Abstract: A modular pressing device capable of generating stage downward forces is provided. The modular pressing device comprises a non-exchangeable pressing module and an exchangeable pressing module. The non-exchangeable pressing module includes a first downward force generating unit. The exchangeable pressing module includes a second downward force generating unit. The first downward force generating unit applies a first downward force to at least one of a testing seat and an electronic device through the exchangeable pressing module. The second downward force generating unit applies a second downward force to the electronic device. Thereby, the modular pressing device is capable to generate two different downward forces to reduce the downward surge force. In addition, as the exchangeable pressing module is worn, the exchangeable pressing module can be replaced quickly such that the maintenance cost can be effectively reduced and the stability of the apparatus can be enhanced.

Abstract: A probe pin alignment apparatus includes a beam-splitting element, an image-sensing device and a light-reflecting element. The beam-splitting element has a first illuminating surface facing a probe element, a second illuminating surface facing an object, and a light incident surface. The beam-splitting element has a semi-reflective surface for reflecting a light beam from the light incident surface to the probe element. The image-sensing device is disposed externally to the light incident surface of the beam-splitting element. The light-reflecting element, disposed oppositely to the light incident surface, allows a light beam to pass through the semi-reflective surface to be reflected back to the semi-reflective surface to be further projected onto the object. The beam-splitting element outputs a probe image and an object image from the first and second illuminating surfaces through the light incident surface.

Abstract: Herein disclosed is a voltage dividing resistor comprising a resistance bar and a plurality of dividing connectors. The resistance bar has a first end and a second end and provides a first current path, which stretches from the first end to the second end along the resistance bar. The distance between the first end and the second end is less than the length of the first current path. The first and second ends are configured to be electrically connected to a power source. The dividing connectors are electrically connected to different locations on the first current path. Each of the dividing connectors has a contact pad. The resistance bar is not coplanar with the contact pads. A divided voltage is obtained from a pair of dividing connectors chosen from the plurality of dividing connectors.

Abstract: A battery cell tray includes a bottom plate, a top plate opposite the bottom plate, at least one partition plate between the bottom plate and the top plate, a pressing plate between the partition plate and the bottom plate, and a transmission device between the pressing plate and the bottom plate and on the bottom plate. The transmission device includes moving members, a spiral rod, and supporting arms. The moving members respectively have a first threaded hole and a second threaded hole. The spiral rod has a first screw thread and a second screw thread that are arranged in reverse rotation directions and respectively engaged with the first threaded hole and the second threaded hole. Two top ends of the supporting arms are pivoted to the pressing plate, and two bottom ends of the supporting arms are respectively pivoted to the moving members.

Abstract: A testing device includes a switch, a sensing circuit, and a control circuit. The switch is coupled to a power supply circuit, and the power supply circuit is configured to output a supply voltage to a device under-test via the switch. The sensing circuit is coupled to the device under-test, and the sensing circuit is configured to receive an input voltage from the device under-test and to output a sensing signal according to the input voltage. The control circuit is coupled to the sensing circuit, the power supply circuit, and the switch. The control circuit is configured to control the power supply circuit to stop outputting the supply voltage at a first time and to turn off the switch at a second time according to the sensing signal.

Abstract: A contact detection circuit is applied to a four-terminal measurement device. The contact detection circuit comprises a first isolator, a signal generator, a multiplier and a calculator. The first isolator comprises a primary side and a secondary side, with the secondary side comprising a first terminal and a second terminal, with the first terminal configured to be electrically connected to a driving terminal and the second terminal configured to be electrically connected to a measuring terminal. The signal generator is configured to provide a measuring signal. The multiplier is configured to generate an output signal based on the measuring signal and a first reflected signal when the first reflected signal is induced at the primary side of the first isolator based on the measuring signal. The calculator calculates contact resistance between the driving terminal and the measuring terminal based on a direct-current component of the output signal.

