Patents Assigned to Anritsu Corporation
  • Patent number: 10998280
    Abstract: Provided is a balance-unbalance converter including: a substrate; an unbalanced line; a first balanced line; and a second balanced line on the substrate. The unbalanced line has a first end at which an unbalanced signal is input, and an opened second end. The first balanced line is in parallel with a line portion of the unbalanced line from the first end to a midpoint of the unbalanced line, and has a midpoint-side third end at which a balanced signal is output, and a grounded fourth end. The second balanced line is in parallel with a line portion of the unbalanced line from the second end to the midpoint, and has a midpoint-side fifth end at which the balanced signal is output, and a grounded sixth end. The unbalanced line is bent at the midpoint toward an opposite side of the first and second balanced lines.
    Type: Grant
    Filed: February 19, 2019
    Date of Patent: May 4, 2021
    Assignee: ANRITSU CORPORATION
    Inventors: Michihiko Ikeda, Yuji Sekine, Takao Yamaguchi
  • Patent number: 10958361
    Abstract: An antenna apparatus is configured to include: a DUT scan mechanism that executes total spherical scanning on a DUT having an antenna in an internal space of an OTA chamber around a reference point; a plurality of antennas disposed at a distance within a near field measurement range from the reference point; and signal analysis devices that respectively perform a near field measurement process related to total radiated power (TRP) based on reception signals of the antennas which receive radio signals in a spurious frequency bandwidth radiated from the antenna transmitting and receiving radio signals in a specified frequency bandwidth, during execution of the total spherical scanning.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: March 23, 2021
    Assignee: ANRITSU CORPORATION
    Inventor: Tomohiko Maruo
  • Patent number: 10855571
    Abstract: A measurement device and a measurement method capable of performing measurement on a device under test while maintaining a desired high data rate even under poor communication conditions such as occurrence of retransmission of a frame from a device under test in a wireless communication connection are provided. The measurement device includes a reception unit 14 that receives a frame transmitted from a DUT 1, a determination unit 16 that determines whether or not a header of the frame has been normally received by the reception unit 14, an acknowledgment transmission unit 13b that transmits the acknowledgment frame to the DUT 1 when the determination unit 16 determines that the header has been normally received by the reception unit 14; and a measurement unit 17 that performs the measurement on the frame determined by the determination unit 16 that the header has been normally received by the reception unit 14.
    Type: Grant
    Filed: February 14, 2019
    Date of Patent: December 1, 2020
    Assignee: ANRITSU CORPORATION
    Inventors: Yoshitaka Kihara, Takahiro Kasagi, Custodio Jean-Elaine Garcia, Yuichi Tsuiki
  • Patent number: 10856159
    Abstract: Provided is a mobile terminal testing device capable of shortening a time required for extracting a test case of a conformance test and a time required for measuring the conformance test. A mobile terminal testing device includes an operation unit 4 that receives an operation input from a user, a display unit 5 that displays an image, and a control unit 6 that displays on the display unit 5, a list of test cases of a conformance test and a list of identification information of a mobile terminal 10 of which performance information is stored in advance, and collates, for each test case selected from the list of test cases, a requirement of the test case with the performance information of the mobile terminal 10 selected from the list of identification information of the mobile terminal to extract a test case to be measured.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: December 1, 2020
    Assignee: ANRITSU CORPORATION
    Inventor: Ryota Chinbe
  • Patent number: 10798668
    Abstract: According to one embodiment, a synchronization circuit includes a received-signal detecting unit which detects a received signal including a first and a second reference signal, a timing-synchronization adjusting unit including a storage module storing information of the first reference signal and a correlation operating module carrying out correlation operation of the first reference signal included in the received signal and the information of the first reference signal output from the storage module, the timing-synchronization adjusting unit which carries out timing synchronization so that a result of the correlation operation carried out by the correlation operating module becomes a predetermined value, and a phase-synchronization adjusting unit which carries out phase synchronization of a subcarrier by adjusting a component varied depending on a phase of a subcarrier frequency by using a phase modulation signal included in the second reference signal, wherein the received signal is a filtered multicarrie
    Type: Grant
    Filed: March 28, 2017
    Date of Patent: October 6, 2020
    Assignee: ANRITSU CORPORATION
    Inventor: Sunao Ronte
  • Patent number: 10784582
    Abstract: A circularly polarized antenna device, which is connectable to a wireless terminal measurement apparatus for performing measurements on a device under test (DUT) provided with an antenna on one surface of the DUT, includes a circularly polarized antenna and a holder. The circularly polarized antenna includes a dielectric substrate and a circularly polarized type of antenna element formed on a first surface of the dielectric substrate. The first surface is opposite to the one surface of the DUT. The circularly polarized antenna is spatially coupled to the antenna of the DUT. The holder holds the circularly polarized antenna and the DUT such that the one surface of the DUT and the dielectric substrate are not parallel to each other.
