Patents Assigned to Anritsu Corporation
  • Patent number: 11671200
    Abstract: An object of the present disclosure is to determine whether or not a codeword in which a plurality of symbol errors are corrected occurs, and to detect a potential network failure. According to the present disclosure, there is provided a network test apparatus including: a reception unit that receives codewords generated by using pulse amplitude modulation (PAM); an arithmetic processing unit that measures the number of symbol errors per codeword included in the codewords by using forward error correction (FEC), and counts the number of codewords for each number of symbol errors per codeword; and a display unit, in which whether or not there is a codeword in which a plurality of symbol errors are corrected is displayed on the display unit by using the number of codewords.
    Type: Grant
    Filed: February 23, 2021
    Date of Patent: June 6, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Akinobu Tsuyuki, Tomohiro Ito
  • Patent number: 11665042
    Abstract: Included are a demodulation unit 20 that demodulates a received OFDM modulation signal to acquire a demodulated constellation signal, an ideal constellation signal generation unit 312 that generates an ideal constellation signal from the demodulated constellation signal, a data extraction unit 313 that extracts signal data included in some symbol sections including a known reference symbol, among all symbol sections, from the demodulated constellation signal and the ideal constellation signal, a phase error calculation unit 314 that calculates the phase error of the demodulated constellation signal for the ideal constellation signal, with respect to the extracted signal data, a phase error characteristics estimation unit 315 that estimates the frequency characteristics of the phase error, and a phase error correction unit 316 that corrects the phase error of the demodulated constellation signal, based on the frequency characteristics of the phase error.
    Type: Grant
    Filed: July 7, 2022
    Date of Patent: May 30, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Atsuki Morita, Mark Joseph Aquino Isip
  • Patent number: 11632172
    Abstract: It is possible to allow a user to easily distinguish between an event at a place to be resolved and an event at a place having no problem on a path of a PON communication network to be measured. A light intensity distribution of return light is processed in a time-series order to detect an event at each position on a network. A parameter N1 relating to the total number of splitters present on a path of the network is specified, the number N2 of detections of the total number of splitters detected as an event is recognized, and in a case where “N1>N2”, a last detected event is associated with one optical splitter and is further displayed as an “uncertain splitter” in distinction from a normal splitter.
    Type: Grant
    Filed: September 9, 2021
    Date of Patent: April 18, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Ryota Takasu, Taichi Murakami
  • Patent number: 11632131
    Abstract: An error rate measuring apparatus includes: an operation unit that sets a codeword length, an FEC symbol length, and an FEC symbol error threshold in accordance with a communication standard of a device under test W; error counting means for counting FEC symbol error detected at one FEC symbol interval and an uncorrectable codeword; a display unit that identifies and displays bit string data according to presence or absence of the FEC symbol error in FEC symbol length units based on a counting result; and display control means for performing display control by setting one zone of a display area of identification display as one FEC symbol length, matching a zone length of a horizontal axis of the display area with one codeword length, and performing line feed in codeword length units.
    Type: Grant
    Filed: April 20, 2022
    Date of Patent: April 18, 2023
    Assignee: ANRITSU CORPORATION
    Inventor: Hiroyuki Onuma
  • Patent number: 11624765
    Abstract: A test device 1 that measures the transmission properties or reception properties of the test object 100 having the test antenna 110, and includes an anechoic box 50, a plurality of test antennas 6 that transmit or receive radio signals to or from the antenna, under tests, a posture changeable mechanism 56 that changes the posture of the test object arranged in the quiet zone QZ, a measurement device 2 that measures the transmission properties or reception properties of the test object with respect to the test object whose posture is changed by the posture changeable mechanism using the test antenna, and the reflector 7 that radio signal is reflected. The plurality of test antennas include a reflection type test antenna 6a and the plurality of direct-type test antennas 6b, 6c, 6d.
