. The BIST system includes a decoder that monitors I/O signals and provides an output indicating when I/O signals change indicating partial reconfiguration has occurred. The decoder output is provided to a BIST test signal generator providing signals to an IP core of the FPGA as well as a BIST comparator for monitoring test results to change test signals depending on the partial configuration mode.

Abstract: An FPGA having a programmable frequency output is provided that achieves a (theoretical) M-times reduction in output jitter from a conventional direct digital synthesis (DDS) circuit, by running M accumulator circuits in parallel and combining the outputs in a time-staggered way. I Initially the frequency number N added into the accumulators is varied slightly for each accumulator by multiplying by a number, such as X/16 where X varies from 1 to 16 for each of 16 accumulator circuits. The accumulator circuits are further reconfigured so that the output of a register from a first accumulator provides feedback to the adder input in all of the accumulator circuits. The number of overflowing accumulator registers in a clock cycle will then indicate granularity spatially. To translate spatial granularity to time, a programmable delay circuit is connected to the output of each accumulator register.

Abstract: A pulse width measurement system is provided with components in an FPGA so that pulse widths can be measured that are smaller than the frequency limits of the FPGA system clock. For the measurement, an incoming pulse is fed into the FPGA to many (e.g. 32) I/O inputs in parallel. Each parallel input is then provided to a programmable delay device with each delay configured to a different ascending delay value. The input transition time is then detected by converting the outputs from the delay devices into data indicating the timing information. In one embodiment the outputs of the delay devices address data stored in BRAMs for later processing in the FPGA to determine the timing information.

Abstract: A crossbar switch (50) is implemented in a reconfigurable circuit, such as a FPGA, instantiated with a number of modules (40), the crossbar switch (50) providing communication links between the modules (40). The modules (40) and crossbar switch (50) can be easily updated in a partial reconfiguration process changing only portions of modules (40) and the crossbar switch (50) while other portions remain active. The crossbar switch (50) uses individual wiring to independently connect module outputs and inputs so that asynchronous communications can be used. The crossbar switch (50) can be implemented in different embodiments including a Clos crossbar switch, and a crossbar switch connecting each module output only to a corresponding module input, allowing for a reduction in the amount of FPGA resources required to create the crossbar switches.

Abstract: A PLD includes at least one portion of the programmable interconnect that can be time multiplexed. The time multiplexed interconnect allows signals to be routed on shared interconnect at different times to different destinations, thereby increasing the functionality of the PLD. Multiple sources can use the same interconnect at different times to send signals to their respective destinations. To ensure proper sharing of the interconnect, the sources can include selection devices (such as multiplexers), and the destinations can include capture devices (such as flip-flops), wherein the selection devices and the capture devices are controlled by the same time multiplexing signal. To optimize the time multiplexing interconnect, as much of the same interconnect is shared as possible.

Abstract: Fast logic sharing is created using a feedback path from the output logic macrocell of one functional block to the product term inputs of another function block without going through an advanced interconnect matrix (AIM). The fast feedback path may be provided from the macrocell after the product terms XOR gate without registering, and/or after the register in the macrocell. The fast logic sharing avoids the slow AIM for feedback logic, and allows additional resources to be borrowed from other function blocks with a limited delay penalty. In particular, delay penalties resulting from dividing wide operations requiring multiple product terms between the product terms of multiple functional blocks are significantly reduced.

Abstract: A mechanical support configuration for a probe card of a wafer test system is provided to increase support for a very low flexural strength substrate that supports spring probes. Increased mechanical support is provided by: (1) a frame around the periphery of the substrate having an increased sized horizontal extension over the surface of the substrate; (2) leaf springs with a bend enabling the leaf springs to extend vertically and engage the inner frame closer to the spring probes; (3) an insulating flexible membrane, or load support member machined into the inner frame, to engage the low flexural strength substrate farther away from its edge; (4) a support structure, such as support pins, added to provide support to counteract probe loading near the center of the space transformer substrate; and/or (5) a highly rigid interface tile provided between the probes and a lower flexural strength space transformer substrate.

Abstract: A cooling assembly includes a package with one or more dies cooled by direct cooling. The cooled package includes one or more dies with active electronic components. A coolant port allows a coolant to enter the package and directly cool the active electronic components of the dies.

Abstract: Signal paths within an interconnect structure linking input/output (I/O) ports of an integrated circuit (IC) tester and test points of an IC die on a wafer are tested for continuity, shorts and resistance by using the interconnect structure to access a similar arrangement of test points on a reference wafer. Conductors in the reference wafer interconnect groups of test points. The tester may then test the continuity of signal paths through the interconnect structure by sending test signals between pairs of its ports through those signal paths and the interconnecting conductors within the reference wafer. A parametric test unit within the tester can also determine impedances of the signal paths through the interconnect structure by comparing magnitudes of voltage drops across pairs of its I/O ports to magnitudes of currents it transmits between the I/O port pairs.