Patents Assigned to Hamamatsu Photonics, K. K.
  • Publication number: 20200278460
    Abstract: A scintillator panel includes a substrate having a substrate main surface, a substrate rear surface, and a substrate side surface; a scintillator layer having a scintillator rear surface formed of a plurality of columnar crystals, a scintillator main surface, and a scintillator side surface; and a protective film covering the scintillator side surface of the scintillator layer. The substrate side surface partially has a coarsened region. The scintillator side surface has a coarse surface including an uneven structure. The protective film closely adheres to the scintillator side surface such that the coarse surfaces are covered.
    Type: Application
    Filed: July 3, 2018
    Publication date: September 3, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Kazuhiro SHIRAKAWA, Keisuke GOTO, Haruki YAMAJI, Hidenori JONISHI, Masashi HATANAKA, Jun SAKURAI
  • Publication number: 20200279729
    Abstract: A laser desorption/ionization method, includes: a first step of preparing a sample support body including a substrate on which a plurality of through holes opening to a first surface and a second surface facing each other are formed, a conductive layer provided on at least the first surface, and a solvent provided in the plurality of through holes with refractoriness in a vacuum; a second step of mounting a sample on a mounting surface of a mounting portion, and of disposing the sample support body on the sample such that the second surface is in contact with the sample; and a third step of ionizing a component of the sample that is mixed with the solvent and is moved to the first surface side from the second surface side through the through hole by irradiating the first surface with laser beam while applying a voltage to the conductive layer.
    Type: Application
    Filed: October 5, 2018
    Publication date: September 3, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Yasuhide NAITO, Takayuki OHMURA, Masahiro KOTANI
  • Publication number: 20200280694
    Abstract: A pixel circuit includes a differential amplifier. The differential amplifier includes a non-inverting input terminal, an inverting input terminal, and an output terminal. The differential amplifier includes an input differential pair including first and second NMOS transistors, a current mirror pair including PMOS transistors, and a constant current source including a fifth NMOS transistor. A threshold voltage of each of the first and second NMOS transistors is higher than a threshold voltage of the fifth NMOS transistor. Further, the threshold voltage of each of the first and second NMOS transistors is higher than a threshold voltage of another NMOS transistor.
    Type: Application
    Filed: October 3, 2018
    Publication date: September 3, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Sho MORITA, Takayuki KURASHINA, Hiroo YAMAMOTO
  • Patent number: 10761318
    Abstract: Provided is a mirror device including a mirror which is supported to be flappable around a fast axis and supported to be flappable around a slow axis and in which a resonance frequency of flapping thereof with respect to the fast axis is a first value and a resonance frequency of the flapping thereof with respect to the slow axis is a second value lower than the first value; a signal extracting portion configured to obtain from a slow axis coil a synthesized signal including an induced signal generated in the slow axis coil due to an operation of flapping the mirror around the fast axis and configured to extract the induced signal from the synthesized signal; and a signal generating portion configured to generates a driving signal so that the flapping of the mirror with respect to the fast axis is in a resonance state according to the induced signal.
    Type: Grant
    Filed: March 16, 2017
    Date of Patent: September 1, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventor: Akira Takahashi
  • Patent number: 10759655
    Abstract: An actuator device includes a support portion, a movable portion, a connection portion which connects the movable portion to the support portion on a second axis so that the movable portion is swingable about the second axis, a first wiring which is provided on the connection portion, and a second wiring which is provided on the support portion. The rigidity of a first metal material forming the first wiring is higher than that of a second metal material forming the second wiring. The second wiring is connected to a surface opposite to the support portion in a first connection part located on the support portion in the first connection part.
    Type: Grant
    Filed: December 22, 2016
    Date of Patent: September 1, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Sadaharu Takimoto, Yuki Morinaga, Daiki Suzuki, Yoshihisa Warashina
  • Patent number: 10758999
    Abstract: The object to be processed cutting method includes: a crystal orientation identifying step of identifying a crystal orientation of the substrate; a line to cut setting step of setting, for the object to be processed, a line to cut passing through a street region formed between adjacent functional devices, after the crystal orientation identifying step; and a cutting step of cutting the object to be processed along the line to cut, after the line to cut setting step. In the line to cut setting step, in a case where an extending direction of the street region does not match the crystal orientation, the line to cut parallel to the crystal orientation and inclined with respect to the extending direction of the street region, is set for the object to be processed.
