Abstract: A method and system is provided for generating a tree-style graphical representation that depicts simultaneously hierarchical and non-hierarchical interrelationships among a set of entities. Two sets of specifications are acquired. One set describes a set of hierarchical interrelationships. The other set describes a set of non-hierarchical interrelationships among the same set of entities. Based on the two sets of specifications, a tree-style graphical representation is generated that depicts both hierarchical and non-hierarchical interrelationships. The generated tree-style graphical representation is displayed, as a graphical user interface, on a display device.

Abstract: This invention overcomes the disadvantages of the prior art by providing a human/machine interface (HMI) for use with machine vision systems (MVSs) that provides the machine vision system processing functionality at the sensor end of the system, and uses a communication interface to exchange control, image and analysis information with a standardized, preferably portable device that can be removed from the MVS during runtime. In an illustrative embodiment, this portable device can be a web-browser equipped computer (handheld, laptop or fixed PC) or a Personal Digital Assistant (PDA). The communication interface on the sensor-end of the system is adapted to communicate over a cable or wireless communication link (for example infrared (IR) or radio frequency (RF)), with a corresponding communication interface in the portable device.

Abstract: A method and apparatus for use with a web of material having a web length dimension and a web surface, the method for placing mark sequences on the web surface every X distance along the web length dimension identifying location along the web length dimension, the method comprising the steps of monitoring web location, every X distance, placing a sequence of N marks on the web surface along the web length wherein each two adjacent marks define a space length dimension and wherein the pattern of space length dimensions formed by the N marks in the sequence together specify a specific web length location. The invention also includes a marking and defect locating system including a high speed printer and a high resolution, high speed camera to facilitate the methods.

Abstract: Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filtered without affecting features in the image not associated with structure or texture. The filtered image is inspected in a probe mark inspection operation.

Abstract: A method is provided for computing a composite image representing a focused image of an object in an application of machine vision in an optical inspection system. An image tessellated into focus regions is evaluated by region for fine feature sharpness. A sharpness image is computed for each focused region using a fine feature sharpness measurement. A focused composite image is computed by combining as a weighted average, the images at several focus settings, using the sharpness image at each focus setting as the weight. The focused composite image can be further analyzed, inspected, or otherwise processed.

Abstract: A method and apparatus is provided for illuminating a wafer during wafer alignment using machine vision. An illumination device is fabricated using electroluminescent material, that provides diffuse illumination uniformly over the surface of the lamp to provide backlighting of the wafer. Contrast between the image of the wafer and the diffuse illumination produce edge features in the image that can be analyzed to determine the position and orientation of the wafer.

Abstract: A method is disclosed for finding a deformed pattern in an image using a plurality of sub-patterns. By advantageously restricting sub-pattern search ranges, search speed is improved, and the incidence of spurious matches is reduced. The method also quickly decides which sub-pattern result, of several potential candidates, is most likely to be the correct match for a deformed sub-pattern. Also, a method is provided for characterizing a deformed pattern in an image by using results from feature-based search tools to create a mapping that models the deformation of the pattern. A transform, selectable by a user, is fit to the results from the search tools to create a global deformation mapping. This transformation is fit only to feature points derived from matches resulting from successful sub-pattern search, without including data from areas of the pattern that were blank, not matched, or otherwise didn't contain information about the pattern's distorted location.

Abstract: A search method is disclosed for finding bar code symbols and various two-dimensional symbols, regardless of orientation, that is efficient, robust, and easy to use. The method works well on cluttered backgrounds, on skewed symbols, when symbols are almost touching, and when symbols are adjacent to text. The method includes choosing a candidate start region in the image, and then determining whether the candidate start region includes at least a portion of a candidate oriented encoded signal. Next, an approximate orientation of the candidate oriented encoded signal is determined. Then, the candidate start region is grown, using the approximate orientation, so as to form a candidate symbol region that encloses an entire candidate code symbol, including at least a portion of the candidate start region. The method is finely responsive to orientation.

Abstract: The invention provides methods and appartaus for analysis of images of two-dimensional (2D) bar codes in which a model that has proven successful in decoding of a prior 2D image of a 2D bar code is utilized to speed analysis of images of subsequent 2D bar codes. In its various aspects, the invention can be used in analyzing conventional 2D bar codes, e.g., those complying with Maxicode and DataMatrix standards, as well as stacked linear bar codes, e.g., those utilizing the Codablock symbology. Bar code readers, digital data processing apparatus and other devices according to the invention be used, by way of non-limiting example, to decode bar codes on damaged labels, as well as those screened, etched, peened or otherwise formed on manufactured articles (e.g., from semiconductors to airplane wings).

Abstract: An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted features are analyzed to derive geometric descriptions of the zone regions of the pad, that are applied in semiconductor device inspection, fabrication, and assembly operations.

