Abstract: A system for testing automobile radar sensor configurations includes multiple probe arrays, multiple enclosures, a channel emulator and a test controller. The enclosures each enclose one of the probe arrays together with a corresponding different automobile radar sensor. Each probe array is configured to receive radar signals from the corresponding automobile radar sensor and emulate echo signals back to the corresponding automobile radar sensor. The channel emulator is configured to supply the echo signals to each of the probe arrays. The test controller includes a memory that stores instructions and a processor that executes the instructions. The test controller controls the channel emulator and is configured to perform performance testing on an automobile radar sensor configuration that includes the automobile radar sensors and an automobile driving controller that reacts to the echo signals received by each of the automobile radar sensors.

Abstract: A peripheral component interconnect express (PCI-E) interface module is configured to operate as a host module or a target module. The PCI-E interface module can be employed in a system slot or one of multiple peripheral slots of a PCI-E compatible chassis. In addition, the PCI-E interface module is configured to communicate through passive copper cable or active optical cable.

Abstract: An oscilloscope probe includes: a connector pod; a probe identification module disposed in the connector pod, the probe identification module having a cross-sectional area; and a resistor disposed in the connector pod, and in-line with the probe identification module and having a substantially identical cross-sectional area as the probe identification module.

Abstract: A system of measuring and correcting for distortions in homodyne systems and a method for operating a data processing system to provide an estimate of distortions in homodyne systems are disclosed. The method for operating a data processing system to provide an estimate of a distortion introduced by a homodyne system when the homodyne system processes a time a multi-tone time domain input signal, x(t), to obtain a time domain output signal, y(t) includes receiving a frequency spectrum, X(f), of the multi-tone time domain input signal, x(t) and measuring an output frequency spectrum, Y(f), when the homodyne system operates on x(t). A plurality of parameters of a model that represents a linear frequency response of the homodyne system when operating on X(f) to arrive at Y(f) by fitting the model to Y(f) and X(f) is determined, and the model is applied to X(f) and Y(f) to estimate the distortions.

Abstract: An integrated circuit package includes a transmission line structure, conductive bonds, a post and a dielectric post. The transmission line structure runs from a printed circuit board (PCB) to an integrated circuit (IC) and includes a center transmission line surrounded by ground and sealed from exposure to air. The conductive bonds connect the transmission line structure to pads on the integrated circuit from where the center transmission line exits the integrated circuit package. The first post is part of the center transmission line where the center transmission line enters the integrated circuit package from the printed circuit board. The dielectric post supports the center transmission line where the center transmission line exits the integrated circuit package to connect to the conductive bonds and compensates part of the conductive bond inductance.

Abstract: A method for measuring modulated radio frequency (RF) signals from a device under test (DUT) includes inputting a test RF signal to the DUT, where the test RF signal is modulated with a repetitive complex waveform and a pulsed waveform, the repetitive complex waveform including multiple RF tones with an RF tone spacing and an RF repetition period, where a pulse width of the pulsed waveform is less than the RF repetition period; acquiring an output RF signal from the DUT responsive to the input test RF signal; down converting the output RF signal to an intermediate frequency (IF) signal; sampling the IF signal using an analog to digital converter (ADC) having an ADC clock frequency; measuring ADC samples of the IF signal; and reconstructing the test RF signal modulated with the repetitive complex waveform using the measured ADC samples.

Abstract: A method measures a characteristic of a SUT using a signal measurement device having multiple input channels. The method includes digitizing first and second copies of the SUT in first and second input channels to obtain first and second digitized waveforms; repeatedly determining measurement values of the SUT characteristic in the first and second digitized waveforms to obtain first and second measurement values, respectively, each second measurement value being paired with a first measurement value to obtain measurement value pairs; multiplying the first and second measurement values in each of the measurement value pairs to obtain measurement products; determining a mean-squared value (MSV) of the SUT characteristic measurement; and determining a square root of the MSV to obtain a root-mean-squared (RMS) value of the measured SUT characteristic, which substantially omits variations not in the SUT, which are introduced by only one of the first or second input channel.

Abstract: A method, system and non-transitory computer-readable medium used for testing a plurality of circuits to determine open surfaces are disclosed. The method includes: receiving one or more of attack techniques, and known open surfaces; carrying out attacks on a circuit to determine vulnerable surfaces of the circuit; determining when new open surfaces exist in the circuit; updating an attack plan based on the new open surfaces; carrying out the attack plan; generating a report of the open and vulnerable surfaces; and updating a repository to include new attack techniques against newly discovered open surfaces of the circuit.

Abstract: A system and method are provided to determine equivalent isotropic radiated power (EIRP), effective isotropic sensitivity (EIS) and/or signal quality of a DUT in a test chamber, where the DUT has an AUT that has beam-forming capability and is offset from a center of a quiet zone of the test chamber. The method includes establishing a connection with the DUT using a far-field probe antenna in a far-field of the test chamber relative to the AUT so that the AUT forms a beam in a beam peak direction towards the far-field probe antenna; locking the beam of the AUT in the beam peak direction to prevent subsequent beam forming; and performing a near-field measurement of the EIRP, the EIS and/or the signal quality of the AUT with the beam locked in the beam peak direction using a near-field probe antenna in a near-field of the test chamber.

