Patents Assigned to Agilent Technologies
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Patent number: 7362091Abstract: A test probe. The test probe includes an interconnect module configured to connect to a modular, replaceable wireless module, a connect module configured to communicate with a communication network and the wireless module, an identification module configured to receive and transmit an identification of the test probe, an audio module configured to enable transfer of audio data from/for communication with the communication network from/to the wireless module and to translate audio data to/from audio signals, and a computer configured to enable transfer of audio signals from/to the audio module, transfer of digital data from/to the wireless module, and transfer of test data to/from a remote controller. Test data from the remote controller comprises instructions to control the wireless module and data for the wireless module to transfer to the connect module, and test data transmitted to the remote controller comprises digital data and audio data received from the wireless module.Type: GrantFiled: April 28, 2006Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventors: Dion N. Heisler, Nimal K. K. Gamage
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Patent number: 7361906Abstract: A method and system for determining a biopolymer array substrate thickness dependent optimal focus distance for scanning a molecular array by a molecular array scanner are provided. A reference substrate is automatically scanned at successively greater distances of the stage from a light gathering medium, such as an optical fiber, or z-positions, to produce data providing a functional relationship between z-position and measured signal intensities. The data is then processed by an array substrate thickness dependent focus-finding routine that selects an optimal focus-distance for data scans which is optimized for the thickness of the reference substrate. Also provided are methods of determining the thickness of a biopolymer array substrate using a position sensitive device (PSD) component of a biopolymer array scanner.Type: GrantFiled: December 23, 2004Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventors: Jayati Ghosh, John F. Corson, Debra A. Sillman
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Patent number: 7363321Abstract: A system and method to provide transaction processing. The system and method include data analysis modules appropriately interspersed among computer executables that output data. The data analysis modules process computer executable output data as input data and produce analysis module output data. The analysis module output data can be used as input to other computer executables or analysis modules. Such a system and method can be useful in a test environment.Type: GrantFiled: September 2, 2004Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventor: Stephen C. Booth
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Patent number: 7362836Abstract: Eye diagrams are made for signals on each channel in a group thereof. Outlying signals that do not exhibit overlap for a sampling parameter that is to be common for all channels may be ignored and a warning given. Selected, normalized eye openings are used to discover optimum sampling parameters for each channel. Locations within each eye opening are ranked according to preference. Algorithms are used to select a single best value for a sampling parameter common to all the channels, and the corresponding best other sampling parameter is found for each channel. One algorithm disregards good choices for many channels to accommodate any remaining channel by using only a commonly agreed upon value (a jury system). Another algorithm gives weight to a choice according to the number of channels that agree on that choice (majority rule). A graphical user interface facilitates the selection, and emphasizes which sampling parameters are constrained to vary together.Type: GrantFiled: April 27, 2005Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventor: Richard A Nygaard, Jr.
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Patent number: 7361930Abstract: A method of forming a multiple layer passivation film on a semiconductor device surface comprises placing a semiconductor device in a chemical vapor deposition reactor, introducing a nitrogen source into the reactor, introducing a carbon source into the reactor, depositing a layer of carbon nitrogen on the semiconductor device surface, introducing a silicon source into the reactor after the carbon source, and depositing a layer of silicon carbon nitrogen on the carbon nitrogen layer. A semiconductor device incorporating the multiple layer passivation film is also described.Type: GrantFiled: March 21, 2005Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventor: Gary R. Trott
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Patent number: 7362846Abstract: An x-ray shielded imaging detector is disclosed. In one embodiment, the x-ray shielded imaging detector comprises a scintillator, a photodetector, and an optical connection between the scintillator and the photodetector. The x-ray shielded imaging detector also includes a first high density shielding material adjacent the optical connection. The first high density shielding material absorbs x-ray energy and attenuates it before the x-ray energy reaches the photodetector when the x-ray energy impinges on the x-ray shielded imaging detector at an angle other than perpendicular to a major axis of the scintillator and the photodetector. Other embodiments and related methods of operating an x-ray system are also disclosed.Type: GrantFiled: August 19, 2004Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventor: Ronald K Kerschner
