Patents Represented by Attorney William C. Cray
  • Patent number: 7476887
    Abstract: Apparatus and methods are disclosed for forming plasma generated EUV light source optical elements, e.g., reflectors comprising MLM stacks employing various binary layer materials and capping layer(s) including single and binary capping layers for utilization in plasma generated EUV light source chambers, particularly where the plasma source material is reactive with one or more of the MLM materials.
    Type: Grant
    Filed: March 19, 2007
    Date of Patent: January 13, 2009
    Assignee: Cymer, Inc.
    Inventors: Norbert R. Bowering, Alexander I. Ershov, Timothy S. Dyer, Hugh R. Grinolds
  • Patent number: 7453077
    Abstract: An EUV light source and method of operating same is disclosed which may comprise: an EUV plasma production chamber comprising a chamber wall comprising an exit opening for the passage of produced EUV light focused to a focus point; a first EUV exit sleeve comprising a terminal end comprising an opening facing the exit opening; a first exit sleeve chamber housing the first exit sleeve and having an EUV light exit opening; a gas supply mechanism supplying gas under a pressure higher than the pressure within the plasma production chamber to the first exit sleeve chamber. The first exit sleeve may be tapered toward the terminal end opening, and may, e.g., be conical in shape comprising a narrowed end at the terminal end.
    Type: Grant
    Filed: December 29, 2005
    Date of Patent: November 18, 2008
    Assignee: Cymer, Inc.
    Inventors: Norbert R. Bowering, Bjorn A. M. Hansson, Rodney D. Simmons
  • Patent number: 7449704
    Abstract: An EUV light source apparatus and method for producing EUV light, which includes a plasma generation chamber for generating EUV plasma; an EUV light collector having a reflective portion irradiated by EUV light produced in the EUV plasma; a target sample having reflective portion comprised of the same materials as the EUV light collector reflective portion; a first EUV detector for detecting EUV light produced in the EUV plasma; and a second EUV detector for detecting EUV light reflected from the target sample.
    Type: Grant
    Filed: December 27, 2006
    Date of Patent: November 11, 2008
    Assignee: Cymer, Inc.
    Inventors: Igor V. Fomenkov, Alexander I. Ershov
  • Patent number: 7449703
    Abstract: An EUV target delivery system and method are disclosed which may comprise: a target material purification system connected to deliver liquid target material comprising: a first container and a second container in fluid contact with the target material reservoir; a filter intermediate the first chamber and the second chamber; a liquid target material agitation mechanism, or at least one purification chamber containing the target material in a form reactive with impurities contained in the inert gas reacting with such impurities and removing from the inert gas the impurities, or providing an evaporation chamber in fluid communication with an impurity chamber and with a target droplet mechanism liquid target material reservoir and containing liquid source material; heating the liquid source material to a first temperature sufficient to evaporate a first set of contaminants; heating the liquid source material to a second temperature sufficient to evaporate lithium.
    Type: Grant
    Filed: February 25, 2005
    Date of Patent: November 11, 2008
    Assignee: Cymer, Inc.
    Inventor: Alexander N. Bykanov
  • Patent number: 7439530
    Abstract: An apparatus and method is disclosed which may comprise a laser produced plasma EUV system which may comprise a drive laser producing a drive laser beam; a drive laser beam first path having a first axis; a drive laser redirecting mechanism transferring the drive laser beam from the first path to a second path, the second path having a second axis; an EUV collector optical element having a centrally located aperture; and a focusing mirror in the second path and positioned within the aperture and focusing the drive laser beam onto a plasma initiation site located along the second axis. The apparatus and method may comprise the drive laser beam is produced by a drive laser having a wavelength such that focusing on an EUV target droplet of less than about 100 ?m at an effective plasma producing energy if not practical in the constraints of the geometries involved utilizing a focusing lens. The drive laser may comprise a CO2 laser. The drive laser redirecting mechanism may comprise a mirror.
    Type: Grant
    Filed: June 29, 2005
    Date of Patent: October 21, 2008
    Assignee: Cymer, Inc.
    Inventors: Alexander I. Ershov, Alexander N. Bykanov, Oleh Khodykin, Igor V. Fomenkov
  • Patent number: 7415056
    Abstract: A gas discharge laser system producing a laser output pulse and a method of operating such a system is disclosed which may comprise a pulse stretcher which may comprise a laser output pulse optical delay initiating optic directing a portion of the laser output pulse along a laser system output pulse optical axis and diverting a portion of the output pulse into an optical delay having an optical delay path and which may comprise a plurality of confocal resonators in series aligned to deliver an output of the optical delay to the laser output pulse optical delay initiating optic; an optical axis alignment mechanism comprising an radial mirror positioning mechanism operable to position the output of the optical delay to the align with the portion of the laser output pulse transmitted along the optical axis of the portion of the laser system output pulse transmitted by the laser output pulse optical delay initiating optic.
