Patents Assigned to Anritsu Corporation
  • Patent number: 12287347
    Abstract: There is provided an article inspection verification system provided in an article inspection line including a plurality of article inspection devices that determine whether an inspection target article is a non-defective product or a defective product. The article inspection verification system includes physical effect generators that generate a physical effect that causes the inspection target article to be determined to be the defective product while the inspection target article passes through inspection sections corresponding each of article inspection devices, and a physical effect control unit that stores generation conditions of the physical effect by the physical effect generators and drives the physical effect generators in accordance with the generation conditions during an operation of the article inspection line.
    Type: Grant
    Filed: March 22, 2023
    Date of Patent: April 29, 2025
    Assignee: ANRITSU CORPORATION
    Inventors: Eiji Asai, Toshiaki Kikuchi, Takamasa Ito, Mami Ozawa, Tatsuya Inagaki
  • Patent number: 12265120
    Abstract: An error rate measurement apparatus includes a display control unit, an operation display unit, and a control unit. The display control unit displays a firsts coefficient value in a selectable manner by tabs of a number corresponding to a Full Swing value, performs matrix display on a display screen by using each one of combinations of each second coefficient value and each third coefficient value in the first coefficient value on the selected tab, and displays each coefficient value on the display screen in a three-dimensional bird-eye view by using each second coefficient value and each third coefficient value as a combination of a horizontal direction coordinate axis and a vertical direction coordinate axis and using the first coefficient value as a depth direction coordinate axis. The operation display unit selects a range including at least one cell as a scanning target in the matrix display or a bird-eye display.
    Type: Grant
    Filed: May 16, 2023
    Date of Patent: April 1, 2025
    Assignee: ANRITSU CORPORATION
    Inventor: Hiroyuki Onuma
  • Patent number: 12261648
    Abstract: To provide a mobile terminal test device capable of efficiently testing a mobile terminal compatible with NSA while suppressing a test configuration to be small. A mobile terminal test device includes a first analysis unit 24a and a second analysis unit 24b that analyze a signal received from a mobile terminal, a first port 21a, a second port 21b, a first port 31a, and a second port 31b connected to the mobile terminal, a selection unit 22 that selects the ports to be connected to the first analysis unit 24a and the second analysis unit 24b, and a control unit 6 that performs control such that it is not possible to perform measurement setting for a measurement target of which it is not possible to simultaneously perform measurement, based on the measurement target to be measured by the set first analysis unit 24a and second analysis unit 24b.
    Type: Grant
    Filed: September 27, 2022
    Date of Patent: March 25, 2025
    Assignee: ANRITSU CORPORATION
    Inventor: Naoki Inoue
  • Patent number: 12253924
    Abstract: An error rate measurement apparatus includes an operation display unit and a display control unit. Displays a measurement result when the matrix scan function is executed. The display control unit displays a first coefficient value in a selectable manner by tabs of a number corresponding to the Full Swing value, uses each one of combinations of the first coefficient value, each second coefficient value, and each third coefficient value on the selected table as the cell, displays an error count value and the bit error rate for each cell, which are obtained by the matrix scan function on a display screen in a matrix, and identifies and displays the bit error rate for each cell on the display screen according to an error degree.
    Type: Grant
    Filed: May 16, 2023
    Date of Patent: March 18, 2025
    Assignee: ANRITSU CORPORATION
    Inventor: Hiroyuki Onuma
  • Patent number: 12255377
    Abstract: Provided is a waveguide connection structure 1 in which two waveguides 10 and 20 respectively formed with waveguide paths 11 and 21 face each other, in which a choke groove 25 having a depth corresponding to a leakage prevention target frequency is provided, at the end face 20a of the waveguide 20, in a band-shaped region whose center is a center of the waveguide path 21, and which is bounded by an inner ellipse and an outer ellipse, the minor radius of the outer ellipse is longer than the minor radius of the inner ellipse by a length corresponding, and the choke groove 25 includes two groove portions 25a and 25b that are in contact with the inner ellipse and the outer ellipse and are located on the longer side of the rectangle, in the band-shaped region.
