Abstract: Methods and compositions for high-throughput identification of protein/nucleic acid binding pairs are provided. In the subject methods, a nucleic acid probe array, e.g., a molecular beacon probe array, is contacted with a target nucleic acid population to produce a hybridized array. The resultant hybridized array is then contacted with a population of proteins to produce a protein bound array. Any resultant array surface bound target nucleic acid/protein complexes are then detected to identify protein/nucleic acid binding pairs. In certain embodiments, the protein and/or nucleic acid members of the identified protein/nucleic acid binding pairs are further characterized. Also provided are systems and kits for use in practicing the subject methods. The subject invention finds use in a variety of different applications.

Abstract: A layout independent test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. Each test access point structure is conductively connected to various locations along a trace at a test access point and above an exposed surface of the printed circuit board to be accessible for probing by a fixture probe.

Abstract: A random component of jitter and a deterministic component of jitter are separated. A measured jitter distribution is obtained. A form is selected for a selected component of jitter. The selected component of jitter is either the random component of jitter or the deterministic component of jitter. A remaining component of jitter is either the random component of jitter or the deterministic component of jitter, whichever is not the selected component of jitter. The selected form for the selected component of jitter is convolved with a generalized function for the remaining component of jitter to produce a resulting equation. The resulting equation is fitted to the measured jitter distribution.

Abstract: Systems methods and recordable media for predicting multi-variable outcomes based on multi-variable inputs. Additionally, the models described can be used to predict the multi-variable inputs themselves, based on the multi-variable inputs, providing a smoothing function, acting as a noise filter. Both multi-variable inputs and multi-variable outputs may be simultaneously predicted, based upon the multi-variable inputs. The models find a critical subset of data points, or “tent poles” to optimally model all outcome variables simultaneously to leverage communalities among outcomes.

Abstract: Embodiments of the current-mode track and hold circuit comprise a cascode input stage, a dynamic biasing stage, a cascode output stage, and a switch operable to interconnect the input stage and the output stage. The input stage is connected to receive an input current. The dynamic biasing stage is connected to receive a scaled version of the input current as a dynamic biasing current and dynamically biases the input stage in response to the dynamic biasing current. Dynamically biasing the track-and-hold circuit in response to a dynamic biasing current that is a scaled version of the input current significantly increases the maximum peak-to-peak voltage swing allowed at the input of the track-and-hold circuit and enables a corresponding increase in signal-to-noise ratio. These benefits are obtained at the expense of only a small increase in power consumption.

Abstract: A system and method for providing an improved microchip measurement apparatus comprising an external reservoir connected via an input line and output line to a well disposed on the microchip. The reservoir and well may be sealed and a pump connected to the input line so as to enable a continuous flow of liquid from the reservoir to the well. In addition, the volume of liquid in the well may be kept constant, thereby improving the overall measurement accuracy.

Abstract: The present invention is directed to a method for an electrically conductive structure on a printed circuit board for connecting an element on the printed circuit board with other elements. The electrically conductive structure may include a contact pad on a first side of the printed circuit board and two or more connection pads on the first side of the printed circuit board. The two or more connection pads are in close physical proximity to the contact pad and electrically connected to the contact pad. The element on the printed circuit board is directly connected to one the two or more connection pads electrically. The structure permits various engineering changes to the electrical connections of elements on the printed circuit board by desoldering electrical connections to the two or more connection pad, by severing traces to the connection pads, or by severing the electrical connection between the connection pads and the contact pad.

Abstract: Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probe insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred and alternate probing locations for said respective nets.

Abstract: A process for protecting a filament in a thermal conductivity detector from chemical corrosion includes changing the flow direction of the column effluent in the thermal conductivity detector to allow the column effluent to bypass the filament when an undesired compound appears in the column effluent. The flow direction of the column effluent in the thermal conductivity detector is changed when the undesired compound disappears from the column effluent to allow the column effluent to pass through the filament. A thermal conductivity detector that allows the column effluent to (1) bypass the filament when an undesired compound appears in the column effluent and (2) pass through the filament when the undesired compound disappears in the column effluent is also described.

Abstract: An isolation resistor is incorporated into the plunger of a probe tip spring pin by, for example, doping a ceramic that is used to form the plunger, or forming the plunger of first and second electrically coupled materials, at least a first of which has a resistivity sufficient to serve as an isolation resistor. Alternately, an isolation resistor is embedded in a printed circuit board trace that is used to couple either an upper or lower blind plated hole to a via. A probe tip spring pin is then inserted into the upper blind plated hole.

Abstract: Systems and methods for performing multi-measurements are provided. One such method includes: displaying a first icon corresponding to a multi-source measurement, displaying waveforms, visually associating the first icon with at least one of the waveforms responsive to user input, and performing a multi-source measurement related to the waveforms.

