Patents Assigned to Agilent Technologies
  • Patent number: 7345410
    Abstract: A resonator. The resonator includes a bottom electrode overlaying at least part of a substrate, a composite structure overlaying at least part of the bottom electrode, and a top electrode overlaying at least part of the composite structure. The composite structure comprises a piezoelectric layer and a compensation layer, and the compensation layer includes silicon dioxide combined with boron.
    Type: Grant
    Filed: March 22, 2006
    Date of Patent: March 18, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Kevin J. Grannen, John Choy, Carrie A. Rogers
  • Publication number: 20080062176
    Abstract: Graphs for displaying data are generated by acquiring signals using a signal acquisition device. The signals are processed to obtain a first series of data and a second series of data comprising independent and dependent variables. A search is performed of the dependent variables of the first series of data and the second series of data and the minimum dependent variable value and maximum dependent variable value are determined. The scale of a second axis of a first graph and of a second graph are determined such that the scales of the second axes of the first and second graphs have the same units and minimum and maximum second axis scale values; and the minimum second axis scale value is no larger than the minimum dependent variable value and the maximum second axis scale value is no smaller than the maximum dependent variable value so that the entire range of the dependent variables of the first series is displayed at or between the minimum and maximum second axis scale values.
    Type: Application
    Filed: September 7, 2006
    Publication date: March 13, 2008
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventor: Prashant Arya
  • Publication number: 20080062175
    Abstract: A measurement system comprises a signal acquisition device for acquiring signals. A processor processes the signals to obtain a first series of data and a second series of data. A display device receives the first series of data and the second series of data. A first graph on the display device has a first graph first axis and a first graph second axis with the first series of data displayed thereon. A second graph on the display device has a second graph first axis and a second graph second axis with the second series of data displayed thereon. The first graph first axis has the same units and minimum and maximum first axis scale values as the second graph second axis. Also, the first graph second axis is recalibrated from having different minimum and maximum second axis scale values as the second graph second axis to having the same units and minimum and maximum second axis scale values as the second graph second axis.
    Type: Application
    Filed: September 7, 2006
    Publication date: March 13, 2008
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventor: Prashant Arya
  • Patent number: 7343266
    Abstract: A system and method of verifying metadata in a measurement processing system is described. Each combination of metadata is associated with a key, and the keys are used to verify that operations performed using the measurements are valid based on the metadata of the respective measurements. Embodiments allow metadata verification to be made prior to operating on measurements. Embodiments also minimize the processing that results from making such checks redundantly causing slowdown in the measurement processing.
    Type: Grant
    Filed: November 30, 2005
    Date of Patent: March 11, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Jerry J. Liu, Bruce Hamilson, Jefferson B. Burch
  • Patent number: 7338292
    Abstract: A board-to-board interconnect is presented. The interconnect is fashioned from solder beads or hemi-ellipsoidal surface features on a surface of a printed circuit board and contact pads on a second printed circuit board.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenneth W Johnson, Brock J. LaMeres
  • Patent number: 7340717
    Abstract: A method for generating a software model of a dynamic system takes as input a preliminary software model of the system. Normally, the preliminary software model is based on a system model that is generated by a system designer within a modeling environment. Generally speaking, the preliminary software model does not allow access to the internal variables of the system model from outside the modeling environment, but nonetheless may be executed on a computer platform in the absence of the modeling environment. Interface software is then produced which exposes the internal variables of the system model. The resulting software model, built from both the preliminary software model and the interface software, allows programmatic access to its internal variables, and potentially allows execution control, from outside the modeling environment, thus typically enhancing detailed simulation of the system model beyond the capabilities provided by the modeling environment.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Richard Craig Allen, Randy A Coverstone
  • Patent number: 7339509
    Abstract: A signal sampling system includes an input signal and a plurality of samplers. The plurality of samplers produces a plurality of sample output signals. Each sampler from the plurality of samplers samples the input signal to produce a corresponding sample output signal from the plurality of sample output signals. Each sampler samples the input signal with a sampling pulse having a sampling aperture. A first sampling aperture used by a first sampler from the plurality of samplers to sample the input signal differs in duration from a second sampling aperture used by a second sampler from the plurality of samplers to sample the input signal.
