Abstract: An illuminating device for a microscope may include a holder which carries a plurality of lighting units to be positioned in an illuminating target position. It may also include a pivot system with which the holder can be rotated about a pivot axis such that each lighting unit can be positioned selectively in the illuminating target position, wherein the rotational range of the holder about the pivot axis is less than 360°.

Abstract: A microscope including an imaging objective for imaging a sample on a detector and means for illuminating the sample with a light sheet in the focus plane of the imaging objective. The illumination means includes an illumination source which emits coherent light, and Bessel optics which generate at least two plane waves from the light beam and give propagation directions for the plane waves. The propagation direction of each of the plane waves encloses an acute angle with the focus plane in each instance, the magnitude of the acute angle being identical for each of the plane waves, so that the plane waves undergo constructive interference in the focus plane so that a light sheet is generated. Similarly, the illumination means can also include an optical element by which a rotationally symmetric Bessel beam is generated from the light beam for dynamic generation of a light sheet.

Abstract: The invention makes it possible to adjust the light intensity of a laser scanning microscope laser beam in an economical manner and with high accuracy. A separate acousto-optic component can be omitted in that a light modulation section such as an electroabsorption modulator (EAM) or a semiconductor amplifier (SOA) is arranged directly at the laser diode, advisably at one of its front sides. It is nevertheless possible to control the light intensity economically and with high accuracy because the important parameters of the laser beam remain unchanged when the optical output power is changed by the light modulation section. The light modulation section is preferably formed integral with the laser diode in at least one material layer.

Abstract: The invention relates to an illuminating device for a microscope with an illumination magazine comprising a plurality of light emitting units. A mechanical illuminator changer can change the light emitting unit currently active in the operative position. A filter magazine having a plurality of filter units is present, wherein a mechanical filter changer for changing the filter unit currently in the active operative position is associated with the filter magazine. At least one mechanical coupling component is provided for cooperation with the filter changer and the illuminator and for uniquely assigning each filter unit to a specific light emitting unit.

Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.

Abstract: Provided are methods, computer implemented methods, and devices for machine vision. The methods and devices are capable of quantifying the amount of a particular color resulting from a particular stain in a sample stained with multiple agents.

Abstract: The invention relates to a method for operating a microscope in which excitation light is focused on, or beamed to, different points of a specimen, in which an intensity of the excitation light is point-specifically varied and in which an intensity of the light reflected by said specimen in at least one spectral range is measured point-specifically and quantitatively. The method according to the invention is characterized in that the intensity and/or a spectral composition of the excitation light beamed to a specific point of said specimen is automatically adjusted by a regulating device on the basis of information previously gained from measured data of said specimen concerning an estimated or actual intensity of the light reflected in the spectral range by said point such that an integral of the intensity of the light reflected in the spectral range by this point during a pixel dwell time is within a predefined value interval. The invention also relates to a microscope.

Abstract: Disclosed is an imaging system that stores and retrieves very large scanned digital images, as in applications that automatically scan biological samples using a computer-controlled digital camera microscope. Slide data is entered, zelle data is captured and compressed and a zelle database file is loaded. Furthermore, an image database file is loaded and it is determined whether another zelle is to be stored. The image can be retrieved by accessing the zelle database, reading a zelle record, reading an image file, loading the display buffer, and determining whether another zelle is to be loaded.

Abstract: A device for generating an image of an object is provided, comprising an illumination module, by means of which the object can be illuminated with a pattern whose phase is altered temporally, a recording module, by means of which a plurality of recordings of the object are carried out during the phase change of the pattern, and a processing module, which generates the image from the recordings, wherein the illumination module moves a light beam over the object and modulates its intensity synchronously with the movement such that the beam generates the pattern in scanning fashion.

Abstract: The invention relates to a microscope having a stage for supporting a sample to be examined, a recording sensor, an imaging optic for imaging the sample onto the recording sensor, a moving unit by means of which the distance between the stage and the imaging optic can be changed, a control unit for controlling an image recording of the sample and a focus-holding unit for maintaining a prescribed focal position for image recording of the sample at temporal intervals, wherein the focus-holding device comprises at least one hardware element and one software module, wherein the focus-holding unit is fully integrated in the control unit, on both the hardware and software sides.

