Patents Assigned to Agilent Technologies
  • Patent number: 7440863
    Abstract: Methods, tools, systems and computer readable media for compliance testing instrumentation and/or software. Data from one or more analytical instruments and/or software is converted to a technology-neutral format, which is independent of instrument type, instrument model, instrument manufacturer and data type of the analytical instrument or software from which the data was outputted. Calculations are performed on the converted data to produce one or more outputs, and then selection is made from the one or more outputs to populate a final report, wherein the one or more outputs are standardized and are directly comparable to outputs resultant from carrying out the method on another set of one or more other analytical instruments and/or software, irrespective of manufacturer or model of the other analytical instruments and/or software.
    Type: Grant
    Filed: April 29, 2005
    Date of Patent: October 21, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Charles Manfredi
  • Patent number: 7440113
    Abstract: An apparatus and method for measuring displacement includes a light beam directed to an interferometer core that splits the light beam into first and second component beams. The first component beam is directed to a diffraction grating at approximately a Littrow angle. A diffraction is received by the interferometer core and is combined with the second component beam. The combination of the first and second component beams is measured to determine displacement of the diffraction grating.
    Type: Grant
    Filed: December 23, 2005
    Date of Patent: October 21, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: William R Trutna, Jr., Geraint Owen, Alan B Ray, James Prince, Eric Stephen Johnstone, Miao Zhu, Leonard S Cutler
  • Patent number: 7439897
    Abstract: Staggered interleaved Nyquist regions associated with differing ADC clock rates (FCLK) avoids spectrum lost through disjoint guard bands at the end of or between adjacent Nyquist regions. The staggered interleaved Nyquist regions overlap by an amount at least as much as is consumed by the guard bands. Selectable anti-aliasing filters associated with each Nyquist region and its ADC clock rate are used to enforce the staggered Nyquist regions and their various guard bands. For example, and neglecting guard bands, an initial raw band of operation RB1 may be the First Nyquist region for a basic sampling frequency Fs. An adjacent raw band of operation RB2 that overlaps RB1 may be the Second Nyquist region for an alternate sampling frequency 2Fs/3. An adjacent raw band of operation RB3 that overlaps RB2 may be the Second Nyquist region for the basic sampling frequency Fs. These raw bands interleave and overlap: RB1: DC to Fs/2 1st Nyq. for FCLK = Fs RB2: (2/3)Fs ? to 2(2Fs/3)/2 = 2nd Nyq.
    Type: Grant
    Filed: April 26, 2007
    Date of Patent: October 21, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Joseph M. Gorin, Kenneth D. Poulton
  • Patent number: 7440862
    Abstract: Embodiments of the present invention use the results of a plurality of defect detecting tests and adjust the result of each test in a manner that reflects the accuracy of the test that produced it. A manufactured unit can then be evaluated using a mathematical combination of the adjusted results.
    Type: Grant
    Filed: May 10, 2004
    Date of Patent: October 21, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Jonathan Qiang Li, Daniel A. Usikov
  • Publication number: 20080256337
    Abstract: In the field of data communications, it is desirable to track bits of a bit sequence remaining to be decoded by a decoder. A method of decoding the bit sequence that corresponds to a PDU comprises reading-in a bit sequence and processing the bit sequence. In order to maintain a record of the bits reaming to be processed, a data stack is used during decoding of the bit sequence.
    Type: Application
    Filed: April 14, 2008
    Publication date: October 16, 2008
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Kevin Mitchell, Tony Kirkham
  • Patent number: 7437265
    Abstract: A method for designing a measurement/control system that enables a system designer to explicitly specify the portions of a measurement/control system that are subject to a set of time constraints and the portions of the measurement/control system that are not directly subject to the set of time constraints. A method according to the present teachings includes determining an HRT/SRT boundary between a hard real-time (HRT) portion of a measurement/control system and a soft real-time (SRT) portion of the measurement/control system and determining a buffer for the HTR/SRT boundary in response to a set of time constraints associated with the HRT portion.
    Type: Grant
    Filed: April 29, 2005
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: John C. Eidson
  • Patent number: 7436991
    Abstract: A system and method utilize data buffers and data access schedules to improve handling of captured image data of an object under inspection for tomosynthetically processing such captured image data to reconstruct desired cross-sectional images therefrom. One embodiment implements a data buffer communicatively coupled to a radiographic imaging system that allows for storage of captured radiographic image data for at least a portion of multiple different projections of an object under inspection, such as image data associated with one or more angles of view of one or more different regions of the object, and then later that stored data may be used for tomosynthetically reconstructing cross-sectional images for the object under inspection.