    Type: Grant
    Filed: January 27, 2021
    Date of Patent: April 11, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Tomohiko Maruo, Hiroyuki Baba, Masafumi Setsu
  • Patent number: 11627481
    Abstract: To provide a mobile communication terminal test device and a mobile terminal test method capable of easily generating test cases for a mobile communication terminal supporting 5G NR at low cost without omissions. Provided is a mobile terminal test device 1 that tests a mobile communication terminal 2 by simulating a mobile communication base station, the mobile terminal test device including: an acquisition unit (141) that acquires terminal capability information, which is information related to a capability of the mobile communication terminal, by communicating with the mobile communication terminal; an extraction unit (142) that extracts first capability information related to a first wireless communication method from the terminal capability information; and a generation unit (144) that generates a test case as a combination (210) of parameter setting values to be set in test parameters in the first wireless communication method, based on the first capability information.
    Type: Grant
    Filed: April 1, 2021
    Date of Patent: April 11, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Shunsuke Chino, Tsuyoshi Sato, Takuma Goto, Ryoji Yamamoto
  • Patent number: 11626944
    Abstract: There are provided a data comparison unit that detects an FEC symbol error of a signal under test output from a DUT in accordance with an input of a jitter signal, an error counting unit that counts the number of detected FEC symbol errors for each codeword for each phase modulation amount, a codeword classification unit that classifies a plurality of codewords included in the signal under test into a plurality of groups based on the counted number of FEC symbol errors, a codeword number counting unit that counts the number of codewords in each group for each phase modulation amount, and a display control unit that controls a display of a first graph having a horizontal axis as the phase modulation amount and a vertical axis as a ratio of the number of codewords in each group, on a display screen.
    Type: Grant
    Filed: February 23, 2022
    Date of Patent: April 11, 2023
    Assignee: ANRITSU CORPORATION
    Inventor: Tatsuya Iwai
  • Patent number: 11616677
    Abstract: A receiving device includes a reception unit 10 that samples a signal to be measured a transmitted from a DUT 2 and acquires a sample signal d; an FFT processing unit 21 that performs an FFT process by multiplying the sample signal; a signal length calculation unit 31 that calculates a signal length of the signal to be measured from the sample signal; a comparing unit 33 that compares the calculated signal length of the signal to be measured with a first FFT length conforming to a communication standard; and an FFT length setting unit 34 that, when as a result of the comparison by the comparing unit, the signal length is shorter than the first FFT length, sets a second FFT length shorter than the signal length of the signal to be measured, as the FFT length of the FFT process by the FFT processing unit.
    Type: Grant
    Filed: September 22, 2021
    Date of Patent: March 28, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Takasumi Ikebe, Kenji Goto, Mayfor Dangkiw
  • Patent number: 11609264
    Abstract: There is provided an attenuation amount setting unit that sets, in a case where signals are simultaneously output from all output ports of a plurality of interface units at the same signal level, one of the plurality of interface units as the reference interface unit, and adds a difference between an attenuation amount of a second attenuator stored in a storage unit of the reference interface unit and an attenuation amount of another second attenuator stored in another storage unit of the other interface unit to an attenuation amount of each of a plurality of third attenuators of the other interface unit to correct the attenuation amount.
    Type: Grant
    Filed: December 7, 2021
    Date of Patent: March 21, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Koichiro Tomisaki, Jesse Paulo Valencia Macabasco
  • Patent number: 11598669
    Abstract: An optical spectrum analyzer is provided that can separate measurement target light into orthogonal polarization components and perform measurement and enable optical spectrum measurement that does not depend on polarization of the measurement target light. Measurement target light is separated into two orthogonal polarization components, the two polarization components whose position is shifted in an engraved line direction of a diffraction grating are incident on the diffraction grating, diffracted light of the two polarization components emitted from the diffraction grating is condensed, and the condensed diffracted light is incident on an incident side end surface of a 2-core ferrule with the two polarization components adjacent to each other.
    Type: Grant
    Filed: March 14, 2022
    Date of Patent: March 7, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Shinji Morimoto, Motohiro Banno, Taichi Murakami
  • Patent number: 11588479
    Abstract: Provided are a spread spectrum clock generator and a spread spectrum clock generation method, a pulse pattern generator and a pulse pattern generation method, and an error rate measuring device and an error rate measuring method capable of improving usability when adjusting a waveform of a modulation signal during training. A setting screen 60 includes a 0-th frequency shift input unit 71 for arbitrarily setting a frequency shift of a waveform of a modulation signal in a plurality of time sections, a first frequency shift input unit 72, a second frequency shift input unit 73, a third frequency shift input unit 74, and a modulation selection unit 67 for switching a waveform pattern of the modulation signal from a first pattern to a second pattern.
