Patents Assigned to Inficon
  • Patent number: 6635875
    Abstract: The invention relates to an infrared gas analyser (1), especially for use as a gas detector for leak detection using a sampling probe. Said gas analyser comprises a vessel (test vessel 2), through which a test gas flows, and an infrared light source (4, 5, 42) which produces an infrared light that shines through the test vessel (2). The analyser further encompasses a detector (35) that facilitates measurement of the infrared light absorption in the test gas. The aim of the invention is to provide at low costs an analyser that is apt for every day use. To this end, a reference vessel (3) through which a reference gas flows is provided in addition to the test vessel (2) through which the test gas flows. A reference gas is sucked from the environment of the test gas suction area. The same or an additional light source (4, 5, 42) and the same detector (35) are allocated to said reference vessel.
    Type: Grant
    Filed: August 6, 2001
    Date of Patent: October 21, 2003
    Assignee: Inficon GmbH
    Inventors: Werner Grosse Bley, Günter Voss, Ulrich Döbler, Thomas Böhm
  • Patent number: 6634215
    Abstract: The invention relates to a method for the integral leak detection on test samples with relatively thin walls, in which the test sample (1) comprising the test gas is tested for leaks in a test chamber; in order to test whether or not test samples are properly filled with test gas, it is proposed that for checking the test gas concentration in the test samples (1), the test gas concentration in at least one of the test samples (1) is measured thereby that its wall (2) is provided with a leak (4), and that with this test sample (1) a leak detection process is carried out.
    Type: Grant
    Filed: April 9, 2001
    Date of Patent: October 21, 2003
    Assignee: Inficon GmbH
    Inventors: Markus Nothhelfer, Rudi Widt
  • Patent number: 6595040
    Abstract: A test leak unit (1) includes a supply of test gas, preferably helium, and an element (14) for determining leakage rates. The aim of the invention is to create a simple, robust and easily refilled test leak unit, especially for detecting packaging leaks. To this end, the test gas supply is stored under substantially atmospheric pressure in a resealable reservoir (2) including a closing part (3), such that when the reservoir (2) is closed, a test gas-impermeable seal is developed between the closing part (3) and the reservoir (2), and the leakage rate-determining element (14) forms part of the closing part (3).
    Type: Grant
    Filed: June 29, 2001
    Date of Patent: July 22, 2003
    Assignee: Inficon GmbH
    Inventors: Rudi Widt, Rudolf Flosbach
  • Patent number: 6591687
    Abstract: A capacitive vacuum measuring cell includes first and second ceramic housing bodies (1, 4) joined by an edge seal (3). A thin ceramic membrane (2) is supported between first and second housing bodies (1, 4) by the edge seal (3) at a small distance from the first housing body (1) creating a reference vacuum chamber (25) therebetween. An electrically conductive material (7) coats opposing surfaces of the first housing body (1) and the membrane (2) to form a capacitor. A measurement vacuum chamber (26) is provided between the membrane (2) and the second housing body (4). A port (5) communicates with the second housing body (4) to connect the measurement vacuum chamber (26) of the measuring cell to the medium to be measured. The membrane (2) is made from an Al2O3 slurry that is sintered in a first heating step, cooled, and then reheated to smooth the membrane.
    Type: Grant
    Filed: December 22, 1998
    Date of Patent: July 15, 2003
    Assignee: Inficon GmbH
    Inventors: Per Bjoerkman, Ray Olsson
  • Patent number: 6584829
    Abstract: A method for operating a film leak detector (1) which includes two films (5, 6) each stretched in a frame (3, 4), which, with a test sample (79) emplaced, delimit a test chamber (80). The detector is equipped with two vacuum pumps (13, 30), in which first the test chamber (80) is evacuated and, after the evacuation operation, a leak detection operation takes place. In order to avoid test gas pollution and impurities during the first phase of the evacuation of the test chamber (80), only one (13) of the two vacuum pumps is operated and during the leak detection operation only the second vacuum pump (30) is operated.
    Type: Grant
    Filed: April 9, 2001
    Date of Patent: July 1, 2003
    Assignee: Inficon GmbH
    Inventors: Rudolf Flosbach, Rudi Widt
  • Publication number: 20030118802
    Abstract: A ceramic membrane for a capacitive vacuum measuring cell includes a thin ceramic membrane with a thickness of <250 &mgr;m, in particular less than 120 &mgr;m. The membrane is produced from a ribbon-shaped green body of Al2O3, and is given high planarity by smoothing the membrane after sintering. The green body is sintered at a sintering temperature that is higher than the smoothing temperature applied following sintering.