    Type: Grant
    Filed: November 16, 2022
    Date of Patent: March 18, 2025
    Assignee: ANRITSU CORPORATION
    Inventors: Yusa Takemoto, Shigenori Mattori
  • Patent number: 12256158
    Abstract: To provide an inspection apparatus capable of simultaneously picking up images of one side and the other side of an inspection item with an image pickup device. An inspection apparatus 1 includes a first conveyance unit 31 and a second conveyance unit 32 arranged with a predetermined gap G and inspects a workpiece W when the workpiece W passes over the predetermined gap G. The inspection apparatus 1 includes a first image pickup device 11 provided on one side with the predetermined gap G in a direction intersecting with a conveyance direction of the workpiece W, a second image pickup device 12 provided on the other side, a first light emission device 21 disposed at a position facing the first image pickup device 11, and a second light emission device 22 disposed at a position facing the second image pickup device 12.
    Type: Grant
    Filed: January 17, 2023
    Date of Patent: March 18, 2025
    Assignee: ANRITSU CORPORATION
    Inventors: Masaru Ishida, Hiroki Nakajima, Mikio Shibukawa
  • Patent number: 12253610
    Abstract: A network measurement device includes a display control unit that displays location information stored in a location information table and a setting control unit that sets the location information selected from the displayed location information as positioning start location information of a moving destination, and has a configuration of, after setting the positioning start location information, executing positioning at the moving destination based on reception signal information from a GNSS and measuring a time synchronization error between reference time information acquired from the GNSS and reference time information under test used by an apparatus in a location of the moving destination by comparing the reference time information and the reference time information under test.
    Type: Grant
    Filed: May 27, 2022
    Date of Patent: March 18, 2025
    Assignee: ANRITSU CORPORATION
    Inventors: Atsushi Furuki, Shinichi Seto
  • Patent number: 12255801
    Abstract: There are provided a signal generator capable of flexibly increasing the number of taps while realizing high-speed emphasis switching and an emphasis switching method using the signal generator. A signal generator includes: an emphasis addition circuit including at least one finite impulse response (FIR) filter unit that generates an emphasis waveform pattern by adding an emphasis to a pattern of a pulse amplitude modulation (PAM) signal including multi-values which are two or more values; and a tap value setting unit that switches M tap values C(0), C(?1), . . . , and C(1?M) and sets the M tap values C(0), C(?1), . . . , and C(1?M) to each FIR filter unit according to an emphasis switching request from a DUT 100. The FIR filter unit is configured on an FPGA or an ASIC.
    Type: Grant
    Filed: June 15, 2023
    Date of Patent: March 18, 2025
    Assignee: ANRITSU CORPORATION
    Inventor: Tatsuya Iwai
  • Patent number: 12199649
    Abstract: The signal generating device includes a signal generator that generates a signal of a predetermined frequency, a high-pass filter bank that removes a signal of a frequency lower than or equal to a first frequency lower than a predetermined frequency from the signal generated by the signal generator, a YTF that removes a signal outside a predetermined frequency band from the signal output by the high-pass filter bank, a splitter that distributes the signal output by the YTF into a plurality of signals, two amplifiers that adjust levels of the signals distributed by the splitter, respectively, and two low-pass filter banks that remove signals of frequencies equal to or higher than a second frequency which is higher than the predetermined frequency from each of the signals output by the amplifiers.
    Type: Grant
    Filed: June 20, 2022
    Date of Patent: January 14, 2025
    Assignee: ANRITSU CORPORATION
    Inventors: Ittetsu Kaji, Takanori Tanaka, Kayoko Horiuchi
  • Patent number: 12192801
    Abstract: A measuring device 1 tests the operation of the communication function of an UE 70 by performing communication simulating a base station with the UE 70, and includes a reception unit 11a that receives a signal to be measured transmitted from the UE 70, a signal data calculation unit 12 that converts the signal to be measured into a digital signal and calculates signal data, a trigger signal output unit 13 that outputs a trigger signal at a predetermined timing when a predetermined trigger condition is satisfied, a signal extraction unit 14 that receives the trigger signal, and extracts IQ data in a predetermined section according to the predetermined timing from the signal data, and an IQ data analysis unit 52 that analyzes the extracted IQ data.
