Abstract: A graphic data processing apparatus comprising a CPU coupled to an entry device, storage storing graphic data and a plurality of programs and a display, and adapted such that a command mode for drawing a desired graphic form is selected by designating the corresponding desired graphic form in the already displayed graphic forms and a program for drawing the graphic form is automatically selected.

Abstract: A graphic data processing apparatus comprising a CPU coupled to an entry device, storage storing graphic data and a plurality of programs and a display, and adapted such that a command mode for drawing a desired graphic form is selected by designating the corresponding desired graphic form in the already displayed graphic forms and a program for drawing the graphic form is automatically selected.

Abstract: An automated method for designing an integrated circuit layout using a computer based upon an electronic circuit description and based upon cells which are selected from a cell library, each of the cells having an associated area, comprising the steps of: (a) placing each of the cells in the integrated circuit layout so that the cells can be coupled together by wires to form a circuit path having an associated predetermined delay constraint wherein the cells are coupled together based upon the electronic circuit description input to the computer; (b) connecting the cells together with the wires to form the circuit path; and (c) adjusting an area of at least one of the cells to satisfy the associated predetermined delay constraint of the circuit path.

Abstract: The present invention relates to a method of interactive visualization and parameter selection for engineering design. Initially, a nominal topology and associated design variables are set. The design variables are treated as being independent of each other for the purposes of a design variable sweep or sensitivity analysis to determine effects of changes in design variables on performance. The results of the sweep are presented to a designer, for example, by a suitable software tool including a graphical user interface. The designer selects design variables and revises their values based on the visually presented results of the sweep and effects a simulation using the revised values. If the results are satisfactory and a stopping condition is satisfied then the method is done. Otherwise, a determination must be made as to whether additional values can be changed or whether a new sweep must be effected.

Abstract: An apparatus to enable products to be evenly spaced so that they can be loaded onto a collator or other receiving device on a packaging machine. The packages are caused to be placed on a chain conveyor belt which has a multiplicity of spinning rollers to cause linear movement of the package along the chain conveyor belt. A multiplicity of sensors which actuate a respective air driven cylinder to cause a friction plate to come in contact with a selected portion of rollers at a location of the package will cause the linear movement of the package to stop for a given period of time so that the package can be appropriately spaced from the packages ahead of it and the packages behind it on the conveyor.

Abstract: A programmed computer generates descriptions of circuits (called “checkers”) that flag functional defects in a description of a circuit undergoing functional verification. The programmed computer automatically converts the circuit's description into a graph, automatically examines the graph for instances of a predetermined arrangement of nodes and connections, and automatically generates instructions that flag a behavior of a device represented by the instance in conformance with a known defective behavior. The checkers can be used during simulation or emulation of the circuit, or during operation of the circuit in a semiconductor die. The circuit's description can be in Verilog or VHDL and the automatically generated checkers can also be described in Verilog or VHDL. Therefore, the checkers can co-simulate with the circuit, monitoring the simulated operation of the circuit and flagging defective behavior.

Abstract: This invention determines whether two logic level circuit models have equivalent functionality. The method allows difficult portions of the equivalent functionality check to be partitioned and concurrently solved in a distributed computing environment. This permits the user to use, in a scalable fashion, additional computing resources to rapidly solve difficult equivalent functionality checks. The method allows difficult checks to be solved using (1) a divide-and-conquer approach, (2) by a competitive approach in which many independent attempts are made to solve the same check, or (3) by allocating more resources to solve the difficult check.

Abstract: A programmed computer generates descriptions of circuits (called “checkers”) that flag functional defects in a description of a circuit undergoing functional verification. The programmed computer automatically converts the circuit's description into a graph, automatically examines the graph for instances of a predetermined arrangement of nodes and connections, and automatically generates instructions that flag a behavior of a device represented by the instance in conformance with a known defective behavior. The checkers can be used during simulation or emulation of the circuit, or during operation of the circuit in a semiconductor die The circuit's description can be in Verilog or VHDL and the automatically generated checkers can also be described in Verilog or VHDL. Therefore, the checkers can co-simulate with the circuit, monitoring the simulated operation of the circuit and flagging detective behavior.

Abstract: A method of interactively determining at least one optimized design candidate using an optimizer, the optimizer having a generation algorithm and an objective function, the optimized design candidate satisfying a design problem definition, comprises generating design candidates based on the generation algorithm. The generated design candidates are added to a current set of design candidates to form a new set of design candidates. The design candidates are evaluated based on the objective function so that design candidates can be selected for inclusion in a preferred set of design candidates. The current state of the optimizer is presented to a designer for interactive examination and input is received from the designer for updating the current state of the optimizer. These steps are repeated until a stopping criterion is satisfied.

Abstract: A method of multi-topology optimization is used in AMS circuit design to address the problem of selecting a topology while sizing the topology. First, design schematics are manually or automatically selected from a database of known topologies. Additional topologies can be designed as well. For each candidate design there is associated a topology and a set of parameters for that topology. Analogously to the step of automatic sizing for a single topology, multi-topology optimization comprises optimizing over the entire population of design simultaneously while not requiring that all topologies are fully optimized. The multi-topology optimization step is repeated until one or more stopping criteria are satisfied. The sized schematic is then passed onto placement, routing, extraction and verification.