    Type: Grant
    Filed: July 25, 2018
    Date of Patent: September 22, 2020
    Assignee: ANRITSU CORPORATION
    Inventors: Yoshihiro Kuroiwa, Aya Yamamoto, Tomonori Morita
  • Patent number: 10778192
    Abstract: A filter coefficient calculation device includes a function unit that has a plurality of functions to be executed by an FIR filter, a function selection unit that selects one or a plurality of functions from among the plurality of functions, and a filter coefficient calculation unit that calculates a filter coefficient in the selected one or plurality of functions, and is configured such that the function unit includes a first transfer function calculation unit, a second transfer function calculation unit, and a third transfer function calculation unit which calculate a transfer function of the FIR filter in the respective functions, and the filter coefficient calculation unit performs inverse Fourier transform on the transfer function in the selected one function or a product of the transfer functions in the plurality of functions to obtain an impulse response of the FIR filter and calculates the impulse response as the filter coefficient.
    Type: Grant
    Filed: October 22, 2018
    Date of Patent: September 15, 2020
    Assignee: ANRITSU CORPORATION
    Inventor: Yasuo Hosaka
  • Patent number: 10763979
    Abstract: An measurement apparatus (antenna apparatus) 1 includes: an OTA chamber 50 having an internal space 51 that is not influenced by the surrounding radio wave environment; a reflector 7 that is housed in the internal space 51, radio signals transmitted or received by an antenna 110 of a DUT 100 being reflected through a paraboloid of revolution; a plurality of test antennas 6 that use radio signals in a plurality of measurement target frequency bands for measuring the transmission and reception characteristics of the DUT 100; and automatic antenna arrangement means 60 for sequentially arranging each of the test antennas 6 at a focal position F, which is determined from the paraboloid of revolution, according to the measurement target frequency bands.
    Type: Grant
    Filed: October 2, 2019
    Date of Patent: September 1, 2020
    Assignee: ANRITSU CORPORATION
    Inventors: Tomohiko Maruo, Aya Yamamoto
  • Patent number: 10749615
    Abstract: There are included an error signal generation unit that generates an error signal for adding a burst error to each of an MSB and an LSB of the PAM4 signal in units of clock cycles, an error addition unit that performs an exclusive OR operation on the MSB and the LSB and the error signal and outputs bit strings obtained as a result of the operation, and a calculation unit that calculates the minimum number of clock cycles required for realizing a bit error rate of a desired test signal and the number of burst errors to be added to the MSB and the LSB during a period of the minimum number of the clock cycles.
    Type: Grant
    Filed: October 28, 2019
    Date of Patent: August 18, 2020
    Assignee: ANRITSU CORPORATION
    Inventors: Hisao Kidokoro, John Jerico Manuel Custodio
  • Patent number: 10735113
    Abstract: A near-field measurement system includes a measurement probe 11 that receives a radio signal that is transmitted from an antenna under measurement 110 at a plurality of measurement positions included in a predetermined scan range, a frequency converter 13 that frequency-converts a frequency of the radio signal to a desired frequency, a timing processing unit 18 that generates a timing signal for starting measurement of an amplitude and a phase of the radio signal from a trigger signal output from a transmission device 100 in synchronization with transmission of the radio signal, and an amplitude and phase calculation unit 19 that acquires a radio signal frequency-converted by a frequency converter 13 and digitized by an A/D converter 14a on the basis of a timing signal for each measurement position and calculates an amplitude and a phase in a near field of the acquired radio signal.