    Type: Grant
    Filed: December 22, 2021
    Date of Patent: January 7, 2025
    Assignee: ANRITSU CORPORATION
    Inventors: Yuki Nitsuma, Takaaki Kamisawa, Katsuo Sakurai, Issei Fukuda, Tomoya Sano
  • Patent number: 12177374
    Abstract: To provide a mobile terminal test device capable of efficiently testing a mobile terminal compatible with NSA while suppressing a test configuration to be small. A mobile terminal test device includes a first analysis unit 24a and a second analysis unit 24b that analyze a signal received from a mobile terminal, a selection unit 22 that selects ports for a first port 21a, a second port 21b, a first port 31a, and a second port 31b connected to the mobile terminal, and ports connected to the first analysis unit 24a and the second analysis unit 24b, and a control unit 6 that causes the selection unit 22 to select the ports to be connected to the first analysis unit 24a and the second analysis unit 24b, from a connection state between the port and the mobile terminal.
    Type: Grant
    Filed: September 23, 2022
    Date of Patent: December 24, 2024
    Assignee: ANRITSU CORPORATION
    Inventor: Naoki Inoue
  • Patent number: 12143841
    Abstract: The base station simulator 10 as a signal analysis device performs communication with the UE 70 by simulating a base station to test the operation of the communication function of the UE 70, and includes a reception unit 21a that receives a signal to be measured modulated by an OFDM method from the UE 70; an analog signal processing unit 22 that calculates signal data of the signal to be measured received by the reception unit 21a; a data analysis unit 27c that calculates power of the signal data for each frequency in each time, based on the signal data; and an analysis result display unit 28c that displays a distribution of the power of the signal data on a time axis and a frequency axis.
    Type: Grant
    Filed: December 30, 2021
    Date of Patent: November 12, 2024
    Assignee: ANRITSU CORPORATION
    Inventors: Yuki Nitsuma, Takaaki Kamisawa
  • Patent number: 12074580
    Abstract: A signal generation unit 2, a DA converter 3, variable attenuators 40, 42, 44, and 46, a measurement unit 6 that detects a level of the signal attenuated by the variable attenuators 40, 42, 44, and 46 and passed through one or more semiconductor components, a switch 48 that switches between an Internal path through which the signal attenuated by the variable attenuator 40, 42, 44, and 46 is transmitted to the measurement unit 6 and an External path through which the signal attenuated by the variable attenuator 40, 42, 44, and 46 is output from an output terminal 10, and a control unit 7 that obtains a correction value of an attenuation amount of the variable attenuators 40, 42, and 44 with the Internal path and obtains a correction value of an attenuation amount of the variable attenuator 46 with the External path.
    Type: Grant
    Filed: December 21, 2022
    Date of Patent: August 27, 2024
    Assignee: ANRITSU CORPORATION
    Inventors: Hirofumi Ono, Koji Yamashita, Shinichi Ito
  • Patent number: 12074651
    Abstract: A signal generation unit 2, a DA converter 3, variable attenuators 40, 42, 44, and 46 that attenuate an analog signal converted by the DA converter 3, a measurement unit 6 that detects a level of the signal attenuated by the variable attenuators 40, 42, 44, and 46 and passed through one or more semiconductor components, and a control unit 7 that obtains a value of a step error, which is a correction value of an attenuation amount of the variable attenuators 40, 42, 44, and 46 in each of a plurality of steps obtained by dividing a maximum value of the attenuation amount of the variable attenuators 40, 42, 44, and 46 by a variation amount, which is a predetermined attenuation amount are included.
    Type: Grant
    Filed: December 21, 2022
    Date of Patent: August 27, 2024
    Assignee: ANRITSU CORPORATION
    Inventors: Hirofumi Ono, Koji Yamashita, Shinichi Ito
  • Patent number: 12034492
    Abstract: The base station simulator 10 as a signal analysis device performs communication with a UE 70 by simulating a base station to test an operation of a communication function of the UE 70, and includes a reception unit 21a that receives a signal to be measured modulated by an OFDM method, transmitted from the UE 70, an analog signal processing unit 22 that calculates signal data of the signal to be measured received by the reception unit 21a, a data analysis unit 27c that analyzes the signal data for a predetermined analysis item for each time domain defined by the OFDM method, and calculates analysis results of a plurality of analysis items corresponding to each time domain, and an analysis result display unit 28c that displays the analysis results of the plurality of analysis items side by side.
