Patents Assigned to Agilent Technologies
  • Patent number: 6856184
    Abstract: A system that includes a first circuit configured generate a first set of encoded signals in response to a first clock signal and a second circuit configured to generate a second set of encoded signals in response to the first clock signal is provided. The system also includes a third circuit configured to generate a first pulse signal and a second pulse signal in response to the first set of encoded signals and the second set of encoded signals, and a fourth circuit configured to generate a second clock signal in response to the first pulse signal and the second pulse signal.
    Type: Grant
    Filed: January 15, 2003
    Date of Patent: February 15, 2005
    Assignee: Agilent Technologies, Inc
    Inventor: Takashi Hidai
  • Patent number: 6855271
    Abstract: An improved coated phosphor filler for an optical device includes a plurality of individual phosphor filler particles, and a coating layer having a plastic substance coated on each of the phosphor filler particles.
    Type: Grant
    Filed: January 21, 2004
    Date of Patent: February 15, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Bee Yin Chua
  • Patent number: 6854980
    Abstract: The present invention provides a probe card comprising a substrate and an external connection terminal located on substrate, wherein external connection terminal 1 is separated from a body of substrate by conductors attached to the substrate, whereby the waiting time due to dielectric absorption can be constantly shortened, and the steady-state leakage current can be stably reduced, thereby enhancing the accuracy of measuring microcurrents and determining microcurrent fluctuations for semiconductor wafer testing devices.
    Type: Grant
    Filed: March 31, 2003
    Date of Patent: February 15, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Yukoh Iwasaki
  • Patent number: 6854179
    Abstract: A circuit feature that is interior to a packaged integrated circuit is modified by first identifying a trimming point on the interior circuit feature using an x-ray inspection system. Coordinates of the trimming point are then related to the coordinates of a visible reference marker. The relationship between the visible reference marker and the trimming point is then used to position a cutting tool over the trimming point. Finally, the cutting tool is used to make one or more cuts into the packaged integrated circuit, until the interior circuit feature has been acceptably modified at the trimming point.
    Type: Grant
    Filed: July 25, 2002
    Date of Patent: February 15, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Albert An-Bon Yeh, Regina Nora Pabilonia, Robert William Kressin, Wei Liu
  • Patent number: 6856460
    Abstract: A light transmission system includes a laser, an optical fiber, and a transfer lens. The transfer lens transfers light emitted by the laser into the optical fiber. The transfer lens includes a diffractive surface for receiving and collimating the light originating form the laser. The diffractive surface is defined by a surface function that includes a first phase function having angular symmetry and a second phase function having radial symmetry. The second phase function includes a cusp region with a discontinuous slope therein. The transfer lens provides reflection management so that light reflected from the end of the optical fiber is not focused at a location at which light is emitted by the laser and also favorable launch conditions so that light launched into the optical fiber avoids index anomalies along the axis of the optical fiber.
    Type: Grant
    Filed: June 27, 2003
    Date of Patent: February 15, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Christopher L. Coleman, Ye Christine Chen
  • Patent number: 6856126
    Abstract: A voltage probe includes a first signal lead configured to receive a first signal from a device under test, a first probe-tip network that is coupled to the first signal lead and that has a frequency response that includes a first transmission zero, a first compensation network that is coupled to the first probe-tip network and that has a frequency response that includes a first transmission pole, a second signal lead configured to receive a second signal from the device under test, a second probe-tip network that is coupled to the second signal lead and that has a frequency response that includes a second transmission zero, a second compensation network that is coupled to the second probe-tip network and that has a frequency response that includes a second transmission pole, and a differential amplifier circuit that is coupled to the first compensation network and to the second compensation network, and that is configured to provide a third signal that is responsive to the first signal and to the second sign
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: February 15, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Michael T. McTigue, Kenneth Rush, Bob Kimura, Michael J. Lujan
  • Patent number: 6856924
    Abstract: Sampling is performed. A strobe signal is generated from a first signal. Multiple sampled signals are sampled using the strobe signal. Each of the multiple sampled signals is synchronous with its own clock reference and each of clock references are asynchronous with respect to each other. Analog-to-digital conversion is performed on each sampled value of each of the multiple sampled signals. For each of the clock references that is not synchronous with the first signal, a phase comparison is performed between the clock reference and the first signal to produce a difference value. The difference value indicates a phase difference between the clock reference and the first signal. Analog-to-digital conversion of the difference value is performed at a frequency determined by the strobe signal.
