Abstract: A linear ion trap traps a plurality of charged particles in a charged particle trap including first and second electrode mirrors arranged along an axis at opposite ends of the particle trap, the electrode mirrors being capable, when voltage is applied thereto, of creating respective electric fields configured to reflect charged particles causing oscillation of the particles between the mirrors. The method includes: (a) introducing into the charged particle trap the plurality of charged particles, the particles having a spread in the oscillation time of the particles per oscillation; (b) applying voltage to the electrode mirrors during step (a) to induce a relatively weak self-bunching of the charged particles; and (c) after the plurality of charged particles has been introduced into the charged particle trap, waiting for a time period ?T and then changing the voltage so as to induce a relatively stronger self-bunching among the charged particles.
Abstract: Equalized Acquisition Record are prepared from Original Acquisition Records reflecting Total Jitter and from an existing description of DDJ. Removal of timing DDJ alters the locations of edges associated with data events. Voltage DDJ adjusts the asserted voltage in the central portion of a Unit Interval. One technique for equalizing timing jitter variably interpolates along the existing Original Acquisition Record to discover plausible new voltage values to assign to existing sample locations along the time axis. Another technique construes the desired amount of correction for each data event as an impulse that is applied to a Finite Impulse Response Filter whose output is a Voltage Correction Waveform having a smoothed voltage excursion. Time variant voltage values output from the Finite Impulse Response Filter are collected into a Voltage Correction Waveform Record having entry times found in the Original Acquisition Record.
Abstract: Separation and analysis of measured Total Jitter (TJ) begins with a suitably long arbitrary digital test pattern, from which an Acquisition Record is made. A Time Interval Error (TIE) or Voltage Level Error (VLE) Record is made of the Acquisition Record. A Template defines a collection of associated bit value or transitions that are nearby or otherwise related to a bit location of interest, and has associated therewith a collection of Descriptors and their respective Metrics. Each Descriptor identifies one of the various different patterns of bit value or transitions that fit the Template. The TIE/VLE Record is examined, and a parameter is measured for each instance of each Descriptor for the Template. The collection of measured parameters for each particular Descriptor are combined (e.g., averaging) to produce the Metric for that Descriptor.
Abstract: A method of determining position information, the method having detecting—along a first direction—a value of a geometry parameter related to a structure formed on and/or in a substrate, and determining—with regard to a second direction—a value of a position parameter based on the detected value of the geometry parameter and a predetermined relationship between the geometry parameter and the position parameter.
Type:
Grant
Filed:
August 18, 2006
Date of Patent:
January 20, 2009
Assignee:
Agilent Technologies, Inc.
Inventors:
Stefan Falk-Jordan, Bernd Nawracala, Hans-Peter Zimmermann
Abstract: Digitally sampled real or sampled and down-converted complex data representing an RF signal are received. One or more statistical computations are calculated for each group of N data values. The one or more statistical computations are calculated for groups of N data values until a particular number of data values (K) are acquired. The one or more statistical computations calculated for each group are computed and stored at the time of acquisition and are available for immediate viewing on a display.
Abstract: A noise signal generator includes a random word generator for generating a sequence of random words, each word representing an input value, a mapping unit for receiving the sequence of random words, mapping each input value to an output value of according to a probability distribution function, and providing a corresponding sequence of output values, and a digital-to-analog converter for generating a noise signal based on the output values.
Type:
Grant
Filed:
March 31, 2006
Date of Patent:
January 20, 2009
Assignee:
Agilent Technologies, Inc.
Inventors:
Martin Muecke, Joachim Moll, Marcus Mueller
Abstract: Systems and methods for optimizing the analysis of co-eluting compounds during a cycle of a tandem mass spectrometer system are provided. The tandem mass spectrometer system switches fast from analyzing one compound ion to analyzing another compound ion and from one collision cell energy to another. The fast switching allows complex sampling patterns that improve coverage of the ionic signal of the co-eluting compounds while allowing different collision cell energies to be analyzed.
Type:
Grant
Filed:
August 24, 2006
Date of Patent:
January 20, 2009
Assignee:
Agilent Technologies, Inc.
Inventors:
Gregor Overney, William Frazer, Harry Bunting, Chiachen Chang
Abstract: A separation unit comprising a magazine unit with a magazine is described. The magazine comprises a plurality of pockets, each pocket being adapted for accommodating a separation column for separating compounds of a fluid sample. The magazine unit is adapted for moving any of the pockets to a structural component, wherein a pocket and the structural component are adapted for complementing one another to form a column compartment.