    Type: Grant
    Filed: August 29, 2003
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Steven Greenbaum, Lee A. Barford, Stanley T. Jefferson
  • Patent number: 7435951
    Abstract: The invention provides a mass spectrometry system ion source containing a sample plate and an illumination device that is configured to produce a light beam that contacts the sample plate surface to define a grazing angle between the light beam and the sample plate surface. The ion source may also contain an imaging device, e.g., a CCD or CMOS camera or the like, for viewing the area. In one embodiment, the imaging device may be connected to a display, e.g., a video monitor. Methods and mass spectrometry systems empliying the ion source are also provided.
    Type: Grant
    Filed: June 8, 2005
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Jean-Luc Truche, Gregor T. Overney, William D. Fisher, Richard P. Tella
  • Patent number: 7437249
    Abstract: Methods, systems and computer readable media for removing trends in signal intensity values from features on a chemical array. Inputted signal values from features on the array are surface fitted to calculate a surface approximation. The surface approximation is normalized and used to de-trend the signal intensity values from the features.
    Type: Grant
    Filed: June 30, 2006
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: John Frederick Corson, Jayati Ghosh, Svetlana Shchegrova
  • Patent number: 7437638
    Abstract: Disclosed herein are various methods and apparatus related to Boundary-Scan testing, including a method for generating Boundary-Scan test vectors. The method assigns different binary signatures to all of the drivers and hysteretic test receiver memories of a circuit assembly under test, and then generates a series of Boundary-Scan test vectors wherein each test vector is derived from corresponding bits of the binary signatures.
    Type: Grant
    Filed: November 12, 2002
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Kenneth P. Parker
  • Patent number: 7437486
    Abstract: A measurement device having a configurable measurement interface that enables the dynamic allocation of responsibilities among front-end and back-end subsystems of a measurement device. A measurement device according to the present teachings includes a front-end subsystem for performing an interaction with a physical environment and back-end subsystem having a set of resources for supporting the front-end subsystem. The front-end and back-end subsystems are coupled to and communicate through a measurement interface. The front-end subsystem transfers a set of bootstrap information via the measurement interface to the back-end subsystem and in response the back-end subsystem configures the resources to support the front-end subsystem.
    Type: Grant
    Filed: December 23, 2003
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Jefferson B. Burch, Glenn R. Engel, Glen L. Purdy, Jr.
  • Patent number: 7436519
    Abstract: A method for non-linearity compensating interferometer position data generated from a measurement signal includes generating a first set of non-linearity parameters based on received digital position values. The method includes sensing whether a low velocity condition exists. A first one of the non-linearity parameters is updated based on an estimated magnitude of the measurement signal if the low velocity condition exists. At least one digital position value is compensated based on the updated non-linearity parameter if the low velocity condition exists.
    Type: Grant
    Filed: June 1, 2005
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: David C. Chu, Lee C. Kalem, William Clay Schluchter
  • Patent number: 7437391
    Abstract: In one embodiment, the present invention is directed to a numerically controlled oscillator. The numerically controlled oscillator comprises: a phase accumulator for receiving an input digital word; and a phase to amplitude converter that is operatively coupled to the phase accumulator to receive a first phase signal and a second phase signal, the phase to amplitude converter calculating a sine value and a cosine value of each of the first and second phase signals, the phase to amplitude converter generating a summation of (i) a product of the sine value of the first phase signal and the cosine value of the second phase signal and (ii) a product of the sine value of the second phase signal and the cosine value of the first phase signal.
    Type: Grant
    Filed: June 14, 2004
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Brian M. Miller
  • Patent number: 7436877
    Abstract: A Method and Apparatus to Perform Surgical Reactive Jamming while Maintaining Simultaneous Tactical Communications is disclosed. The system provides an enhancement to surgical reactive jammers that combines near-real-time jamming capability with the additional feature of allowing tactical communications. The tactical communications transmissions are compressed and packetized such that they can be broken up and transmitted during the jamming system's look-through periods. This approach facilitates listening during these look-through periods (not only for EW emitters, but also for friendly communications signals). The system should allows for talk during these look-through periods (“talk-through” periods). Such a system is unique in that it can automatically calculate the best frequency for a surgical reactive jammer to use against enemy targets as well as providing a fully secure tactical communications link which is synchronized with other units in the field.