    Type: Grant
    Filed: September 13, 2017
    Date of Patent: August 4, 2020
    Assignee: ANRITSU CORPORATION
    Inventors: Hanako Noda, Masaaki Fuse
  • Patent number: 10651954
    Abstract: To provide a calibration system and a calibration method capable of measuring the amplitude and the phase of the radio signal on the electromagnetic radiation surface of the measured antenna, even in the case where the interval between antenna elements is narrow. The calibration system 1 includes: an antenna control unit 16 that selects and excites a combination of antenna elements from among a plurality of antenna elements provided in the measured antenna 100 and thereafter selects and excites another combination of antenna elements; and a probe antenna 12 that receives an electromagnetic wave of the radio signal transmitted from the combination of the antenna elements at a plurality of measurement positions set within a predetermined measurement plane P of the near field area of the measured antenna 100, each time a combination of the antenna elements selected by the antenna control unit 16 are switched.
    Type: Grant
    Filed: April 5, 2019
    Date of Patent: May 12, 2020
    Assignee: ANRITSU CORPORATION
    Inventors: Takashi Kawamura, Masaaki Fuse
  • Patent number: 10587374
    Abstract: A signal generator includes inverse characteristic calculation means for calculating an inverse characteristic of a transfer function from an inverse characteristic of a frequency characteristic of a signal based on the transmission standard, inverse Fourier transform means for calculating impulse responses of a plurality of points by performing inverse Fourier transform on the inverse characteristic of the transfer function, impulse response cutout means for cutting out the points for a predetermined number of taps from the impulse response, frequency characteristic calculation means for calculating a frequency characteristic based on values of the points for the number of taps cut out from the impulse response, and display control means for displaying on a display screen, the frequency characteristic calculated by the frequency characteristic calculation means and an ideal frequency characteristic read from an S parameter file of a device under test.
    Type: Grant
    Filed: April 25, 2019
    Date of Patent: March 10, 2020
    Assignee: ANRITSU CORPORATION
    Inventors: Tatsuya Iwai, Hiroyuki Onuma
  • Patent number: 10536310
    Abstract: In a signal generating device 2, first signal generation means 12 for generating a most significant bit signal stream MSB, second signal generation means 13 for generating a least significant bit signal stream LSB, a mask generation means 14 for defining a bit that allows error insertion and a bit that prohibits error insertion with different pieces of bit information, and generating a mask pattern of each of the most significant bit signal stream MSB and the least significant bit signal stream LSB, based on symbol transition information indicating a transition destination of four PAM4 symbols of a PAM4 signal; and error insertion means 15 for inserting an error, based on bit information of the mask pattern corresponding to each bit of the most significant bit signal stream and the least significant bit signal stream designated according to a symbol error rate.
    Type: Grant
    Filed: April 2, 2019
    Date of Patent: January 14, 2020
    Assignee: ANRITSU CORPORATION
    Inventor: Tatsuya Iwai
  • Patent number: 10521922
    Abstract: Provided is an end face inspection device capable of inspecting different end face shapes without replacing an adapter for attachment. An end face inspection device includes: an optical system that forms an image of an end face of a test object, which is fixed at a predetermined position, at a position of an image sensor; and a focus detection section that acquires image data, which is output by the image sensor, and determines whether or not the end face is brought into focus in the image data. The focus detection section acquires a plurality of the image data pieces, in which parts of the end face are brought into focus by changing a focal position of the optical system by a predetermined distance at a time, and acquires focused image data by synthesizing the respective parts brought into focus in the plurality of image data pieces.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: December 31, 2019
    Assignee: ANRITSU CORPORATION
    Inventor: Ryota Takasu
  • Patent number: 10524144
    Abstract: A mobile terminal testing apparatus capable of facilitating a setting of a combination of frequency bands of carrier aggregation and a setting of frequency information of each band and easily performing a test of the carrier aggregation is provided. A mobile terminal testing apparatus includes a control unit (14) that acquires UE capability information of a mobile communication terminal (2), displays a list of combinations of frequency bands set in a carrier aggregation band combination list of the UE capability information, and sets frequency information of each cell of carrier aggregation according to a frequency band in a combination selected from the list.
