Abstract: The object of the present invention is to provide a wire grid type polarizer formed of an inexpensive material in a comparatively simple process. A wire grid type polarizer of the present invention comprises: a substrate which prevents light in a specific wavelength range from being transmitted therethrough; and a photoresist layer provided on a surface and a back of the substrate, wherein parallel line patterns having a plurality of concave-convex portions are formed on the photoresist layer to be in parallel with each other on the surface and the back of the substrate, and a metal is deposited only over a top of a convex portion of the parallel line patterns having the concavo-convex portions formed on the surface and the back of the substrate and in the vicinity thereof so that a wire grid is formed on the surface and the back of the substrate.

Abstract: A UV detector for liquid chromatography is equipped with a light source; a flow cell having a light entrance side and a light exit side; a first optical system for shining light from the light source into the flow cell so as to form an image roughly at the light exit side of the flow cell or at a position outside the flow cell at a prescribed distance away from the light exit side thereof; a light detector; a second optical system for directing light exiting the flow cell to the light detector; and a truncated cone shaped sample chamber formed in the flow cell along the axial direction thereof, with the base of the truncated cone being positioned at the light entrance side of the flow cell.

Abstract: A rangefinder 10 comprises a light source 12 for emitting a luminous flux L1 having a predetermined beam diameter; interfering means 14 which is an object having an optical axis substantially perpendicular to a direction in which the object to be measured can be dislocated, the interfering means 14 having a transmission type diffraction grating 20 as one object for splitting the luminous flux L1 from the light source 12 into two diffraction luminous fluxes L2, L3 having respective directions different from each other, the two diffraction luminous fluxes L2, L3 being caused to impinge on a reflection type diffraction grating 22 as the other object, respective reflection luminous fluxes L2, L3 thereof being superposed on each other again by the transmission type diffraction grating 20 so as to interfere with each other; detecting means 16 for photoelectrically detecting interference light L4 obtained by the interfering means 14; and signal processing means 18 for measuring an intensity change and interference p

Abstract: In a probe microscope 120 for causing a sample 112 and a tip portion 118a of a probe 118 on the sample side to approach each other, detecting an interaction between the sample 112 and the sample-side probe tip portion 118a, and obtaining surface information of the sample 112 from the interaction, the probe 118 being a flexible needle-like probe; the probe microscope 120 comprises vibrating means 122 capable of rotating the probe 118 while flexing the sample-side tip portion 118a thereof so as to draw a circle having a size corresponding to an increase and decrease in the interaction between the sample surface 112 and the tip portion 118a, and detecting means 124 for detecting the increase and decrease in the size of the circle drawn by the sample-side probe tip portion 118a due to the interaction and obtaining, from the increase and decrease in the size of the circle, information about the distance between the sample 112 and the sample-side probe tip portion 118a.

Abstract: A circular dichroism detector includes a light source having a large emission intensity in the ultraviolet region such as an HgXe lamp or Hg lamp, a diffraction grating for wavelength dispersing the light emitted from the light source, a polarizer for linearly polarizing the light emitted from the light source, a PEM for modulating wavelength dispersed linearly polarized light to alternately produce left-handed circularly polarized light and right-handed circularly polarized light, a flow cell through which the circularly polarized light will be passed, and a photodiode for detecting the circularly polarized light passing through the flow cell.

Abstract: A gas analyzing apparatus comprises a light source (34) emitting an infrared luminous flux; a sample cell (38) which is arranged such that a sample gas is introduced therein and the infrared luminous flux emitted from the light source (34) is transmitted therethrough; and detection means (10a, 10b) which contain absorbers and are arranged such that the infrared luminous flux transmitted through the sample cell (38) passes through the absorbers and an increase in pressure according to the temperature within each of their absorber containers raised upon absorption of the infrared luminous flux by each absorber is optically detected so as to measure, based on the increases in pressure, concentrations of ingredients to be measured in the sample gas, wherein, as the absorbers contained in the detection means (10a, 10b), gases having ingredients identical to the ingredients to be measured are used, respectively.

Abstract: A spectrometer slit switching mechanism includes a slit plate having a plurality of entrance slits and exit slits formed at prescribed positions, parallel support rods for supporting the slit plate so as to be movable along the support rods, a screw portion formed on at least one support rod for transmitting forced to the slit plate, and a driving motor for transmitting rotational energy to the support rod provided with the screw portion, wherein the entrance slits are arranged on a line that runs parallel to the direction of movement of the slit plate and the exit slits are arranged on a line that is both parallel to and spaced a prescribed distance from the line on which the entrance slits are arranged. In accordance with this structure, the driving motor is operated in the clockwise and counterclockwise directions to raise and lower the slit plate in order to align a desired entrance slit and exit slit with the light path of the spectrometer.