    Type: Grant
    Filed: August 8, 2016
    Date of Patent: September 1, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Junji Okuma, Yo Sugimoto
  • Publication number: 20200271511
    Abstract: An optical measuring device includes an integrator formed with an incident opening on which excitation light is to be incident and an exit opening from which measurement light is to exit, a light guide unit for guiding the measurement light that exits from the exit opening, and a light detecting unit for detecting the measurement light guided by the light guide unit. The light guide unit includes a plurality of light guide members arranged so that incident end surfaces of the light guide members face the inside of the integrator through the exit opening. The light detecting unit detects the measurement light that is guided by at least one of the plurality of light guide members. Light-receiving regions of the plurality of light guide members on the incident end surface side overlap with each other in the integrator.
    Type: Application
    Filed: May 12, 2017
    Publication date: August 27, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Kengo SUZUKI, Kazuya IGUCHI, Yasuyuki TANABE
  • Publication number: 20200271512
    Abstract: Provided is a position detection sensor. In a first pixel part, as an incident position is closer to a first end of a first pixel pair group in a second direction, an intensity of a first electric signal decreases. In a second pixel part, as the incident position is closer to the first end, an intensity of a second electric signal increases. In a third pixel part, as the incident position is closer to a second end of a second pixel pair group in a first direction, an intensity of a third electric signal decreases. In a fourth pixel part, as the incident position is closer to the second end, an intensity of a fourth electric signal increases. A calculation unit calculates a second position on the basis of the first and second electric signals, and calculates a first position on the basis of the third and fourth electric signals.
    Type: Application
    Filed: August 21, 2018
    Publication date: August 27, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Munenori TAKUMI, Haruyoshi TOYODA, Yoshinori MATSUI, Kazutaka SUZUKI, Kazuhiro NAKAMURA, Keisuke UCHIDA
  • Publication number: 20200273689
    Abstract: A laser desorption/ionization method includes a first process of preparing a sample support body. The sample support body includes a substrate, an ionization substrate, and a support that supports the ionization substrate with respect to the substrate such that a first surface of the ionization substrate is separated from the substrate. A plurality of through-holes are formed at least in measurement regions of the ionization substrate. A conductive layer is provided on peripheral edges of the through-holes at least on the second surface. Further, the laser desorption/ionization method includes a second process of dropping the sample on the measurement regions of the ionization substrate, and a third process of, after the sample has infiltrated into the ionization substrate, ionizing components of the sample by applying a laser beam to the second surface while applying a voltage to the conductive layer.
    Type: Application
    Filed: August 3, 2018
    Publication date: August 27, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Yasuhide NAITO, Takayuki OHMURA, Masahiro KOTANI
  • Publication number: 20200273691
    Abstract: A laser desorption/ionization method, includes: a first step of preparing a sample support body including a substrate on which a plurality of through holes opening to a first surface and a second surface facing each other are formed, and a conductive layer provided on at least the first surface; a second step of introducing a sample and a solvent having refractoriness in a vacuum into the plurality of through holes; and a third step of ionizing a component of the sample by irradiating the first surface with laser beam while applying a voltage to the conductive layer.
    Type: Application
    Filed: October 5, 2018
    Publication date: August 27, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Yasuhide NAITO, Takayuki OHMURA, Masahiro KOTANI
  • Publication number: 20200273688
    Abstract: Provided is a sample support body that includes a substrate, an ionization substrate, and a support. The ionization substrate has a plurality of measurement regions for dropping a sample on a second surface. A plurality of through-holes that open in a first surface and the second surface are formed at least in the measurement regions of the ionization substrate. A conductive layer is provided on peripheral edges of the through-holes at least on the second surface. The support has a first support provided on peripheral edges of the measurement regions on the first surface to separate the plurality of measurement regions when viewed in the direction in which the substrate and the ionization substrate face each other.
    Type: Application
    Filed: August 3, 2018
    Publication date: August 27, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Takayuki OHMURA, Masahiro KOTANI
  • Publication number: 20200271514
    Abstract: An optical detection circuit includes: a first optical detection element having a first anode and a first cathode, the first optical detection element being configured to generate voltage between the first anode and the first cathode due to photoelectromotive force generated in accordance with incident-light quantity; and a first operational amplifier having a first non-inverting input terminal, a first inverting input terminal, and a first output terminal, in which the first non-inverting input terminal is connected to fixed potential, one of the first anode and the first cathode is connected to the first inverting input terminal, and the other of the first anode and the first cathode is connected to the first output terminal.