    Type: Grant
    Filed: December 15, 2021
    Date of Patent: February 21, 2023
    Assignee: ANRITSU CORPORATION
    Inventor: Tatsuya Iwai
  • Patent number: 11579192
    Abstract: An error rate measuring apparatus includes a data transmission unit that transmits a test signal of a known pattern and a parameter value defined by a communication standard to a device under test, and a bit error measurement unit that measures a bit error of a signal transmitted from the device under test. The data transmission unit sequentially changes the parameter value and transmits the parameter value to the device under test. The bit error measurement unit measures a bit error of a signal transmitted from the device under test corresponding to the parameter value. The error rate measuring apparatus further includes a discrimination unit that discriminates a parameter value at which the number of bit errors is the least in a measurement result of the bit error measurement unit, as an optimum value of emphasis of an output waveform of the device under test.
    Type: Grant
    Filed: July 8, 2021
    Date of Patent: February 14, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Hisao Kidokoro, Hiroyuki Inaba
  • Patent number: 11555850
    Abstract: It is possible to know a guideline for adjusting the levels of three voltage thresholds of a PAM4 signal. An error detection device receives a measurement pattern including a pseudo random pattern having equal appearance frequencies of four levels, decodes the measurement pattern into a most significant bit sequence signal MSB and a least significant bit sequence signal LSB, based on three voltage thresholds Vth1, Vth2, and Vth3, identifies and counts, by a level counting unit, the four levels of the measurement pattern, based on the most significant bit sequence signal MSB and the least significant bit sequence signal LSB, and displays numerical values or bar graphs indicating ratios of the appearance frequencies of the four levels of the measurement pattern so as to be in the same order as waveform levels of the measurement pattern, based on a result of the counting.
    Type: Grant
    Filed: October 26, 2021
    Date of Patent: January 17, 2023
    Assignee: ANRITSU CORPORATION
    Inventor: Hisao Kidokoro
  • Patent number: 11546786
    Abstract: A first mobile terminal testing device 1 including plurality of pseudo base station units 12-0, 12-1 operating as LTE base stations of NSA, and second mobile terminal testing device 2 operating as 5G NR base stations of NSA are provided. Each of the pseudo base station units 12-0, 12-1 is associated with the second mobile terminal testing devices 2, 2. The second mobile terminal testing device 2 generates a 5G NR control signal when testing a mobile terminal 3 which supports for NSA. The generated 5G NR control signal is transmitted to the first mobile terminal testing device 1. The first mobile terminal testing device 1 transmits the received 5G NR control signal to the mobile terminal 3 by the LTE control signal using the pseudo base station unit 12 corresponding to the second mobile terminal testing device 2 which transmits the control signal.
    Type: Grant
    Filed: February 17, 2021
    Date of Patent: January 3, 2023
    Assignee: ANRITSU CORPORATION
    Inventor: Daiki Kano
  • Patent number: 11525853
    Abstract: A temperature test apparatus 1 includes a test antenna 6 configured to transmit or receive a radio signal to or from the antennas 110 in order to measure reception characteristics or transmission characteristics of the DUT 100, a heat-insulating housing 70 made of heat-insulating material surrounding a space region 71 including a quiet zone QZ, and a measuring device 20 configured to measure the transmission characteristics or the reception characteristics of the DUT 100. The heat-insulating housing 70 has a flat plate shaped part 70a in a region through which radio waves of a radio signal transmitted from the test antenna 6 passes before entering the quiet zone QZ. The flat plate shaped part 70a is perpendicular to the traveling direction of the radio waves of the radio signal entering the quiet zone QZ.