    Type: Grant
    Filed: March 31, 2006
    Date of Patent: August 19, 2008
    Assignee: Cymer, Inc.
    Inventors: Palash P. Das, Thomas Hofmann, Gang Lei
  • Patent number: 7411203
    Abstract: An apparatus and method for EUV light production is disclosed which may comprise a laser produced plasma (“LPP”) extreme ultraviolet (“EUV”) light source control system comprising a target delivery system adapted to deliver moving plasma initiation targets and an EUV light collection optic having a ibeus defining a desired plasma initiation site, comprising; a target tracking and feedback system comprising: at least one imaging device providing as an output an image of a target stream track, wherein the target stream track results from the imaging speed of the camera being too slow to image individual plasma formation targets forming the target stream imaged as the target stream track; a stream track error detector detecting an error in the position of the target stream track in at least one axis genemily perpendicular to the target stream track from a desired stream truck intersecting the desired plasma initiation site.
    Type: Grant
    Filed: December 27, 2006
    Date of Patent: August 12, 2008
    Assignee: Cymer, Inc.
    Inventors: Igor V. Fomenkov, Alexander I. Ershov
  • Patent number: 7402825
    Abstract: A laser produced plasma (“LPP”) extreme ultraviolet (“EUV”) light source and method of operating same is disclosed which may comprise an EUV plasma production chamber having a chamber wall; a drive laser entrance window in the chamber wall; a drive laser entrance enclosure intermediate the entrance window and a plasma initiation site within the chamber and comprising an entrance enclosure distal end opening; at least one aperture plate intermediate the distal opening and the entrance window comprising at least one drive laser passage aperture. The at least one aperture plate may comprise at least two aperture plates comprising a first aperture plate and a second aperture plate defining an aperture plate interim space. The at least one drive laser aperture passage may comprise at least two drive laser aperture passages.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: July 22, 2008
    Assignee: Cymer, Inc.
    Inventors: Rodney D. Simmons, John W. Viatella, Jerzy R. Hoffman, R. Kyle Webb, Alexander N. Bykanov, Oleh Khodykin
  • Patent number: 7388220
    Abstract: An apparatus and method for EUV light production is disclosed which may comprise a laser produced plasma (“LPP”) extreme ultraviolet (“EUV”) light source comprising a target delivery system adapted to deliver moving plasma initiation targets and an EUV light collection optic having a focus defining a desired plasma initiation site.
    Type: Grant
    Filed: December 27, 2006
    Date of Patent: June 17, 2008
    Assignee: Cymer, Inc.
    Inventors: Igor V. Fomenkov, Alexander I. Ershov
  • Patent number: 7372056
    Abstract: An EUV light generation system and method is disclosed that may comprise a droplet generator producing plasma source material target droplets traveling toward the vicinity of a plasma source material target irradiation site; a drive laser; a drive laser focusing optical element having a first range of operating center wavelengths; a droplet detection radiation source having a second range of operating center wavelengths; a drive laser steering element comprising a material that is highly reflective within at least some part of the first range of wavelengths and highly transmissive within at least some part of the second range of center wavelengths; a droplet detection radiation aiming mechanism directing the droplet detection radiation through the drive laser steering element and the lens to focus at a selected droplet detection position intermediate the droplet generator and the irradiation site.
    Type: Grant
    Filed: June 29, 2005
    Date of Patent: May 13, 2008
    Assignee: Cymer, Inc.
    Inventors: Alexander N. Bykanov, J. Martin Algots, Oleh Khodykin, Oscar Hemberg
  • Patent number: 7369597
    Abstract: Providing a high peak power short pulse duration gas discharge laser output pulse comprises a pulse stretcher a laser output pulse optical delay initiating optic diverting a portion of the output laser pulse into an optical delay having an optical delay path and comprising a plurality of confocal resonators in series aligned to deliver an output of the optical delay to the laser output pulse optical delay initiating optic. The plurality of confocal resonators comprises four confocal resonators comprising a twelve pass four mirror arrangement. An apparatus and method may comprise a plurality, e.g., two pulse stretchers in series and may include spatial coherency metrology.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: May 6, 2008
    Assignee: Cymer, Inc.