    Type: Grant
    Filed: December 23, 2021
    Date of Patent: July 9, 2024
    Assignee: ANRITSU CORPORATION
    Inventors: Yuki Nitsuma, Takaaki Kamisawa
  • Patent number: 12007862
    Abstract: Provided herein are an error detection device and an error detection method to intuitively identify the reason for a handshake failure. An entire state transition flow including each state based on the communication standard and a state transition condition to be executed between states is displayed as a state transition setting screen, and an immediately preceding state in which the state transition fails and the failed state transition condition are highlighted on the state transition setting screen, when the handshake with the device under test ends.
    Type: Grant
    Filed: September 12, 2022
    Date of Patent: June 11, 2024
    Assignee: ANRITSU CORPORATION
    Inventor: Ryo Sunayama
  • Patent number: 11994550
    Abstract: The temperature test apparatus includes an OTA chamber 50 as an anechoic box, a heat insulating housing that is accommodated in the OTA chamber, a temperature control device that controls a temperature in the heat insulating housing, a ventilation block 210 that is made of metal and provided to block an opening 502 formed in the OTA chamber, and in which a plurality of through-holes 214 are formed, a first cover 220 that is provided on an outer side of the OTA chamber to cover the ventilation block, and form a first space 225 with the ventilation block, and is joined to a pipe for air from the temperature control device, and a second cover 250 that is provided on an inner side of the OTA chamber to cover the ventilation block, and form a second space 255 communicating with the heat insulating housing, together with the ventilation block.
    Type: Grant
    Filed: November 23, 2021
    Date of Patent: May 28, 2024
    Assignee: ANRITSU CORPORATION
    Inventor: Tomonori Morita
  • Patent number: 11977464
    Abstract: An error rate measuring apparatus detects a bit error of input data returned from a device under test with transmission of a test signal at an error detector, and includes a log recording unit that records log data of state transition of each lane by handshakes of a plurality of lanes in a predetermined communication standard with respect to the device under test in making the device under test transit to a state of LOOPBACK, and a display unit that displays the recorded log data of the state transition of each lane in a time-series order.
    Type: Grant
    Filed: March 25, 2022
    Date of Patent: May 7, 2024
    Assignee: ANRITSU CORPORATION
    Inventor: Ryo Sunayama
  • Patent number: 11979229
    Abstract: An error rate measuring apparatus includes error counting means for comparing bit string data obtained by converting a signal received from the device under test with error data, counting the number of FEC symbol errors by each codeword length in a case where the number of FEC symbol errors is less than the threshold value, and collectively counting the number of FEC symbol errors of codeword lengths in a case where the number of FEC symbol errors is equal to or greater than the threshold value, and display control means for displaying and controlling a list of collected results of the number of FEC symbol errors of each codeword length.
    Type: Grant
    Filed: October 29, 2021
    Date of Patent: May 7, 2024
    Assignee: ANRITSU CORPORATION
    Inventor: Hiroyuki Onuma
  • Patent number: 11965921
    Abstract: A measurement system and method tests for spurious emissions included in a signal transmitted from a mobile terminal in a shorter time than before. The system includes: a band division unit for dividing the measurement frequency band into a plurality of divided bands; a first spurious measurement control unit which causes a measurement device to measure the spurious emissions of the signal to be measured in each divided band and the peak power of the spear in each divided band; and a first pass/fail determination unit that determines whether or not pass determination criteria is satisfied. The first pass/fail determination unit determines whether the peak power does not exceed the threshold of the pass determination criteria in each divided band. The threshold value of the pass determination criteria is lower than the threshold of the standard determination criteria defined by the 3GPP standard.
    Type: Grant
    Filed: September 21, 2022
    Date of Patent: April 23, 2024
    Assignee: ANRITSU CORPORATION
    Inventors: Hiroaki Iida, Koki Iwata, Kayoko Horiuchi