Abstract: The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates.

Abstract: A family of microscopes include an illumination device which produces a planar light sheet along an illumination axis of an illumination beam path and a transverse axis normal to the illumination axis. A detection device detects light emitted from the sample region along an axis of detection of a detection beam path. The illumination and detection axes as well as the transverse axis and the axis of detection being oriented relative each other at an angle unequal to zero. A light sheet generator also produces rotationally symmetrical light and includes structure and control for rapidly scanning the sample region along the transverse axis. The illumination device includes a second light sheet generator having a first astigmatically active optical element with at least one astigmatic lens for producing a static sheet of light. Selection elements used to select either the first or the second light sheet or both together to produce the sheet of light.

Abstract: For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (2). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.

Abstract: The invention relates to a method for imaging a sample using a microscope, in particular a scanning microscope, in which the sample is illuminated with excitation light via an illuminating beam path, and light emitted from the sample is recorded via a detection beam path, wherein at least one adjustable beam splitter having an adjustable threshold wavelength is arranged in the detection beam path or/and in the illuminating beam path, and wherein light emitted from the sample is detected in at least one detection channel. According to the inventive method, for at least one predetermined sample region, a signal intensity of light detected in the at least one detection channel is recorded for a plurality of threshold wavelengths set at the adjustable beam splitter to obtain a signal/threshold-dependency of the predetermined sample region.

Abstract: An image processing device comprising an acquisition interface for acquiring recorded image data or recorded image signals and a graphics interface for a display device is constructed in such a way that a temporal sequence of recorded images can be acquired via the acquisition interface and an image data acquisition device connected to the latter and a temporal sequence of display images can be generated from the recorded image sequence, preferably with a smaller quantity of display images over the period of time in which the recorded image sequence is acquired. A display image of the display image sequence is generated from a partial sequence of at least two already acquired recorded images of the recorded image sequence, this partial sequence being associated with the display image of the display image sequence, and the display images can be sent to the display device via the graphics interface.

Abstract: A method for automatic focusing of a microscope on a predetermined object in a specimen to be examined may include a) producing a set of criteria to be satisfied for the predetermined object using at least one training image of the object, b) producing a first image of the specimen to be examined which contains the predetermined object with the microscope in a first focal position, c) ascertaining the section or sections of the first image, which in each case satisfies or satisfy the set of criteria according to step a), and defining each ascertained section as object area of the first image, d) producing further images of the specimen with the microscope in different focal positions, e) determining the optimum focal position(s) using the further images, wherein, for this purpose, in all images only the partial region or partial regions which correspond to the object area or object areas is/are evaluated, f) focusing the microscope on at least one of the optimum focal position(s) determined in step e).

Abstract: An arrangement for equalizing binocular visual fields for microscopes and other optical instruments, with an eyepiece arranged in each beam path, and with diaphragms serving the purpose of visual field adjustment. The diaphragms are fixed or movable in or in immediate proximity to an intermediate image plane in the optical output to the left eye and/or to the right eye. One diaphragm is arranged eccentrically or concentrically in the installation space of at least one eyepiece or in at least one eyepiece support of the corresponding optical instrument provided therefor. Adjusters are present for positioning and/or adjusting the diaphragms.

Abstract: A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

Abstract: A mirror cascade for the adjustment-free bundling of a plurality of light sources to be coupled into the beam path of a laser scanning microscope, comprising a beam combiner housing in which the mirror cascade is located, wherein the beam combiner housing can be either mounted directly on a scanning head of a laser scanning microscope and has a direct optical connection thereto or can be mounted on a microscope housing and has an optical connection thereto or is directly arranged in the scanning head. The invention further relates to a laser scanning microscope with such a mirror cascade.

Abstract: The disclosure provides a family of microscopes with components or discrete compact devices for illuminating an object with radiation of various spectral ranges suitable for multichannel fluorescence microscopy, so that an object is sequentially illuminated with different excitation spectra of particular fluorescent dyes.

Abstract: A focusing method for an optical instrument for magnified viewing of an object is disclosed. The instrument includes instrument optics, an adjusting unit for adjusting the focal position when viewing the object by means of the instrument optics, as well as a recording unit which records the object by means of the instrument optics.

Abstract: An optoelectronic detector and method of using same. In order to avoid any condensation on a surface, it has been known to heat such a surface. However, heating an optoelectronic detector will create a stronger hissing noise due to the greater dark current that is caused thereby. The invention is intended to avoid any condensation on an optoelectronic detector without airtight encapsulation. To this end, the detector is cooled and equipped with a sensor for the determination of a current value of one of the variables ambient humidity and ambient dew point temperature and a control unit that is connected with the sensor and designed to control the cooling device in dependence of such a value. By taking into account the ambient humidity or, respectively, the dew point temperature in the control of the cooling device, condensation on the detector can be avoided. An airtight encapsulation of the detector and the cooling device is not required.