Abstract: A strategy for optimal buffering in the case of an infinitely long wire buffered with an arbitrary number of equally spaced single-size buffers is presented. A simple but efficient technique is proposed using this to choose a buffer size and determine a good inter-buffering distance up front, thus enabling fast, efficient buffer insertion. The analysis also allows representing delays of long wires as a simple function of the length and buffer and wire widths. Based on this, a novel constant wire delay approach is proposed where the proposed wire delay model is used for fairly accurate prediction of wire delays early in the design process and these predictions are later met via buffer insertion and wire sizing.

Abstract: A system for calculating interconnect wire lateral capacitances in an automated integrated circuit design system subdivides the chip area of a circuit design to be placed and routed into a coarse grid of buckets. An estimate of congestion in each bucket is computed from an estimated amount of routing space available in the bucket and estimated consumption of routing resources by a global router. This congestion score is then used to determine the spacing of the wires in the bucket which is in turn used to estimate the capacitance of the wire segment in the bucket.

Abstract: Disclosed is a subgrid detailed router that performs searches for wire locations at the grid level. Once a solution is found, the wire is placed in a based upon a finer subgrid. Specifically, the present invention includes subgrids that in a preferred embodiment have a resolution that is 16X greater than the resolution of the conventional grids. This increased resolution is useful for improving routing density with variable width and variable spacing designs. In operation, the subgrid detailed router of the present invention searches at the grid level for potential wire paths using a code associated with each grid. This code contains data corresponding to each of the subgrids, such that upon completion of a routing a net, information exists that allows for the placement of the net at locations corresponding to the subgrid that has finer resolution than the grid which was used to implement the routing search.

Abstract: An automated logic circuit design system uses a common database to store design data at different states of the design process, including data-flow graphs, netlists and layout descriptions. In this way, the need to translate circuit descriptions between tools is eliminated, thus leading to increased speed, flexibility and integration. The common database includes entities, models, cells, pins, busses and nets. The data-flow graphs are stored as graphs, the nodes in a graph as cells, and the edges as busses. Physical design data is available by storing the cells in a model in a KD tree. This allows queries on cells in the netlist located in the layout within arbitrary areas.

Abstract: Methods and apparatuses for automated design of parallel drive standard cells are disclosed. The capacitive load to be driven by a particular output of a standard cell is determined. The driving capacity of the output is also determined. Based on the capacitive load to be driven and the driving capacity, a number of standard cells to be used is determined. The multiple standard cells are coupled in parallel having the respective outputs coupled to the capacitive load to be driven. In one embodiment, the standard cells coupled is parallel are placed such that the connection between the respective outputs and the load are substantially equal.

Abstract: An automated logic circuit design system uses a common database to store design data at different states of the design process, including data-flow graphs, netlists and layout descriptions. In this way, the need to translate circuit descriptions between tools is eliminated, thus leading to increased speed, flexibility and integration. The common database includes entities, models, cells, pins, busses and nets. The data-flow graphs are stored as graphs, the nodes in a graph as cells, and the edges as busses. Physical design data is available by storing the cells in a model in a KD tree. This allows queries on cells in the netlist located in the layout within arbitrary areas.

Abstract: An automated method for designing an integrated circuit layout using a computer based upon an electronic circuit description and based upon cells which are selected from a cell library, each of the cells having an associated area, comprising the steps of: (a) placing each of the cells in the integrated circuit layout so that the cells can be coupled together by wires to form a circuit path having an associated predetermined delay constraint wherein the cells are coupled together based upon the electronic circuit description input to the computer; (b) connecting the cells together with the wires to form the circuit path; and (c) adjusting an area of at least one of the cells to satisfy the associated predetermined delay constraint of the circuit path.

Abstract: An automated method for designing an integrated circuit layout using a computer based upon an electronic circuit description and based upon cells which are selected from a cell library, each of the cells having an associated area, comprising the steps of: (a) placing each of the cells in the integrated circuit layout so that the cells can be coupled together by wires to form a circuit path having an associated predetermined delay constraint wherein the cells are coupled together based upon the electronic circuit description input to the computer; (b) connecting the cells together with the wires to form the circuit path; and (c) adjusting an area of at least one of the cells to satisfy the associated predetermined delay constraint of the circuit path.

Abstract: A method for designing a sequence of logic gates in a path is described. In one embodiment, the method includes modeling gate delay as a function of input slew and output load using a delay model and adjusting electrical efforts in each stage to reduce the gate delay along the path. In one embodiment, the electrical efforts in each stage are adjusted to minimize the delay along the path, where the delay along the path is minimized when a product of logical effort and electrical effort associated with each gate is the same.

Abstract: An automated method for designing an integrated circuit layout with a computer, based upon an electronic circuit description and upon a selected plurality of cells from a cell library, comprising the steps of: (a) assigning each of the cells to one of a plurality of buckets designated on the integrated circuit layout, each of the cells being connected to one of the other cells; (b) performing global routing to connect at least some of the selected cells of step (a) together such that global routes are formed to provide net topology information; (c) performing track routing which sets the position of each of the global routes; (d) performing detailed placement such that the positions of all selected cells are fixed within each of the buckets designated on the integrated circuit layout; and (e) performing detailed routing such that detailed routes are formed to complete the integrated circuit layout.