    Type: Grant
    Filed: July 3, 2006
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Lars Karlsson
  • Patent number: 7437275
    Abstract: Methods, systems and computer program products for performing multi-location execution of tests between or among multi-sided test components in a wireless environment are described. Multiple flows are initiated substantially simultaneously and concurrently executed. A graphical representation of a multi-flow test is created that permits synchronization of the flows among agents at multiple remote locations. The graphical representation is converted into a textual representation in an open communication standard format, and information regarding each flow involved in the test is ascertained. The flows are substantially simultaneously initiated and concurrently executed with synchronization and dynamic data exchange components.
    Type: Grant
    Filed: November 1, 2005
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Abhay Sathe, Thomas G. Bartz, Nimal Gamage, David E. Bingham, Carolyn Darbie, Stephen C. Booth
  • Patent number: 7435810
    Abstract: A method of fabricating polynucleotide arrays includes dissolving a nucleotide monomer, oligonucleotide, or polynucleotide in a solvent containing ionic liquid and depositing the resulting solution on an array substrate. The method has particular application to fabrication of an addressable array of polynucleotides on a substrate that carries substrate bound moieties each with a hydroxyl group. The process may be repeated at specific locations on the array to elongate the polynucleotide deposited on the array.
    Type: Grant
    Filed: December 22, 2004
    Date of Patent: October 14, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Joel Myerson, Michel G M Perbost, Douglas J Dellinger, Geraldine F Dellinger
  • Patent number: 7431044
    Abstract: An apparatus and method for adjusting the orientation of a lubricant-retaining basin is disclosed. The apparatus includes a cabinet configured for retaining a vacuum pump and a lubricant-retaining basin. A rotatable member engages the lubricant-retaining basin and elevates the back end of the basin to permit drainage of lubricant from the front end of the basin.
    Type: Grant
    Filed: January 28, 2005
    Date of Patent: October 7, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Robert Dallas Ricker, Viet X. Nguyen, Bernard John Permar, Jerome M. Szczepaniak, Lindy T. Miller, Eric Alan Schneider, Bill Van Ocker
  • Patent number: 7430227
    Abstract: A wavelength tunable laser unit has a laser mode selection, and is adapted to provide a laser signal in accordance with one or more laser control parameters. For operating the laser unit, the laser signal is swept in a wavelength range, a laser operation signal indicative of the laser unit's operation during the sweep is received, and the laser operation signal is analyzed for detecting an indication of a mode hop occurred in the generated laser signals during the sweep. At least one correction value is determined based on the detected mode hop indication, and at least one of the one or more laser control parameters, applicable for a next wavelength sweep, is modified based on the determined at least one correction value.
    Type: Grant
    Filed: April 30, 2002
    Date of Patent: September 30, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Michael Schubert, Bernd Nebendahl, Emmerich Mueller, Ralf Haeussler, Wolf Steffens
  • Patent number: 7429869
    Abstract: A coefficient indicating the relationship between a measurement voltage of voltage measuring unit and a voltage drop in a drain bias voltage due to drain current is determined based on an S parameter of a bias tee and an input impedance of the measuring unit. A voltage drop at the drain is determined from the coefficient. Based on the determined voltage drop, a drain bias voltage actually applied to the drain of an FET is determined. Also, a coefficient for converting the measurement voltage of the measuring unit into a drain current is determined based on an S parameter of a two-terminal-pair network of the bias tee and the input impedance of the voltage measuring unit. Based on the determined coefficient, a drain current actually flowing in the FET is determined.
    Type: Grant
    Filed: June 14, 2006
    Date of Patent: September 30, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Yasushi Okawa
  • Patent number: 7430488
    Abstract: A measurement system comprising modules for receiving analog measurement signals and outputting digital data and a controller for receiving and data processing of these digital data, this measurement system, wherein these modules comprise a A/D converter for converting analog measurement signals to digital data and measuring these data, an output for outputting these digital data, and a controller for controlling the timing of these measurements and the timing of these outputs, and in that the control by the controller is accomplished by outputting during the breaks between multiple measurements.
    Type: Grant
    Filed: March 10, 2005
    Date of Patent: September 30, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Takuya Otani