Abstract: A microscope configuration according to an exemplary embodiment includes a microscope system with at least one addressable component and also a control system with a plurality of control modules for influencing a plurality of test-environment parameters in a test chamber of the microscope system. The control modules are configured to be combined in modular manner and to be coupled through an interface unit with a unified bus, through which they are controlled. A control module influencing a test-environment parameter of an incubation system has a control command interface unit configured to receive at least one control command. The control command interface unit couples with a bus. A control device is coupled with the control command interface unit and influences the test-environment parameter based upon the control command. A further interface unit is coupled to the control command interface unit and outputs, again, the received control command.

Abstract: A family of microscopes with illumination systems directing a sheet of light having an approximately planar extension in an illumination axis of an illumination beam path and in a transverse axis orthogonally oriented to the illumination axis. The microscopes have detection devices used to detect light that is emitted by a sample region. The detection devices including a detection lens system disposed in the detection beam path and an optical detection element spaced from a front lens of the detection lens system and independently adjustable thereof. The optical detection element continuously varies the size of a detection image field and/or continuously displaces a focal plane of detection in the P-region.

Abstract: The present disclosure relates to a family of microscopes, each with at least one lens group that includes at least one lens and a lens mount and moves along the optical axis via a drive system for The drive system includes a rotary motor and transmission elements to convert the rotary motion to linear motion to transmit the translational movement to the lens group, and, simultaneously, to prevent rotations of the lens group about the optical axis. In an embodiment, the rotating output shaft of the motor is connected with a screw spindle that engages with a threaded hole machined into the lens mount, so that the lens group is directly moved in a translational manner. The engagement of the screw spindle with the lens mount both effects the translational movement of the lens group and secures the lens group against rotation about the optical axis.

Abstract: The invention relates to methods for positioning at least one preferably biological specimen in the specimen space of a microscope arrangement, and to devices for carrying out these methods. Methods and devices are proposed, wherein the specimen's orientation relative to a detection objective's optical axis can be repeatedly changed and, in doing so, the specimen is held so that a substantially unobstructed view of the specimen is ensured from every detection direction. In different constructional variants, the specimen is held at a supporting device by adhesive forces or by a flowing medium, the specimen is held at a capillary opening by capillary action, or at least one specimen is embedded in a body of transparent gel, and the gel body is fixed in the specimen space by means of a rotatable holding device, and the detection direction is changed by rotating the holding device by a given angle of rotation.

Abstract: A microscope including an illumination device for a light sheet having an approximately planar extension along an illumination axis of an illumination beam path with a transverse axis to the illumination axis. Light emitted from the sample region on axis of detection the illumination axis and the axis of detection as well as the transverse axis and the axis of detection being oriented relative at an non-zero angle. The illumination device includes structure deflecting light to different beam path and thus produces an additional sheet of light, together illuminating the sample region on common illumination axis, and with switches between beam paths. Detection device has a detection lens system for light from by the sample region. The switches include a rapidly switching element with a time <10 ms, a predetermined integration of the surface detector synchronized so the sample region is illuminated twice during integration.

Abstract: A microscope image processing method includes applying a computing operation to at least one part of a microscope image, having the following steps: (a) providing the image in the mass storage device, (b) breaking down the microscope image into at least two image segments that can be loaded into the working memory and that have a dimension m, where m?n, (c) for one image segment, determining all pixels that are located in the image segment and in at least one of the partial images, so that a filled image segment results, (d) providing the filled image segment in the working memory, (e) applying the computing operation to the pixels located in the filled image segment so that an image segment result is created, (f) repeating steps (c), (d), and (e) for all image segments, and (g) combining all image segment results to create an overall result.

Abstract: An observation and analysis unit that magnifies an image of a sample and further accomplishes the evaluation and analysis thereof. The observation and analysis unit includes a light-microscopic device designed for the magnified imaging and optical evaluation of the sample and a sample analyzer that analyses selected regions of the sample. The sample analyzer includes an electron source from which an electron beam can be directed to a region of the sample selected by use of the light-microscopic device. The sample analyzer further includes an X-ray detector designed to detect X-ray radiation generated by the interaction of the electron beam with the sample material. The unit further includes an actuation and evaluation unit that generates control commands for the light-microscopic device and the electron source and spectrally analyzes the X-ray radiation.

Abstract: Microscope with heightened resolution and linear scanning wherein the sample is illuminated with a first and a second illuminating light, whereby the first illuminating light excites the sample, and the second illuminating light is generated through the refraction of coherent light at a periodic structure and displays a periodic structure in a lateral beam direction and in axial beam direction.