    Type: Grant
    Filed: May 2, 2006
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Mark Joseph Woodward, Marlin Viss
  • Patent number: 7340365
    Abstract: In a method for verifying the operation of a plurality of test system instruments, a harness cable is electrically coupled to a plurality of test signal ports on the plurality of test system instruments. A first plurality of test measurements are then initiated via the harness cable, with the first plurality of test measurements being made between two or more sets of test ports that are on three or more of the instruments. The plurality of test measurements are captured from the test system instruments using a computer. The computer then indicates to a user whether ones of the plurality of test measurements are within defined ranges. A second plurality of test measurements, between ones of the plurality of test instruments and a test module, may also be initiated via the harness cable. Exemplary harness cable embodiments are also disclosed.
    Type: Grant
    Filed: April 23, 2004
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: William Hobson Wubbena, Carl Benvenga
  • Patent number: 7339982
    Abstract: Modular, jitter-tolerant, data acquisition and processing systems are disclosed. An exemplary embodiment comprises a receiving portion having a first module configured to receive a serial bit stream and recover a serial data stream and a first clocking signal from the serial bit stream. The receiving portion also comprises a second module configured to receive the serial data stream and the first clocking signal and generate a parallel data stream and a second clocking signal.
    Type: Grant
    Filed: May 13, 2003
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Reed Glenn Wood, Jr.
  • Patent number: 7339367
    Abstract: An interface module. The interface module includes a probe identification module configured for connection to an identification bus, a probe detect module configured for connection to a detect-control bus, a power control module configured for connection to the detect-control bus, a control and data module configured for connection to a control-data bus, and multiple connectors. Each connector has an associated hot swap circuit. For each connector, if the probe detect module detects connection of that connector to a test probe via connection of that connector to the probe detect module, the probe identification module is configured to enable transfer of an identification label identifying that test probe to that test probe via that connector and the control and data module is configured to enable transfer of control instructions and data between the control-data bus and the test probe via connection of the control and data module to that connector.
    Type: Grant
    Filed: April 28, 2006
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Dion N. Heisler, Nimal K. K. Gamage
  • Patent number: 7340605
    Abstract: A system and method is disclosed for storing waveforms on a computer, while ensuring that the waveforms are only used on a signal generator fitted with the correct licensing keys. The system includes one or more signal generation applications for calculating one or more waveforms. Each waveform can be stored on a computer by bundling the waveform, a code that includes license information and any signal generator settings required to configure the signal generator into a single file. The file can further be encrypted for security purposes. Upon receiving a request for the file, a download application associated with the signal generator retrieves the encrypted file, decrypts the file and compares one or more keys stored within the signal generator with the code to determine whether the signal generator is allowed to download the waveform.
    Type: Grant
    Filed: October 31, 2001
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Andrew Caminschi
  • Patent number: 7339720
    Abstract: The present invention is directed to systems and methods which provide a widely tunable, low-noise, synthesized microwave source with an OEO oscillator.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Roger L. Jungerman
  • Patent number: 7340218
    Abstract: A receiver channel, test system and method employ adaptive nulling to filter a targeted frequency component from a pulsed signal to produce a filtered pulsed signal. The filtered pulsed signal facilitates measuring pulsed performance parameters of a device under test. The receiver channel includes an adaptive nulling filter having a frequency response with a null that is adjustable in a null location to correspond to a vicinity of the targeted component. The test system includes a pulsed signal source, a test set, and a controller that controls the signal source and the test set. The test set includes the receiver channel with the adaptive nulling filter. The method of adaptive null filtering includes adjusting a location of a null in a frequency response of the adaptive nulling filter to correspond to a vicinity of the targeted component to produce the filtered pulsed signal.
