Abstract: A display for use in a printed circuit board inspection system for inspecting objects on a printed circuit board is capable of displaying a greater-than-two dimensional image of the shape of the surface of an object resident on the printed circuit board in at least two dimensions. The image of the object is generated based on optical imaging of the object under different illumination configurations.

Abstract: A coaxial connector including an outer conductor, a glass to metal seal (GMS) assembly, and a center conductor, is disclosed. The outer conductor has a tubular shape and defines longitudinal axis. Here, the center conductor and the GMS assembly are coupled before they are placed within the outer conductor. When the GMS assembly is coaxially placed within the outer conductor, the GMS assembly and the outer conductor define a variable gap enclosure. Fusing agent such as solder is placed within the variable gap enclosure. A bead is inserted into the outer conductor surrounding the center conductor and engaging the center conductor at a circumferential slot. The slide-on dielectric bead provides support for the center conductor and maintains the center conductor's position within the outer conductor and its characteristic impedance throughout.

Abstract: In one embodiment, a method for testing continuity of electrical paths through a circuit assembly includes: 1) mating a test-facilitating circuit package to a connector of the circuit assembly; the circuit package having a plurality of contacts for mating to a plurality of contacts of the connector; the circuit package containing incomplete or no mission circuitry for the circuit assembly, but containing a plurality of passive circuit components coupled in parallel between the package's plurality of contacts and a test sensor port of the circuit package; 2) stimulating one or more nodes of the circuit assembly; 3) measuring an electrical characteristic of the circuit package; and 4) comparing the measured electrical characteristic to at least one threshold to assess continuities of at least two electrical paths through the circuit assembly. Other embodiments are also disclosed.

Abstract: A method and a measurement system determine a transmission response of a device under test (DUT). The method includes measuring a reflection response from a first port of the DUT while a known reflective termination is on a second port of the DUT, and time gating the measured reflection response to produce a gated reflection response that is the transmission response of the DUT. The measurement system includes a vector network analyzer, a controller, a memory and a computer program. The computer program includes instructions that implement measuring the reflection response from the first port of the DUT, and further implement time gating the measured reflection response. The time gating isolates reflection data associated with the known reflective termination from the measured reflection response.

Abstract: An assembly includes a circuit board with a ball grid array device attached to a first side of the circuit board. A brace surrounding the ball grid array device has a series of mounting holes and a series of members extending between the mounting holes. The brace is removably secured to the first side of the circuit board at the mounting holes.

Abstract: A test system and method which utilizes a component data base that stores performance data for individual component of the system. The system and method can further provide for using data and information from one calibration procedure in connection with performing further calibration procedures. The system and method can further provide for utilizing data of from linear components of the system to determine performance characteristics of non-linear components.

Abstract: A phase-compensating cube comer retroreflector includes three rear reflecting surfaces. All three rear reflecting surfaces can be coated with a phase-compensating film stack that induces 2n? phase difference when handling polarized light. So coated, the phase-compensating cube comer preserves the polarization orientation and ellipticity of the incident light. Such a phase-compensating cube comer can be used to improve the accuracy of distance-measuring interferometers. The cube corner directs light to and from other optical elements, including a polarizing beam-splitters, mirrors, and quarter-wave plates.

Abstract: A mass analyzer for isolating, fragmenting and scanning ions. The mass analyzer includes an ion trap having a first electrode, a second electrode adjacent to the first electrode, and a third electrode interposed between the first electrode and the second electrode, a first RF source electrically connected to the first electrode and second electrode and a second RF voltage source electrically connected to the third electrode. The second RF voltage source provides for a second electrical field for fragmenting ions and broadens the potential application of the fragmentation cut-off of the device allowing for analysis of peptides and other complex molecules. The mass analyzer may be used independently or in combination with a mass spectrometry system. A method of ion fragmentation and cut-off is also disclosed.

Abstract: A method for designing a base includes (1) selecting a location of a first center of expansion of a child part (CEchild) relative to a parent part; (2) determining a location of a second center of expansion of a bond joint (CEbond) bonding the child part to the base; and (3) determining a location of a third center of expansion of the base (CEbase) on a centerline, which is defined by the CEchild and the CEbond, so the CEchild does not substantially move relative to the parent part under a temperature change. To determine the location of the CEbase, the method further includes (a) determining a length change to the child part from the CEbond to the CEchild under the temperature change; (b) determining a length of the base that produces the same length change under the temperature change; and (c) locating the CEbase at the length away from the CEbond.

Abstract: A method and system for economically packaging microarrays into sealed reaction chambers and storage vessels. A pocket strip is manufactured as a linear sequence of pockets, or wells, into which microarrays are positioned. A cover strip is then heat sealed to the upper surface of the pocket strip to create a linear sequence of sealed reaction chambers or storage vessels, each containing a microarray. Mechanical features or optical features are included along the length of the pocket strip to facilitate mechanical translation and positioning of microarrays embedded within the microarray strip. Septa are affixed to, or embedded within, the cover strip to provide resealable ports through which solutions can be introduced into, or extracted from, the reaction chambers. In an alternate embodiment, the microarrays are deposited directly onto the cover strip, eliminating the need for separate microarray substrates.