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Patent number: 7362445Abstract: A polarization control system includes a light source that generates two light beams with different polarization states and optical frequencies. A polarization state modulator changes the polarization states of the two light beams. A first detector path generates a first beat signal from the two light beams passing through a first polarizer. A second detector path generates a second beat signal from the two light beams passing through a second polarizer that is oriented substantially orthogonal to the first polarizer. An amplitude detector generates an amplitude beat signal from the first and the second beat signals. The system then uses the amplitude beat signal to determine how to adjust the polarization state modulator in order to generate the first and the second light beams with the desired polarization states.Type: GrantFiled: June 17, 2005Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventors: Joanne Y. Law, Raymond K. L. Yeung, Eric S. Johnstone, Kerry D. Bagwell
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Patent number: 7362447Abstract: An interferometer can achieve a high dynamic range for measurements along vertical and horizontal directions using a first measurement channel providing a high dynamic range measurement of a path including components respectively parallel and perpendicular to the optics-object separation and a second measurement channel providing a high dynamic range measurement with just a perpendicular component. Further, using the same techniques at multiple locations around permits a high dynamic range for measurements of the degrees of freedom of an object.Type: GrantFiled: December 9, 2005Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventor: William Clay Schluchter
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Patent number: 7363567Abstract: Disclosed is a system and method for testing electronic devices which uses a random pattern for testing electronic devices. In one embodiment there is communicated to a device under test (DUT) a test sequence causing the DUT to exercise certain parameters in a controlled pattern of operation. The test sequence is randomly created. In one embodiment this random creation is controlled by a random looping algorithm which controls both the order of and the magnitude of each parameter. Included, if desired, is the ability to selectively retransmit previously communicated test sequences.Type: GrantFiled: August 28, 2003Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventor: Robert A. Rands
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Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes
Patent number: 7362106Abstract: A method and apparatus for detecting open defects on non-probed node under test of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, a probed node neighboring the non-probed node under test is stimulated with a known source signal. A sensor of a capacitive sensing probe is capacitively coupled to at least the probed node and non-probed node under test of the electrical device, and a measuring device coupled to the capacitive sensing probe measures a capacitively coupled signal present between the sensor of the probe and at least the probed and non-probed node of the electrical device. Based on the value of the capacitively sensed signal, a known expected “defect-free” capacitively sensed signal measurement and/or a known expected “open” capacitively sensed signal measurement, a determination is made of whether an open defect exists on the non-probed node under test of the electrical device.Type: GrantFiled: June 29, 2005Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventors: Kenneth P. Parker, Myron J. Schneider -
Patent number: 7362149Abstract: Zero crossings for a non-symmetrical VIN may be determined by first amplifying and clipping VIN to create a non-symmetrical square wave whose zero crossings are those of VIN. A selected polarity edge of the non-symmetrical square wave may be taken as a 0° indicator and is used to create a fundamental sawtooth ramp of the same frequency and in phase with VIN. The fundamental sawtooth ramp starts at zero volts, linearly ramps to some peak and is AC coupled to a comparator whose other input is zero volts. That creates a square wave that is symmetrical as to its half-cycles, and whose every other edge is synchronous with the start of the fundamental sawtooth ramp, and whose intervening edges occur in the middle of the ramp. The intervening edge is detected and taken as a 180° indicator.Type: GrantFiled: October 23, 2006Date of Patent: April 22, 2008Assignee: Agilent Technologies, Inc.Inventors: Chin Hong Cheah, Lian Ping Teoh
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Publication number: 20080087813Abstract: A mass spectrometer system includes a first mass spectrometer channel. The mass spectrometer system includes a second mass spectrometer channel. A housing is configured to enclose the first and second mass spectrometer channels within the same chamber. A mass analyzer is coupled with the first and second channels and configured to analyze ion streams received from the first and second channels.Type: ApplicationFiled: October 13, 2006Publication date: April 17, 2008Applicant: Agilent Technologies, Inc.Inventors: Harvey Dean Loucks, Gregory Paul Houtz
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Publication number: 20080087814Abstract: An apparatus for analyzing ions by determining times of flight of the ions includes a flight tube. The apparatus includes a pulser for redirecting ions into the flight tube. The apparatus includes a first detector located at a first position within the flight tube. The apparatus includes a second detector located at a second position within the flight tube, wherein the pulser redirects ions in a first ion stream incident on a first flight path into a first trajectory so that ions in the first ion stream interact with the first detector, and the pulser redirects ions in a second ion stream incident on a second flight path into a second trajectory so that ions in the second ion stream interact with the second detector, and the detectors are configured to detect times of arrival of the ions.Type: ApplicationFiled: October 13, 2006Publication date: April 17, 2008Applicant: Agilent Technologies, Inc.Inventor: Harvey Dean Loucks
