Patents Assigned to JEOL Ltd.
  • Patent number: 10804086
    Abstract: There is provided a mass spectrometry data processor allowing for easy selection of a compositional formula for a sample component to be analyzed (analyte) even in general mass spectrometry applications. The mass spectrometry data processor is used to perform a qualitative analysis of the sample component based both on a first mass spectrum obtained by ionizing the sample component by a soft ionization method and on a second mass spectrum generated by cleavage of the sample component.
    Type: Grant
    Filed: December 4, 2018
    Date of Patent: October 13, 2020
    Assignee: JEOL Ltd.
    Inventors: Kenji Nagatomo, Masaaki Ubukata, Ayumi Kubo
  • Patent number: 10802095
    Abstract: A spectrum y includes a waveform-of-interest component and a baseline component which is a wide-band component. A weight array x is applied with respect to a base function array A to generate a baseline model Ax. An optimum baseline model Ax? is searched according to a first condition to fit a corresponding portion SIAx of the base line model Ax with respect to a representative portion yI of the baseline component and a second condition to reduce an Lp norm (wherein p?1) of the weight array x.
    Type: Grant
    Filed: February 26, 2019
    Date of Patent: October 13, 2020
    Assignee: Jeol Ltd.
    Inventor: Tomoki Nakao
  • Patent number: 10788553
    Abstract: A transmission signal generator generates a lock transmission signal that excites a lock nucleus (deuteron) used for observing a change of a static magnetic field. A LOCK transmission circuit transmits the lock transmission signal to an NMR probe. A LOCK reception circuit receives an NMR signal of the lock nucleus. A LOCK transmission sequencer, based on a pulse sequence generated according to at least one of amplitude modulation, frequency modulation, or phase modulation, controls generation of the lock transmission signal performed by the transmission signal generator.
    Type: Grant
    Filed: March 27, 2018
    Date of Patent: September 29, 2020
    Assignee: JEOL Ltd.
    Inventors: Hiroyasu Asano, Takeshi Tukada
  • Patent number: 10775456
    Abstract: A sample pipe is provided in a sample temperature control pipe. A detection coil is provided in a low-temperature airtight chamber and configured to irradiate a sample with a high-frequency magnetic field. A room-temperature shield is provided on an outer circumferential surface of the sample temperature control pipe or on an inner circumferential surface thereof, and is configured to block irradiation of the high-frequency magnetic field from the detection coil from reaching a region other than an observation object. A low-temperature shield is provided in an airtight chamber and between the detection coil and the room-temperature shield and is configured to block irradiation of the high-frequency magnetic field from the detection coil from reaching the room-temperature shield.
    Type: Grant
    Filed: April 24, 2019
    Date of Patent: September 15, 2020
    Assignee: JEOL Ltd.
    Inventors: Katsuyuki Toshima, Shigenori Tsuji, Shinji Nakamura, Fumio Hobo, Takeshi Tsukada, Akifumi Nomura
  • Patent number: 10766199
    Abstract: An aspect of the present invention includes: a base plate that moves along a vertical direction; a powder feeding unit that laminates a powder layer on an upper surface of the base plate; a beam generating unit that generates a beam in a designated quantity of heat; and a control unit that causes the beam generating unit to irradiate a designated position of the powder layer with the beam in a scan order programmed based on three-dimensional model data. The control unit calculates a required quantity of heat to be input to the designated position, based on heat capacity of the designated position of the powder layer, to set a temperature of the designated position at a desired temperature at a future designated time, and the control unit controls the beam generated by the beam generating unit to enable input of the required quantity of heat to the designated position.
    Type: Grant
    Filed: June 26, 2018
    Date of Patent: September 8, 2020
    Assignee: JEOL Ltd.
    Inventor: Yohsuke Yoshinari
  • Patent number: 10763077
    Abstract: A charged particle beam apparatus acquires a scanned image by scanning a sample with a charged particle beam and detecting charged particles emitted from the sample. The charged particle beam apparatus includes: a plurality of detection units that detect charged particles emitted from the sample; and an image processing unit that generates the scanned image based on a plurality of detection signals outputted from the plurality of the detection units. The image processing unit performs a process of calculating a tilt direction of a sample surface and a tilt angle of the sample surface based on the plurality of the detection signals for an irradiation position of the charged particle beam; and a process of determining a color of a pixel of the scanned image according to the calculated tilt direction and the calculated tilt angle.
    Type: Grant
    Filed: May 23, 2019
    Date of Patent: September 1, 2020
    Assignee: JEOL Ltd.
