Patents Assigned to Anritsu Corporation
  • Patent number: 11368868
    Abstract: A control device 22 performs the simulative communication operation on a measurement device 20 for transmitting and receiving signals between the base transceiver station compliant with the first communication standard and the terminal 11a and a measurement device 21 for transmitting and receiving signals between the base transceiver station compliant with the second communication standard and the terminal 11a. In the control device 22, the display control unit 30d performs display in a form in which the same number of graphic forms as the number of base transceiver stations compliant with the first and second communication standards are arranged in association with one first cell icon indicating that the base transceiver station is compliant with the first communication standard and one second cell icon indicating that the base transceiver station is compliant with the second communication standard.
    Type: Grant
    Filed: July 31, 2020
    Date of Patent: June 21, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Shoichi Nakamura, Shinji Ogawa, Atsushi Motoyama, Anri Muto
  • Patent number: 11362876
    Abstract: A receiving device 100 includes a reception unit 10, a delay signal generation unit 22, a difference calculation unit 23 that calculates a phase difference between the received signal and the delay signal, a variance calculation unit 24 that calculates a variance of the phase difference within a plurality of calculation sections while sliding a set of the plurality of calculation sections which are set corresponding to a cyclic prefix group assigned to a predetermined symbol group included in the received signal, together on the time axis, a symbol detecting unit 25 that detects a position of a symbol in the symbol group on the time axis, based on the position of the minimum peak of the variance on the time axis, and a synchronization timing signal generation unit 29 that generates a synchronization timing signal, based on information on the position of the symbol on the time axis.
    Type: Grant
    Filed: June 18, 2021
    Date of Patent: June 14, 2022
    Assignee: ANRITSU CORPORATION
    Inventor: Atsuki Morita
  • Patent number: 11356187
    Abstract: A measuring device 1 performs control to perform a reception sensitivity test of measuring a throughput of a signal under measurement, and repeating the measurement while changing an output level of a test signal at each measurement position corresponding to a plurality of orientations. The integrated control device 10 that performs the control includes a measurement situation display control unit 18d that displays a measurement progress display screen having a first display area for displaying a result of the reception sensitivity test up to the measurement position where the reception sensitivity test is completed, and a second display area for displaying a progress situation of the measurement of the reception sensitivity test at the measurement position at which the reception sensitivity test is started.
    Type: Grant
    Filed: June 24, 2021
    Date of Patent: June 7, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Hideyuki Endo, Hironori Watanabe, Takumi Nakamura, Yui Yoshida
  • Patent number: 11336501
    Abstract: [Task] There is provided a signal generation apparatus and a signal generation method capable of performing mutual switching between a PAM N signal having n values and a PAM M signal having m values (m<n) without generating a noise or an overvoltage. [Means for Resolution] There are provided a PAM N generation circuit 41 that generates a PAM N signal of n values, a PAM M generation circuit 42 that generates a PAM M signal of m values (m<n) having a maximum voltage level equal to a maximum voltage level of the PAM N signal generated by the PAM N generation circuit 41, and a selector 43 that outputs any one of the PAM N signal generated by the PAM N generation circuit 41 and the PAM M signal generated by the PAM M generation circuit 42.
    Type: Grant
    Filed: December 15, 2020
    Date of Patent: May 17, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Tatsuya Iwai, Tomoaki Kabasawa
  • Patent number: 11336379
    Abstract: A first shift unit (14) that shifts an amplitude value of the I baseband signal and an amplitude value of the Q baseband signal in a lower direction by the predetermined number of bits so that the predetermined number of lower bits thereof have a value after a decimal point, a first rounding unit (15) that rounds-to-even the amplitude value of the I baseband signal and the amplitude value of the Q baseband signal shifted by the first shift unit (14) with a rounding width of 1 in decimal notation, and a first averaging unit (16) that respectively calculates a time average of the amplitude value of the I baseband signal and the amplitude value of the Q baseband signal rounded by the first rounding unit (15) are included.
