Patents Assigned to Keysight Technologies, Inc.
  • Patent number: 10991136
    Abstract: A method for operating a data processing system to provide a graphic visualization of a function is disclosed. The method includes causing the data processing system to present a first GUI to a user on a display associated with the data processing system, causing the data processing system to receive a text string that defines the function in terms of variable parameters and elementary functions, causing the data processing system to provide a list of the variable parameters, receiving user input specifying row and column parameters selected from the list of variable parameters, and generating a grid plot of the function on the display.
    Type: Grant
    Filed: May 30, 2017
    Date of Patent: April 27, 2021
    Assignee: Keysight Technologies, Inc.
    Inventor: Jonathan Helfman
  • Patent number: 10978810
    Abstract: A device for selectively reflecting an incident microwave signal or millimeter-wave signal includes multiple antennae disposed in an array. Each antenna has an input adapted to selectively receive a forward bias signal or a zero bias signal. The device also includes a diode disposed at each input of each antenna. The device also includes a switching device connected to each input, and configured to selectively apply a forward bias or zero bias to each of the diodes. In forward bias, each of the antennae detects the incident microwave signal or millimeter wave signal, and in zero bias, each of the antennae reflects the incident microwave signal or millimeter wave signal.
    Type: Grant
    Filed: August 22, 2019
    Date of Patent: April 13, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Gregory S. Lee, Paul L. Corredoura
  • Patent number: 10971598
    Abstract: A method of forming an HBT structure includes forming an HBT epitaxial layer structure over a first substrate wafer; performing a first substrate transfer of the HBT epitaxial layer structure and the first substrate wafer onto a second substrate wafer, including inverting the HBT epitaxial layer structure and the first substrate wafer; removing the first substrate wafer; forming a first subcollector metal layer over the HBT epitaxial layer structure; performing a second substrate transfer of the subcollector metal layer and the HBT epitaxial layer structure onto a third substrate wafer with a second subcollector metal layer, including inverting the subcollector metal layer and the epitaxial layer structure; compression bonding the first and second subcollector metal layers to provide a bonded subcollector metal layer; and removing the second substrate wafer. The HBT structure includes the third substrate wafer, the bonded subcollector metal layer, and the HBT epitaxial layer structure.
    Type: Grant
    Filed: September 27, 2019
    Date of Patent: April 6, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Martin W. Dvorak, Rory R. Stine, Mathias Bonse, Shusen Huang
  • Patent number: 10969421
    Abstract: A test instrument, including an embedded VNA circuit, for testing a DUT. The test instrument includes a first receiver for receiving an incident RF signal through a first coupling device; a second receiver for receiving a reflected RF signal through a second coupling device; a test port for connecting to an interconnect, which is connectable to a calibration device in a calibrating stage, during which the interconnect is characterized, and to the DUT in a testing stage, during which at least one parameter of the DUT is tested; an RF source for generating the incident RF signal during the calibrating stage; and a processing unit programmed to determine S-parameters of the interconnect based on the incident RF signal and the reflected RF signal, the S-parameters compensating for error introduced by the interconnect when testing the at least one parameter of the DUT in the testing stage.
    Type: Grant
    Filed: September 29, 2018
    Date of Patent: April 6, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Keith F. Anderson, Alex Grichener
  • Patent number: 10956180
    Abstract: Provided are a measurement system that has a plurality of measurement modules and is capable of creating a program of each measurement module easily and a method of creating a program therefor. A measurement system 100 includes a first and second measurement modules 120 and 130, and a controller 102 controlling thereof, in which the controller includes a first processor, a first memory and a first timer; the first measurement module includes a second processor, a second memory, and a second timer; and the second measurement module includes a third processor, a third memory, a third timer; the controller further includes a first function column including one or more execution steps of a first function sequence to be executed by the first measurement module, and a second function column including one or more execution steps of a second function sequence to be executed by the second measurement module, the second function column being adjacent in a first adjacent direction of the first function column.
    Type: Grant
    Filed: July 5, 2018
    Date of Patent: March 23, 2021
    Assignee: Keysight Technologies, Inc.
    Inventor: Tomonori Ura
  • Patent number: 10958362
    Abstract: A method of determining group delay between periodic radio frequency (RF) signals received at a narrow-band coherent receivers includes receiving a first periodic RF signal at a first coherent receiver in the frequency domain, receiving a second periodic RF signal at a second coherent receiver in the frequency domain, which is delayed with respect to the first periodic RF signal, the first and second periodic signals having the same period and carrier frequency; determining a cross-spectrum signal of the first and second periodic RF signals in the frequency domain, the cross-spectrum signal including amplitudes and phases versus frequency; calculating a slope of phase of the cross-spectrum signal at frequencies over at least a portion of a bandwidth of the cross-spectrum signal; and determining a group delay between the first and second periodic RF signals to be the slope of phase of the cross-spectrum signal.
