Abstract: Systems disclosed herein provide for efficient top-level compactors for systems on a chip (SoCs) with multiple identical cores. Embodiments of the systems provide for compactors with a time-skewed assignment configuration, compactors with a space-skewed assignment configuration, compactors with time/space-skewed assignment configuration, and compactors that can selectively switch between the time/space-skewed assignment configuration and a symmetric assignment configuration.

Abstract: Aspects of the present disclosure include systems, methods, devices, and circuits for correcting integral non-linearity using a hybrid phase interpolator. Consistent with some embodiments, a circuit comprises a first and second phase interpolator mixer connected to an injection-locked ring. The first phase interpolator mixer provides a first injection signal to the injection-locked ring based on a clock signal, and the second phase interpolator mixer provides a second injection signal to the injection-locked ring. The first and second injection signals have inverse step size profiles. The injection-locked ring generates a first and second output clock phase based on the first and second injection signals. In generating the first and second output clock phases, the injection-locked ring averages the step size profiles of the first and second injection signals.

Abstract: Disclosed are methods, systems, and articles of manufacture for implementing virtual prototyping for electronic designs. These techniques identify a plurality of leaf cells into a hierarchical physical design of an electronic design, generate the hierarchical physical design at least by performing hierarchical placement for the plurality of leaf cells based in part or in whole upon one or more factors, and revise the placed hierarchical physical design at least by performing hierarchical routing for the plurality of leaf cells on the hierarchical physical design. One aspect may further detach a virtual cell in the hierarchical physical design at least by grouping a first set of leaf cells and representing the first set of leaf cells with a first placeholder.

Abstract: The present disclosure relates to a method for reusing a debugging workspace in an electronic design environment. Embodiments may include performing, using a processor, a verification of an electronic design and identifying at least one triggered property associated with the electronic design. Embodiments may further include identifying at least one fan-in signal associated with the at least one triggered property of the electronic design. Embodiments may also include determining a start point debug location based upon, at least in part, the at least one fan-in signal, wherein the start point debug location includes at least one of signal information, cycle information, and event time information. Embodiments may further include generating a debug workspace, wherein generating includes adding at least one additional debug location and storing a cycle of the additional debug location as a relative cycle that is relative to another debug location associated with the debug workspace.

Abstract: Various embodiments provide for a level shifter with sub-threshold voltage functionality, which permits the level shifter to operate even when a voltage supply to the level shifter falls below a normal operational voltage range of one or more devices (e.g., transistors) within the level shifter. A level shift of an embodiment may operate when a voltage supply falls below a normal operational range in order to save power, which can be useful with respect to battery-operated devices, such an Internet of Things (IoT) sensor.

Abstract: A system, methods, and a computer program product for estimating a yield and creating corners of a circuit design with the aid of a failure boundary classification. The system, methods and computer program product provide for determining, based on how many sampling factors have failures, whether data samples are sufficient as input to scaled-sigma sampling. If the data samples are insufficient, the failure boundary classification is usable to determine whether the yield is high enough to meet a yield target. A design corner can be located by applying a binary search to results of scaled-sigma sampling. The failure boundary classification can aid in setting up the search.

Abstract: An integrated circuit test method provides an interactive shell environment having analysis modules organized as a directory such that for a given session a user can access any of the analysis modules. This invention describes a virtual directory structure for navigating through the entire test data starting from design, test configuration, ATPG patterns, failure information and callout information. This structure also allows the creation of a scripting environment for the user to select a specific configuration and process the information. User can achieve all of this in a single session as opposed to working on every test configuration in an independent session.

Abstract: Methods for debugging a failure in a logic circuit design simulation by tracing a X-value are provided. In one aspect, a method includes detecting during a X-propagation logic circuit design simulation a failure at a register transfer level of a logic circuit comprising one or more logic blocks and tracing a X-value in a data path of the one or more logic blocks until the X-value is observed in a control path of the one or more logic blocks. The method also includes identifying a logic block comprising a control signal of the control path in which the X-value is observed, and identifying the logic block in which the X-value is observed as a root cause of the failure. Systems and machine-readable media are also provided.

Abstract: A control-circuit of an emulation system may include one or more serial link inputs communicatively coupled to a serial bus, a serial link input receiving an input control bit from the serial bus. A configurable logic circuit may be configured to receive multiple control bits from the one or more serial link inputs, execute one or more operations on the plurality of input control bits according to programmable logic, and transmit an output control bit to a serial output link.

Abstract: The present embodiments relate generally to techniques for creating and/or modifying multi-layer buses in an IC design. According to some more particular aspects, embodiments relate to techniques for allowing an IC designer to efficiently transition a multi-layer bus section made of N wires and M layers to another multi-layer bus section made of N wires and any other M? layers. In some embodiments, the user describes, programmatically, one or several custom transitions called a custom transition procedure and saved in a human-readable text file that can also be read by a layout editor tool. By a command associated with the custom transition procedure that is exposed to the user in the layout editor tool, a multi-layer bus is automatically transitioned from a set of layers to another.

Abstract: Various embodiments provide for analyzing impedance states of a set of nodes in a circuit design and providing a set of reasons for those impedance states. The set of reasons can include a reason regarding why a particular node is reported as being in high-impedance (highz) state or in low-impedance (lowz) state, and the reason may be for a specific time point during transient analysis of the circuit design. Some embodiments are implemented within a debugging utility of an electronic design automation (EDA) software system.