    Type: Grant
    Filed: January 11, 2021
    Date of Patent: May 17, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Kengo Kikuchi, Koji Fukazawa, Yuichi Tsuiki, Tsubasa Takahashi, Takato Tokuyama
  • Patent number: 11323140
    Abstract: An object of the present disclosure is to prevent an output level of an analog signal from exceeding a predetermined upper limit value, in a module that adjusts a level of the analog signal. According to the present disclosure, there is provided a signal generation apparatus including an RF base module (12) that converts a digital base band signal for testing into an intermediate frequency (IF) signal and outputs the IF signal, and a control unit (18), in which the RF base module is connected to an RF converter (20) which outputs an analog RF signal obtained by frequency-converting the IF signal, and the control unit clips the IF signal output from the RF base module based on an output level of the analog RF signal output from the RF converter.
    Type: Grant
    Filed: January 22, 2021
    Date of Patent: May 3, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Hirofumi Ono, Ryo Inomata, Kenji Goto, Mayfor Dangkiw
  • Patent number: 11316599
    Abstract: A mobile terminal testing device includes a layer processing unit 3 that communicates with a mobile terminal 10 by performing processing of each layer of a layer-configured communication protocol with a plurality of layers, in which the layer processing unit 3 includes a PHY processing unit 31 that performs multiplexing, channel coding, or the like in order to transmit and receive communication data transmitted to and received from the mobile terminal 10, in which the PHY processing unit 31 transmits a dummy signal, by omitting higher processing from predetermined processing, for an interference signal in multi user-multi input multi output (MU-MIMO) multiplex signals, in a case of testing MU-MIMO terminal-to-terminal interference.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: April 26, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Tomoyuki Fujiwara, Akihiko Suenaga, Toshiaki Aoki
  • Patent number: 11310683
    Abstract: Provided is a mobile terminal testing apparatus capable of executing a test for putting any pseudo base station out of service during state transition, such as during handover or during position registration. A mobile terminal testing apparatus includes a plurality of pseudo base station units 18-1, 18-2, and 18-3 that simulate a plurality of base stations, and a scenario processing unit 17 that controls the pseudo base station units 18-1, 18-2, and 18-3 in compliance with a set scenario to execute a test. The scenario processing unit 17 puts the pseudo base station units 18-1, 18-2, and 18-3 set as a base station executing an out-of-service test out of service in a case where a message set as a message to execute the out-of-service test is transmitted from the pseudo base station units 18-1, 18-2, and 18-3 set as a base station transmitting the message to execute the out-of-service test.
    Type: Grant
    Filed: December 9, 2020
    Date of Patent: April 19, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Nami Takiguchi, Tsuyoshi Sato, Kenji Fujita
  • Patent number: 11293983
    Abstract: Provided is a technique for achieving improvement of usability in setting parameters. An error rate measuring apparatus includes a display unit that displays input boxes for inputting one Codeword length and one FEC Symbol length of FEC on a setting screen, and an operation unit that inputs the one Codeword length and the one FEC Symbol length to the corresponding input boxes according to a communication standard of a device under test. A graphic of one Codeword, a graphic of one FEC Symbol, and a graphic of one Codeword including an error for identifying a configuration relationship of an FEC Symbol to a Codeword of the FEC and a correspondence relationship of an FEC Symbol Error to the Codeword are displayed on the setting screen corresponding to the input box of each of the one Codeword length and the one FEC Symbol length of the FEC.
    Type: Grant
    Filed: February 16, 2021
    Date of Patent: April 5, 2022
    Assignee: ANRITSU CORPORATION
    Inventor: Hiroyuki Onuma
  • Patent number: 11290195
    Abstract: In a measurement device 1, a reception sensitivity test control unit 18 includes test condition setting means 18b for setting a predetermined error tolerance level EL, throughput measurement means 18c for measuring a throughput related to reception capacity of the mobile terminal for each transmission and reception, output level setting means 18d for setting an output level of the test signal to be different from a previous output level according to a comparison result between a measurement result of the throughput and a predetermined threshold value set in advance, and measurement result output means 18e for continuing the transmission and reception in a case where a fluctuation range with respect to the previous output level exceeds the error tolerance level, and outputting a test result in a case where the fluctuation range with respect to the previous output level is in a range of the error tolerance level.