    Type: Grant
    Filed: May 15, 2018
    Date of Patent: December 31, 2019
    Assignee: ANRITSU CORPORATION
    Inventors: Shinji Ogawa, Junya Tanaka, Yasuyuki Matsuyama
  • Patent number: 10483636
    Abstract: An electromagnetic wave shield box 50 accommodates a DUT 100 having an antenna 110 and a coupling antenna 80 that is spatially coupled to the antenna 110, and includes a coupling antenna holding module 70 that arranges a plurality of the coupling antennas 80 annually so that an antenna surface is directed to a center of a ring, and holds the coupling antennas 80. The coupling antenna holding module 70 holds each coupling antenna 80 in a posture in which the coupling antenna 80 is inclined at, for example, 32 degrees with respect to a horizontal surface so that the respective coupling antennas 80 are able to radiate radio waves toward the same radiation point in upper positions, and is rotated by about 5 degrees around a center axis C1 in a direction orthogonal to a circumferential direction of the ring of the coupling antenna 80.
    Type: Grant
    Filed: May 13, 2019
    Date of Patent: November 19, 2019
    Assignee: ANRITSU CORPORATION
    Inventors: Joji Koto, Tomohiko Maruo, Tomonori Morita
  • Patent number: 10439280
    Abstract: A distance between a center of a first probe antenna and a center of a second probe antenna in a measurement plane is longer than a distance between the center of the first probe antenna and a center of a third probe antenna in the measurement plane by a distance between two measurement positions adjacent to each other in a horizontal direction. A distance between a center of a fourth probe antenna and a center of a fifth probe antenna in the measurement plane is longer than a distance between the center of the fourth probe antenna and a center of a sixth probe antenna in the measurement plane by a distance between two measurement positions adjacent to each other in a vertical direction.
    Type: Grant
    Filed: December 11, 2018
    Date of Patent: October 8, 2019
    Assignee: ANRITSU CORPORATION
    Inventors: Takashi Kawamura, Aya Yamamoto, Shigenori Mattori
  • Patent number: 10432282
    Abstract: The present application relates to a technique for reducing the circuit scale of a testing device having a function of performing a fading process with respect to a propagation channel of S×U channels assumed between transmitting and receiving antennas, using a terminal compatible with MIMO for transmitting a downlink signal from a base station to a mobile terminal with the number of base station-side antennas S and the number of terminal-side antennas U, or a circuit substrate, an integrated circuit and the like built into the terminal, as a test object. The multiplication arithmetic operation of the characteristics of the propagation channel and the modulation signal is performed in the frequency domain, and a time domain signal is generated from the arithmetic operation result. It's possible to considerably reduce the scale of a circuit that performs inverse Fourier transform and the scale of a circuit that generates propagation channel characteristics.
    Type: Grant
    Filed: June 15, 2018
    Date of Patent: October 1, 2019
    Assignee: ANRITSU CORPORATION
    Inventor: Takeshi Kobayashi
  • Patent number: 10433366
    Abstract: A measurement device 10 includes a reception unit 13b that receives a frame transmitted from a DUT 1, an MCS determination unit 17a that determines whether or not a received MCS index of a frame received by the reception unit 13b matches a predetermined MCS index for comparison, a transmission unit 13a that transmits a notification signal to the DUT when the MCS determination unit 17a determines that the received MCS index matches the MCS index for comparison, and does not transmit the notification signal to the DUT when the MCS determination unit 17a determines that the received MCS index does not match the MCS index for comparison, and a measurement unit 14 that measures data under measurement included in the frame in which it is determined that the received MCS index matches the MCS index for comparison.
    Type: Grant
    Filed: April 27, 2018
    Date of Patent: October 1, 2019
    Assignee: ANRITSU CORPORATION
    Inventors: Takahiro Kasagi, Masahiro Aoyama, Custodio Jean-Elaine Garcia, Takashi Yanagimoto
  • Patent number: 10429424
    Abstract: A distance H from a standard point O to one surface of a bottom plate of a terminal holding section 31 is set so that with respect to a direct wave that is output from one of a measurement antenna 25 and a wireless terminal that is a measurement target and is directly input to the other one thereof, a reflectivity of a reflection wave that is output from the one thereof, is reflected on one surface 32a of the bottom plate of the terminal holding section 31, and is input to the other one thereof is equal to or smaller than an incidence angle (for example, 80° or 70°) for assigning a predetermined allowable limit in view of a characteristic of incidence angle-to-reflectivity determined by a specific dielectric constant of the terminal holding section 31, to thereby reduce an influence of the reflection wave on measurement.
    Type: Grant
    Filed: January 18, 2019
    Date of Patent: October 1, 2019
    Assignee: ANRITSU CORPORATION
    Inventor: Tomonori Morita