Patents Assigned to Koh Young Technology Inc.
  • Patent number: 10672116
    Abstract: A substrate inspection system and substrate inspection method for setting an inspection region having a three-dimensional shape and/or a two-dimensional arbitrary shape as a region of interest on an image of a substrate. The substrate inspection method includes: generating and displaying a 2D image of a substrate based on image data acquired from the substrate having an inspection object; receiving first input information including arbitrary point data or line data for setting a region of interest at a plurality of particular positions of the 2D image from a user; and displaying the region of interest corresponding to the point data or the line data as a 2D region of interest having an arbitrary shape in accordance with the first input information.
    Type: Grant
    Filed: January 29, 2016
    Date of Patent: June 2, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Ae Seo, Yeon Hee Lee, Won Mi Ahn, Hye In Lee, Jong Hui Lee
  • Patent number: 10660655
    Abstract: The present invention relates to a medical drill device. The medical drill device includes a boring drill including a motor and a drill part; an instrument body coupled to the boring drill; and a plurality of supporting rods coupled to the instrument body so as to support the boring drill to a work area. Each of the supporting rods includes: a straight portion inserted into the corresponding supporting rod insertable part in such a manner that the supporting rod is linearly moved with the instrument body; and a bent portion bent at a predetermined angle from the straight portion. As such, by using the supporting rods having a bent structure to support a boring drill to a work area and simultaneously limiting a boring depth of the boring drill, it is possible to shorten boring time and ensure safety of the boring operation.
    Type: Grant
    Filed: July 13, 2015
    Date of Patent: May 26, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Young Sik Kwon, Seung Chul Han
  • Patent number: 10650510
    Abstract: Disclosed are a substrate inspection apparatus and a method for displaying a component in a three-dimensional inspection of a substrate. The substrate inspection apparatus measures a substrate or an inspection target region of interest of the substrate and displays an image of components positioned within the measured region on a display unit. The image of the components displayed on the display unit may be displayed in a predetermined reference direction. The difference between the reference direction and a direction in which the actual component is disposed on the substrate is displayed in the form of a numerical value or a figure. Alternatively, the image of the component in the reference direction and the image of the actually disposed component are simultaneously displayed on a screen, and a user may convert a display method of the image by using a toggle button.
    Type: Grant
    Filed: July 26, 2016
    Date of Patent: May 12, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Ae Seo, Yeon Hee Lee, Won Mi Ahn, Hye In Lee, Jong Hui Lee
  • Publication number: 20200141721
    Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
    Type: Application
    Filed: January 6, 2020
    Publication date: May 7, 2020
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung-Jun Lee, Kwangill Koh, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
  • Publication number: 20200116653
    Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
    Type: Application
    Filed: October 15, 2019
    Publication date: April 16, 2020
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Chan Kwon LEE, Moon Young JEON, Jung HUR, Deok Hwa HONG, Eun Ha JO
  • Publication number: 20200116651
    Abstract: According to the disclosure, an inspection apparatus determines whether a defect has occurred in a plurality of first inspection objects by comparing a reference range with the measurement value of the plurality of first inspection objects, identifies a plurality of second inspection objects in which a first error has occurred, and a plurality of third inspection objects in which a second error has occurred based on a result of determination whether the defect has occurred, adjusts the reference range based on measurement values of the plurality of second and third inspection objects, determines at least one of an occurrence probability of the first error and the second error based on the adjusted reference range, and displays at least one of a graph indicating the result of determination whether the defect has occurred, the adjusted reference range, the determined occurrence probability of the first error and the second error.
    Type: Application
    Filed: December 13, 2019
    Publication date: April 16, 2020
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Dae Sung KOO, Yong KIM, Ki Won PARK, Yong KIM, Seo Jeong JANG
  • Patent number: 10619870
    Abstract: A humid air forming device, which cools an object to be measured to a predetermined temperature, and which sprays humid air having a predetermined temperature to the cooled object to be measured, thereby forming moisture particles on the surface of the object to be measured, and a measurement system including the same. The humid air forming device includes a cooling unit that cools the object to be measured to a first temperature or lower; and a humid air supply unit that forms humid air having a second temperature, which is higher than the first temperature, and spraying the humid air toward the surface of the cooled object to be measured, thereby forming moisture particles on the surface of the cooled object to be measured.