    Type: Application
    Filed: February 7, 2003
    Publication date: June 26, 2003
    Applicant: INFICON GmbH
    Inventor: Per Bjoerkman
  • Publication number: 20030076494
    Abstract: A novel method for analyzing the pulse train resulting from a scanned beam particle monitor is described. The method enhances signal-to-noise ratio and significantly reduces particle false alarm rate. Performed in the time domain, the method filters noise pulses that do not occur at the scanner frequency. The analysis further identifies particle-pulse-envelopes (PPE's) by performing a forward-looking and backward-looking autocorrelation. Gaussian fits are subsequently applied to identified particle-pulse envelopes, to determine particle characteristics, such as size and speed.
    Type: Application
    Filed: September 9, 2002
    Publication date: April 24, 2003
    Applicant: Inficon, Inc.
    Inventors: Michel P. Bonin, Aaron Stibich, Donald J. Holve
  • Patent number: 6550313
    Abstract: The invention relates to a test gas leakage detection apparatus (1) comprising a test chamber (2) and supply and measuring devices such as fore-pumps and high-vacuum pumps, test gas detectors, electronic components, etc. In order to construct an apparatus of this type in a manner which is simple and which does not restrict mobility, the invention provides that the test chamber (2) and the supply and measuring devices are combined to form a modular unit, and that the test chamber (2) is supported on a housing (3) in which the supply and measuring devices are accommodated. In addition, air cooling devices are assigned to thermally critical components of the supply and measuring devices.
    Type: Grant
    Filed: June 26, 2001
    Date of Patent: April 22, 2003
    Assignee: Inficon GmbH
    Inventor: Rudolf Flosbach
  • Publication number: 20030047465
    Abstract: The invention relates to a method and a device for detecting leaks in the wall of a test object, container or similar, by measuring and evaluating changes that occur in a partial gas pressure. The invention aims to simplify the detection of leaks. To this end, changes that occur in partial pressures of oxygen are detected and evaluated using an oxygen sensor (4).
    Type: Application
    Filed: June 20, 2002
    Publication date: March 13, 2003
    Applicant: INFICON GMBH
    Inventor: Werner Grosse Bley
  • Patent number: 6528008
    Abstract: A ceramic membrane for a capacitive vacuum measuring cell includes a thin ceramic membrane with a thickness of <250 &mgr;m, in particular less than 120 &mgr;m. The membrane is produced from a ribbon-shaped green body of Al2O3, and is given high planarity by smoothing the membrane after sintering. The green body is sintered at a sintering temperature that is higher than the smoothing temperature applied following sintering.
    Type: Grant
    Filed: December 22, 1998
    Date of Patent: March 4, 2003
    Assignee: Inficon GmbH
    Inventor: Per Bjoerkman
  • Publication number: 20030008422
    Abstract: A sensor, such as a mass spectrometer, capable of detecting the presence of materials in a sampled gas is interconnected with a processing chamber of a vacuum manufacturing tool. The sensor includes a timing circuit which is activated only if certain levels of specific materials are detected. Furthermore, the timer is set to run a predetermined time interval after activation so as to discriminate between known transient processing conditions and the presence of impurities which can greatly influence the manufacturing process. When the timer exceeds the predetermined time duration, an output signal can alert the process operator or automatically shutdown the manufacturing tool.
    Type: Application
    Filed: August 30, 2002
    Publication date: January 9, 2003
    Applicant: Leybold Inficon, Inc.
    Inventors: Louis C. Frees, Valentin Rio
  • Patent number: 6482649
    Abstract: A method of determining the reaction efficiency of a CVD process reactor by which a reactive gas combination entering the reactor deposits a solid reaction product as a thin film onto a substrate. The composition of the reactive gas combination is measured by an acoustic cell which is disposed downstream from the outlet port of the reactor to determine the reactor's efficiency. Determination of the reactor's efficiency allows the growth rate of the thin film to be determined as well as associated rates of the products which have been exhausted from the reactor.
    Type: Grant
    Filed: September 23, 1999
    Date of Patent: November 19, 2002
    Assignee: Leybold, Inficon, Inc.
    Inventors: Carl A. Gogol, Jr., Abdul Wajid, Gary Rubloff
  • Patent number: 6476612
    Abstract: In an ionization gauge, the effect of X-rays emitted when a collimated electron beam strikes grid surfaces in the gauge structure is reduced by a louvered beam stop. The louvered beam stop creates shadow regions having no X-rays, thus minimizing the amount of X-rays striking the collector plate and reducing the X-ray effect portion of the residual current.
    Type: Grant
    Filed: April 19, 2001
    Date of Patent: November 5, 2002
    Assignee: Inficon Inc.
    Inventors: Robert E. Ellefson, Louis C. Frees
  • Publication number: 20020153820
    Abstract: An apparatus for determining both total and partial pressures of a gas using one common electron beam includes a partial pressure ionization region and a total pressure ionization region separated by a grid or aperture. A filament produces a plurality of electrons which are focused into an electron beam by a repeller and an aperture or an anode. The interaction between the electron beam and molecules of said gas within the partial pressure and total pressure regions produces first and second ion streams. A focus plate is biased such that the first ion stream is directed to an analyzer which calculates the partial pressure of the gas. An ion collector collects the ions from the second ion stream, where the resulting reference current is used to determine the total pressure of the gas.
