Abstract: A high-sensitivity reflection measurement apparatus disposed in an optical path between a light emitter and a detector of an analysis apparatus comprises an incident-side optical element, which bends the optical path of measurement light emitted from the light emitter such that the angle of incidence of the measurement light so emitted with respect to a sample surface under measurement ranges from 70° inclusive to 90° exclusive with respect to the direction perpendicular to the sample surface under measurement. The measurement light is transmitted as linearly polarized light having a desired oscillation direction, and is incident on the sample surface under measurement. Information related to the measured sample surface is obtained from light reflected from the measured sample surface when the linearly polarized light from the incident-side optical element is incident on the sample surface.

Abstract: A dissolution tester comprising: a circular water tank having a circular cross section the tank being disposed on a base and containing constant-temperature water; a head disposed above the circular water tank, which moves up and down relative to the base; a cantilever arm for supporting the head in a cantilevered fashion and for moving the head up and down relative to the base; a vessel in which a sample and a test liquid are placed, a desired portion of the vessel being immersed into the constant-temperature water in the circular water tank; and a test-liquid agitator suspended from the head, for agitating the sample and the test liquid inside the vessel.

Abstract: A dissolution tester comprising: a water-tank lid which is provided with a retaining hole having an inner diameter that is slightly larger than the outer diameter of the of the vessel and that is slightly smaller than the outer diameter of the flange of the vessel, and which holds the vessel at the retaining hole; a vessel lid which has a tapered portion having a bottom diameter that is smaller than a top diameter thereof; and a lid-moving shaft which is suspended from a lower part of the head to move up and down together with the vessel lid, when the vessel lid is lowered using the lid-moving shaft to cause the tapered portion of the vessel lid to come into contact with the opening of the vessel, the vessel is made to move such that the center axes of the lid-moving shaft and the vessel are aligned.

Abstract: A dissolution tester comprising: a constant-temperature-water tank; a vessel for introducing a dissolution test liquid; a vessel lid having a suction hole for sucking up the test liquid; a suction nozzle which can move up and down together with the nozzle holder; and an administration mechanism for automatically administering a sample for conducting a dissolution test into the vessel; the administration mechanism comprises an administration hole provided at the vessel lid; a sample receiver provided at the vessel lid, for holding the sample at the vessel lid when the administration hole is closed; and a manipulator rod which can move up and down together with the nozzle holder, for opening the administration hole by making contact with the sample receiver such that the sample on the sample receiver is made to fall into the vessel via the administration hole, when carrying out administration.

Abstract: A near-field polarized-light measurement apparatus 10 comprises a near-field probe 14, an analyzer 18, a detector 22, and an analyzer-rotating unit 20. The near-field probe 14 has at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detector 22 detects light transmitted through the sample via the analyzer 18. The analyzer-rotating unit 20 rotates the analyzer 18 about an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzer 18 with the analyzer-rotating unit 20.

Abstract: A near-field film-thickness measurement apparatus having a spatial resolution at or below the wavelength of light and having sufficient film-thickness measurement precision. The near-field film-thickness measurement apparatus 10 comprises a scattering near-field probe 12, a light source 14, a detector 18, a spectroscope 16 disposed in an optical path between the light source 14 and the detector 18, and a film-thickness calculating unit 20. The light source 14 emits excitation light for generating near-field light at a tip of the near-field probe 12 and/or at a surface of a film sample. The detector 18 detects, as measurement light, scattered light generated by bringing the tip of the near-field probe 12 and the surface of the film sample close to the region of the near-field light. The spectroscope 16 performs spectrometry in a predetermined range of wave numbers.

Abstract: An attenuated-total-reflection measurement apparatus 10 of the present invention collects light onto a contact surface between a sample and an ATR prim 14 at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus 10 comprises: a light-irradiating system 12 for emitting the light which is collected onto the contact surface; a photodetector 18 for detecting the total-reflection light from the contact surface; an aperture 20 for restricting the light which the photodetector 18 detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror 22 provided in a light path extending from the ATR prism 14 to the aperture 20. The detection-side scanning mirror 22 is configured to allow the orientation of a reflecting surface thereof to be changed.

Abstract: A near field analysis apparatus comprising: an irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the irradiation-side adjustable optical system; a light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the light-collection-side adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the irradiation-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the light-collection-side adjustable optical system such that the spots of the guide light, which are observe

Abstract: A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler.

Abstract: It is an object of the present invention to provide a multiple-syringe-pump driving apparatus having superior liquid discharging and drawing-up precision. A syringe-pump driving apparatus of the present invention is used for controlling discharge from and drawing-up into a plurality of syringe pumps interconnected in parallel. The syringe-pump driving apparatus 10 comprises: a syringe holder 18 for supporting syringes 14a to 14h of the plurality of syringe pumps 12a to 12h so as to be arranged in parallel; a plunger holder 20 for supporting plungers 16a to 16h contained in the syringes 14a-14h so as to be arranged in parallel; three or more drive screws 24-1 to 24-3 for moving the plunger holder 20 and the syringe holder 18 relative to each other in a straight line in a syringe axial direction 30; and one or a plurality of motors 26 serving as a source of motive power for the drive screws 24-1 to 24-3.

Abstract: A nozzle for collecting extracted material for efficiently collecting a solution sprayed, together with gas, from an exit-tube at the outlet of a backpressure control valve in a supercritical fluid chromatograph or a supercritical fluid extraction apparatus. A nozzle 10 is fitted to an end of and is used for collecting in a collection vessel a liquid component in a fluid supplied from the exit-tube. The nozzle 10 comprises a nozzle body 12, an exit-tube hole 18 provided in the nozzle body 10, an opening 14 provided at the lower end of the nozzle body 10, a filter 14 provided above the opening 14 in the nozzle body 10, and an exhaust hole 20 provided in the nozzle body 10 at a position above the filter 16. When the nozzle 10 is fitted, the downstream tip of the exit-tube is inserted through the exit-tube hole 18 and is secured so that the downstream tip of the exit-tube is almost in contact with the filter 14. The fluid discharged from the exit-tube is sprayed into the filter 14.

