Patents Assigned to JEOL Ltd.
  • Patent number: 11143667
    Abstract: An automatic analyzer includes a specimen holding section that holds a specimen container for containing a specimen; a specimen dispensing section that dispenses the specimen from the specimen container into a dilution container; a dilution container holding section that holds the dilution container for containing a diluted specimen, which is the specimen that has been diluted; a diluted specimen dispensing section that dispenses the diluted specimen from the dilution container into a reaction container; and a controlling section that, while the diluted specimen dispensing section dispenses the diluted specimen into the reaction container in accordance with a measurement item, causes the specimen dispensing section to perform a cleaning operation of the specimen dispensing section any number of times by using a cleaning liquid.
    Type: Grant
    Filed: May 29, 2018
    Date of Patent: October 12, 2021
    Assignee: JEOL Ltd.
    Inventor: Makoto Asakura
  • Patent number: 11137412
    Abstract: There is provided a dispensing unit capable of alleviating the load on a dispensing unit and other components at the time of a collision while maintaining the vibration-suppressing function. Also, an automated analyzer having this dispensing unit is provided. The dispensing unit has a dispensing probe, a drive mechanism, an arm member, a first probe holder, a second probe holder, a first support spring, second support springs, and vibration dampers. The second probe holder is supported to the first probe holder so as to be movable vertically and holds the dispensing probe. The second support springs bias the second probe holder against the first probe holder and in combination have a spring constant smaller than that of the first support spring. The vibration dampers are bridged from the arm member to the second probe holder.
    Type: Grant
    Filed: October 28, 2019
    Date of Patent: October 5, 2021
    Assignee: JEOL Ltd.
    Inventor: Mizuki Nakamura
  • Patent number: 11131638
    Abstract: A calibration method is executed in an analysis device including a spectroscopic element for diffracting a signal generated from a specimen by irradiating the specimen with a primary beam, and a detector that detects the signal diffracted by the spectroscopic element, the detector having a plurality of detection regions arranged in an energy dispersion direction, and the detector detecting the signal to acquire a spectrum of the signal. The calibration method includes determining energy of the signal detected in each of the plurality of detection regions based on a positional relationship between the specimen and the spectroscopic element and a positional relationship between the spectroscopic element and each of the plurality of detection regions.
    Type: Grant
    Filed: December 17, 2019
    Date of Patent: September 28, 2021
    Assignee: JEOL Ltd.
    Inventor: Takanori Murano
  • Patent number: 11133151
    Abstract: A transmission electron microscope includes an electron beam source emitting an electron beam and an illumination optical system for directing the emitted electron beam at a sample. The illumination optical system has a first condenser lens, a second condenser lens, a third condenser lens, a fourth condenser lens, an objective lens, and a condenser aperture disposed at the position of the second condenser lens. The third condenser lens and the fourth condenser lens cooperate to make the position of the condenser aperture and a sample plane conjugate to each other. The first condenser lens and the second condenser lens cooperate to make the electron beam source and a front focal plane of the objective lens conjugate to each other while the conjugate relationship between the position of the condenser aperture and the sample plane is maintained by the third and fourth condenser lenses.
    Type: Grant
    Filed: November 12, 2020
    Date of Patent: September 28, 2021
    Assignee: JEOL Ltd.
    Inventor: Hirofumi Iijima
  • Patent number: 11127561
    Abstract: A secondary storage container is a member which surrounds a primary storage container. A vaporized coolant generated in a primary storage space flows into and is stored in the secondary storage container. Radiant heat is blocked by the secondary storage container in a cooled state. Heat transferred to the primary storage container is reduced by a heat conducting path including the secondary storage container.
    Type: Grant
    Filed: October 14, 2020
    Date of Patent: September 21, 2021
    Assignee: JEOL Ltd.
    Inventor: Masashi Shimizu
  • Publication number: 20210253541
    Abstract: Provided is a method for industrially producing a triazolidinedione compound at a high purity and a high yield. A precipitation step for preparing a solution that contains a triazolidinedione compound represented by formula (1) and precipitating the triazolidinedione compound therefrom is performed. In this step, the pH of the solution is adjusted to 3.0 to 8.5 and the solution is prepared so as to contain 3-15 parts by volume of solvents for 1 part by mass of the triazolidinedione compound. (In the formula, R1 is a substituted or unsubstituted amino group-bearing organic group.
    Type: Application
    Filed: June 11, 2019
    Publication date: August 19, 2021
    Applicants: TOKUYAMA CORPORATION, JEOL Ltd.
    Inventors: Makoto SATOU, Misao MATSUSHIGE, Seketsu FUKUZAWA, Masaki TAKIWAKI
  • Publication number: 20210253587
    Abstract: Provided are a stable triazolinedione adduct, a method for producing the same, a method for producing an ene compound, and a method for analyzing an ene compound. A triazolinedione adduct that is stable until the time of use and can be reacted while reverting to a triazolinedione compound at the time of use. Specifically, a triazolinedione adduct represented by formula (1). (In the formula, R1 is an organic group, and A is a fused ring of three or more rings including at least one aromatic ring.
