Abstract: Infrared cameras can include an infrared sensor and an infrared lens assembly defining an optical axis. A camera can include an inner gear engaging the infrared lens assembly and a focus ring that engages the inner gear. The inner gear can engage the focus ring and the infrared lens assembly such that rotation of the focus ring about its central axis can cause the rotation of the infrared lens assembly about its optical axis, which may be offset from the central axis of the focus ring. The camera can include a sensor can threadably engaging the infrared lens assembly and fixed relative to the infrared sensor such that rotation of the infrared lens assembly causes the infrared lens assembly to move relative to the infrared sensor. The sensor can support other components such as a visible light lens assembly or a laser within a perimeter of the focus ring.

Abstract: A network analyzer includes a main unit and a physically separate remote unit. In at least one configuration, the main unit generates and transmits test signals through a device under test to the remote unit. Reference circuitry in the main unit uses signals from a local oscillator and an analog-to-digital ADC sample clock to produce reference signal data representative of the test signals as transmitted to the device under test. Receive circuitry in the remote unit produces received signal data representative of the test signals as received from the device under test, using the same signals from the local oscillator and ADC sample clock as used by the reference circuitry to produce the reference signal data. Comparison of the received signal data with the reference signal data indicates parameters of the device under test, including attenuation and phase shift in the test signals as caused by the device under test.

Abstract: Analysis systems can include both a test and measurement tool for generating measurement data representative of at least one parameter of a device under test and an imaging tool for generating image data representative of a target scene. An electrical isolation mechanism can electrically isolate a user operating the analysis tool from the test and measurement circuit through the imaging tool. The electrical isolation mechanism can include an insulating coating surrounding a part of the imaging tool having an opening proximate the imaging tool so that electromagnetic radiation can enter through the opening and reach the imaging tool. The opening can be sized so that a standard finger cannot penetrate the opening to within a predetermined distance of the imaging tool. Additionally or alternatively, a window positioned over the opening can prevent access to the imaging tool via the opening.

Abstract: Systems and methods provide measurement of one or more electrical parameters (e.g., impedance) of a device under test (DUT) using an electrical parameter measurement device (e.g., multimeter, oscilloscope) that includes reference signal circuitry that generates, detects, and processes common mode reference signals. A measurement device may include a known common mode AC reference voltage source coupled to a common input terminal. During measurement of a DUT, circuitry may detect a signal at a voltage test input terminal and a signal at the common input terminal. The circuitry may process the first and second signals to determine one or more electrical parameters of the DUT, which one or more electrical parameters may be used to implement one or more features. The determined electrical parameters may be presented to an operator via a visual indicator device and/or may be communicated to an external device via a wired and/or wireless communications interface.

Abstract: Systems and methods for calibrating a voltage measurement device are provided herein. The voltage measurement device generates a reference current signal and senses the reference current signal in a conductor under test. A calibration system may control a calibration voltage source to selectively output calibration voltages in a calibration conductor. The calibration system may obtain data from the voltage measurement device captured by the voltage measurement device when measuring the calibration conductor. Such data may include one or more reference current measurements, one or more voltage measurements, etc. The calibration system utilizes the obtained measurements to generate calibration data which may be stored on the voltage measurement device for use thereby during subsequent operation. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, etc.

Abstract: A measurement device and method includes a controller for controlling performance of a test on a test object, a signal generator for generating a signal indicative of an audible prompt to audibly identify a test result of the test object, and a signal transmitter for wirelessly transmitting the signal indicative of the audible prompt to a device remote from the measurement device.

Abstract: A power testing device includes a communication port with pins that receive signals from a device under test. First test circuitry is coupled to a first set of pairs of the pins, and second test circuitry is coupled to a second set of pairs of the pins. A switch is coupled to the first test circuitry and/or the second test circuitry. While the switch is in a first state, the first test circuitry and the second test circuitry are electrically isolated from each other. While the switch is in a second state, the first test circuitry and the second test circuitry are not electrically isolated from each other. A processor is coupled to the first test circuitry, the second test circuitry, and the switch. A memory stores instructions that cause the processor to control operation of the first test circuitry, the second test circuitry, and the switch.

Abstract: An optical testing device is provided. The testing device includes a position sensing detector (PSD) having an optical sensing area that is optically responsive to a first range of wavelengths. The PSD receives a plurality of optical signals having wavelengths within the first range and emitted through a respective plurality of optical fibers and detects a plurality of positions where the optical signals impinged on the optical sensing area for determining array polarity. The PSD receives a plurality of first optical signals having wavelengths within the first range and detects the polarity and a plurality of optical intensities of the first optical signals. The testing device includes a photodetector that is optically responsive to a second range of wavelengths different than the first range. The photodetector receives a plurality of second optical signals within the second range and detects a plurality of optical intensities of the second optical signals.

Abstract: A Rogowski coil in a sensor unit has voltage induced by a conductor surrounded by the Rogowski coil. The voltage is integrated to represent current which is converted to digital data representing current in the conductor and sent wirelessly to a multimeter. The sensor unit may receive control signals from the multimeter and a remote control apparatus. A plurality of sensor units may be networked and controlled by the remote control apparatus.

Abstract: A system and method for generating messages from a cloud-based server relating to cable test device usage. Provided is at least one test device configured to perform one or more cabling test procedures and a cloud-based server configured to couple to the at least one cable test device for transmission of data therewith. The cloud-based server includes a database configured to store test device activity data received from the one or more cable test devices. The cloud-based server includes a processor configured to define messages to be electronically delivered to one or more prescribed recipients contingent upon a defined event being satisfied by the received cable test device activity data and to analysis the cable test device activity data stored in the database to determine when a defined event has been satisfied. A message is electronically transmitted to the prescribed recipients when the defined event is determined satisfied.

Abstract: A method and apparatus for optical sensor-based position sensing are provided. In the method and apparatus, a first displacement is detected by a first optical position sensor and a second displacement is detected by a second optical position sensor of an optical position sensor assembly located on a radio frequency (RF) imaging device. A processor coupled to the optical position sensor assembly determines a position of the RF imaging device based at least in part on the detected first and second displacements. The processor determines a tilt of the RF imaging device based at least in part on the detected first and second displacements and associates, in a memory, the position and the tilt of the RF imaging device with data representing an RF image of a portion of a space disposed behind a surface captured by the RF imaging device.

Abstract: One or more embodiments are directed to conductor tracing instruments that include a receiver for detecting an energized conductor and methods for detecting an energized conductor. The receiver includes a plurality of sensors configured to sense magnetic fields produced by the energized conductor and a feedback mechanism configured to communicate information to a user regarding the magnetic fields being sensed. At least two of the sensors are configured to sense magnetic fields having directions of magnetic force that are different from each other. In one embodiment, the sensors are positioned so as to sense magnetic fields having directions of magnetic force that are perpendicular to each other. A change in information provided by the feedback mechanism communicates a change in direction of the energized conductor being detected by the receiver.

Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.