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Publication number: 20080087815Abstract: A mass spectrometer system includes a first ion source that produces ions in a first ion stream. The mass spectrometer system includes a second ion source that produces ions in a second ion stream. A capillary receives the first and second ion streams and separately introduces ions in the first and second ion streams into a mass spectrometer channel. A mass analyzer is configured to receive and analyze ions from the channel. In one aspect, the capillary introduces ions in the first and second ion streams into the mass spectrometer channel in alternating sequence.Type: ApplicationFiled: October 13, 2006Publication date: April 17, 2008Applicant: Agilent Technologies, Inc.Inventors: Harvey Dean Loucks, James L. Bertsch
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Patent number: 7357018Abstract: A measurement inside a specimen is performed by providing a nanoscale FET probe comprising a cantilever element and a nanowire extending from the cantilever element. The nanowire is electrically connected to the cantilever element at at least one of the ends of the nanowire. The nanowire is coated along at least part of the length thereof with molecules of a capture agent. The cantilever element is moved to insert the nanowire onto the specimen. An electrical property of the nanoscale FET probe is monitored to detect binding events between the capture agent molecules and an analyte of interest inside the specimen.Type: GrantFiled: February 10, 2006Date of Patent: April 15, 2008Assignee: Agilent Technologies, Inc.Inventors: Bo U Curry, Sungsoo Yi
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Patent number: 7356443Abstract: Representative embodiments are directed to systems and methods for analyzing the selection of measurements of events associated with a communications network. In one embodiment, the selection of measurements includes creating a representation of a network. After the creation of the network representation, multiple sets of contemplated measurements associated with the network representation are created. A metric is calculated that is related to the respective diagnostic effectiveness for each set of contemplated measurements when the respective set of contemplated measurements is provided to a network diagnostic algorithm.Type: GrantFiled: December 17, 2003Date of Patent: April 8, 2008Assignee: Agilent Technologies, Inc.Inventor: Lee A. Barford
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Patent number: 7356340Abstract: A system and method is shown for determining the spatial boundary of certain measurable phenomena, such as broadcast signals, at various locations within geographical areas covered by the phenomenon. Data representing relative signal quality at various locations within the geographical area is created within a mobile device, such as a cell phone capable of receiving the phenomenon. The data is stored and refined within the device so as to define weak signal quality areas within at least a portion of the geographical area traveled by the mobile device. The refinement, which in one embodiment comprises coalescing and splitting stored data locations in the device allows for long storage periods by reducing memory requirements. By devoting the majority of memory to locations in the vicinity of the good/bad boundary, the most detailed picture possible of the boundary is achieved for a given amount of memory.Type: GrantFiled: August 2, 2004Date of Patent: April 8, 2008Assignee: Agilent Technologies, Inc.Inventor: Bruce Hamilton
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Patent number: 7355719Abstract: An interferometer provides a large dynamic range for perpendicular displacement measurements. In operation, a measurement reflector on an object reflects a measurement beam to an overlying Porro prism, and a reference reflector on the object returns a reference beam to the interferometer. A second Porro prism in the interferometer can return the reference beam for a second pass to the reference reflector, while the measurement beam complete only one pass. Reductions in beam walk-off result from retroreflections in the Porro prisms and the matching effects that some object rotations have on measurement and reference beams. Perpendicular motion of the object relative to the first Porro prism causes a Doppler shift only in the measurement beam. Accordingly, a beat frequency found when combining the measurement and reference beams can indicate a residual Doppler shift associated with the motion in the perpendicular direction.Type: GrantFiled: August 16, 2005Date of Patent: April 8, 2008Assignee: Agilent Technologies, Inc.Inventor: William Clay Schluchter
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Patent number: 7354695Abstract: A method is provided for preparing high surface-area texturing of a substrate using methods by which material from a substrate is subtracted from or added to the surface of the substrate. In one embodiment, the method is a subtractive lithographic method that involves exposing a laser-ablatable substrate, such as a polymeric or ceramic substrate, to laser light. A mask may be used to define the pattern of light incident on the substrate. High surface-area textured substrates, in particular, miniaturized planar analysis devices having high surface-area textured features, prepared by the methods disclosed herein, are also provided. A method by which the high surface-area textured substrate or the miniaturized planar analysis device is used as a master from which replicate copies thereof may be made is also provided.Type: GrantFiled: March 29, 2005Date of Patent: April 8, 2008Assignee: Agilent Technologies, Inc.Inventors: Reid A. Brennen, Sally A. Swedberg
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Patent number: 7354289Abstract: A positive locking push-on 3.5 mm (or other diameter, such as 2.4 mm) connector is provided by retaining an existing bayonet lug and latch style push-on latch mechanism and associated male and female outer conductor shells, but which is sized for 3.5 mm use, while providing SMA/APC-3.5 style male and female center conductor pins that are held in place within their respective outer conductor shells by RF beads that are part of a unitized transmission line subassembly. Alteration of certain axial dimensions of the outer conductor shells prevents the accidental mating of the 3.5 mm bayonet connector with a BNC connector of the opposite gender, and does so in a way that prevents damage to any of the center pins.Type: GrantFiled: May 30, 2006Date of Patent: April 8, 2008Assignee: Agilent Technologies, Inc.Inventor: James E. Cannon