Abstract: An electrical probe includes a probe assembly and a second electrical connection member. The probe assembly includes a needle cylinder, a first electrical connection member, a probe head and a sub-probe. The first electrical connection member and the probe head locate to two opposite sides of the needle cylinder. The first electrical connection member and the probe head electrically connect the needle cylinder. The sub-probe penetrates the probe head, and plugs the needle cylinder to electrically connect a cable but being electrically isolated from the needle cylinder. The sub-probe is located on a side away from the first electrical connection member. When the probe head depresses the object, the needle cylinder drives the first cylinder to a contact position to allow the first electrical connection member to electrically contact the second electrical connection member, and thus the probe head connects the second electrical connection member via the needle cylinder.

Abstract: An electrical probe structure includes a conductive cylinder, a first electrical connecting port and a probe assembly. The conductive cylinder for being fixed to the base plate has thereinside a sliding tunnel. The first electrical connecting port is electrically connected to the conductive cylinder. The at least one flexible conductive tube is furnished inside the sliding tunnel. The at least one probe assembly includes a first needle cylinder and a first probe. The first needle cylinder, slidably penetrating the conductive cylinder, electrically contacts the at least one flexible conductive tube so as to have the first needle cylinder to electrically connect the first electrical connecting port via the at least one flexible conductive tube and the conductive cylinder. The first probe is mounted and electrically connected to the first needle cylinder.

Abstract: A method is provided for testing a semi-finished battery cell. The semi-finished battery cell is charged with a constant current when a voltage difference between the first conductor and the second conductor is less than a voltage threshold. The semi-finished battery cell is charged with a constant voltage when the voltage difference between the first conductor and the second conductor is equal to or larger than the voltage threshold. An overall electric quantity is obtained after a default time period, wherein the overall electric quantity is an electric quantity charged to the semi-finished battery cell with the constant current during the default time period. Accordingly, an insulation related to electrodes of the semi-finished battery cell is determined as poor when the overall electric quantity is larger than an electric quantity threshold.

Abstract: A probe supporting structure, configured to support probe for testing battery cell, includes a base and at least two supporting members. The supporting members are detachably disposed on the base with an adjustable distance between the supporting members. The supporting members are arranged in parallel manner.

Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.

Abstract: A dew resistant module for a test socket, and an electronic component testing device having the same are provided. An enclosure body is provided to circumscribe the test socket; and a test socket base plate provided on top of the test socket and enclosure body. A cover is provided to cover the test socket, enclosure body and test socket base plate. With the provision of the enclosure body and the cover, the test socket, test socket base plate and a portion of the thermal head are prevented from coming into contact directly with the atmosphere, whereby condensation or dewing is prevented, thermal insulation achieved and energy consumption minimized.

Abstract: A method for testing air tightness includes connecting a testing chamber and a storage chamber, supplying negative pressure to the storage chamber, measuring the pressure in the storage or testing chamber to obtain a first pressure value, determining air tightness of the testing chamber according to the negative pressure and the first pressure value, stopping the negative pressure to the storage chamber, measuring the pressure in the storage chamber to obtain a second pressure value, measuring the pressure in the storage chamber after stopping the negative pressure to the storage chamber to obtain a third pressure value, and determining air tightness of the testing chamber according to the second and third pressure values. The device includes testing and storage chambers, a negative pressure generator, and a pressure gauge connected to the storage chamber, which is connected to the testing chamber. The negative pressure generator is connected to the storage chamber.

Abstract: A device for pressing an electronic component with different downward forces includes a first downward-pressure generating device, a depressing head, a second downward-pressure generating device and a depressing piston. The first downward-pressure generating device has the depressing head to apply a first downward pressure to the test socket and a portion of the electronic component. The second downward-pressure generating device has the depressing piston to apply a second downward pressure downward to another portion on the electronic component, so that the electronic component can couple electrically with a plurality of probe of the test socket. Thereupon, at least two downward-pressure generating devices are included to provide at least two different downward pressures to the electronic component solely or simultaneously to the electronic component and the testing equipment, such that specific downward-pressure requirements by precision electronic components can be fulfilled.

