Abstract: An ATR apparatus includes a prism having a reflection surface, a holding unit holding a sample including a suspension on the reflection surface, and an adjustment unit adjusting a fluidal state of the sample held on the reflection surface. The adjustment unit adjusts the fluidal state of the sample to a first fluidal state in order to acquire a first detection result relating to the sample in the first fluidal state and adjusts the fluidal state of the sample to a second fluidal state in order to acquire a second detection result relating to the sample in the second fluidal state.

Abstract: A light detection device includes: a back-illuminated light receiving element; a circuit element; a connection member; an underfill; and a light shielding mask. The light shielding mask includes a frame having an opening and a light shielding layer formed on an inner surface of the opening. A first opening edge on the side of the circuit element in the opening is located at the outside of an outer edge of the light receiving element. A second opening edge opposite to the circuit element in the opening is located at the inside of the outer edge of the light receiving element. The opening is narrowed from the first opening edge toward the second opening edge. A width of the frame increases from the first opening edge toward the second opening edge. The underfill reaches a gap between the light receiving element and the light shielding layer.

Abstract: A manufacturing method of a semiconductor device includes: a first step of forming a laminated film by growing crystals on a sapphire substrate, forming an insulating film on a laminated film, and forming contact holes at an electrical connection point of an n-GaN layer and an electrical connection point of a p-GaN layer in the insulating film to produce a first member; a second step of forming a conductive layer on the first member to produce a second member in which the conductive layer electrically connects the electrical connection point of the n-GaN layer and the electrical connection point of the p-GaN layer; a third step of irradiating the second member with excitation light and measuring light emission generated in the second member; and a fourth step of forming a first pad electrode and a second pad electrode to produce a semiconductor device.

Abstract: A measuring device includes: an excitation light source; an integrating sphere; an excitation optical system; a light detector; and a first detection optical system, wherein the first detection optical system has an opening portion, the excitation optical system and the first detection optical system have a separation optical element, a first converging element, and a second converging element, wherein the optical axis of the excitation light incident on the subject to be measured and the optical axis of the light to be measured emitted from the integrating sphere obliquely intersect with each other by means of the separation optical element and the first converging element, and wherein an irradiation spot and the opening portion are in an optically conjugate relationship by means of the first converging element and the second converging element.

Abstract: A radiation imaging device according to one embodiment includes a radiation detection panel having a first surface on which a detection region is formed and an electrode pad is formed outside the detection region, and a second surface on a side opposite to the first surface, a base substrate having a support surface configured to face the second surface of the radiation detection panel and configured to support the radiation detection panel, and a flexible circuit substrate connected to the electrode pad via a connecting member, wherein an end portion of the base substrate is located further inward than an inner end portion of the connection region in which the electrode pad, the connecting member, and the flexible circuit substrate overlap each other when seen in an Z direction orthogonal to the support surface.

Abstract: An inspection method includes: a contact step of bringing a conductive tape into contact with a sample provided with a plurality of light emitting elements; and a first measurement step of irradiating the sample with light and measuring light emission generated in the sample in a state in which the conductive tape contacts the sample after the contact step.

Abstract: A substrate manufacturing apparatus includes a stage on which a semiconductor substrate is disposed. The substrate manufacturing apparatus includes an irradiation unit that irradiates the semiconductor substrate disposed on the stage with a pulsed laser of a predetermined pulse period. The substrate manufacturing apparatus includes a controller that controls a relative position between the stage and the irradiation unit. The irradiation unit generates a plurality of converging points arranged on a straight line at a predetermined pitch. The controller moves the relative position between the stage and the irradiation unit at a predetermined speed in parallel to the straight line on which the plurality of converging points are arranged. The predetermined speed is a speed at which a moving distance of the plurality of converging points in one period of the predetermined pulse period is the same as the predetermined pitch.

Abstract: The photosensitive region includes a first impurity region and a second impurity region having a higher impurity concentration than that of the first impurity region. The photosensitive region includes one end positioned away from the transfer section in the second direction and another end positioned closer to the transfer section in the second direction. A shape of the second impurity region in plan view is line-symmetric with respect to a center line of the photosensitive region along the second direction. A width of the second impurity region in the first direction increases in a transfer direction from the one end to the other end. An increase rate of the width of the second impurity region in each of sections, obtained by dividing the photosensitive region into n sections in the second direction, becomes gradually higher in the transfer direction. Here, n is an integer of two or more.

Abstract: A light-emitting device according to an embodiment includes a structure for increasing an optical confinement coefficient of a layer forming a resonance mode. The light-emitting device includes a first cladding layer, an active layer, a second cladding layer, a resonance mode formation layer, and a high refractive index layer. The first cladding layer, the active layer, the second cladding layer, the resonance mode formation layer, and the high refractive index layer mainly contain nitride semiconductors. The high refractive index layer has a refractive index higher than that of any of the first cladding layer, the active layer, the second cladding layer, and the resonance mode formation layer, and has a superlattice structure in which two or more layers having refractive indices different from each other are repeatedly laminated.

Abstract: An optical unit includes an input portion configured to have measurement light having a wavelength extending from an ultraviolet region to a visible region input thereto, an optical system configured to condense the measurement light in a state where a chromatic aberration is caused to occur, and an opening portion configured not to image light having a wavelength in the visible region and to image light having a wavelength in the ultraviolet region of the measurement light having a chromatic aberration having occurred therein.

