Patents Assigned to Jasco Corporation
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Patent number: 8531674Abstract: An object of the present invention is to provide a total reflection measuring apparatus which, while visually observing a specific minute area of a measurement object, is capable of efficiently obtaining optical data on the basis of the total reflection measurement. A microscopic total reflection measuring apparatus of the present invention comprises a Cassegrain mirror 12 having a Cassegrain primary mirror 16 and a Cassegrain secondary mirror 18, which condenses an incident light beam 30 on a measurement object 20 by making an incident light beam successively reflected by the secondary mirror 18 and the primary mirror 16, and which obtains a reflected light beam 32 from the measurement object 20 by making the reflected light beam 32 successively reflected by the primary mirror 16 and the secondary mirror 18. And, a total reflection prism 14 is arranged below the Cassegrain secondary mirror 18.Type: GrantFiled: April 20, 2010Date of Patent: September 10, 2013Assignee: JASCO CorporationInventors: Noriaki Soga, Hiroshi Sugiyama, Takayuki Sera, Jun Koshoubu
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Publication number: 20130169965Abstract: A depolarizer includes a pair of wedge-shaped plates made of an optically isotropic material, laid one on top of another such that the total thickness is constant and wedge-plate holding means for holding the pair of wedge plates separately. The wedge-plate holding means includes a pressure-applying section for applying pressure to each of the pair of wedge plates in a direction perpendicular to the thickness direction of the pair of wedge plates. The pressure-applying direction for one of the pair of wedge plates and the pressure-applying direction for the other of the pair of wedge plates intersect at an angle of 45 degrees.Type: ApplicationFiled: December 27, 2012Publication date: July 4, 2013Applicant: JASCO CORPORATIONInventor: JASCO Corporation
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Publication number: 20130161243Abstract: A high-pressure fluorescence flow cell comprises a cell body made of a light-transmissive material, wherein the cell body is penetrated by a straight-line flow path for a high-pressure fluid, wherein the flow path is formed with a cross section of 0.1 mm2 to 5 mm2, both inclusive, orthogonal to its longitudinal direction, wherein the ratio t/d of the wall thickness t (mm) to the width d (mm) of the flow path satisfies formula (1) below, t d ? 1 2 × [ ? + P ? - P - 1 ] × 1.5 ( 1 ) where ? indicates the tensile stress (MPa) of the material of the cell body, and P indicates the withstand pressure (MPa) of the cell body.Type: ApplicationFiled: December 7, 2012Publication date: June 27, 2013Applicant: JASCO CORPORATIONInventor: JASCO Corporation
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Patent number: 8327725Abstract: There is provided a sample collection container, a sample collection apparatus, and a sample collection method used in a supercritical fluid system capable of collecting a multi-constituent sample contained in a supercritical fluid at low cost and high collection efficiency. The pressure of a supercritical fluid containing a sample is reduced to a pressure close to the atmospheric pressure, and the depressurized supercritical fluid is forced to undergo adiabatic expansion to form gas-phase CO2 containing a liquid component in the form of aerosol. The gas-phase CO2 is fractionated for each constituent of the contained sample, transferred to a probe 60 of Liquid Handler, and dispensed into a large number of collection vials 300 under the atmospheric pressure, each of which is provided with a vial cap 100.Type: GrantFiled: September 26, 2009Date of Patent: December 11, 2012Assignee: JASCO CorporationInventor: Takeshi Kanomata
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Publication number: 20120303308Abstract: The figure is fixed in a given position. If peaks are seen in the positive Y direction, the minimum value of the difference in height between the spectrum and the figure in the range where the figure is present on the X-axis. The minimum value and the height of the figure at the reference point are added. The figure is moved within a range containing the reference point, and the minimum value of the difference in height between the spectrum and the figure is added to the height of the figure at the reference point, at each point on the figure. A maximum value L(xi) of the calculated values is obtained, and the maximum value L(xi) is obtained as a baseline value at the X coordinate of the reference point.Type: ApplicationFiled: August 2, 2012Publication date: November 29, 2012Applicant: JASCO CORPORATIONInventors: Takeo Soejima, Yusei Ohkubo
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Patent number: 8243290Abstract: A highly accurate three-dimensional measurement base is specified with simple settings. When a peak occurs in the positive Z-axis direction, a hemisphere or semi-spheroid figure (z?0) is placed to contain a position (xi, yi) where a base point should be obtained, scanning is performed such that the bottom of the figure contains the position (xi, yi), and the minimum value lmin of the difference between the Z position of a surface profile image and the height of the hemisphere or semi-spheroid figure at each position, and the height of the hemisphere or semi-spheroid figure at the position (xi, yi) are obtained. The maximum value of the sums is expressed as L(xi, yi), and a base point (Xi, Yi, L(xi,yi)) is specified. Base points are specified throughout the target surface by the same base point setting method, and a three-dimensional measurement base is specified on the basis of the specified base points.Type: GrantFiled: April 13, 2010Date of Patent: August 14, 2012Assignee: JASCO CorporationInventors: Takeo Soejima, Yusei Ohkubo