Abstract: A method is provided for performing receiver and transmitter tests of a phased array antenna using a test system including probe antennas for transmitting and receiving RF signals, respectively. For the receiver tests, the method includes receiving the RF signals at receiver channels over propagation paths corresponding to the probe antennas, where each of the receiver channels is set at a selected complex gain setting of multiple available complex gain settings; measuring a combined receive signal output from a single combined output of the phased array antenna; isolating complex gain and complex path loss products from the measured combined receive signal corresponding to the selected complex gain setting and the propagation paths at each of the receiver channels; and determining a relative value between the complex gain of one receiver channel and previous complex gain of the one receiver channel using the isolated complex gain and complex path loss products.

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

Abstract: A heterodyne optical interferometer incorporates error correction elements to correct a cyclic error that may be present in an interferometric measurement. The cyclic error can be caused by various factors such as an imperfect polarization relationship between two wavelength components, deficiencies in optical propagation paths (such as light leakage), imperfect optical coatings, and/or imperfect components. The cyclic error, which typically manifests itself as erroneous displacement information characterized by a low velocity sinusoidal frequency component, can be reduced or eliminated by using birefringent optical elements and other optical elements to alter certain characteristics of one or both wavelength components and reduce light leakage components in one or more light propagation paths in the heterodyne optical interferometer.

Abstract: A method of determining the bit error ratio (BER) of a device under test (DUT) includes transmitting a first signal of an original test bit pattern over a first channel to a receiver of the DUT, and forward error correction (FEC) encoding the original test bit pattern of the first signal transmitted to the receiver of the DUT in a loopback mode of the DUT to generate an FEC encoded test bit pattern. The method further includes transmitting a second signal of the FEC encoded test bit pattern from a transmitter of the DUT over a second channel, and FEC decoding the FEC encoded test bit pattern of the second signal to obtain a decoded test bit pattern and comparing the decoded test bit pattern with the original test bit pattern to determine a BER of the DUT.

Abstract: An apparatus includes an electrical connector. The electrical connector is configured to electrically couple a signal transmission line to another signal transmission line. The electrical connector includes a first electrical conductor and a second electrical conductor. The first electrical conductor is disposed around a center axis. The first electrical conductor is disposed azimuthally symmetric around the center axis. The second electrical conductor is disposed around the center axis and around the first electrical conductor. The second electrical conductor is disposed azimuthally symmetric around the center axis. Faces on opposing ends of the electrical connector along the center axis are configured to mate the signal transmission line and the second electrical conductor in a first plane and the other signal transmission line and the second electrical conductor in a second plane.

Abstract: A measurement system and a method of removing effects of instability of the measurement system while measuring at least one S-parameter of a device under test (DUT) are provided. The method includes initially determining a characteristic of the measurement system, including identifying a location of an instability in the time domain of the measurement system; determining a change of the characteristic of the measurement system while connected to the DUT; and compensating for the determined change of the characteristic of the measurement system while connected to the DUT by removing effects of the determined change on measurements of the at least one S-parameter of the DUT.

Abstract: A N×M non-blocking switch matrix, where N and M are integers, includes an input stage having a plurality of m/2-way multiport switches, where quotient m/2 is a positive integer less than M, and an output stage having a plurality of n/2-way multiport switches, where quotient n/2 is a positive integer less than N. The switch matrix further includes a transfer stage having a plurality of transfer switches operatively connected between the input stage and output stage, and selectively applying outputs of the m/2-way multiport switches to inputs of the n/2-way multiport switches such that any given input to the m/2-way multiport switches is connectable to any given output of the n/2-way multiport switches.

Abstract: An interferometer has a first input configured to provide a first measurement beam at a first frequency, and a second measurement signal at the first frequency. The interferometer has a second input configured to provide a reference beam at a second frequency that is different than the first frequency; an optical element comprising a first portion comprising a polarization beam splitter; and a diffraction grating disposed over the optical element configured to diffract the first measurement beam and the second measurement beam.

Abstract: A sensor device is provided for testing electrical connections in a DUT using contactless fault detection. The sensor device includes main traces for conducting an RF signal supplied by a signal source; at least one inductor connected to at least one of the main traces; and a slit formed between opposing conductor portions at a tip of the sensor device for sensing open circuits and/or short circuits in portions of the DUT located in a sensing region below the slit, the tip being at an end of the sensor device opposite ends of the main traces connected to the signal source. An electric field, generated by the sensor device in response to the RF signal, substantially concentrates in the slit, enhancing the sensing of the open and/or the short circuits during the contactless fault detection.

Abstract: A signal measurement device and method are provided for receiving an RF input signal using frequency sweeping. The method includes determining RMS power levels of a noise floor of the signal measurement device at respective frequencies from a start frequency to a stop frequency of a swept frequency range; determining values of resolution bandwidths corresponding to the frequencies, the values of the resolution bandwidths being inversely proportional to the RMS power levels of the noise floor at the respective frequencies; performing frequency sweeping from the start frequency to the stop frequency to receive the RF input signal at the signal measurement device; and implementing the determined values of the resolution bandwidths corresponding to the frequencies while performing the frequency sweeping.

Abstract: A system and method for operating a data processing system to modify a time domain input signal to a signal generator to correct for distortions introduced by the signal generator are disclosed. The method includes receiving a target signal specifying a signal to be generated by the signal generator and initializing an input signal with the target signal, the method includes a) inputting the input signal to the signal generator to arrive at a signal generator output signal; b) measuring a frequency spectrum of the signal generator output signal with a test instrument; c) updating the input signal based on a comparison of said measured frequency spectrum and a frequency spectrum of target input signal; and d) repeating steps a)-c) until an exit condition is satisfied.