Abstract: A system for mapping dissimilar communication protocols is disclosed. In one embodiment, the system comprises user communication information that spans at least two dissimilar communication networks, a first communication protocol associated with a first communication network, a second communication protocol associated with a second communication network, and a software code segment configured to detect a call setup identifier and a call tear-down identifier associated with the first communication protocol, the software code segment also configured to detect a call setup identifier and call tear-down identifier associated with the second communication protocol, where the call setup identifier and the call tear-down identifier associated with the second communication protocol may occur within a predetermined amount of time before or after the call setup identifier or the call tear-down identifier associated with the first communication protocol.

Abstract: Techniques for automating probing location selection during printed circuit board (PCB) and corresponding PCB tester fixture design are presented. The invention includes a system and algorithm for selecting a probe layout comprising a set of probing locations for a printed circuit board design having a plurality of nets, at least some of which have a number of alternative possible probing locations. The system and algorithm iteratively generates a potential probe layout comprising one or more probing locations per net, and based on the potential probe layout, determines one or more regions of maximum deflection. A probing location from the potential probe layout that is located in a region of maximum deflection and is associated with a net having one or more alternative probing locations is removed from the potential probe layout and replaced in the with one of the one or more alternate probing locations associated with the net.

Abstract: An adaptive cycle-slipped detector (“ACSD”) for use in a Phase-Locked Loop (“PLL”) circuit. The ACSD may include a phase comparator, a phase shifter in signal communication with the phase comparator, and a cycle-slipped detector (“CSD”) in signal communication with the phase shifter.

Abstract: A method and apparatus for automatically debugging and optimizing an in-circuit test that is used to test a device under test on an automated tester is presented. The novel test debug and optimization technique extracts expert knowledge contained in a knowledge framework and automates the formulation of a valid stable, and preferably optimized, test for execution on an integrated circuit tester.

Abstract: Methods, systems and recordable media for accurately reading and identifying high quality signals from a microarray feature. Signals may be identified and used regardless of their geographic/geometric locations and patterns within the feature zone. High quality signals may be read, identified and outputted from a microarray feature in a geometrically independent manner, such that the best quality signals are identified and useable, regardless of the locations or patterns in the region from which the best quality signals are outputted.

Abstract: There are disclosed systems and methods for performing diagnostic testing on portable communication devices, such as cellular telephones. In one embodiment, diagnostic commands are generated internal to the communication device and processed within the device as though the test commands had been received from a remote location. The processed commands can be analyzed either within the portable device or remote therefrom. For remote processing, a wireless port is provided.

Abstract: A software framework for centralizing the management of test plans, test configurations, test sources, debug information for testing electrical devices in a manufacturing testing environment is presented. A three-tier software architecture is defined that allows one-time effort and segregation of tasks related to integration of hardware devices, development of multiple applications, and testing of multiple applications.

Abstract: Systems and methods for reducing noise in spectral data. A noise burst level is defined. If a spectral point has an intensity greater than the burst level (a burst point), points neighboring the burst point are examined. If a function of these neighboring points indicates that the burst point is a discrete event, then the abundance level of the burst point is altered.

Abstract: An internal ADC in a delta-sigma ADC is characterized using inherent delta-sigma ADC circuitry. In one embodiment, a constant DC value is applied as the input signal. The sum of the constant DC value and a feedback signal is integrated. Then, a digital approximation including the integrated sum is generated. The feedback signal is generated and allows ramping of the integrated sum.

Abstract: A management method for data in a semiconductor characteristic evaluation apparatus comprised of a control unit, a memory unit, and input/output units includes steps for selecting the workspace including the test programs for testing a plurality of wafer types, for storing the test results in the selected workspace as histories, and for searching for the desired test results from the histories of the stored test results.