    Type: Grant
    Filed: June 8, 2016
    Date of Patent: April 14, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Jang Il Ser, Hyo Bin Kim, Yong Seung Shin, Hong Ki Kim, Ho Jun Lee
  • Publication number: 20200060783
    Abstract: A surgical robot system for stereotactic surgery, according to the present disclosure, may include: a stereotactic surgery unit to move and rotate a surgical instrument; a controller to receive the first imaging data that represents a three-dimensional image of a surgical portion that includes a surgical target; one or more markers to be attached to, or disposed near, the surgical portion; an imaging unit to create the second imaging data that represents a three-dimensional external image of the surgical portion; and a tracking unit to track the positions and postures of the imaging unit and the markers. The controller may create the coordinate conversion relationships for converting a coordinate from the first coordinate system of the first imaging data into the fourth coordinate system of the stereotactic surgery unit and control the stereotactic surgery unit by using the coordinate conversion relationships above.
    Type: Application
    Filed: October 29, 2019
    Publication date: February 27, 2020
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Eun Hyoung SEONG, Young Sik KWON, Jae Heon CHUNG
  • Patent number: 10563978
    Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
    Type: Grant
    Filed: June 12, 2019
    Date of Patent: February 18, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung-Jun Lee, Kwangill Koh, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
  • Publication number: 20200045862
    Abstract: A board inspecting apparatus include a measuring section, a processing section and a display section. The measuring section obtains measurement data for at least a portion of a board. The processing section compares the measurement data and reference data of the board, based on selection feature objects, by associated selection feature objects, to perform distortion compensation for the board, and inspects the board with distortion compensation. The display section distinguishably displays a first area with the distortion compensation successful and a second area with the distortion compensation failed. The processing section compares a number of recognizable effective feature objects with a reference number, and determine the distortion compensation as failed when the number of the recognizable effective feature objects is below the reference number.
    Type: Application
    Filed: September 22, 2017
    Publication date: February 6, 2020
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Won JUNG, Jong Jin CHOI
  • Patent number: 10548681
    Abstract: A surgical robot system for stereotactic surgery, according to the present disclosure, may include: a stereotactic surgery unit to move and rotate a surgical instrument; a controller to receive the first imaging data that represents a three-dimensional image of a surgical portion that includes a surgical target; one or more markers to be attached to, or disposed near, the surgical portion; an imaging unit to create the second imaging data that represents a three-dimensional external image of the surgical portion; and a tracking unit to track the positions and postures of the imaging unit and the markers. The controller may create the coordinate conversion relationships for converting a coordinate from the first coordinate system of the first imaging data into the fourth coordinate system of the stereotactic surgery unit and control the stereotactic surgery unit by using the coordinate conversion relationships above.
    Type: Grant
    Filed: December 21, 2016
    Date of Patent: February 4, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Eun Hyoung Seong, Young Sik Kwon, Jae Heon Chung
  • Publication number: 20200035350
    Abstract: A method for processing one or more histological images captured by a medical imaging device is disclosed. In this method, the histological image is received, and target regions each of which corresponds to a candidate type of tissue are identified based on a predictive model as sociating one more sample histological images with one or more sample target histological images. One or more display characteristics associated with the identified at least one target histological image is applied to the histological image.
    Type: Application
    Filed: February 21, 2018
    Publication date: January 30, 2020
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Kenneth Mark SULLIVAN, Jin Man KANG
  • Publication number: 20200015911
    Abstract: The present disclosure provides an image matching device. The image matching device according to the present disclosure includes a 3D scanner configured to three-dimensionally scan a dorsal surface of a patient to obtain a first dorsal surface scan image, a tracking sensor configured to obtain position and posture information of a reference marker and position and posture information of a scanner marker, and a processor configured to generate a virtual first vertebrae measurement image for estimation of a position of the vertebrae of the patient based on a human body correlation model and the first dorsal surface scan image and match a coordinate system of the virtual first vertebrae measurement image with a coordinate system of the patient based on the position and posture information of the reference marker and the position and posture information of the scanner marker.
    Type: Application
    Filed: February 21, 2018
    Publication date: January 16, 2020
    Applicants: KOH YOUNG TECHNOLOGY INC., INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
    Inventor: Byung Ju YI
  • Patent number: 10533844
    Abstract: Disclosed is a three-dimensional shape measuring apparatus using a diffraction grating, comprising: a light splitter installed in a traveling direction of a light generated from a light source unit and configured to reflect a portion of the light along a first path and transmit a portion of the light along a second path; an image sensor unit configured to receive a light traveling along the first path and reflected from a measurement target having at least one hole, and measure the shape of the measurement target; and a diffraction grating disposed on at least one light path among a light path between the light source unit and the light splitter, a light path between the measurement target and the light splitter, and a light path between the measurement target and the image sensor unit.
