Patents Assigned to Advanced Interconnect Materials LLC
  • Patent number: 8324730
    Abstract: A copper interconnection structure includes an insulating layer, an interconnection body including copper in an opening provided on the insulating layer, and a diffusion barrier layer formed between the insulating layer and the interconnection body. The diffusion barrier layer includes an oxide layer including manganese having a compositional ratio of oxygen to manganese (y/x) less than 2.
    Type: Grant
    Filed: October 29, 2009
    Date of Patent: December 4, 2012
    Assignee: Advanced Interconnect Materials LLC
    Inventors: Junichi Koike, Akihiro Shibatomi
  • Publication number: 20110032467
    Abstract: A liquid crystal display device including, a pair of substrates, a gate electrode of a thin film transistor (TFT) formed on one of the substrates, and a wiring layer connected to the gate electrode or an electrode of the thin film transistor, wherein at least a part of the gate electrode or a part the wiring layer is formed by a layer structured by a pure copper layer and a Cu—Mn alloy layer including Mn, wherein a concentration of Mn in the Cu—Mn alloy layer is more than 0.1 and not more than 20 atomic percentage within a solubility limit of Mn in the copper, and wherein a boundary surface between the Cu—Mn alloy layer and said one of the substrate includes an oxide layer having a Mn oxide layer.
    Type: Application
    Filed: July 9, 2010
    Publication date: February 10, 2011
    Applicants: Tohoku University, Advanced Interconnect Materials LLC
    Inventor: Junichi Koike
  • Patent number: 7782413
    Abstract: The present invention includes a liquid crystal display device with an oxide film having high adhesiveness to a semiconductor layer or a pixel electrode to thereby prevent oxidation of a wiring material or the like, and includes a source electrode and a drain electrode having high conductivity, and a manufacturing method therefor. In one embodiment of the present invention, a liquid crystal display device has a TFT electrode of a TFT substrate, wherein a source electrode or a drain electrode includes a layer of mainly copper and an oxide covering an outer part of the layer. Further, in the present invention, the semiconductor layer or the pixel electrode and said source electrode or the drain electrode are in ohmic contact in the TFT electrode.
    Type: Grant
    Filed: May 9, 2007
    Date of Patent: August 24, 2010
    Assignees: Tohoku University, Advanced Interconnect Materials LLC
    Inventors: Junichi Koike, Hideaki Kawakami
  • Patent number: 7782433
    Abstract: A method of forming an oxide film on a surface of a copper alloy, including the steps of providing a copper alloy including copper and an element selected from the group consisting of Mn, Zn, Ga, Li, Ge, Sr, Ag, Ba, Pr and Nd, and diffusing atoms of the element to a surface of the copper alloy so as to form an oxide film on the surface of the copper alloy, wherein a concentration of the element in the copper alloy is more than 0.1 and not more than 20 atomic percentage and within a solubility limit of the element in the copper.
    Type: Grant
    Filed: September 23, 2009
    Date of Patent: August 24, 2010
    Assignees: Tohoku University, Advanced Interconnect Materials LLC
    Inventor: Junichi Koike
  • Patent number: 7755192
    Abstract: A copper interconnection structure includes an insulating layer, an interconnection and a barrier layer. The insulating layer includes silicon (element symbol: Si), carbon (element symbol: C), hydrogen (element symbol: H) and oxygen (element symbol: O). The interconnection is located on the insulating layer, and the interconnection includes copper (element symbol: Cu). The barrier layer is located between the insulating layer and the interconnection. The barrier layer includes an additional element, carbon (element symbol: C) and hydrogen (element symbol: H). The barrier layer has atomic concentrations of carbon (element symbol: C) and hydrogen (element symbol: H) maximized in a region of a thickness of the barrier layer where the atomic concentration of the additional element is maximized.
    Type: Grant
    Filed: March 24, 2009
    Date of Patent: July 13, 2010
    Assignees: Tohoku University, Advanced Interconnect Materials LLC
    Inventors: Junichi Koike, Akihiro Shibatomi
  • Publication number: 20100015330
    Abstract: A method of forming an oxide film on a surface of a copper alloy, including the steps of providing a copper alloy including copper and an element selected from the group consisting of Mn, Zn, Ga, Li, Ge, Sr, Ag, Ba, Pr and Nd, and diffusing atoms of the element to a surface of the copper alloy so as to form an oxide film on the surface of the copper alloy, wherein a concentration of the element in the copper alloy is more than 0.1 and not more than 20 atomic percentage and within a solubility limit of the element in the copper.
    Type: Application
    Filed: September 23, 2009
    Publication date: January 21, 2010
    Applicants: National University Corporation Tohoku University, Advanced Interconnect Materials LLC
    Inventor: Junichi Koike
  • Patent number: 7633164
    Abstract: The present invention includes a liquid crystal display device having an oxide film having high adhesiveness to a substrate to thereby prevent oxidation of a wiring material or the like, and includes, an electrode or a terminal electrode having high conductivity, and a manufacturing method therefor. Consequently, in the present invention, a liquid crystal display device has an electrode terminal of a TFT substrate, wherein the electrode is formed on an insulator and is comprised of a conductive layer mainly consisting of copper and an oxide covering an outer part, further the oxide is a layered structure of transparent electrodes, the layered portion having ohmic contact, and the oxide mainly consists of manganese oxide.
    Type: Grant
    Filed: April 10, 2007
    Date of Patent: December 15, 2009
    Assignees: Tohoku University, Advanced Interconnect Materials LLC
    Inventors: Junichi Koike, Hideaki Kawakami
  • Patent number: 7626665
    Abstract: To provide a highly conductive Cu alloy which is advantageous in that an alloying element added to Cu is first reacted with oxygen contained in a gas atmosphere or solid in contact with the Cu member to form an oxide film which can prevent oxidation of Cu. The copper alloy comprises copper (Cu) containing an inevitable impurity, and an element added to the copper, wherein the added element is capable of being dissolved in the copper in an amount of 0.1 to 20 at. %, wherein the added element has an oxide formation free energy smaller than that of Cu and has a diffusion coefficient in Cu larger than the self-diffusion coefficient of Cu.
    Type: Grant
    Filed: August 30, 2005
    Date of Patent: December 1, 2009
    Assignees: Tohoku University, Advanced Interconnect Materials LLC
    Inventor: Junichi Koike