Abstract: A method is provided for detecting spot defects on an object when an allowable variation (called the “background”) in the appearance of the object can be modeled. Methods are also provided for measuring and classifying detected spot defects. An alignment model is used to align the image of the object, a background model is then used to estimate the (possibly different) background in each region, and each background is substantially removed from the image so as to form a foreground image on which blob analysis can be applied to detect spot defects, the blob analysis using a threshold image that accommodates different noise statistics for each region. The method facilitates robust spot defect inspection of fiber optic end faces, or of any object with different object regions. The method also allows use of blob analysis over a larger range of conditions, including conditions that make simple blob analysis infeasible.

Abstract: A method for accurately and efficiently determining the location of points or entities in a machine vision image. A set of sub-models are constructed from a global training model representing objects viewed by the machine vision system. The set of sub-models are used to fix the actual location of user selected points or entities. Configuration of the sub-models is automated to ensure that the sub-models contain sufficiently stable features within optimally sized regions without requiring substantial user expertise. Located entities are compared to evaluate compliance with pre-selected tolerances.

Abstract: A method and apparatus for inspection of probe marks made on the interconnection lands of semiconductor devices using machine vision is disclosed. An image of an interconnection land is analyzed, and features of the image that may constitute indicia of probe marks are refined through the application of a series of unique heuristic processes. The output of the method is measurement data that can be used to characterize and verify the processes used to electrically probe semiconductor devices.

Abstract: A method of analyzing machine vision images to identify low contrast features such as scratches or cracks on the polished ends of optical fibers. A bank of oriented filters having incremental angles of orientation are tuned to respond to the frequency characteristics of oriented scratches or cracks having an approximate width. The filters are applied to an image to generate a filter response image for each filter orientation. The set of filter response images are combined to form a single data set indicating a magnitude and angle for each pixel in the original image. Elements of the combined data set having corresponding angles and magnitudes are grouped to form contour components that can be optionally input to higher order processes.

Abstract: A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features.

Abstract: An embodiment of the invention provides a method for training a system to inspect a spatially distorted pattern. A digitized image of an object, including a region of interest, is received. The region of interest is further divided in to a plurality of sub-regions. A size of each of the sub-regions is small enough such that a conventional inspecting method can reliably inspect each of the sub-regions. A search tool and an inspecting tool are trained for a respective model for each of the sub-regions. A search tree is built for determining an order for inspecting the sub-regions. A coarse alignment tool is trained for the region of interest. Another embodiment of the invention provides a method for inspecting a spatially distorted pattern. A coarse alignment tool is run to approximately locate a pattern. Search tree information and an approximate location of a root image, found by the coarse alignment tool, is used to locate sub-regions sequentially in an order according to the search tree information.

Abstract: A method is provided for obtaining high-resolution performance from a standard image sensor, such as a single-chip image sensor. Since single-chip color image sensing is often the least expensive way to obtain color images, the invention helps to lower the cost of high-resolution machine vision performance. The color image produced by the single-chip image sensor is processed in two ways at run-time. In one stage of run-time, processing is performed on the original color image provided by the image sensor, including normal low-resolution image processing and low-resolution machine vision analysis. In another stage of run-time, a high-resolution search model is determined to search the color image using knowledge of the geometric properties of the arrangement of the pixels of the low-resolution image sensor, and the sub-pixel phase of the high-resolution search model. The invention can as much as double the accuracy of machine vision analysis using a standard color camera.

Abstract: A method and system provides increased levels of security for a mantrap portal by continuously monitoring two zones of the mantrap; a primary zone and a secondary zone. A primary sensor determines that exactly one or zero people are present in the primary zone when requesting access into a secured area. A secondary sensor determines that exactly zero people are present in the secondary zone when access to the secured area is granted. The primary and secondary sensors in combination can detect piggyback events and tailgating events before granting access to a secured area. Further, the primary and secondary sensors in combination can detect the presence of unauthorized persons in a mantrap prior to granting access to the mantrap for exit from a secured area.

Abstract: A method is provided for finding a whole pattern in an image, where at least a portion of the whole pattern falls outside the boundary of the image. The method includes, for each candidate pose of a search model of the whole pattern that results in a transformed search model that may extend beyond the boundary of the image, applying a match-quality metric to only a subset of search model features and corresponding image features, the subset being uniquely determined by the pose. The features which do not overlap the image at that pose of the model are completely excluded from the metric computation. All the relevant available information is used, using no arbitrarily hypothesized information. The higher-level strategy of the search procedure is free to consider poses where the model extends partially outside the image, and the results of each metric computation will be the most true value possible.

Abstract: An apparatus for directing uniform intensity light onto a surface where the light is provided at an acute angle with respect to the surface including a light source that generates initial light rays that are essentially perpendicular to the surface and a guidance member positioned between the source and the surface which receives the initial rays and redirects the rays such that redirected rays are parallel and form acute angles with respect to the surface, the source and guidance member juxtaposed with respect to the surface so that the redirected rays subtend the surface.