    Type: Grant
    Filed: June 24, 2021
    Date of Patent: March 29, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Zhihui Wu, Takumi Nakamura
  • Patent number: 11290196
    Abstract: There is provided mobile terminal testing device and system capable of reducing a processing load, when testing mobile terminals that support NSA. Included are a first mobile terminal testing device operating as a base station of LTE and a second mobile terminal testing device operating as a base station of 5G NR of NSA, when testing a mobile terminal which supports NSA, the second mobile terminal testing device generates a control signal of 5G NR, transmits the generated control signal of 5G NR to the first mobile terminal testing device, and the first mobile terminal testing device 1 transmits the received control signal of 5G NR to the mobile terminal according to the LTE.
    Type: Grant
    Filed: November 12, 2019
    Date of Patent: March 29, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Takahiro Hosoya, Toyohiro Kayanuma, Daiki Kano, Toru Yamasaki
  • Patent number: 11283481
    Abstract: Provided are a spread spectrum clock generator and a spread spectrum clock generation method, a pulse pattern generator and a pulse pattern generation method, and an error rate measuring device and an error rate measuring method capable of performing SSC modulation of any frequency shift according to a standard. Included are a reference signal generator 10 that generates a reference signal, a modulation waveform generator 20 that generates a modulation waveform, a modulation unit 30 that frequency-modulates the reference signal with the modulation waveform to generate an SSC modulated signal, and a modulation control unit 42a capable of arbitrarily controlling the frequency shift of the modulation waveform and a slope of the frequency shift in any time section.
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: March 22, 2022
    Assignee: ANRITSU CORPORATION
    Inventor: Tatsuya Iwai
  • Patent number: 11277763
    Abstract: A mobile terminal measurement system 1 tests a mobile terminal 30 corresponding to LTE and NR while controlling an LTE measurement device 10 and an NR measurement device 20 with a control device 50. The control device 50 includes an LTE operation display screen 70 for inputting a test setting value in the LTE measurement device 10, on which a test result corresponding to LTE is displayed, and an NR operation display screen 80 for inputting a test setting value in the NR measurement device 20, on which a test result corresponding to NR is displayed. The control device 50 displays communication management information (UE Capability Information) transmitted from the mobile terminal 30 to the LTE measurement device 10, on the LTE operation display screen 70 and the NR operation display screen 80.
    Type: Grant
    Filed: January 20, 2021
    Date of Patent: March 15, 2022
    Assignee: ANRITSU CORPORATION
    Inventor: Makoto Ueda
  • Patent number: 11272385
    Abstract: In a control device 22 constituting a communication terminal measurement apparatus 10, a display control unit 30d displays an NR connection confirmation/support screen 36a indicating a connection mode for connection between an NR measurement device 20 and a communication terminal 11a, and an LTE connection confirmation/support screen 36b indicating a connection mode for connection between a LTE measurement device 21 and the communication terminal 11a. Further, information on the signal of the NR communication standard is attached as a text to the image of the port through which the signal of the NR communication standard is input and output, and information on the signal of the LTE communication standard is attached as a text to an image of the port through which the signal of the LTE communication standard is input and output.
    Type: Grant
    Filed: July 9, 2020
    Date of Patent: March 8, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Shoichi Nakamura, Shinji Ogawa, Atsushi Motoyama, Anri Muto
  • Patent number: 11271663
    Abstract: In response to a command from the control PC 4, the first mobile terminal test apparatus 2 compresses data of test signals including a first test signal and a second test signal which are generated and encrypted, and adds a restoration parameter to a header of the compressed data. The second mobile terminal test apparatus 3 acquires the restoration parameter-added compressed data at the second port 3a via the cable 5 from the first port 2a, and restores and encrypts the data of test signals before encryption, based on the restoration parameters. Under the control of the control PC 4, the first mobile terminal test apparatus 2 outputs the data of the first test signal to the device under test W, and the second mobile terminal test apparatus 3 outputs the data of the second test signal to the device under test W.