    Type: Application
    Filed: September 5, 2018
    Publication date: August 27, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventor: Kenji MAKINO
  • Publication number: 20200273692
    Abstract: A laser desorption/ionization method, includes: a first step of preparing a sample support body including a substrate on which a plurality of through holes opening to a first surface and a second surface facing each other are formed, a conductive layer provided on at least the first surface, and a matrix provided in the plurality of through holes; a second step of mounting a sample on a mounting surface of a mounting portion, and of disposing the sample support body on the sample such that the second surface is in contact with the sample; and a third step of ionizing a component of the sample that is mixed with the matrix and is moved to the first surface side from the second surface side through the through hole by irradiating the first surface with laser light while a voltage is applied to the conductive layer.
    Type: Application
    Filed: August 6, 2018
    Publication date: August 27, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Masahiro KOTANI, Takayuki OHMURA
  • Publication number: 20200271520
    Abstract: A spectrum measurement apparatus includes a signal generation unit, a detector, an AD converter, and an operation unit. An external cavity laser light source includes a quantum cascade laser and a diffraction grating. The signal generation unit outputs a wavelength sweep signal repeatedly giving an instruction for sweep of a resonant wavelength selected by the diffraction grating and a pumping instruction signal repeatedly giving an instruction for on/off of pumping of the quantum cascade laser in each period of wavelength sweep based on the instruction of the wavelength sweep signal. The operation unit inputs a digital value output from the AD converter, obtains an oscillation spectrum in each period of the wavelength sweep, and integrates the oscillation spectra obtained with changing the phase of the pumping instruction signal for each period of the wavelength sweep.
    Type: Application
    Filed: February 21, 2020
    Publication date: August 27, 2020
    Applicants: TOHOKU TECHNO ARCH CO., LTD., HAMAMATSU PHOTONICS K.K.
    Inventors: Yuji MATSUURA, Naoto SHIBATA
  • Patent number: 10755980
    Abstract: Laser light is converged at an object including a semiconductor substrate formed with a plurality of functional devices on a front surface, from a back surface of the semiconductor substrate, and while a distance between the front surface and a first converging point of the laser light is maintained at a first distance, whereby a first modified region is formed along the line. The laser light is converged at the object from the back surface, and while a distance between the front surface and a second converging point is maintained at a second distance, and while the second converging point is offset with respect to a position at which the first converging point is converged, whereby a second modified region is formed along the line. A predetermined portion including the back surface and at least the second modified region is removed.
    Type: Grant
    Filed: April 18, 2019
    Date of Patent: August 25, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Takafumi Ogiwara, Yuta Kondoh
  • Publication number: 20200266024
    Abstract: An electron beam irradiation device includes: an electron beam generation part; a housing part that provides a vacuum space in which the electron beam generation part is accommodated; an electron beam guide part in which a base end side is connected to the housing part and communicates with the vacuum space, in which a tip end side is provided with a long tubular member capable of being inserted into a container via a mouth portion of the container, and in which the electron beams pass through an inside; an electron beam emission window which is provided on the tip end side of the electron beam guide part; and an adjustment part that adjusts a trajectory of the electron beams in the electron beam guide part. The adjustment part is disposed on the base end side of the electron beam guide part on an outside of the vacuum space.
    Type: Application
    Filed: November 1, 2016
    Publication date: August 20, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventor: Tatsuya MATSUMURA
  • Patent number: D894421
    Type: Grant
    Filed: July 18, 2018
    Date of Patent: August 25, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Takayuki Ohmura, Masahiro Kotani
  • Patent number: D895138
    Type: Grant
    Filed: July 18, 2018
    Date of Patent: September 1, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Takayuki Ohmura, Masahiro Kotani
  • Patent number: D895142
    Type: Grant
    Filed: July 18, 2018
    Date of Patent: September 1, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Takayuki Ohmura, Masahiro Kotani
  • Patent number: D895143
    Type: Grant
    Filed: July 18, 2018
    Date of Patent: September 1, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Takayuki Ohmura, Masahiro Kotani