Abstract: The damascene wiring structure includes a base including a main surface provided with a groove, an insulating layer including a first portion provided on an inner surface of the groove and a second portion provided on the main surface, a metal layer provided on the first portion, a wiring portion embedded in the groove, and a cap layer provided to cover the second portion, an end portion of the metal layer, and the wiring portion. A surface of a boundary part between the first portion and the second portion includes an inclined surface inclined with respect to a direction perpendicular to the main surface. The end portion of the metal layer enters between the cap layer and the inclined surface, and in the end portion, a first surface along the cap layer and a second surface along the inclined surface form an acute angle.

Abstract: A focal position estimation system is a system for estimating a focal position when in focus corresponding to an estimation target image, and includes: an estimation target image acquisition unit that acquires an estimation target image; and a focal position estimation unit that outputs a feature quantity of the estimation target image from the estimation target image by using a feature quantity output model and estimates a focal position when in focus corresponding to the estimation target image from the output feature quantity, wherein the feature quantity output model is generated by machine learning from a plurality of learning images associated with focal position information related to a focal position at the time of imaging, and feature quantities of two different learning images are compared with each other according to focal position information associated with the two different learning images, and machine learning is performed based on the comparison result.

Abstract: A light-emitting device is an S-iPM laser of M-point oscillation including a phase modulation layer. Four-direction in-plane wavenumber vectors each including a wavenumber spread corresponding to an angular spread of light output from the light-emitting device are formed on a reciprocal lattice space of the phase modulation layer. The magnitude of at least one of the in-plane wavenumber vectors is smaller than 2?/?. A predetermined phase distribution included in the phase modulation layer includes an element for focusing the light output.

Abstract: A light modulator of to this embodiment enables high-speed modulation to an SLM using a liquid crystal. The light modulator comprises refractive index regions arranged in a first direction on a reference plane, a region surrounding each refractive index regions and having a refractive index lower than that of each refractive index region, a first conductive film, and a second conductive film. The first conductive film is provided on any one of a pair of side surfaces arranged in the first direction in at least one refractive index region selected from the refractive index regions and belonging to a first group. The second conductive film is provided on any one of the pair of side surfaces so as not to overlap with the first conductive film in at least one refractive index region selected from the refractive index regions and belonging to a second group.

Abstract: A confocal microscope unit includes: a light source device which includes a light emitting element, a photodetector, a drive unit, and a control unit; and a scan mirror which scans excitation light, wherein, the control unit executes first control of adjusting and outputting a drive signal for driving the drive unit based on a control signal and a detection signal from the photodetector and executes the first control while changing a value of the control signal to generate and store a data table indicating a correspondence between a drive current and light intensity of excitation light, and wherein, the control unit executes second control of outputting the control signal as a drive signal, executes the second control by using the control signal corresponding to the drive current corresponding to the target light intensity based on the data table, and executes control of stopping the drive current.

Abstract: A smell sensor includes an ion sensor having a sensitive film, a substance adsorption film disposed on the sensitive film and configured to adsorb a smell substance to be detected, and an electrode configured to apply a reference voltage to the substance adsorption film. The substance adsorption film is in a state of releasing a proton in response to absorbing the smell substance.

Abstract: A method for producing an optical element includes: disposing a joint layer on a substrate; forming a first portion and a second portion in a second surface of the joint layer; and forming a plurality of structural bodies, which are made of a dielectric, on the second surface of the joint layer. The joint layer has a first surface facing the substrate, and the second surface located on a side opposite the first surface. The first portion is covered with a resist layer, and the second portion is exposed from the resist layer. After the dielectric is laminated on at least the second portion, the resist layer is removed to form the plurality of structural bodies on the second surface.

Abstract: An optical unit includes: a base which includes a main surface; a mirror device which includes a movable mirror portion and is disposed on the base; a frame member that is provided on the main surface so as to surround the mirror device; and a window member that is bonded to the frame member and has a flat plate shape. The frame member includes a first wall portion which is provided on the main surface and includes a first top surface on the side opposite to the main surface, a second wall portion which is provided on the main surface so as to face the first wall portion and includes a second top surface on the side opposite to the main surface.

Abstract: The light detector includes a light detection substrate having at least one light receiving region and a light incident surface on which a detection target light is incident, and a meta-lens including a plurality of unit structures arranged in a grid pattern and disposed on the light incident surface to focus the detection target light. When viewed in a thickness direction of the light detection substrate, an opening region in which no unit structure is formed is provided in a region including a center of the meta-lens.

Abstract: A dispersion stability evaluation method is a method for evaluating a dispersion stability of dispersoid dispersed in a dispersion medium. The dispersion stability evaluation method includes a first step of holding a sample including the dispersion medium and the dispersoid on a reflective surface, and a second step of causing terahertz waves to be incident on the reflective surface from a side opposite to the sample and detecting the terahertz waves reflected by the reflective surface. In the second step, while a state where the dispersoid are allowed to move toward the reflective surface is maintained, a plurality of detection results respectively corresponding to a plurality of times apart from each other are acquired.