    Inventor: Takeshi Otsuka
  • Patent number: 10761102
    Abstract: Provided is a method for derivatizing an s-cis-diene compound with a Cookson-type derivatization reagent, the method including adding, in a reaction stopping step of stopping a derivatization reaction of the s-cis-diene compound, a decomposition inhibitor to inhibit decomposition of a derivative to be obtained.
    Type: Grant
    Filed: September 28, 2017
    Date of Patent: September 1, 2020
    Assignees: Tokyo University of Science, National University Corporation Chiba University, JEOL Ltd.
    Inventors: Tatsuya Higashi, Shoujiro Ogawa, Fumio Nomura, Mamoru Satoh, Masaki Takiwaki
  • Patent number: 10763093
    Abstract: Neutral particles are blocked by a deflector provided upstream of a detector. A controller changes a reference potential V2 of the deflector in connection with a change of a reference potential V1 of a collision cell such that a potential difference ?V between the reference potential V1 and the reference potential V2 is constant. The change of the reference potential V2 is executed during a period in which an ion pulse does not pass the deflector.
    Type: Grant
    Filed: March 8, 2019
    Date of Patent: September 1, 2020
    Assignee: JEOL Ltd.
    Inventor: Junkei Kou
  • Patent number: 10755888
    Abstract: An aberration corrector includes: a first multipole, a second multipole, a third multipole, and a fourth multipole arranged along an optical axis A; a first transfer lens system arranged between the first multipole and the second multipole; a second transfer lens system arranged between the second multipole and the third multipole; and a third transfer lens system arranged between the third multipole and the fourth multipole, wherein each of the first multipole, the second multipole, the third multipole, and the fourth multipole generates a three-fold symmetric field.
    Type: Grant
    Filed: March 26, 2019
    Date of Patent: August 25, 2020
    Assignee: JEOL Ltd.
    Inventor: Shigeyuki Morishita
  • Patent number: 10748308
    Abstract: A three-dimensional image reconstruction method, in which a cross section preparation step includes: a specimen preparation step of attaching, on a surface of a specimen, a grid-like mark member in which rectangular openings are two-dimensionally arranged, and disposing the grid-like mark member under a shielding member so that a side of each of the rectangular openings of the grid-like mark member forms a 45-degree or 90-degree angle with respect to a direction in which a linear end edge of the shielding member extends; and a processing position determination step of adjusting relative positions of the shielding member and the grid-like mark member by using the grid-like mark member as an index of a processing position.
    Type: Grant
    Filed: August 17, 2018
    Date of Patent: August 18, 2020
    Assignee: JEOL Ltd.
    Inventors: Yusuke Uetake, Shunsuke Asahina, Yuuki Yamaguchi
  • Patent number: 10746675
    Abstract: An image processing device includes a spectrum acquisition unit that acquires a plurality of spectra that respectively have different measurement energy ranges and energy resolutions and are acquired using an X-ray spectrometer having a plurality of dispersion elements with different spectral characteristics, a graph generation unit that sets the plurality of spectra on a single graph having an axis of an ath root of the energy (where a?2) as a first axis, and an axis based on an X-ray intensity as a second axis, and a display control unit that executes control to display the graph generated by the graph generation unit on a display unit.
    Type: Grant
    Filed: July 30, 2018
    Date of Patent: August 18, 2020
    Assignee: JEOL Ltd.
    Inventors: Norihisa Mori, Naoki Katoh, Masaki Morita
  • Patent number: 10748741
    Abstract: An X-ray analyzer includes: an X-ray detector that detects an X-ray emitted from a specimen and outputs a signal having a step that has a height corresponding to energy of the X-ray; a pulse generation circuit that converts the signal output from the X-ray detector into a first pulse signal; a pulse-width setting circuit that sets a pulse width; a pulse-width conversion circuit that converts a pulse width of the first pulse signal into the pulse width set by the pulse-width setting circuit to form a second pulse signal; a pulse-height discriminator that discriminates the second pulse signal according to a pulse height of the second pulse signal; a counting circuit that calculates a counting rate of the discriminated second pulse signal; and a counting-loss correction processing unit that corrects the counting rate. The counting-loss correction processing unit corrects the counting rate based on the pulse width.
    Type: Grant
    Filed: August 9, 2019
    Date of Patent: August 18, 2020
    Assignee: JEOL Ltd.
    Inventor: Kazunori Tsukamoto
  • Patent number: 10741357
    Abstract: A method of observing a liquid specimen in an electron microscope includes: housing the liquid specimen in a space formed by a specimen stage and a lid member; and observing the liquid specimen, wherein the lid member includes a water retaining material, and a supporting member for supporting the water retaining material, and the water retaining material is provided with a through-hole that enables passage of an electron beam with which the liquid specimen is irradiated.
    Type: Grant
    Filed: March 25, 2019
    Date of Patent: August 11, 2020
    Assignee: JEOL Ltd.