    Inventors: Scot T. Smith, Alexander I. Ershov, Alexei Lukashev
  • Patent number: 7365349
    Abstract: An apparatus and method for cleaning a plasma source material compound from a plasma produced EUV light source collector optic which may comprise reacting the plasma source material compound with hydrogen to form a hydride of the plasma source material from the plasma source material contained in the plasma source material compound on the collector optic. The method may further comprise initiating the reacting by introducing hydrogen into a plasma formation chamber containing the collector optic, and may further comprise removing the hydride from the collector optic, e.g., by cleaning plasma action and/or plasma source material sputtering, or other means as may be determined to be effective. An apparatus and method of extending the useful life of a plasma produced EUV light source collector coating layer may comprise in situ replacement of the material of the coating layer by deposition of the coating layer material onto the coating layer.
    Type: Grant
    Filed: June 27, 2005
    Date of Patent: April 29, 2008
    Assignee: Cymer, Inc.
    Inventors: William N. Partlo, Alexander I. Ershov, Igor V. Fomenkov, Oleh Khodykin
  • Patent number: 7366219
    Abstract: A line narrowing method and module for a narrow band DUV high power high repetition rate gas discharge laser producing output laser light pulse beam pulses in bursts of pulses, the module having a nominal optical path are disclosed which may comprise: a dispersive center wavelength selection optic moveably mounted within an optical path of the line narrowing module, selecting at least one center wavelength for each pulse determined at least in part by the angle of incidence of the laser light pulse beam containing the respective pulse on the dispersive wavelength selection optic; a first tuning mechanism operative in part to select the angle of incidence of the laser light pulse beam containing the respective pulse upon the dispersive center wavelength selection optic, by selecting an angle of transmission of the laser light pulse beam containing the pulse toward the dispersive center wavelength selection optic; a second tuning mechanism operative in part to select the angle of incidence of the laser light pu
    Type: Grant
    Filed: November 30, 2004
    Date of Patent: April 29, 2008
    Assignee: Cymer, Inc.
    Inventors: J. Martin Algots, Robert A. Bergstedt, Walter D. Gillespie, Vladimir A. Kulgeyko, William N. Partlo, German E. Rylov, Richard L. Sandstrom, Brian Strate, Timothy S. Dyer
  • Patent number: 7346093
    Abstract: A high power narrow band, high repetition rate laser light source optical improvement apparatus and methods are disclosed with a fast angularly positionable mirror having a mirror mounting frame, a reflective optic with a coefficient different from that of the mounting frame, at least one flexure mount fromed in the mounting frame that is flexible having flexure arm attached the flexture to the mounting frame. The apparatus may include a flexure force mechanism having an elongated rod. The force mechanism may pre-stress the flexure. The mirror maybe a grating which includes a substrate with metallic layer formed on the substrate, and a protective coating made of silica formed on the reflective metallic layer. The grating maybe actively tuned using an electro- or magneto-sensitive element. Oxides of the metal in the reflective layer may be removed by a hydrogen purge system exposed to deep ultraviolet radiation.
    Type: Grant
    Filed: March 23, 2004
    Date of Patent: March 18, 2008
    Assignee: Cymer, Inc.
    Inventors: Richard L. Sandstrom, John Martin Algots, Joshua C. Brown, Raymond F. Cybulski, John Dunlop, James K. Howey, Richard G. Morton, Xiaojiang Pan, William N. Partlo, Firas F. Putris, Tom A. Watson, Thomas A. Yager
  • Patent number: 7256893
    Abstract: An apparatus and method for controlling a laser system is disclosed which may comprise a spectrometer adapted to measure an unknown bandwidth of a spectrum of light emitted from the laser, which may comprise an optical bandwidth measuring unit adapted to provide as an output a measured parameter, which is indicative of a parameter of the unknown bandwidth of the spectrum being measured; a reported parameter computing unit adapted to compute a reported parameter of the unknown bandwidth of the spectrum being measured according to the formula: Reported Parameter(“RP”)=A*(Measured Parameter(“MP”))+C, wherein the RP and MP are a different type of parameter and the values of A and C are determined based upon calibration of the optical bandwidth measuring unit MP response for light of known valued of RP.
    Type: Grant
    Filed: June 26, 2003
    Date of Patent: August 14, 2007
    Assignee: Cymer, Inc.