    Type: Application
    Filed: June 11, 2019
    Publication date: August 19, 2021
    Applicants: TOKUYAMA CORPORATION, JEOL Ltd.
    Inventors: Masahiko SEKI, Seketsu FUKUZAWA, Masaki TAKIWAKI
  • Patent number: 11094498
    Abstract: There is provided a monochromator capable of reducing angular dispersion in electron rays. In the monochromator, a first Wien filter and a second Wien filter are arranged symmetrically with respect to a first plane of symmetry. A third Wien filter and a fourth Wien filter are arranged symmetrically with respect to a second plane of symmetry. A pair of the first and second Wien filters and a pair of the third and fourth Wien filters are arranged symmetrically with respect to a third plane of symmetry. The first through fourth Wien filters produce their respective electromagnetic fields which are identical in sense and strength.
    Type: Grant
    Filed: June 24, 2020
    Date of Patent: August 17, 2021
    Assignee: JEOL Ltd.
    Inventor: Masaki Mukai
  • Patent number: 11085941
    Abstract: An automated analyzer includes: a special washing information storage unit that stores special washing information for avoiding carry-over of a pretreatment specimen dispensing nozzle; a first special washing liquid dispensing unit that dispenses a special washing liquid used for special washing to a pretreatment container; and a special washing control unit that controls the first special washing liquid dispensing unit, a pretreatment table, and the pretreatment specimen dispensing nozzle based on the special washing information and information on specimens consecutively dispensed by the pretreatment specimen dispensing nozzle for causing the first special washing liquid dispensing unit to dispense the special washing liquid to the pretreatment container and for causing the pretreatment specimen dispensing nozzle to suck the special washing liquid from the pretreatment container.
    Type: Grant
    Filed: November 12, 2018
    Date of Patent: August 10, 2021
    Assignee: JEOL Ltd.
    Inventor: Makoto Asakura
  • Patent number: 11087951
    Abstract: In a scanning transmission electron microscope, a control unit performs: processing of calculating a first auto-correlation function that is an auto-correlation function of a first scanning transmission electron microscope image; processing of acquiring a first intensity profile along a straight line that passes through a center of the first auto-correlation function; processing of obtaining a position of an inflection point that is closest to the center of the first auto-correlation function in the first intensity profile and adopting an intensity at the position as a first reference intensity; processing of obtaining an aberration coefficient by fitting a first aberration function to an isointensity line that connects positions where intensity is equal to the first reference intensity in the first auto-correlation function and by fitting a second aberration function to an isointensity line that connects positions where intensity is equal to a second reference intensity in a second auto-correlation function;
    Type: Grant
    Filed: January 29, 2020
    Date of Patent: August 10, 2021
    Assignee: JEOL Ltd.
    Inventors: Shigeyuki Morishita, Izuru Chiyo
  • Patent number: 11067518
    Abstract: A whole measurement process includes a plurality of step combinations. Each of the step combinations is composed of a solution-state measurement step and a solid-state measurement step. In the solution-state measurement step, solution-state NMR measurement is performed such that magnetization that is to be used in the solid-state measurement step remains. In the solid-state measurement step, solid-state NMR measurement is performed by using the magnetization that remains. No waiting time for recovering magnetization is provided between the solution-state measurement step and the solid-state measurement step. The solid-state measurement step may be performed earlier, and the solution-state measurement step may be performed later. Alternatively, the two steps may be performed simultaneously.
    Type: Grant
    Filed: December 11, 2017
    Date of Patent: July 20, 2021
    Assignees: RIKEN, JEOL Ltd.
    Inventor: Yusuke Nishiyama
  • Patent number: 11062434
    Abstract: A method of generating an elemental map includes: acquiring a plurality of correction channel images by scanning a surface of a standard specimen having a uniform elemental concentration with a primary beam and generating a correction channel image for each channel; generating correction information for each pixel of each correction channel image among the plurality of correction channel images based on a brightness value of the pixel; acquiring a plurality of analysis channel images by scanning a surface of a specimen to be analyzed with the primary beam and generating an analysis channel image for each channel; correcting brightness values of pixels constituting an analysis channel image among the plurality of analysis channel images based on the correction information; and generating an elemental map of the specimen to be analyzed based on the plurality of analysis channel images having pixels with corrected brightness values.
    Type: Grant
    Filed: October 2, 2019
    Date of Patent: July 13, 2021
    Assignee: JEOL Ltd.
    Inventor: Tatsuya Uchida
  • Patent number: 11061088
    Abstract: A container has a sample installation unit and an NMR circuit therein, and is connected to a bearing gas supply path and a drive gas supply path for supplying gas to the inside of that container. This container is also connected to an exhaust path that exhausts the gas from the inside of the container. The exhaust path has a pressure control valve as an adjustment mechanism for adjusting the pressure in the container.