    Inventors: Noriyuki Inoue, Toshiaki Suzuki, Yoshiko Takashima
  • Patent number: 10739284
    Abstract: An X-ray analyzer includes: a detector which detects X-rays generated from a specimen; a cooling element which cools the detector; and a spectrum generating unit which generates a spectrum based on a detection signal of the detector. The spectrum generating unit corrects an attenuation of intensity of a spectrum attributable to contamination of the detector, based on an elapsed time from a reference time until the X-rays are detected.
    Type: Grant
    Filed: August 13, 2018
    Date of Patent: August 11, 2020
    Assignee: JEOL Ltd.
    Inventor: Takanori Murano
  • Patent number: 10741358
    Abstract: An electron microscope comprises: an electron microscope main body including a phase plate that imparts a phase change to an electron wave, a moving mechanism that moves the phase plate, and a detector that acquires an image formed by an electron beam transmitted through a sample; and a control unit that controls the electron microscope main body. The control unit performs a phase plate image acquisition process of acquiring a phase plate image which is an image of the phase plate; an unevenness determination process of determining whether or not the phase plate has unevenness based on the phase plate image; and a moving mechanism control process of moving the phase plate by controlling the moving mechanism when the control unit has determined that the unevenness is present.
    Type: Grant
    Filed: June 27, 2019
    Date of Patent: August 11, 2020
    Assignee: JEOL Ltd.
    Inventors: Yuko Shimizu, Hirofumi Iijima, Naoki Hosogi, Jun Yamashita
  • Patent number: 10741359
    Abstract: An electron microscope includes: a display control unit which sequentially acquires electron microscope images of a sample and causes a display unit to display the electron microscope images as a live image; an analysis area setting unit which sets an analysis area on the sample based on a designated position on the live image designated by pointing means; and an analysis control unit which performs control for executing elemental analysis of the set analysis area. The analysis area setting unit sets, as the analysis area, an area on the sample which corresponds to a continuous area including the designated position and having brightness comparable to brightness of the designated position.
    Type: Grant
    Filed: May 7, 2018
    Date of Patent: August 11, 2020
    Assignee: JEOL Ltd.
    Inventor: Akira Abe
  • Patent number: 10720318
    Abstract: When a first scheme (transition observation time optimization scheme) is selected, a computation unit computes an actual transition observation time as a time of an integer multiple of a storage-ejection time of a collision cell within a frame of a transition observation time. When a second scheme (storage-ejection time optimization scheme) is selected, the computation unit divides the transition observation time by a maximum storage-ejection time to determine a number of repetitions of a storing-ejecting operation of the collision cell, and determines a storage-ejection time based thereon.
    Type: Grant
    Filed: March 13, 2019
    Date of Patent: July 21, 2020
    Assignee: JEOL Ltd.
    Inventor: Junkei Kou
  • Patent number: 10720302
    Abstract: An electron microscope includes: an optical system including an aberration correction device; and a control unit that controls the aberration correction device, wherein the control unit performs: processing for displaying, on a display unit, an image for designating a direction of aberration in superposition on an aberration pattern representing a state of aberration, processing for specifying the direction of aberration from the image that has been subjected to a rotation operation, and processing for controlling the aberration correction device to cause the aberration correction device to introduce an aberration in the specified direction.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: July 21, 2020
    Assignee: JEOL Ltd.
    Inventors: Shigeyuki Morishita, Takeo Sasaki, Tomohiro Nakamichi
  • Patent number: 10720304
    Abstract: A charged particle beam apparatus acquires a scanned image by scanning a sample with a charged particle beam and detecting charged particles emitted from the sample. The charged particle beam apparatus includes: a plurality of detection units that detect charged particles emitted from the sample, and an image processing unit that generates the scanned image based on a plurality of detection signals outputted from the plurality of the detection units.
    Type: Grant
    Filed: May 23, 2019
    Date of Patent: July 21, 2020
    Assignee: JEOL Ltd.
    Inventor: Takeshi Otsuka
  • Patent number: 10720301
    Abstract: An aberration corrector for an electron microscope includes a geometric aberration corrector provided with a transfer lens system, wherein the transfer lens system includes an optical system for chromatic aberration correction, the optical system for chromatic aberration correction has a first portion, a second portion, and a third portion disposed along an optical axis, and each of the first portion, the second portion, and the third portion has a thickness in a direction along the optical axis and generates an electromagnetic field having two-fold symmetry in which an electric field having two-fold symmetry and a magnetic field having two-fold symmetry are superimposed.
    Type: Grant
    Filed: January 23, 2019
    Date of Patent: July 21, 2020
    Assignee: JEOL Ltd.
    Inventor: Hidetaka Sawada