Abstract: A flow cell (112) used for detecting a characteristic of a continuously-flowing fluid comprises a narrow inlet path (118) for the fluid, a flow cell portion (112) having a diameter larger than that of the narrow inlet path (118), and flow-regulating portion (122) which is disposed between the narrow inlet path (118) and the flow cell portion (112) and has a diameter substantially the same as that of the flow cell portion (112) and a plurality of holes (134a to 134d), such that the fluid is introduced from the narrow inlet path (118) into the flow cell portion (112) by way of each of the holes (134a to 134d) of the flow-regulating portion (122).

Abstract: A lamp unit is provided with a projecting portion on the inner wall of the lamphouse in the vicinity of the arc portion. The lamphouse is ventilated by the van provided at one end of the lamphouse and the vent provided at the other end. The inner diameter of the lamphouse at the arc portion provided with the projecting portion is smaller than that of both end portions, so that the flow velocity of the air passing through the lamphouse is higher in the vicinity of the arc portion, which produces a heat of a high temperature. Even if the lamp is horizontally installed, which lowers the heat dissipation efficiency, since the lamp is adequately air-cooled, an extreme temperature rise is prevented. The lamphouse is removeably mounted, and the lamp is mounted in a cartridge. The cartridge may be inserted into the lamphouse for replacement of the lamp.

Abstract: An NO radical measuring method comprising the steps of mixing a test sample solution containing NO radicals with hydrogen peroxide or an analogous substance thereto and luminol or an analogous substance thereto, and measuring the intensity of chemiluminescence. The method enables a trace amount of NO radical to be measured with accuracy and in real time. An apparatus used for this method is also disclosed.

Abstract: An apparatus for measuring the thickness of a semiconductor layer includes a light source emitting light; an interferometer producing modulated interference light by modulating the light from the light source; an optical system including a light transmission member for introducing the modulated interference light into a measurement sample including at least one film on a substrate; a light detecting element for detecting the modulated interference light reflected from the film and producing an output signal in response; an extracting element for extracting a film interference component having a waveform from the output signal; and an element for calculating the thickness of the film from the waveform of the output signal component. The light detecting element includes a plurality of photodetectors having respective photometric wavenumber ranges that overlap.

Abstract: A total reflection measuring apparatus having a cassegrain mirror which has cassegrain primary mirror and cassegrain secondary mirror focuses the light which is reflected by the above secondary mirror and the primary mirror on an object of measurement. A prism which is positioned in lower part of the above cassegrain secondary mirror and a prism lift which moves the prism between a shadow behind the cassegrain secondary mirror and the object. The prism lift positions the prism in the shadow behind the cassegrain secondary mirror when visual observation is required. As a result, the clear observation of object becomes possible.

Abstract: A concentration correcting apparatus comprising a correction coefficient calculating means and a correcting means is shown and described. The correction coefficient calculating means calculates a correction coefficient for correcting the concentration of the material when the actual density of the medium at the measurement of the material is calculated in terms of the density of the medium under the reference temperature and pressure, from the results of the temperature measuring means and the pressure measuring means. The correcting means corrects the results of the material measuring means to a concentration under the reference temperature and pressure on the basis of the correction coefficient.

Abstract: Phas difference controller for use in equipments having a photoelastic modulator, such as ellipsometers and optical rotatory dispersion meters. For enabling the photoelastic modulator to produce the constant amplitude of the phase difference regardless of the change in the wavelength of light incident into the photoelastic modulator, and regardless of the change in the temperature of the photoelastic modulator itself or its atmosphere, the controller has a birefringence polarizer which splits incident light into two linearly polarized light beams, ordinary light and extraordinary light. One of them acts as reference light LR and the other one acts as main light LM. These light beams pass through a photoelastic modulator which is forced to vibrate at angular frequency of .omega.. After that, the passed reference light LR is detected by a photomultiplier via an analyzer. The photoelastic modulator is forced to vibrate at angular frequency of .omega.

Abstract: An apparatus for and a method of evaluating a multilayer thin film of the present invention. An interference light beam in a predetermined wave number region is projected as a parallel beam onto a multilayer thin film sample and the interference light beam reflected by the sample is detected to find an interferogram. The interferogram is subject to Fourier transform, filtering and reverse Fourier transform so that a spatialgram is provided. Thereby the variation in incident angle of the light beam incident on the sample and in incident surface is reduced, and the spatialgram can be provided with accurate information of the multilayer thin film.