    Type: Grant
    Filed: February 27, 2020
    Date of Patent: March 23, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Andrew Michael Owen, Loren C. Betts
  • Patent number: 10938488
    Abstract: Disclosed is a system for measuring free space properties of an antenna. The system includes an analyzer adapted to obtain from an antenna supported in the air by an aircraft, at least one property of the antenna, and to determine at least one property of the antenna. The system also includes a telemetry unit adapted to relay information from the analyzer to a ground station.
    Type: Grant
    Filed: March 23, 2020
    Date of Patent: March 2, 2021
    Assignee: Keysight Technologies, Inc.
    Inventor: Michael W. Howard
  • Patent number: 10935584
    Abstract: A system and a method to determine beam dynamics and multi-user performance of a base station having an antenna array including multiple antenna elements are disclosed. The system includes a measurement probe antenna positioned in a mid-field of the antenna array, a reference antenna having a fixed position with respect to the base station antenna array, and a coupling probe array including multiple coupling probe antennas positioned in a reactive field of the base station antenna array for coupling RF signals of the antenna elements to selected coupling probe antennas to form a high dimension radiation channel matrix between the antenna array and the coupling probe array. The system further includes a channel emulator configured to receive the measured antenna element patterns from the measurement probe antenna, to receive the RF signals coupled to the selected coupling probe antennas, to provide bi-directional channel models of channels between the base station and user devices.
    Type: Grant
    Filed: August 26, 2019
    Date of Patent: March 2, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Hong-Wei Kong, Ya Jing, Zhu Wen
  • Patent number: 10928421
    Abstract: A handheld differential contact probe includes a housing configured to be held in a hand of a user, a pair of probe arms carried by the housing, and a pair of opposing probe tip assemblies each carried by one of the respective probe arms and each having a probe tip circuit coupled to a probe tip at a distal end thereof. A probe tip span adjustment mechanism is carried by the housing and coupled to the pair of probe arms, and configured to adjust a span between the probe tips. A ground path mechanism is coupled between the probe tip circuits of the respective probe tip assemblies, and includes a pair of curved conductive ribbon springs each coupled at an outer end thereof to a respective probe tip circuit, and each curved conductive ribbon spring slidably engaging each other at a respective inner end thereof.
    Type: Grant
    Filed: August 21, 2019
    Date of Patent: February 23, 2021
    Assignee: Keysight Technologies, Inc.
    Inventor: Jason Swaim
  • Patent number: 10917937
    Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.
    Type: Grant
    Filed: October 20, 2014
    Date of Patent: February 9, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Steve G. Duffy, Xu Zhao, Hong-Wei Kong, Ya Jing
  • Patent number: 10914756
    Abstract: A miniature probe for measuring small voltage signals of a DUT includes a probe body having a flexible substrate and signal transmission lines running a longitudinally, and a first probe connection circuit located at a first end of the probe body and including exposed wires, SMT components coupled between the exposed wires and the signal transmission lines, respectively, and a local mechanical stiffener mounted adjacent the SMT components. The wires are connectable to the DUT for receiving the voltage signals. The probe further includes a second probe connection circuit located at a second end of the probe body, and including transmission line connectors coupled to the signal transmission lines, respectively, and a bent portion of the flexible substrate between the probe body and the transmission line connectors. The bent portion enables the transmission line connectors to exit the probe substantially axially, relative to the longitudinal length of the probe body.
    Type: Grant
    Filed: August 14, 2018
    Date of Patent: February 9, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Jason Andrew Swaim, Daniel A. Garcia, Michael Thomas McTigue
  • Patent number: 10908184
    Abstract: An apparatus that searches for a pattern in a signal is disclosed. The apparatus can be used to implement a real time trigger in an instrument such as a high speed oscilloscope. The apparatus includes a symbol generator and a finite state machine (FSM). The symbol generator receives an ordered sequence of signal values and converts the ordered sequence of signal values into an ordered sequence of symbols, each symbol having a plurality of states. The FSM receives the ordered sequence of symbols and generates a match signal if the ordered sequence of symbols includes a target sequence specified by a regular expression that includes a counting limitation on one of the symbol states. The FSM includes a counting state that includes a counter that counts instances of the one of the symbol states.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: February 2, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Andrew Lehane, Antony J. A. Kirkham
  • Publication number: 20210011619
    Abstract: A method of operating a first data processing system having a screen for responding to a vector gesture performed on that screen is disclosed. The method includes estimating a direction and assuming an identity for the vector gesture prior to the vector gesture being completed. A command that depends on the estimated direction and assumed identity is executed, the command being a command that would be required to update a current state of the first data processing system if the assumed identity of the vector gesture is correct. The command is executed prior to the vector gesture being completed. The current state of the first data processing system is then updated based on the data generated by the command. After the vector gesture has been determined to have been completed, the first data processing system is updated to a state indicated by the completed vector gesture.
    Type: Application
    Filed: September 28, 2020
    Publication date: January 14, 2021
    Applicant: Keysight Technologies, Inc.