    Inventor: Robert Rafac
  • Patent number: 7230964
    Abstract: The present invention provides a modular high repetition rate ultraviolet gas discharge laser light source with a beam delivery to a production line machine. The system includes an enclosed and purged beam path with beam pointing control for delivery the laser beam to a desired location such as the entrance port of the production line machine. Preferred embodiments include equipment for beam attenuation, equipment for automatic feedback beam alignment and equipment for accurate optics module positioning at installation and during maintenance. In preferred embodiments, the production line machine is a lithography machine and two separate discharge chambers are provided, one of which is a part of a master oscillator producing a very narrow band seed beam which is amplified in the second discharge chamber. This MOPA system is capable of output pulse energies approximately double the comparable single chamber laser system with greatly improved beam quality.
    Type: Grant
    Filed: April 29, 2003
    Date of Patent: June 12, 2007
    Assignee: Cymer, Inc.
    Inventors: Plash P. Das, R. Kyle Webb, Marco Giovanardi, Gregory Francis, Huckleberry B. Dorn, Kyle P. Erlandsen, John W. Nelson, Richard L. Sandstrom, Alexander I. Ershov
  • Patent number: 7218661
    Abstract: An injection seeded modular gas discharge laser system capable of producing high quality pulsed laser beams at pulse rates of about 4,000 Hz or greater and at pulse energies of about 5 mJ or greater. Two separate discharge chambers are provided, one of which is a part of a master oscillator producing a very narrow band seed beam which is amplified in the second discharge chamber. The chambers can be controlled separately permitting separate optimization of wavelength parameters in the master oscillator and optimization of pulse energy parameters in the amplifying chamber. A preferred embodiment in a F2 laser system configured as a MOPA and specifically designed for use as a light source for integrated circuit lithography. In the preferred MOPA embodiment, each chamber comprises a single tangential fan providing sufficient gas flow to permit operation at pulse rates of 4000 Hz or greater by clearing debris from the discharge region in less time than the approximately 0.25 milliseconds between pulses.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: May 15, 2007
    Assignee: Cymer, Inc.
    Inventors: David S. Knowles, Daniel J. W. Brown, Richard L. Sandstrom, German E. Rylov, Eckehard D. Onkels, Herve A. Besaucele, David W. Myers, Alexander I. Ershov, William N. Partlo, Igor V. Fomenkov, Richard C. Ujazdowski, Richard M. Ness, Scot T. Smith, William G. Hulburd
  • Patent number: 7209507
    Abstract: A method and apparatus are disclosed for controlling the output of a two chamber gas discharge laser comprising an oscillator gas discharge laser and an amplifier gas discharge laser that may comprise establishing a multidimensional variable state space comprising a coordinate system having at least two coordinates, each coordinate comprising a selected variable representing an operating parameter of the oscillator or the amplifier; tracking a multidimensional operating point in the multidimensional variable state space according to the variation of the selected variables in either or both of the oscillator or the amplifier to determine the position of the multidimensional operating point in the multidimensional state space; determining from the position of the multidimensional operating point in the multidimensional operating space a region from a plurality of defined regions in the multidimensional operating space in which the multidimensional operating point is located and identifying the region.
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: April 24, 2007
    Assignee: Cymer, Inc.
    Inventors: John A. Rule, Paolo Zambon
  • Patent number: 7203562
    Abstract: A system for a monitoring lithography lasers at integrated circuit fabrication plants. Each laser at each fabrication plant has associated with it a terminal server. With respect to each fabrication plant a central control server unit is in communication with each of the lasers through a local area network. Information from the lasers is collected by the central control server unit and the information is used to provide summary information which is made available in a web site format to interested parties having access authorization.
    Type: Grant
    Filed: January 28, 2004
    Date of Patent: April 10, 2007
    Assignee: Cymer, Inc.
    Inventors: Parthiv S. Patel, Joseph E. Conway, Muljadi Tantra, Jeffrey W. Moen, Jason R. Carlesi, Roger L. Green, Tom A. Watson, Christopher G. Rowan
  • Patent number: 7203217
    Abstract: An electric discharge, narrow band gas laser with improvements in wavelength stability. Improvements result from reduced laser beam directional fluctuations or fast correction of those fluctuations. Applicant has discovered, using an extremely sensitive knife edge optical technique, that gas discharge laser windows in a trapezoidal configuration were causing slight wavelength perturbations when laser gas density varied during laser operation. The optical technique involves using test laser beam directed through the discharge region of the gas discharge laser, blocking a portion of the beam with a knife edge and measuring the non-blocked portion of the beam to monitor beam deflection. With this technique, Applicant can measure beams deflection with an accuracy of about 0.3 microradians and with a time response of about 1 microsecond.
    Type: Grant
    Filed: July 23, 2002
    Date of Patent: April 10, 2007
    Assignee: Cymer, Inc.
    Inventor: Zsolt Bor