Abstract: Compact beam manipulators employ one or more Risley prism sets with or without a parallel plate translator. One beam manipulator contains a plate mounted to permit pitch and yaw adjustments and a prism set mounted to permit rotations. The rotations of the prisms adjust a beam direction, and adjustment of the plate adjusts the beam position. Another beam manipulator contains a prism set mounted to permit rotations and pitch and yaw adjustments of the prisms. The rotations and pitch and yaw adjustments provide coupled changes in the position and direction of a beam, and iterative adjustments alternate between rotating prisms to change the beam direction and the adjusting pitch and yaw to change the beam position. The iterative adjustments are complete when the beam has a target position and a target direction to within required tolerances. Gluing elements to optic holders minimizes stress-induced birefringence and temperature and humidity effects.

Abstract: A reed relay which comprises a reed switch with reeds at both ends; an electrostatic shield pipe inside which the reed switch passes; a coil bobbin having a hollow part in which the electrostatic shield pipe is disposed; removable bushings attached to the electrostatic shield pipe and the coil bobbin and having a reed support hole that supports the reed switch; and the removable bushing is capable of disabling the support of the reed switch by the bushings after anchoring the reed relay and both ends of the reeds.

Abstract: The present invention relates to an apparatus and to a method of determination of an optical property of a DUT, in particular of an optical fiber, by means of OTDR, comprising the steps of: coupling an initial optical signal into the DUT, detecting a response signal of the DUT, and determining the optical property of the DUT by means of OTDR using at least a second order backscatter part of the response signal.

Abstract: A method for mapping a spectrum obtained from signals under test corresponding to linearly spaced frequencies to logarithmically spaced frequencies in a measuring apparatus. A spectrum within a predetermined frequency range from logarithmically spaced frequencies is selected from this spectrum corresponding to linearly spaced frequencies and vector averaging of the selected spectrum is performed.

Abstract: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.

Abstract: An ESD protection circuit is formed at the input/output interface contact of an integrated circuit to protect the integrated circuit from damage caused by an ESD event. The ESD protection circuit has a polysilicon bounded SCR connected between a signal input/output interface contact of the integrated circuit and a power supply connection of the integrated circuit and a biasing circuit. The biasing circuit is connected to the polysilicon bounded SCR to bias the polysilicon bounded SCR to turn on more rapidly during the ESD event. The biasing circuit is formed by at least one polysilicon bounded diode and a first resistance. Other embodiments of the biasing circuit include a resistor/capacitor biasing circuit and a second diode triggering biasing circuit.

Abstract: A delay line is constructed using a lossless (or low loss) transmission line which, in turn, can be constructed using an auxiliary conductor inductively coupled to the primary conductor. The auxiliary conductor is driven by the primary conductor through an active shunt network distributed along the transmission line. The auxiliary conductor is placed close enough to the primary conductor so that the two conductors have a substantial amount of mutual inductance compared to their self-inductance. In one embodiment, a combination of conductance and transconductance are used to cancel losses and control dispersion in the transmission line for high frequency signal transmission. In one embodiment, an FIR filter is constructed using the delay line.

Abstract: A fabrication and adhesion method for a polyaryl-ether-ketone (PAEK) device, such as a microfluidic device, is disclosed. At least one glassy uncrystallized PAEK substrate is heated up to near or above the glass transition temperature to allow the substrate to crystallize from the glass state, while embossing the substrate with patterns. Bonding the PAEK substrate to another substrate is accomplished using a solvent-resistant adhesive, such as a polyimide-based adhesive, in combination with an adhesion enhancement treatment. In certain embodiments, the adhesion enhancement treatment is a plasma treatment or a chemical sulfonation treatment.

Abstract: Disclosed are systems and methods for utilizing a pool of mobile devices in probing operations comprising a probing host system including probe management and data management operative aspects, and a pool of mobile devices, one or more of which are operative under control of the probe management to provide probing data to the data management, wherein the one or more mobile devices comprise mobile devices for which location and movement is not under control of the probing host system.

Abstract: A measured signal, such as a high-speed digital pulse, transmitted through a system is corrected. The measured signal is sampled to a sampled signal sequence, and a signal series is provided as a plurality of the sampled signal sequences put together successively. The signal series is windowed with a window function, and a corrected measured signal is recalculated from the windowed signal series using information about the frequency-dependency of the system.