Abstract: It is an object of the present invention to provide a mapping-data analyzing method that can display a map in which sufficient information is extracted from the spectra of obtained mapping data to enable objective analysis. The mapping-data analyzing method of the present invention is used for analyzing mapping data obtained by measuring, with a spectrometer apparatus, spectra at a plurality of points on a specimen surface. The method comprises a principal-component calculating step and a grouped-map display step. In the principal-component calculating step, spectral data obtained at each point on the specimen surface is defined as an individual sample and principal component analysis, in which values at a plurality of wave numbers of each spectral data set serve as variables, is performed to calculate the scores of a plurality of principal components for each individual sample.

Abstract: A depth measuring apparatus is disclosed that comprises a mover for moving in an optical axis direction an objective lens for condensing a parallel light beam from a light emitter onto a measurement spot of a sample and converting light from the measurement spot to a parallel light beam, image forming lens for projecting light from the measurement spot obtained via the objective lens, aperture for passing only light from the focal point position of the objective lens, a surface scattered light information acquirer for detecting, while the objective lens is being moved, the amount of light passing through the aperture and having an excitation wavelength of the test subject, a fluorescence information acquirer for detecting, while the objective lens is being moved, the amount of light passing through the aperture and having a fluorescence wavelength of the subject, and a distance information acquirer for obtaining distance information between a position of the objective lens where the detection value of surface

Abstract: The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy. An infrared circular dichroism measuring apparatus 101 comprising: AC signal extractors 110–112 where an interference light beam from an IR light source 102 which has passed an interferometer 103 is converted into a clockwise and a counterclockwise circularly polarized light beams and is irradiated on a sample to extract from a detected signal of detector 107 an interferogram by each of the circularly polarized light beams; DC signal extractors 113, 112 for extracting an interferogram by the IR absorption of the sample; a calculator 114 for figuring out the circular dichroism; and a selective transmitter 120 for narrowing down the wavelength region to be measured based on an IR absorption wavelength region corresponding to a vibration mode of the structure to be measured in the sample molecule.

Abstract: A high-sensitivity reflection measurement apparatus disposed in an optical path between a light emitter and a detector of an analysis apparatus, the high-sensitivity reflection measurement apparatus comprising an incident-side optical element, wherein the incident-side optical element bends the optical path of measurement light emitted from the light emitter such that the angle of incidence of the measurement light emitted from the light emitter with respect to a sample surface under measurement is a desired angle ranging from 70 degrees inclusive to 90 degrees exclusive with respect to the direction perpendicular to the sample surface under measurement, transmits the measurement light as linearly polarized light having a desired oscillation direction, and makes the linearly polarized light incident on the sample surface under measurement; and information related to the sample surface under measurement is obtained according to light reflected from the sample surface under measurement when the linearly polariz

Abstract: A method capable of acquiring data at a high speed while holding proper precision during measurement with an infrared imaging apparatus uses an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method which acquires data from a multi-element detector in an infrared imaging apparatus. The method involves starting to scan an element of the said multi-element detector synchronously with a sampling signal based on a reference signal of an interferometer, and scanning the element at a higher frequency than a sampling frequency of the sampling signal. The method further involves completing the scanning of all the elements before a next sampling signal to the sampling signal starting the element scanning is generated, and repeating a series of operations every time the sampling signal is generated.

Abstract: A mapping-measurement apparatus for applying mapping measurement to a predetermined area on a surface of a sample, comprising: a light illumination unit for illuminating the sample with light; a photodetector for detecting, through an aperture, reflection light or transmission light coming from the sample; and a detection-side scanning mirror provided in the optical path from the sample to the aperture. The aperture restricts light to be detected by the photodetector only to light coming from a given measurement portion only on the surface of the sample. The detection-side scanning mirror is structured such that the direction of a reflection plane thereof can be changed. The direction of the reflection plane of the detection-side scanning mirror is changed with respect to the incident direction of the reflection light or the transmission light coming from the sample to change the measurement portion on the surface of the sample where measurement is performed by the photodetector.

Abstract: It is an object of the present invention to provide a data acquiring method in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of scanning each element of the multi-element detector in order synchronously with a sampling signal (12) generated by a reference signal (10) of an interferometer and repeating a series of scanning operations after completely scanning all the elements, thereby carrying out scan, shifting a starting point of sampling in next scan by one element from the starting point of the previous scan, thereby carrying out the same scanning, and repeating the scan at the number of times corresponding to the number of all the elements and then extracting data for each element from storing sampling data, thereby acquiring a data sequence of all the sampling points for each element.

Abstract: A depth measuring apparatus is disclosed that comprises a mover for moving in an optical axis direction an objective lens for condensing a parallel light beam from a light emitter onto a measurement spot of a sample and converting light from the measurement spot to a parallel light beam, image forming lens for projecting light from the measurement spot obtained via the objective lens, aperture for passing only light from the focal point position of the objective lens, a surface scattered light information acquirer for detecting, while the objective lens is being moved, the amount of light passing through the aperture and having an excitation wavelength of the test subject, a fluorescence information acquirer for detecting, while the objective lens is being moved, the amount of light passing through the aperture and having a fluorescence wavelength of the subject, and a distance information acquirer for obtaining distance information between a position of the objective lens where the detection value of surface

Abstract: An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source 116; reflection means 140, light detection means 124; press means 128, 130 pressing a probe tip against said reflection means; storage means 142; calculation means 144 figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means 126 controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.