    Type: Application
    Filed: April 19, 2001
    Publication date: October 24, 2002
    Applicant: Inficon Inc.
    Inventors: Robert E. Ellefson, Louis C. Frees
  • Patent number: 6468814
    Abstract: A sensor, such as a mass spectrometer, capable of detecting the presence of materials in a sampled gas is interconnected with a processing chamber of a vacuum manufacturing tool. The sensor includes a timing circuit which is activated only if certain levels of specific materials are detected. Furthermore, the timer is set to run a predetermined time interval after activation so as to discriminate between known transient processing conditions and the presence of impurities which can greatly influence the manufacturing process. When the timer exceeds the predetermined time duration, an output signal can alert the process operator or automatically shutdown the manufacturing tool.
    Type: Grant
    Filed: July 21, 1999
    Date of Patent: October 22, 2002
    Assignee: Leybold Inficon, Inc.
    Inventors: Louis C. Frees, Valentin Rio
  • Patent number: 6091068
    Abstract: An ion collector includes a Faraday collector having a conductive surface disposed substantially parallel to and spaced from the axis of an entering particle beam containing charged and uncharged particles. A grounded plate disposed in the path of the particle beam allows incoming uncharged particles to impinge thereupon. Preferably, the application of a suitable potential to the conductive plate manipulates incoming charged ions to impinge upon either the electron multiplier or the Faraday collector. The ion collector can further include an electron multiplier used in conjunction with the Faraday collector to allow separate modes of operation. Application of a suitable first potential to the electron multiplier can cause charged particles to be deflected directly to the Faraday collector in one mode, and application of a second potential can cause deflection of charged particles to the electron multiplier, with the effects of the uncharged particles on the output of the detector being minimized.
    Type: Grant
    Filed: May 4, 1998
    Date of Patent: July 18, 2000
    Assignee: Leybold Inficon, Inc.
    Inventors: William E. Parfitt, Timothy L. Karandy, Louis C. Frees, Robert E. Ellefson
  • Patent number: 5948983
    Abstract: A wall deposit monitoring system for measuring variation in wall deposit thickness in an etch or deposition chamber having a contained reactive environment includes at least one quartz or other piezoelectric crystal sensor installed through a wall of the chamber using a feed-through member. A cover assembly retains the sensor at a projecting end of the feed-through member in a position in proximity with the interior of a chamber wall. The cover includes an opening providing access to the active portion of the sensor for exposure to the reactive environment. An attached oscillating device causes the active portion of the sensor to resonate. As processing is performed in the chamber, a solid reaction product accumulates on the exposed active portion, damping the vibration of the sensor. A detection device sensing the shift in frequency can then calculate the relative change in thickness for a given material.
    Type: Grant
    Filed: July 22, 1998
    Date of Patent: September 7, 1999
    Assignee: Leybold Inficon, Inc.
    Inventors: Carl C. Gogol, Jr., Mark F. Kendrick
  • Patent number: 5889281
    Abstract: A method for linearizing the sensitivity of a quadrupole mass spectrometric system to allow the sensor to more accurately report partial pressures of a gas in high pressure areas in which the reported data is effected by a number of loss mechanisms. According to the invention, correction factors can be applied empirically or software in a quadrupole mass analyzer system can be equipped with correcting software to expand the useful range of the mass spectrometer.
    Type: Grant
    Filed: July 11, 1997
    Date of Patent: March 30, 1999
    Assignee: Leybold Inficon, Inc.
    Inventors: David H. Holkeboer, Robert E. Ellefson
  • Patent number: 5852270
    Abstract: A method for manufacturing a miniature quadrupole from a single blank includes fastening four lengthwise insulating strips into parallel slots formed in the blank. A lengthwise axial hole is cut through the blank for the guide wire used in the EDM process. The blank is machined lengthwise into four electrodes using the EDM process so that the electrodes are spaced apart in a widthwise direction and each electrode is connected to an adjacent electrode by one of the insulating strips. During the cutting, the electrodes are held in place by the insulating strips.
    Type: Grant
    Filed: June 3, 1997
    Date of Patent: December 22, 1998
    Assignee: Leybold Inficon Inc.
    Inventor: David H. Holkeboer
  • Patent number: RE38138
    Abstract: A method for linearizing the sensitivity of a quadrupole mass spectrometric system to allow the sensor to more accurately report partial pressures of a gas in high pressure areas in which the reported data is effected by a number of loss mechanisms. According to the invention, correction factors can be applied empirically or software in a quadrupole mass analyzer system can be equipped with correcting software to expand the useful range of the mass spectrometer.
    Type: Grant
    Filed: October 6, 2000
    Date of Patent: June 10, 2003
    Assignee: Leybold Inficon, Inc.
    Inventors: David H. Holkeboer, Robert E. Ellefson