Abstract: A User Programmable Key resides on an instrument to assist a user to access and execute preferred features of the instrument in a minimal amount of time. A feature or a set of features are programmed into the User Programmable Key by a user from some or all of the available features in an instrument. The User Programmable Key is assigned to an area adjacent or on the graphical user interface and visible while a user accesses other available buttons, menus or features of an instrument's menu tree.
Abstract: Using MEMS device design and fabrication techniques, liquid metal inductors can be formed. Because of the common fabrication techniques, liquid metal inductors can be more easily integrated with certain MEMS microswitches.
Abstract: In accordance with the invention, rapid surface seeks to the measurement surface by a scanning probe microscope are enabled by using an actuator coupled to a position sensor.
Abstract: Making use of the values of error items quantified during full n-port calibration, an indicator of whether or not all calibration steps have been uniformly conducted (calibration consistency) is calculated and the result of the calibration is confirmed based on this indicator.
Abstract: A contact is formed on indium-phosphide material. Regions of the indium-phosphide material are exposed. An energetic bombardment is performed on exposed regions of the indium-phosphide material. Metal is deposited on the exposed regions of the indium-phosphide material where energetic bombardment occurred.
Type:
Grant
Filed:
March 29, 2005
Date of Patent:
January 6, 2009
Assignee:
Agilent Technologies, Inc.
Inventors:
Martin W. Dvorak, Timothy C. Engel, Ronald J. Miller, Scott D. Lafrancois
Abstract: For dispensing volumes of liquids, a hinged septum has a flap inclined with respect to the longitudinal axis of a liquid channel. A deposition device deposits liquid on the flap, wherein the deposition device is arranged to contact the flap.
Abstract: Systems and processes for using the same for developing analytical device methods are provided. Also provided are computer program products for executing the subject processes.
Abstract: A voltage sensor capable of single-point or simultaneous multi-point contactless voltage measurement has an electro-optic transducer, a surface plasmon resonance (SPR) and an optical system. The electro-optic transducer is operable to translate an electric field dependent on the voltage in a device under test field to a variation in refractive index. The surface plasmon resonance (SPR) transducer is juxtaposed with the electro-optic transducer and is operable to translate the variation in the refractive index of the electro-optic transducer to a variation in reflectivity. The optical system is configured to illuminate the SPR transducer with incident light at a surface plasmon resonance-inducing angle of incidence and to detect light reflected by the SPR transducer at a single point or at multiple points within a region.
Abstract: A baseband measurement system includes a host and a Digital Immediate Frequency (DIF) subsystem. The DIF subsystem includes both hardware and software components, such as, for example, a microprocessor and its associated software, a FPGA, one or more ASICs, and memory. The baseband measurements are processed using the FPGA, ASICs, and the microprocessor and its software. The microprocessor controls the flow of the data in and out of the memory and distributes the processing tasks to both the hardware and software components in a cooperative manner. The microprocessor orchestrates the measurements and processing by operating as a measurement state machine. Selection of the proper component is based on the type of measurement and its processing requirements, as well as the current state of the hardware and software components. The host receives the processed data and performs post-processing operations if needed. The host also displays the processed data.
Type:
Grant
Filed:
December 15, 2003
Date of Patent:
January 6, 2009
Assignee:
Agilent Technologies, Inc.
Inventors:
Yi He, Xiangzhou Joe Zhang, John E. Neeley
Abstract: Briefly described, embodiments of this disclosure include mass spectrometry systems and methods of performing molecular mass spectrometry and elemental mass spectrometry using a single mass spectrometry system.
Abstract: An operation method for a semiconductor measurement apparatus having measuring, displaying, inputting, and storing devices, and a computing and controlling device connected to the other devices that performs computation and control. The method includes selecting, through the inputting device, a template for a semiconductor measurement-evaluation application displayed by the displaying device for individual technical fields; setting, through the inputting device, setting information required for execution with respect to the application templates displayed by the displaying device and of storing the setting information in the storing device; executing the application for which the setting information is stored; and storing an execution result obtained by executing the application for which the setting information is stored and execution-result attribute information into the storing device and of displaying the execution result and the execution-result attribute information on the displaying device.
Abstract: A measurement management system adapted to communicate with one or more measurement instruments, comprises at least one driver, each being adapted for communicating with at least one measurement instrument, a database adapted for storing information, and a processing unit adapted for processing information. Data communication within the measurement management system is provided using an MMS data format, in which data content is separated from information about presentation or representation of the data content.