    Type: Grant
    Filed: June 30, 2004
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Robert E. Shoulders, Loren C. Betts
  • Patent number: 7339853
    Abstract: Generally, the embodiments are directed to circuits and methods for time stamping an event at a fraction of a clock cycle. A time stamping circuit comprises two or more detection circuits. The detection circuits receive an event-in signal and generate event signals based on a clock phase at which the event-in signal was received. A decoder receives the event signals and outputs an event-out signal and a time stamp that represents the phase at which the event-in signal was detected. By time stamping the event-in signal to a phase division, the time stamping circuit detects event signals that occur at a rate faster than the clock cycle.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Vamsi Krishna Srikantam, Andew David Fernandez, Dietrich Werner Vook
  • Patent number: 7339984
    Abstract: An apparatus and method for measuring jitter using phase and amplitude undersampling. A sampling circuit samples an input signal to obtain amplitude and phase information, a computation circuit determines Time Interval Error (TIE) information from the amplitude and phase information, and a signal processor processes the TIE information to generate a jitter spectrum.
    Type: Grant
    Filed: September 5, 2003
    Date of Patent: March 4, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Fadi Daou
  • Patent number: 7336764
    Abstract: A ceramic electron beam accelerator is disclosed finding particularly efficacious uses in X-ray electronic circuit imaging and testing applications. The ceramic stage design eliminates the need for placing metal reinforcements between adjoining stages of the accelerator, thereby increasing the accelerator's mechanical robustness and reliability, while also reducing manufacturing costs.
    Type: Grant
    Filed: October 20, 2005
    Date of Patent: February 26, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: David C. Reynolds
  • Patent number: 7336673
    Abstract: Creating a low-bandwidth channel in a high-bandwidth channel. By taking advantage of extra bandwidth in a high-bandwidth channel, a low-bandwidth channel is created by inserting extra packets. When an inter-packet gap of the proper duration is detected, the extra packet is inserted and any incoming packets on the high-bandwidth channel are stored in an elastic buffer. Observing inter-packet gaps, minimal latency is introduced in the high-bandwidth channel when there is no extra packet in the process of being sent, and the effects of sending a packet on the low-bandwidth channel are absorbed and distributed among other passing traffic.
    Type: Grant
    Filed: October 17, 2003
    Date of Patent: February 26, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Slawomir K. Ilnicki, Ajay Khoche, Gunter W. Steinbach
  • Patent number: 7333964
    Abstract: A data analyzer for analyzing an incoming data stream, comprising a pattern matcher adapted for comparing in a first step the first data stream with a first data pattern and in a second step a second data stream with a second data pattern and for generating a match signal indicative of a match between the first data stream and the first data pattern or between the second data stream and the second data pattern, a trace memory adapted for storing a part of the first data stream dependent on the match signal of the first step, and for outputting stored data as second data stream in a second step and a data switch adapted for receiving the first data stream and the second data stream, and to be set in the first step to a first state for providing the pattern matcher with the first data stream and in the second step to a second state for providing the pattern matcher with the second data stream.
    Type: Grant
    Filed: November 7, 2005
    Date of Patent: February 19, 2008
    Assignee: Agilent Technologies Inc.
    Inventor: Thomas Dippon
  • Patent number: 7332715
    Abstract: For generation and delivery of ions from an ionization chamber through an ion entrance orifice to a mass analyzer operating at high vacuum, high pass ion filtration is effected within the ionization chamber by application of electrical potentials to an electrode associated with the ion entrance orifice and to an electrode between the ionization region and the ion entrance orifice to create a retarding electric field upstream from the ion entrance orifice. The retarding electric field hinders the movement to the ion entrance orifice of ions having drift velocities below a lower limit, and as the retarding voltage gradient is made steeper, the lower limit increases.
    Type: Grant
    Filed: August 16, 2006
    Date of Patent: February 19, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Charles W. Russ, IV, Steven M. Fischer, Robert K. Crawford
  • Patent number: 7333311
    Abstract: A structure and method operable to provide ESD protection for protected circuitry of automatic test equipment (ATE). In a disable mode, the first voltage potential and second voltage potential are substantially equivalent to the reference potential resulting in a clamping circuit providing a nominal clamping voltage to the protected circuit so that an ESD event having a voltage between the first voltage potential and the second voltage potential is shunted to the reference potential via first and second ESD rails, wherein the ESD event is received on a DUT node coupled to the one or more signal rails of the protected circuitry.
    Type: Grant
    Filed: May 27, 2005
    Date of Patent: February 19, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: John C. Kerley, David D. Eskeldson