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Publication number: 20120082569Abstract: A pressure gauge mounted to a pump or a back pressure regulator in an HPLC, SFC, or SFE system provides improved solvent exchange and improved measurement precision. A through hole having an inside diameter of 1.0 mm is made in a hexagonal member similar in shape to a pipe joint. A part of the hexagonal member is cut away to form a flat surface such that the distance to the outside periphery of the through hole is 0.5 mm to serve as a strain-measurement strain gauge attaching surface. One strain gauge is attached to the center of the strain-measurement strain gauge attaching surface, and two strain gauges are attached for temperature correction, one on the same surface as the strain-measurement strain gauge attaching surface and the other on an outside surface of the hexagonal member.Type: ApplicationFiled: September 29, 2011Publication date: April 5, 2012Applicant: JASCO CORPORATIONInventors: Takeshi Kanomata, Hiroaki Yamura
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Publication number: 20110292387Abstract: A simple method and apparatus for circular dichroism spectrophotometry are provided that allow a liquid, cream-type, and gel-type specimens having a low degree of transparency to be measured directly and nondestructively without passing light through the specimens. Right-handed or left-handed circularly polarized light enters a prism from an entrance face and hits a specimen mounting face of the prism, on which a specimen is placed, at an angle of 80°. Then, after being totally reflected by the specimen mounting face and going out from an exit face, the light is detected, and the absorbance is determined.Type: ApplicationFiled: May 24, 2011Publication date: December 1, 2011Applicant: JASCO CORPORATIONInventors: Yoshiro Kondo, Ettore Castiglioni
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Publication number: 20110252871Abstract: Measuring apparatus comprises a rotating plate 17, a torque detection plate 18 disposed on a same axis parallel to the plate 17 with a given gap, a torque sensor about the plate 18 through the specimen held between two plates. The plate 18 is a total reflection prism which is made from a material that has a greater refractive index than the specimen and transmits UV and infrared light. An ultraviolet beam is directed onto the specimen through the prism. An infrared beam is directed into the prism. The infrared beam emerging from the prism after total reflection from the interface between the prism and the specimen is detected. A signal processor analyzes the infrared absorption spectrum of the specimen on the basis of the infrared beam. While the viscosity of the specimen in the curing process is measured, the signal processor simultaneously measures the infrared absorption spectrum.Type: ApplicationFiled: April 13, 2011Publication date: October 20, 2011Applicants: JASCO INTERNATIONAL CO., LTD., JASCO CORPORATIONInventors: Toshiyuki Nagoshi, Jun Koshoubu, Mitsuo Watanabe, Takashi Inoue, Shigeru Ito
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Publication number: 20110141490Abstract: A highly accurate three-dimensional measurement base is specified with simple settings. When a peak occurs in the positive Z-axis direction, a hemisphere or semi-spheroid figure (z?0) is placed to contain a position (xi, yi) where a base point should be obtained, scanning is performed such that the bottom of the figure contains the position (xi, yi), and the minimum value lmin of the difference between the Z position of a surface profile image and the height of the hemisphere or semi-spheroid figure at each position, and the height of the hemisphere or semi-spheroid figure at the position (xi, yi) are obtained. The maximum value of the sums is expressed as L(xi, yi), and a base point (Xi, Yi, L(xi,yi)) is specified. Base points are specified throughout the target surface by the same base point setting method, and a three-dimensional measurement base is specified on the basis of the specified base points.Type: ApplicationFiled: April 13, 2010Publication date: June 16, 2011Applicant: JASCO CORPORATIONInventors: Takeo Soejima, Yusei Ohkubo
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Patent number: 7954069Abstract: A microscopic-measurement apparatus capable of displaying, on a display device, an enlarged view of a particular part of a specimen placed on a movable stage and providing optical information of a desired portion includes an observation-image display section for displaying an enlarged view of a specific part of the specimen on the display device; a thumbnail-image display section for acquiring the enlarged image of the specific part as a thumbnail image when the enlarged observation image is specified and displaying the thumbnail image together with the enlarged image on the display device; a thumbnail-coordinate storage section for storing coordinate information of the specific part, where the thumbnail image is acquired, in association with the thumbnail image; and a thumbnail jump display section for causing the observation-image display section to display an enlarged image of the position of the thumbnail image by specifying the thumbnail image.Type: GrantFiled: May 8, 2008Date of Patent: May 31, 2011Assignee: JASCO CorporationInventors: Masaaki Yumoto, Kenichi Akao, Yoshiko Akao, Jun Koshoubu