Abstract: The invention provides an apparatus for focusing ions exiting a multipole mass filter. In general terms, the ion focusing apparatus comprises: a housing having an ion entrance and an ion exit, and, contained within the housing: a) a multipole ion guide having an open ion entrance end, and b) a neutral gas. The ion focusing apparatus is configured so that an ion beam enters the housing via the ion entrance and is collisionally focused by the multipole ion guide and neutral gas prior to exiting the housing. The apparatus is readily employed to collisionally focus an ion beam exiting a quadrupole mass filter. Also provided is a mass spectrometry system containing the ion focusing apparatus, and methods employing the same.

Abstract: A switch comprises an input contact and at least one output contact, a single droplet of conductive liquid located in a channel, the droplet being in constant contact with the input contact, and a heater configured to heat a gas. The heated gas expands to cause the droplet to translate through the channel.

Abstract: Disclosed is a device for releasable connecting an interface with a load board for providing a mechanically pressing of the components against each other. The device comprises a toroidal lock, which is operated by at least one lever to transmit the lock from a releasing position to a locking position. This device enables a quick change of Load boards to the interface with a reproducible positioning. The load board may include extensions, such as rollers, that enter slot-like guides in the toroidal lock and that are to be retained in these guides when the lock is rotated to a locking position.

Abstract: A housing for a thin active probe has two identical molded housing-halves that when assembled form a cavity that encloses the chassis upon which is carried the active circuitry of the probe. The parts exhibit complementary self-symmetry about a longitudinal axis, such that when one is rotated about that axis it performs the mating functions needed to interlock with another part representing its un-rotated self. Interlocking is accomplished by circular tabs and sockets that interfere and prevent the parts from separating once the tabs are in the sockets. The circular tabs are joined to the balance of the housing-half that carries them by a narrow neck and can be sprung over the other housing-half to return to their natural position and fit into a circular socket in that other housing-half.

Abstract: A technique for establishing a tuning signal window for a multi-band VCO involves setting the tuning signal window to an initial size, preferably a relatively small size, and determining whether the VCO is churning. When the VCO is determined to be churning, the tuning signal window is expanded until the VCO stops churning. In an embodiment, the tuning signal window is expanded incrementally until the tuning signal window is large enough to include a solution, where a solution is defined as an operating point along a frequency band that satisfies both the setpoint frequency and tuning window signal requirements. The tuning signal window can be set at an offset relative to the tuning signal zero to compensate for shifts in the frequency bands that may result from changes in operating conditions.

Abstract: The invention provides a composition, kit and method for hybridizing a probe and target at a temperature lower than their standard hybridization temperature. The chemical component added to the composition has a formula R(NH2)C?O, where R is amino or alkyl. A method for use of the chemical component and composition is also disclosed.

Abstract: Methods, systems and computer readable media for identifying print errors caused by erroneous print pattern data received at the printhead of a printer. Methods, systems and computer readable media are also provided for preventing printing according to erroneous printing pattern data received at the printhead. Methods, systems and computer readable media are provided for enhancing the printing speed of a system adapted to identify or prevent printing errors. Further, methods and systems for providing delayed clocking are used for accurate clocking of a printing signal that is sent back from the printhead to the printhead controller for purposes of comparison with a locally stored set of printhead pattern data.

Abstract: A method and apparatus for a wiping fixture probe for cleaning oxides, residues or other contaminants from the surface of a solder bead probe and probing a solder bead probe on a printed circuit board during in-circuit testing.

Abstract: An impedance analyzer includes a reference signal, a first converter a first coupler, a second converter, a second coupler, a modification circuit, a reference signal detector, and a reflected signal detector. The first coupler couples the reference signal to the first converter. The first converter produces a reference intermediate frequency signal. The second coupler couples a reflected signal to the second converter. The second converter produces a reflected intermediate frequency signal. A reflection coefficient for a device under test is determined by using a reflected value detected by the reflected signal detector and a reference value detected by the reference signal detector. In a first operating mode of the impedance analyzer, the reflected intermediate frequency signal is forwarded directly to the reflected signal detector.

Abstract: A tri-axial handling apparatus, in particular for fluid analysis devices, for example for micro-fluid analysis. The handling apparatus comprises at least three axle bodies, each exhibiting a guide component and a carrier component, which by means of a drive is translationally movable on the guide component in the direction of an axis of movement. A guide component of a first axial body is secured to the carrier component of a second axial body, whose guide component is secured to the carrier component of a third axial body. Preferably, each drive for the respective carrier component is a linear motor, which is secured to the respective axle body.