    Type: Grant
    Filed: August 14, 2020
    Date of Patent: March 8, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Kota Ono, Takeo Nomura, Atsushi Usui
  • Patent number: 11255719
    Abstract: A material property inspection apparatus includes a conveyance unit, a light source, an irradiation unit, a light receiving unit, a signal detection unit, a material property value input unit, an inspection set value input unit, and a processing unit. The processing unit calculates a relation equation between the material property value from the material property values of the plurality of test pieces and the light intensity of the transmitted light or the reflected light of respective test pieces, calculates the material property value of the inspected object from the light intensity of the transmitted light or the reflected light detected by the signal detection unit and the relation equation, compares the calculated material property value of the inspected object with the inspection set value inputted from the inspection set value input unit, and determines the quality of the inspected object.
    Type: Grant
    Filed: October 24, 2019
    Date of Patent: February 22, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Masaaki Fuse, Ken Shioiri, Takao Tanimoto, Hideyuki Sakamoto
  • Patent number: 11251879
    Abstract: In a measurement device, a reception sensitivity test control unit includes drop determination means for determining whether or not a measured throughput is in a dropped state to a preset proportion in a steep drop region in which the throughput drops steeply, and output level setting means 18e for performing a setting process of setting an output level of the test signal to be different from a previous output level according to a comparison result indicating whether a throughput measurement result exceeds a predetermined threshold value and a determination result indicating whether the measured throughput is in the dropped state by the drop determination means, the setting process including a process of performing level down or level up on the output level of the test signal with respect to the previous output level in units of an error tolerance level EL when it is determined to be the dropped state.
    Type: Grant
    Filed: June 23, 2021
    Date of Patent: February 15, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Zhihui Wu, Takumi Nakamura
  • Patent number: 11206186
    Abstract: There is provided a measurement apparatus and a measurement method capable of easily performing measurement on a DUT by automatically specifying a Bluetooth (registered trademark) core specification version supported by the DUT. A command packet corresponding to the highest Bluetooth core specification version is transmitted to the DUT, in a case where an event including an error response is returned from the DUT, a command packet corresponding to the next lower Bluetooth core specification version than the command packet of the returned event continuously transmitted to the DUT, in a case where an event not including an error response is returned from the DUT, the Bluetooth core specification version of the command packet of the returned event is specified as the Bluetooth core specification version supported by the DUT, and measurement is performed on the DUT by using the command packet corresponding to the specified Bluetooth core specification version.
    Type: Grant
    Filed: June 30, 2020
    Date of Patent: December 21, 2021
    Assignee: ANRITSU CORPORATION
    Inventors: Yoshihide Goto, Akihisa Kumaki, Takashi Nakano
  • Patent number: 11198159
    Abstract: An article sorting apparatus, comprising a sorting mechanism (23) that performs a sorting operation to convey an inspected article (W) in one of a plurality of sorting directions (D1, D2 and D3); and a control unit that receives a sorting control signal (RJ) and controls operation of the sorting mechanism (23), wherein the sorting mechanism (23) includes rejection arms (31, 32) that change posture between a rejection posture where the rejection arms contact with the article (W) to change the conveyance direction to a specific sorting direction (D2 or D3) and a pass allowance posture where the rejection arms allow the article (W) to pass without contacting with the article, and air cylinders (33A, 33B) that operate the rejection arms to change the posture thereof, and an acceleration sensor (61) and a detection unit (62) and a deterioration determination circuit (46) that determines the deterioration of the movable portion (23M).
    Type: Grant
    Filed: April 5, 2018
    Date of Patent: December 14, 2021
    Assignee: ANRITSU CORPORATION
    Inventors: Junichi Tamura, Koji Koizumi
  • Patent number: 11193815
    Abstract: An article inspection apparatus includes a measuring unit 11 that outputs a measuring signal of weight within a required measurement time from a weight application time, when the weight of an article W is applied, a determination unit 16 that inspects the article W based on the measuring signal, an electromagnetic coil 84 that applies a diagnostic load to the measuring unit 11, and a performance diagnosis unit 18 that causes the diagnostic load to be applied from the electromagnetic coil 84 to the measuring unit 11, within a predetermined diagnosable time longer than the required measurement time from the weight application time, when the weight of the article W is applied to the measuring unit 11, and diagnoses the performance of the measuring unit 11, based on the measuring signal when the diagnostic load is applied.
    Type: Grant
    Filed: December 11, 2019
    Date of Patent: December 7, 2021
    Assignee: ANRITSU CORPORATION
    Inventor: Junichi Tamura