    Inventor: Glenn R. Engel
  • Patent number: 10890642
    Abstract: A method of calibrating an impedance measurement device for measuring DUT impedance includes performing short calibration measurements using a short calibration standard to obtain short raw data; performing first shunt calibration measurements using a first shunt calibration standard to obtain first raw data, the first shunt calibration standard having known first resistance and unknown first inductance; performing second shunt calibration measurements using a second shunt calibration standard to obtain second raw data, the second shunt calibration standard having known second resistance and unknown second inductance; determining first and second complex impedances of the first and second shunt calibration standards by calculating the first and second inductances using the short, first and second raw data applied to a specific error model; and determining general error coefficients for an error model using the first and second complex impedances and the first and second raw data applied to a one-port calibrat
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: January 12, 2021
    Assignee: Keysight Technologies, Inc.
    Inventor: Manuel Kasper
  • Publication number: 20210004639
    Abstract: A method for operating a data processing system and computer readable medium causing a data processing system to execute that method are disclosed. The method includes causing the data processing system to receive a plurality of first EDSs classified into a plurality of first clusters and a first RDS for each of the plurality of first clusters and displaying, a first display for each of the first clusters and a RDS for each of the first clusters. The data processing system receives information from a user specifying one or more of the first clusters to be further clustered to arrive at a specified number of second clusters into which the specified one or more first clusters are to be classified, and performing a second clustering on the selected clusters. The method also includes displaying a second display that includes a plurality of second EDSs, classified into the second clusters.
    Type: Application
    Filed: July 1, 2019
    Publication date: January 7, 2021
    Applicant: Keysight Technologies, Inc.
    Inventors: Naoki Kobayashi, Masaharu Goto
  • Patent number: 10886588
    Abstract: An oscilloscope probe includes a tip network, a low-loss signal cable, and a terminating assembly. The tip network is connected to the signal cable and is configured to electrically connect to a device under test via a tip network node. The terminating assembly includes an amplifier, a feedback network and a terminating attenuator. The amplifier has an inverting input, a non-inverting input connected to ground, and an amplifier output configured to connect to an oscilloscope input. The feedback network is connected between the inverting input and the amplifier output. The terminating attenuator includes a first loop circuit and a second loop circuit. The first loop circuit is provided between the signal cable and the inverting input of the amplifier. The second loop circuit is provided between the signal cable, and ground. Resistance of terminating resistors in the loop circuits are selected to match characteristic impedance of the signal cable.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: January 5, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Michael J. Lujan, Mike T. Mctigue
  • Patent number: 10884023
    Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.
    Type: Grant
    Filed: May 1, 2020
    Date of Patent: January 5, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Edward Vernon Brush, IV, Neil Martin Forcier, Fei Fred Wang, Zheyu Zhang, Wen Zhang
  • Patent number: 10877659
    Abstract: A method for controlling a screen in a data processing system to generate displays that include portions of an underlying scene is disclosed. The method includes displaying on the screen a first displayed scene, detecting a long touch gesture, and displaying a second scene on the screen. The first displayed scene is characterized by a first magnification and a first offset relative to the underlying scene. The second displayed scene includes a different portion of the underlying scene and is characterized by a second magnification that is different from the first magnification. In one aspect of the invention, the second displayed scene is characterized by a second offset that is determined by the long touch gesture, and the second offset depends on the first displayed scene and the long touch gesture.
    Type: Grant
    Filed: July 30, 2018
    Date of Patent: December 29, 2020
    Assignee: Keysight Technologies, Inc.
    Inventor: Jonathan Helfman
  • Patent number: 10878168
    Abstract: A method for operating a data processing system that causes the data processing system to test the consistency between a schematic description of an electronic circuit and a physical implementation of that circuit includes a master device having a plurality of component devices connected by a network of conductors is disclosed. Each of the component devices has a plurality of package pins that connect the component device to the network of conductors. Information specifying a schematic netlist generated from the schematic description and specifying a layout description of the physical implementation is received by the data processing system. The layout description specifies the network of conductors. The data processing system determines any package shorts in the component devices and generates a layout netlist from the layout description. The layout netlist is compared with the schematic netlist.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: December 29, 2020
    Assignee: Keysight Technologies, Inc.
    Inventors: Matthew Ozalas, Anne Marie Hawkins, Praveen Vs, Rameshwar Singh
  • Patent number: 10872107
    Abstract: A method for operating a data processing system to identify documents in a library includes a plurality of documents and a plurality of concepts exemplified by the plurality of documents and computer readable media that stores instructions for causing a data processing system to execute that method are disclosed. The method includes causing the data processing system to identify candidate documents matching a user provided search keyword from the library, causing the data processing system to generate a topical graph relating concepts contained in the candidate documents to one another, and clustering the candidate documents based on the topical graph. For each cluster, the data processing system displays a summary of the candidate documents in that cluster together with a cluster name that characterizes that cluster.
    Type: Grant
    Filed: June 30, 2017
    Date of Patent: December 22, 2020
    Assignee: Keysight Technologies, Inc.
    Inventor: Tomonori Ura