Abstract: The invention relates to a method for calibrating a deflection unit in a TIRF microscope, by means of which an angle of incidence of excitation light onto a specimen is adjusted, wherein a setting of said deflection unit is adjusted such that the pertaining angle of incidence is definitely greater or definitely smaller than an anticipated critical angle for total reflection of the excitation light on a surface of a used specimen, the angle of incidence is scanned by varying the setting of said deflection unit in the direction of an anticipated critical angle, an intensity of an optical response of the used specimen elicited by the excitation light being measured for each setting of the deflection unit, the intensity of the optical response of the specimen used is measured at least for a number of settings of the deflection unit until the intensity of the optical response of the specimen used traverses a flank, and the setting of the deflection unit pertaining to the flank is stored as the setting for the crit

Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A structured phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.

Abstract: A tube unit for microscopes which has a tube lens, including two components with an intermediate, large air separation, and an overall positive refractive power. The air separation is at least half the size of the focal length f of the tube lens. A roof edge mirror or another suitable deflection element is arranged between the two components of the tube lens. The roof edge mirror includes two mirrors, which can be tilted with respect to one another, and which is able to be tilted around its roof edge. The tilting movement or the tilting angle of the tiltable mirror or deflection element corresponds to half the tilt or half the tilting angle of the tube or eyepiece viewing system.

Abstract: In microscopes, particularly laser scanning microscopes, for detecting light coming from a sample, it is known to protect detectors from excessively high light outputs by means of shutters in the detection beam path. Further, in order to measure the light output impinging on the detector when the detection beam path is closed, a portion of the light is coupled out of the detection beam path and directed to a monitor diode. Constructions of this kind are complicated and costly. In the microscope according to the invention, a monitor diode is arranged on the shutter in such a way that the monitor diode is situated in the detection beam path when the shutter is closed. This makes it possible in a simple manner to measure the light output in a microscope when the detection beam path is closed even without additionally coupling light out of the detection beam path.

Abstract: An alignment marker unit for an object holder for microscopic imaging of an object with a microscope, wherein the alignment marker unit can be removed from and remounted on the object holder, wherein the alignment marker unit has at least one alignment marker for microscope-supported detection, and wherein the alignment marker is designed to determine a coordinate system for the object holder which allows for the microscope-supported calibration of the object or an area of the object relative to its position to the object holder and the position of the object holder relative to the microscope. Furthermore, an object holder system including an object holder and an alignment marker unit as described above is provided.

Abstract: Systems and techniques to acquire image data. In general, in one implementation, the technique includes: acquiring image data for a plurality of areas of a scan region. The technique may further include processing the image data to determine whether an area includes one or more desired features. The technique may further include designating an area as “interesting” if it includes a desired feature, and designating an area as non-interesting if it does not include the desired feature. The areas may be sub-divided one or more times, and subdivisions may be analyzed to determine if they include a desired feature.

Abstract: An illuminating device for a microscope may include a holder which carries a plurality of lighting units to be positioned in an illuminating target position. It may also include a pivot system with which the holder can be rotated about a pivot axis such that each lighting unit can be positioned selectively in the illuminating target position, wherein the rotational range of the holder about the pivot axis is less than 360°.

Abstract: An objective lens assembly is provided, with a sleeve, a first positioning member arranged in the sleeve, which is housed displaceable in longitudinal direction of the sleeve and holds at least one lens, a first adjustment unit which brings the first positioning member into abutment on the inside of the sleeve such that the first positioning member rests against the inside of the sleeve in a first linear contact area and at the same time the displaceability of the first positioning member is maintained. More than one positioning member can be utilized along with multiple lenses and can utilize simple mechanical structures (e.g., blind- and through-holes and pins or shanks) and/or magnetic or magnetisable materials to maintain a desired position of the sleeve.

Abstract: A luminescence microscopy method includes a sample being used, which comprises a certain substance, wherein the certain substance can be converted repeatedly from a first state, in which it can be excited into emitting luminescence radiation, into a second state, in which it cannot be excited into emitting luminescence radiation. The substance present in the sample can be brought into the first state by irradiating switch radiation. The certain substance can be excited into emitting luminescence radiation by irradiating excitation radiation. The sample emitting luminescence radiation can be displayed. A high-resolution selection of sample regions extending perpendicularly to a sample surface is carried out by irradiating either the switch radiation or the excitation radiation as structured illumination of the sample. A high-resolution selection of the sample surface is carried out by irradiating the switch radiation and/or the excitation radiation as TIRF illumination of the sample.

Abstract: A device for referenced measurement of reflected light and a method for calibrating such a device are disclosed.