Abstract: A method for checking a wire connection comprises providing a first current by a first power channel and measuring a first voltage by a first measuring channel when each of a positive terminal of the first measuring channel and a positive terminal of the first power channel is connected to one of positive terminals of batteries and each of a negative terminal of the first measuring channel and a negative terminal of the second measuring channel is connected to one of negative terminals of the batteries after measuring the first voltage, providing a second current by the first power channel and measuring a second voltage by the first measuring channel, and determining whether the first measuring channel and the first power channel are connected to a same battery of the batteries.

Abstract: A surface measurement system is configured to measure a sample with a low reflectivity surface. The surface measurement system includes a condensation device and a measurement device. The condensation device is configured to form a liquid layer on the surface of the sample. The condensation device includes a chamber, a temperature controlling gas source, and a humidification gas source. The chamber is configured to accommodate the sample. The temperature controlling gas source is connected to the chamber to provide temperature controlling gases to the chamber, so as to control the temperature of the sample. The humidification gas source is connected to the chamber to provide water vapor to the chamber, so as to form the liquid layer on the surface of the sample. The measurement device includes a plate, a light source, and an image capturing device.

Abstract: An optical measuring device is configured to measure a light beam emitted from a light source. The optical measuring device includes a light collecting element, at least four light-sensing elements, a light splitting device, and at least one lens. The light collecting element is configured to collect the light beam. The light-sensing elements are configured to respectively sense the light fields of different light paths of the light beam. The respective distances of the light paths between the respective light-sensing elements and the light source are different from each other. The light splitting device is configured to split the light beam passing through the light collecting element and respectively guide the split light beams to the light sensing elements. The lens is disposed between at least one of the light-sensing elements and the light collecting element, and is configured to form images on the at least four light-sensing elements.

Abstract: A method for inspecting a solar cell and configured to inspect a peeling state of a three-dimensional pattern of the solar cell includes obliquely illuminating the three-dimensional pattern of the solar cell using a light beam. An image of the solar cell is normally captured. An intensity of the light beam is increased to increase a contrast between the three-dimensional pattern and a shadow of the three-dimensional pattern in the image and increase a contrast between an ink pattern of the solar cell and the shadow in the image to overexpose the ink pattern in the image. Determine if the three-dimensional pattern is peeling according to the shadow of the three-dimensional pattern in the image.

Abstract: A temperature-controlled module for electronic devices and a testing apparatus provided with the same mainly include a temperature-controlled tray, an upper board and a dry-air supply device. The temperature-controlled tray includes holding cavities for accommodating electronic devices and a fluid chamber for cooling fluid. The upper board is furnished with through holes, while the upper board and the temperature-controlled tray are spaced by a predetermined distance. The dry-air supply device provides dry air to a space between the temperature-controlled tray and the upper board. Thereupon, by having cooling fluid to flow inside the temperature-controlled tray, the temperature-controlled tray can be kept in a lower predetermined temperature so as to rapidly cool down the electronic device. In addition, by providing the upper board and the dry-air supply device to allow dry air to flow through the surface of the electronic device, then the water-condensation phenomenon and air leakage can avoided.

Abstract: An output control method for a controller includes the following steps. At each of detection time points, the controller detects a detection voltage value and a detection current value of a load. In a voltage control mode, the controller generates a setting parameter to control the power amplifier according to part of the detection voltage values. In a current control mode, the controller generates the setting parameter to control the power amplifier according to part of the detection current values. When the controller switches to the voltage control mode or the current control mode, the controller determines a ratio between the detection current value and the detection voltage value at one of the detection time points and the setting parameter is generated according to the ratio. Therefore, the bandwidth is substantially the same no matter if the controller operates in the voltage control mode or the current control mode.