    Type: Grant
    Filed: February 25, 2003
    Date of Patent: February 15, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Willard MacDonald
  • Patent number: 6853791
    Abstract: A two-dimensional photonic crystal slab apparatus having a waveguiding capability is provided. Noncircular holes are introduced to replace the circular holes in the two-dimensional lattice of the photonic crystal to provide waveguiding capability. Waveguide bends and splitter using noncircular holes with high transmittances are described for symmetry planes of the two dimensional lattice structure.
    Type: Grant
    Filed: October 31, 2002
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Mihail M. Sigalas
  • Patent number: 6853534
    Abstract: A tunable capacitor. The tunable capacitor has a first fixed capacitor electrode and a second fixed capacitor electrode opposite to one another. The tunable capacitor also has a movable element formed of a conductive material. The movable element is moveable between the first fixed capacitor electrode and the second fixed capacitor electrode to adjust the capacitance between the first fixed capacitor electrode and the second fixed capacitor electrode.
    Type: Grant
    Filed: June 9, 2003
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Kirt R. Williams
  • Patent number: 6853744
    Abstract: An improved circuit board inspection system incorporates a technique that confirms observed electrical connection defects. The improved circuit board inspection system applies a localized investigative routine upon portions of a printed circuit board having one or more identified defects. The technique accounts for the slope of a portion under test of the printed circuit board and provides results that are more accurate from inspection systems that report electrical connection defects.
    Type: Grant
    Filed: December 14, 2001
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Horst Mueller, Sunit Bhalla, Kris Kanack, Stig Oresjo
  • Patent number: 6853176
    Abstract: A self-balancing impedance bridge circuit apparatus includes a sensor device and an electrical element providing a selectable impedance value such that the impedance of the sensor device corresponds to the temperature of the sensor device remaining within acceptable limits.
    Type: Grant
    Filed: January 27, 2004
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Anthony Lymer
  • Patent number: 6853707
    Abstract: An x-ray shielded imaging detector is disclosed. In one embodiment, the x-ray shielded imaging detector comprises a scintillator, a photodetector, and an optical connection between the scintillator and the photodetector. The x-ray shielded imaging detector also includes a first high density shielding material adjacent the optical connection. The first high density shielding material absorbs x-ray energy and attenuates it before the x-ray energy reaches the photodetector when the x-ray energy impinges on the x-ray shielded imaging detector at an angle other than perpendicular to a major axis of the scintillator and the photodetector. Other embodiments and related methods of operating an x-ray system are also disclosed.
    Type: Grant
    Filed: September 5, 2002
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Ronald K Kerschner
  • Patent number: 6853778
    Abstract: The optical module optically aligns two adjacently located optical components. The optical module comprises a substrate and at least one pre-alignment groove formed therein for coarsely aligning the two optical components. The optical components are seated in the at least one groove with a gap between them. The optical module further comprises a waveguide core located in the gap between the two optical components. The waveguide core extends from a light-guiding portion of one optical component to a light-guiding portion of the other optical component and guides light from one optical component to the other.
    Type: Grant
    Filed: September 18, 2002
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Rene P. Helbing, Kenneth R. Wildnauer
  • Patent number: 6853663
    Abstract: An optical semiconductor device having an active layer for generating light via the recombination of holes and electrons therein. The active layer is part of a plurality of semiconductor layers including an n-p junction between an n-type layer and a p-type layer. The active layer has a polarization field therein having a field direction that depends on the orientation of the active layer when the active layer is grown. In the present invention, the polarization field in the active layer has an orientation such that the polarization field is directed from the n-layer to the p-layer.