    Type: Grant
    Filed: August 6, 2020
    Date of Patent: December 13, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Takeshi Kobayashi, Tomohiko Maruo, Yasuhiko Nago
  • Patent number: 11528121
    Abstract: Included are a demodulation unit that demodulates a received OFDM modulation signal to acquire a demodulated constellation signal, an ideal constellation signal generation unit that generates an ideal constellation signal from the demodulated constellation signal, a data extraction unit that extracts signal data corresponding to subcarriers included in a part of an intermediate frequency section among all frequency sections, from the demodulated constellation signal and the ideal constellation signal, a phase error calculation unit that calculates the phase error of the demodulated constellation signal for the ideal constellation signal, with respect to the extracted signal data, a phase error characteristic estimation unit that estimates the frequency characteristic of the phase error, and a phase error correction unit that corrects the phase error of the demodulated constellation signal, based on the frequency characteristic of the phase error.
    Type: Grant
    Filed: June 28, 2021
    Date of Patent: December 13, 2022
    Assignee: ANRITSU CORPORATION
    Inventor: Atsuki Morita
  • Patent number: 11506711
    Abstract: An error rate measuring apparatus that inputs a PAM4 signal of a known pattern as a test signal to a device under test W, receives a signal from the device under test W compliant with the input of the test signal, and measures whether or not an FEC operation of the device under test W is possible based on a comparison result of the received signal and the test signal includes an operation unit that sets one Codeword length and one FEC Symbol length of the FEC as a setting parameter to the signal received from the device under test W according to a communication standard of the device under test W, and a display unit that parallel-displays MSB data and LSB data of each piece of symbol string data obtained by receiving and converting the signal from the device under test W on a display screen.
    Type: Grant
    Filed: February 8, 2021
    Date of Patent: November 22, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Hiroyuki Onuma, Tomoaki Kabasawa
  • Patent number: 11509405
    Abstract: A test control unit controls a mobile terminal such that a first period T1, T3, T5, and T7 in which power of a transmission signal is maintained constant, and a second period T2, T4, T6, and T8 in which the power of the transmission signal is changed stepwise are alternately and continuously repeated, and changes a maximum value of signal power that is receivable by a pseudo base station unit in each first period T1, T3, T5, and T7, according to a power range of the transmission signal to be changed in each second period T2, T4, T6, and T8. A minimum value of the signal power that is receivable by the pseudo base station unit is determined, according to a maximum value of the signal power that is receivable by the pseudo base station unit and a reception dynamic range of a mobile terminal testing apparatus.
    Type: Grant
    Filed: February 18, 2021
    Date of Patent: November 22, 2022
    Assignee: ANRITSU CORPORATION
    Inventor: Naoki Inoue
  • Patent number: 11500004
    Abstract: A test apparatus includes a test antenna that is provided in an OTA chamber 50 and transmits or receives a radio signal to or from an antenna 110 of a DUT 100, and a measurement device that measures transmission characteristics or reception characteristics of the DUT 100 disposed in a quiet zone QZ, by using the test antenna. The test antenna includes a reflector reflection type test antenna 6a that transmits or receives a radio signal to or from the antenna 110 of the DUT via a reflector 7, and mirror reflection type test antennae 6b, 6c, 6d, 6e, and 6f that transmits or receives a radio signal to or from the antenna 110 of the DUT via mirrors 9b to 9f.
    Type: Grant
    Filed: May 17, 2021
    Date of Patent: November 15, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Tomohiko Maruo, Hiroyuki Baba
  • Patent number: 11503714
    Abstract: A thin film board according to the present invention has a structure in which a land, which is a connection portion with a transmission line of a printed circuit board, is used as a back wiring and extends from the end to the inside of the thin film board, and the back wiring and the front wiring are connected by a through hole. In the structure of this thin film board, the land does not become a stub and does not affect the high frequency characteristics of the circuit element. That is, there is no trade-off between the connectivity between the printed circuit board and the thin film board and the high frequency characteristics of the circuit element. Therefore, the thin film board and the circuit element in which the thin film board is mounted on the printed circuit board can support high frequency electric signals up to 60 GHz.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: November 15, 2022
    Assignee: ANRITSU CORPORATION
    Inventor: Kota Kuramitsu