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Publication number: 20110094606Abstract: An object of the present invention is to provide a pressure control apparatus for a supercritical fluid in which variation in pressure is small even in measurement in which analysis conditions are changed with time to improve separation and other performance.Type: ApplicationFiled: October 27, 2010Publication date: April 28, 2011Applicant: JASCO CORPORATIONInventors: Takeshi Kanomata, Kazuharu Okubo, Seiji Horioka
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Patent number: 7903253Abstract: A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler.Type: GrantFiled: November 6, 2009Date of Patent: March 8, 2011Assignee: JASCO CorporationInventor: Jun Koshoubu
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Patent number: 7869039Abstract: A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system.Type: GrantFiled: October 22, 2008Date of Patent: January 11, 2011Assignee: JASCO CorporationInventors: Kenichi Akao, Jun Koshoubu
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Publication number: 20100309455Abstract: An object of the present invention is to provide a total reflection measuring apparatus which, while visually observing a specific minute area of a measurement object, is capable of efficiently obtaining optical data on the basis of the total reflection measurement. A microscopic total reflection measuring apparatus of the present invention comprises a Cassegrain mirror 12 having a Cassegrain primary mirror 16 and a Cassegrain secondary mirror 18, which condenses an incident light beam 30 on a measurement object 20 by making an incident light beam successively reflected by the secondary mirror 18 and the primary mirror 16, and which obtains a reflected light beam 32 from the measurement object 20 by making the reflected light beam 32 successively reflected by the primary mirror 16 and the secondary mirror 18. And, a total reflection prism 14 is arranged below the Cassegrain secondary mirror 18.Type: ApplicationFiled: April 20, 2010Publication date: December 9, 2010Applicant: JASCO CORPORATIONInventors: Noriaki Soga, Hiroshi Sugiyama, Takayuki Sera, Jun Koshoubu
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Publication number: 20100305893Abstract: The figure is fixed in a given position. If peaks are seen in the positive Y direction, the minimum value of the difference in height between the spectrum and the figure in the range where the figure is present on the X-axis. The minimum value and the height of the figure at the reference point are added. The figure is moved within a range containing the reference point, and the minimum value of the difference in height between the spectrum and the figure is added to the height of the figure at the reference point, at each point on the figure. A maximum value L(xi) of the calculated values is obtained, and the maximum value L(xi) is obtained as a baseline value at the X coordinate of the reference point.Type: ApplicationFiled: December 16, 2009Publication date: December 2, 2010Applicant: JASCO CorporationInventors: Takeo Soejima, Yusei Ohkubo
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Patent number: 7839505Abstract: An optical rotating power measurement method comprising: an optical rotating power data acquisition step of starting measurement of the optical rotating power of the sample in a measurement apparatus during a temperature changing process where a controller controls the temperature of the sample such that the temperature reaches the predetermined temperature and of obtaining temperature data and optical rotating power data of the sample as time passes during the temperature changing process; and a data processing step of obtaining a straight line relationship data between the temperature data and the optical rotating power data, by using the fact that the optical rotating power of the sample is proportional to a measurement temperature; wherein the optical rotating power data of the sample at the predetermined temperature or the temperature dependence data of the optical rotating power of the sample is determined based on the straight line relationship data.Type: GrantFiled: February 20, 2008Date of Patent: November 23, 2010Assignee: JASCO CorporationInventors: Hisashi Masago, Tomoyuki Fukazawa, Mutsumi Senuma, Atsushi Yamada, Yuji Fujisawa
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Publication number: 20100110441Abstract: A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler.Type: ApplicationFiled: November 6, 2009Publication date: May 6, 2010Applicant: JASCO CorporationInventor: Jun Koshoubu
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Patent number: 7693689Abstract: A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.Type: GrantFiled: December 20, 2007Date of Patent: April 6, 2010Assignee: JASCO CorporationInventors: Jun Koshoubu, Tetsuji Sunami, Kenichi Akao, Keisuke Watanabe
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Publication number: 20100077874Abstract: There is provided a sample collection container, a sample collection apparatus, and a sample collection method used in a supercritical fluid system capable of collecting a multi-constituent sample contained in a supercritical fluid at low cost and high collection efficiency. The pressure of a supercritical fluid containing a sample is reduced to a pressure close to the atmospheric pressure, and the depressurized supercritical fluid is forced to undergo adiabatic expansion to form gas-phase CO2 containing a liquid component in the form of aerosol. The gas-phase CO2 is fractionated for each constituent of the contained sample, transferred to a probe 60 of Liquid Handler, and dispensed into a large number of collection vials 300 under the atmospheric pressure, each of which is provided with a vial cap 100.Type: ApplicationFiled: September 26, 2009Publication date: April 1, 2010Applicant: JASCO CorporationInventor: Takeshi Kanomata