Abstract: There is provided a determination apparatus. The determination apparatus includes (a) a determination device having a plurality of determination terminals, (b) a controller for selecting at least one of the plurality of determination terminals, determining a calibration reference standard, and setting of a property value of the determined calibration reference standard, and (c) a memory for storing a parameter of the determined calibration reference standard and a determined value for the parameter as determined by the determination device. The determination device determines an error of the determined value of the parameter, the error being stored in the memory, the determination device outputting the determined value after removing an effect of the error therefrom, and obtaining and storing a re-determined value for the parameter while maintaining the determined value of the parameter of the calibration reference standard in the memory.

Abstract: Apparatus for delivering ions to a mass analyzer. The apparatus includes a time of flight ion guide, a pulsing device for receiving a continuous ion stream containing ions of different atomic mass and for delivering pulses of ions to the ion guide wherein ions in each of the pulses of ions exit the ion guide in ascending order of their atomic mass, and a gating device at the exit end of the ion guide for allowing ions of a predetermined atomic mass to pass to the mass analyzer.

Abstract: A method of operating an ion filter for selecting ions and related apparatus. The filter have a plurality of elongated electrodes, and the ions have a secular frequency. The method comprises exciting each elongated electrode with a first voltage component, the first voltage component having a first amplitude and a first frequency; exciting each elongated electrode with a second voltage component, the second voltage component having a frequency substantially equal to a secular frequency of motion for the ion; and generating an electric field and rotating the electric field around the axis.

Abstract: A mass spectrometer system comprises a flight tube having an operational length, a measurement device for measuring a variation in the longitudinal length of the flight tube, means for compensating for the measured variation in the longitudinal flight tube length, and a detector positioned near a downstream end of the flight tube. The measurement device comprises an optical interferometer, and may specifically comprise a Michelson interferometer. In a first embodiment, the mass spectrometer system includes an actuator coupled to the measurement device and the detector for moving the detector in a longitudinal direction to compensate for the measured variation in the operational flight tube length. In a second embodiment, the mass spectrometer system includes a processor coupled to the measurement device configured to calculate analyte ion mass to charge ratio. The processor is configured to modify a calculation of analyte ion mass to charge ratio using the measured variation in operational flight tube length.

Abstract: Embodiments of the invention involve UV resistant liquid crystal cells. One embodiment of the invention is to increase the volume of the liquid crystal material that is stored inside the cell. For example, trenches may be used to provide reservoirs that hold the additional liquid crystal material. The inventive cell can be used as a SLM in photolithographic imaging systems.

Abstract: An operating environment of a measurement apparatus for measuring semiconductor devices under test. In particular, a measurement apparatus for a device under test and a method using the measurement apparatus in which a user can promptly and easily understand the selection of the semiconductor measurement-evaluation application used for measuring the device under test, the setting of parameters used during execution, the display of the execution and the result of the execution, and the programming-related operations.

Abstract: There is provided a calibration method for a time measurement apparatus having a time-voltage converter for converting the time interval of measurement signals and clock signals to voltage, an analog-digital converter for converting this voltage to digital values, and a time interval measurement device for measuring this time interval from these digital values. The method includes a calibration signal generation step for calibrating the calibration signals for the subperiod of these clock signals, with these calibration signals having a shorter period difference than the time which corresponds to the resolution of this analog-digital converter; a frequency distribution analysis step for repeatedly measuring these calibration signals, finding this digital value, and analyzing the cumulative frequency distribution of these digital values; and a calibration determining step for determining the calibration value of these digital values such that this cumulative frequency distribution is linear.

Abstract: An inspection system uses microwave radiation to capture a microwave image of a transportable item. The system includes a transmit scanning panel including a transmit array of transmit antenna elements, each being programmable with a respective phase delay to direct a transmit beam of microwave radiation toward a target of the transportable item for transmission of the microwave radiation through the target. The system further includes a receive scanning panel including a receive array of receive antenna elements, each being programmable with a respective phase delay to receive a receive beam of microwave radiation from the target. A processor measures the amplitude and phase of the microwave radiation in the receive beam to determine a relative value of a pixel within the microwave image of the transportable item based on a reference value of the pixel.

Abstract: A rack for holding on its inside multiple electronic devices, which have fans for drawing outside air to inside the devices and exhaust ports for discharging air, including two pairs of support columns, the columns of each pair being placed parallel to one another in the front and the back at a pre-determined distance apart from one another, and air ducts for directing exhaust air from the above-mentioned exhaust ports of these electronic devices positioned between at least one pair of the two pairs of support columns, having a structure wherein there are side covers that cover the side surfaces, and the air ducts are installed between the pair of support columns between the side covers and the inside of the rack and are substantially formed from multiple panels adjacent to one another inside of the rack.