    Type: Grant
    Filed: December 21, 2001
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Ghulam Hasnain, Richard P. Schneider, Scott W. Corzine, Mark Hueschen, Tetsuya Takeuchi, Danny E. Mars
  • Patent number: 6853273
    Abstract: Disclosed herein is a relay having a first circuit, a second circuit, a ground, an electro-magnetic actuator assembly, and an armature assembly. The armature assembly is movable between first and second positions with respect to the first and second circuits, and is controlled by the electro-magnetic actuator assembly. Movement of the armature assembly to its first position allows current to flow through the first circuit. Movement of the armature assembly to its second position couples the first circuit to the ground and allows current to flow through the second circuit. The ground may be embodied in an extension of the armature assembly that contacts the first circuit when the armature assembly moves to its second position, or the ground may be embodied in a biased conductor that is moved into contact with the first circuit when the armature assembly moves to its second position.
    Type: Grant
    Filed: December 20, 2001
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: James A. Freeman
  • Patent number: 6853492
    Abstract: A method and system for a conductive lens. In one method embodiment, the present invention forms a silver flash layer on a lens. A polyester sheet is then applied over the silver flash layer. Openings are utilized in the polyester sheet to expose an edge portion of the silver flash layer. A conductive bus layer is then applied around the edges of the lens, the conductive bus providing an electrical coupling between the silver flash layer and the conductive bus. In so doing, a lens that is visually transparent but electromagnetic interference (EMI) opaque is formed.
    Type: Grant
    Filed: October 27, 2003
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Lee Seng Lau, Boon Leong Yeap, Woai Sheng Chow
  • Patent number: 6852850
    Abstract: A method of fabricating polynucleotide arrays includes dissolving a nucleotide monomer, oligonucleotide, or polynucleotide in a solvent containing ionic liquid and depositing the resulting solution on an array substrate. The method has particular application to fabrication of an addressable array of polynucleotides on a substrate that carries substrate bound moieties each with a hydroxyl group. The process may be repeated at specific locations on the array to elongate the polynucleotide deposited on the array.
    Type: Grant
    Filed: October 31, 2001
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Joel Myerson, Michel G M Perbost, Douglas J Dellinger, Geraldine F. Dellinger
  • Patent number: 6853198
    Abstract: A method and apparatus for calibrating a measurement path of 2N measurement ports comprises presenting a high reflect calibration standard at each measurement port and measuring a reflection characteristic for each measurement port, presenting a line calibration standard and a through calibration standard between each one of N direct pairs of the measurement ports and measuring forward and reverse reflection and transmission responses and calculating a load match error coefficient for each measurement port, and presenting only the through calibration standard between indirect pairs of measurement ports and calculating the forward and reverse transmission tracking for each indirect pairs of measurement ports.
    Type: Grant
    Filed: November 14, 2002
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Ali Boudiaf, Vahe Adamian, Peter Phillips
  • Patent number: 6853932
    Abstract: A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan may comprise a specification of the following, for example, for each of the channels: a label describing use of the corresponding channel, a center frequency, a bandwidth, a power level, information regarding the carrier roll-off, a default status indicator identifying whether the corresponding channel is currently allocated or reserved for future use, one or more default threshold levels for various tests, and an alternate center frequency that may be utilized by the corresponding channel. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan.
    Type: Grant
    Filed: November 30, 1999
    Date of Patent: February 8, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: James Wichelman, Bruce Votipka, Eric N. Flink, Craig Chamberlain
  • Patent number: 6851076
    Abstract: The various functions that are desirable for interior test memory within a memory tester are implemented in Memory Sets each serving as the host for one or sometimes more of such functions. For certain classes of testing a portion of interior test memory can be used as a Stimulus Log RAM that operates as an ideal DUT to create the correct conditions that are to exist in an actual DUT after testing. The actual part can then be tested, while the expected receive vectors are taken from the Stimulus Log RAM, and the comparison results sent to an ECR, Tag RAM's, etc., as usual. In this way the test program does not have to create or contain within itself the particular receive vectors that are the expected response from the applied stimulus.
    Type: Grant
    Filed: September 28, 2000
    Date of Patent: February 1, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: John H Cook, III, Stephen D Jordan, Preet P Singh