Abstract: An exemplary memory arrangement can be provided, which can include, for example, a memory(ies), and an algorithmic memory unit(s) (AMU) coupled to the memory(ies), wherein the AMU includes a programmed testplan algorithm(s) configured to test the memory(ies). The AMU(s) can further include a hardwired testplan(s) configured to test the memory(ies). A Joint Test Action Group (“JTAG”) controller may be coupled to the AMU(s), which can be configured to access logic of the programmed testplan algorithm(s). A direct access controller (DAC) can be coupled to the AMU(s), which can be configured to access internal nodes in the AMU(s). The DAC can be configured to activate the programmed testplan algorithm(s) using a minimally direct access pin interface in the AMU(s).

Abstract: Aspects of the present disclosure address improved systems and methods for designing an integrated circuit design clock tree structure with scaled-load balanced clusters. Consistent with some embodiments, the system may include a clock tree synthesis (CTS) tool configured to recursively group pins to form a set of clusters that are balanced according to a scaled load. During the recursive grouping, the CTS tool scales actual loads of clusters in accordance with a scaling factor that is based on the radius of the cluster. In this way, the scaling factor penalizes large cluster spans during recursive clustering, thereby producing a clock tree structure that meets design rule constraints.

Abstract: According to certain aspects, the present embodiments relate to an inverse lithography technology (ILT) solution that provides masks with perfect symmetry and minimal complexity. A methodology according to the embodiments includes several steps and strictly maintains symmetry in each of these steps. In one step, lithographic model kernels are processed to enforce symmetry corresponding to an illumination source. In another step, an ideal grayscale mask for a target pattern is computed using the symmetrical model kernels and computation domain centered on each target polygon. In another step optimized polygons are computed using the computed grayscale mask. The final mask perfectly maintains the symmetry properties of the illumination source. An ILT solution according to the embodiments can be used on an original design hierarchy and on a full chip scale.

Abstract: Disclosed herein are systems and methods to generate, by a compiling processor, one or more sets of one or more execution instructions responsive to compiling a netlist file. The method further includes storing, by the compiling processor, a set of execution instructions into an instruction memory of an execution processor. The method further includes generating, by a compiling processor, a set of one or more keephot instructions for the execution processor based upon the set of execution instructions stored into the instruction memory of the execution processor. The method further includes storing, by a compiling processor, the set of keephot instructions into the instruction memory of the execution processor.

Abstract: A system and method are provided to control error-protected access to a memory device having address integrity protection for data words of memory transactions. A communication port receives a command having a port address, which is adaptively converted to a memory address by an interface portion. The interface portion includes an adaptation stage carrying out a predefined adaptation response on an address propagated therethrough during a clock cycle of operation. An address protection portion configures the adaptation stage to maintain the predefined adaptation response over at least two clock cycles. Address error is detected based on comparison of output addresses respectively generated upon iterative propagation of the same input address through the adaptation stage over the clock cycles. A command control portion executes to adaptively split each command received from the interface portion, as well as the corresponding memory address according to an inline storage configuration of the memory device.

Abstract: A method for simulating an integrated circuit design is provided. The method includes executing a characterization tool over a first portion of a parameter space of a circuit design to form a netlist associated with the first portion of the parameter space. The method also includes forming a first sub-netlist from the netlist, selecting, for the first sub-netlist, a condition from at least one of a process, a voltage, or a temperature condition, and at least one parameter from the first portion of the parameter space. The method further includes executing a simulation of the first sub-netlist in a selected solver mode using the condition and the at least one parameter, and incorporating a result of the simulation in a circuit performance report, wherein the result is associated with the condition, with the at least one parameter, and with the first sub-netlist.

Abstract: Various embodiments provide for a circuit for measuring a frequency difference, a phase difference, or both of at least two clock signals (e.g., a reference clock signal and a feedback clock signal). In particular, various embodiments described herein may be used in a circuit design to convert an input phase of two clock signals to a frequency difference, which may be outputted in the form of a digital word. Additionally, various embodiments described herein may be used in a circuit design to convert an input phase of two clock signals as phase difference output, which may be outputted in the form of a digital word. Various embodiments can provide the frequency difference, the phase difference, or both in near real-time and with only a small amount of latency.

Abstract: A method for generating a validation test may include using a processor, identifying, in a scenario for validation testing, a plurality of actions that address a single resource in a conflicting manner; and automatically generating target code of the scenario that includes one or a plurality of resource management commands so as to prevent conflicting addressing of that resource by said plurality of actions.

Abstract: Various embodiments provide for determining a delay of a data signal with respect to a data strobe signal within a memory system comprising a memory controller and a memory module. In particular, some embodiments adjust a phase between a data signal and a data strobe signal such that a data eye of the data signal arrives at a receiver latch of a memory module can be centered on a transition of the data strobe signal. By centering the data eye of the data signal with the transition of the data strobe signal, various embodiments can ensure that the data strobe signal transition falls between the leading and trailing edges of the data eye, which in turn permits the memory module to obtain correct data from the memory controller during a write operation.