    Type: Grant
    Filed: August 22, 2019
    Date of Patent: July 13, 2021
    Assignees: Osaka University, JEOL Ltd.
    Inventors: Toshimichi Fujiwara, Yoh Matsuki, Yuki Endo, Shinji Nakamura, Hiroki Takahashi
  • Patent number: 11061006
    Abstract: A review image is displayed prior to measurement of an analysis target sample. The review image includes a waveform image and a numerical value image showing a measurement condition determined for a measurement segment of interest. The waveform image includes a waveform portion which is a part of a chromatogram, and a marker array showing a period of a circulating ion measurement. The marker array includes a plurality of markers which are displayed in an overlapping manner over the waveform portion.
    Type: Grant
    Filed: June 3, 2019
    Date of Patent: July 13, 2021
    Assignee: JEOL Ltd.
    Inventor: Masako Ota
  • Patent number: 11043353
    Abstract: An energy filter has a plurality of sector magnets which are configured symmetrically with respect to a symmetry plane, and forms a real image on the symmetry plane. The energy filter include: an entrance aperture provided with a slit having a longitudinal direction in a direction perpendicular to an energy dispersion direction; and a hexapole and a quadrupole disposed on the symmetry plane.
    Type: Grant
    Filed: March 23, 2020
    Date of Patent: June 22, 2021
    Assignee: JEOL Ltd.
    Inventor: Kazuya Omoto
  • Patent number: 11043355
    Abstract: An ion milling apparatus includes a sample holder, a vacuum chamber, an evacuation section, a vacuum gauge, a heater, a gas inlet assembly, and a control section. The evacuation section vents gas in the interior space of the vacuum chamber. The vacuum gauge measures the pressure in the interior space of the vacuum chamber. The heater heats the sample holder. The gas inlet assembly admits a dry gas containing no moisture into the interior space of the vacuum chamber. When the pressure in the interior space has reached below a given pressure, the control section controls the gas inlet assembly based on information about the pressure in the interior space so as to admit the dry gas into the vacuum chamber.
    Type: Grant
    Filed: December 3, 2019
    Date of Patent: June 22, 2021
    Assignee: JEOL LTD.
    Inventor: Tsutomu Negishi
  • Patent number: 11037755
    Abstract: An observation method includes placing a specimen on a specimen supporting film of a specimen support, attaching the specimen support to a retainer, attaching the retainer to an optical microscope retainer holding base, attaching the optical microscope retainer holding base to a specimen stage of an optical microscope and observing the specimen under the optical microscope, attaching the retainer to a transmission electron microscope retainer holding base, and loading the transmission electron microscope retainer holding base into a transmission electron microscope and observing the specimen under the transmission electron microscope.
    Type: Grant
    Filed: May 13, 2019
    Date of Patent: June 15, 2021
    Assignee: JEOL Ltd.
    Inventors: Yuji Konyuba, Yuta Ikeda, Tomohiro Haruta, Tomohisa Fukuda
  • Patent number: 11031208
    Abstract: A cold cathode field-emission electron gun includes: an emitter; an extraction electrode which extracts electrons from the emitter; and a biased electrode which is disposed closer to the emitter than the extraction electrode. A voltage applied to the biased electrode is variable.
    Type: Grant
    Filed: September 14, 2018
    Date of Patent: June 8, 2021
    Assignee: JEOL Ltd.
    Inventor: Yuji Kohno
  • Publication number: 20210109119
    Abstract: Provided is a method for analyzing a diene compound including: a triazolinedione adduct heating step of heating a triazolinedione adduct to produce a triazolinedione compound; an ene compound formation step of reacting the triazolinedione compound with a diene compound to obtain an ene compound; and an ene compound analysis step of analyzing the ene compound to quantitative determine the diene compound. Also provided is a method for producing an ene compound, including: a triazolinedione adduct heating step of heating a triazolinedione adduct to produce a triazolinedione compound; and an ene compound formation step of reacting the triazolinedione compound with a diene compound to obtain an ene compound.
    Type: Application
    Filed: October 7, 2020
    Publication date: April 15, 2021
    Applicants: JEOL Ltd., TOKUYAMA CORPORATION
    Inventors: Masaki TAKIWAKI, Seketsu FUKUZAWA, Misao MATSUSHIGE, Shin WATANABE
  • Patent number: 10976332
    Abstract: There is provided a receptacle carrier unit and automated analyzer capable of suppressing generation of temperature nonuniformities among liquid aliquots received in plural receptacles without increasing the parts count. The receptacle carrier unit has a turntable, a turntable drive, a cool box, a cooling portion, and a control section. The control section controls the turntable drive, based on the number and installation locations of the receptacles installed in the cool box and on temperature distribution information, to homogenize the effects that the individual receptacles receive from the cool box.
    Type: Grant
    Filed: January 4, 2019
    Date of Patent: April 13, 2021
    Assignee: JEOL Ltd.
    Inventor: Hideaki Yamamoto