    Type: Grant
    Filed: November 11, 2015
    Date of Patent: January 14, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventor: Jang Il Ser
  • Patent number: 10533952
    Abstract: A substrate inspection apparatus according to an embodiment of the present invention comprises a projection unit, an illumination unit, an image acquisition unit and a processing unit. The projection unit irradiates an inspection target with light for obtaining three-dimensional shape information of the inspection target. The illumination unit irradiates the inspection target with at least two lights having different colors. The image acquisition unit acquires a first image by receiving light irradiated by the projection unit and reflected from the inspection target, and a second image by receiving the lights irradiated by the illumination unit and reflected from the inspection target. The processing unit acquires brightness information and color information from the first image and the second image, respectively, which are acquired by the image acquisition unit, and acquires at least a portion of a boundary by using the bright information and the color information.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: January 14, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Kye-Hoon Jeon, Dal-An Kwon
  • Patent number: 10517683
    Abstract: A parallel-type micro robot capable of precise control while minimizing size thereof and a surgical robot system having the same are disclosed. The parallel-type micro robot includes a base plate, a work plate, a main fixing shaft module, a horizontal movement module and at least one angle-controlling module. The base plate includes a base body portion and at least one base connecting portion connected to the base body portion. The work plate includes a work body portion corresponding to the base body portion and at least one work connecting portion connecting to the work body portion to correspond to the base connecting portion. The main fixing shaft module is disposed between the base body portion and the work body portion, and coupled to the work body portion such that the work body portion is rotatable. The horizontal movement module is disposed between the main fixing shaft module and the base body portion, and moves the main fixing shaft module along first and second directions intersecting each other.
    Type: Grant
    Filed: June 30, 2015
    Date of Patent: December 31, 2019
    Assignees: KOH YOUNG TECHNOLOGY INC., KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
    Inventors: Sung-Mok Kim, Whee-Kuk Kim, Byung-Ju Yi
  • Publication number: 20190376906
    Abstract: A method for adjusting a condition for determining a quality of an inspection object comprises: acquiring measurement values for the structures of a plurality of inspection objects; determining whether each of the plurality of inspection objects is good or defective by comparing error values of the measurement values with respect to design values with a predetermined reference value; identifying one or more inspection objects in which determination error has occurred among the plurality of inspection objects; generating and outputting an inspection result graph including the number of inspection objects according to the error values, the reference value, and the number of the one or more inspection objects in which the determination error has occurred; updating the reference value according to a graphical input; and redetermining whether each of the plurality of inspection objects is good or defective by comparing the error values with the updated reference value.
    Type: Application
    Filed: November 3, 2017
    Publication date: December 12, 2019
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Dae Sung KOO, Yong KIM, Ki Won PARK
  • Patent number: 10492879
    Abstract: A surgical robot system for stereotactic surgery, according to the present disclosure, may include: a stereotactic surgery unit to move and rotate a surgical instrument; a controller to receive the first imaging data that represents a three-dimensional image of a surgical portion that includes a surgical target; one or more markers to be attached to, or disposed near, the surgical portion; an imaging unit to create the second imaging data that represents a three-dimensional external image of the surgical portion; and a tracking unit to track the positions and postures of the imaging unit and the markers. The controller may create the coordinate conversion relationships for converting a coordinate from the first coordinate system of the first imaging data into the fourth coordinate system of the stereotactic surgery unit and control the stereotactic surgery unit by using the coordinate conversion relationships above.
    Type: Grant
    Filed: December 21, 2016
    Date of Patent: December 3, 2019
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Eun Hyoung Seong, Young Sik Kwon, Jae Heon Chung
  • Publication number: 20190364666
    Abstract: An apparatus that communicates with a screen printer and a solder inspection device is disclosed. The apparatus according to the present disclosure may include a process that is configured to: obtain first information associated with each of a plurality of pads on the substrate; obtain second information associated with each piece of the solder paste applied to each of the plurality of pads from the solder inspection device; determine a position correction value for the stencil mask with respect to the substrate based on the first information and the second information; and deliver the position correction value to the screen printer.
    Type: Application
    Filed: December 21, 2018
    Publication date: November 28, 2019
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Duk Young LEE, Jae Hyung KIM, Jeong Kyu NOH
  • Publication number: 20190362483
    Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.
    Type: Application
    Filed: August 8, 2019
    Publication date: November 28, 2019
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Ae SEO, Won Mi AHN, Hye In LEE, Jong Hui LEE