Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.

Abstract: An item transfer apparatus according to the present invention is for transferring items and comprises: a switching part for switching the front and rear surfaces or top and bottom surfaces of the items with respect to the transfer direction of the item; a transferring part for transferring the items to the switching part; and a rotating part for rotating the items while maintaining the top and bottom surfaces of the items.

Abstract: The present disclosure relates to a method of correcting a three-dimensional image. To correct an image distorted by coherence gate curvature (CGC) occurring by an optical system, the method generates a three-dimensional image of a sample holder on which an object to be measured is placed from an interference signal, generates a CGC profile on the basis of an image of a cover glass of the sample holder appearing in the three-dimensional image, generates a CGC fitting curve from the CGC profile, and corrects the interference signal by using the CGC fitting curve. The present disclosure also relates to an OCT system capable of performing a method of correcting a three-dimensional image.

Abstract: The board inspecting apparatus include a measuring section obtaining measurement data for at least a portion of a board, a processing section comparing the measurement data and pre-obtained reference data, based on feature objects set on the board, to perform warpage compensation and inspecting the board with warpage compensated, a display section displaying ranges adjusting a first level of an inspection speed and a second level of a precision of the warpage compensation, and an input section receiving, from a user, inputs for the first and second levels as a specific setting combination having a trade-off relationship. The processing section, when the inspection speed and the precision are established, designates a specific option corresponding to the inspection speed and the precision among options increasing the precision so that the specific option is applied. Thus, users' convenience may be improved, and users may easily set options for distortion compensation.

Abstract: A stereotactic surgery robot according to the present disclosure may include: a rotating unit that is configured to have a surgical instrument that is able to be attached thereto, and is configured to rotate the surgical instrument on at least one of two rotational axes according to an entry posture of the surgical instrument; a moving unit that is configured to move the rotating unit in the direction of at least one of three linear axes according to the position of a surgical target; and a surgical portion support unit that is configured to be connected to the moving unit, and is configured to be detachable with respect to an operating table, wherein the moving unit may move the rotating unit such that an intersection point of the two rotational axes matches the surgical target.

Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

Abstract: A method for measuring a three-dimensional shape includes the steps of: forming a pattern on a light irradiated to an object from a light source unit installed in an electronic device by a pattern unit installed in the electronic device; generating image data by photographing the object to which the light on which the pattern is formed is irradiated by a camera unit installed in the electronic device; generating phase data for the object using the image data, and generating, using the phase data by a data generation unit, feature value data for a feature value of the object; and determining, by a determination unit, whether the feature value data is identical to pre-stored reference value data using the feature value data and the pre-stored reference value data.

Abstract: Disclosed are a pattern light irradiating device and an inspection apparatus using the same. The pattern light irradiating device includes first and second pattern light sources installed on a frame having a plurality of through-holes. Each of the through-holes is formed along a single optical axis. The first pattern light source is configured to irradiate first pattern light having a fixed pitch. The second pattern light source is configured to irradiate second pattern light having a variable pitch.

Abstract: An apparatus, a recording medium, and a method for generating a control parameter of a screen printer are disclosed. The apparatus includes a memory that stores a simulation model configured to derive predictive inspection information on a printed state of solder paste based on a plurality of control parameters of the screen printer; a communication circuit configured to receive first inspection information on a plurality of solder pastes printed by the screen printer based on a first control parameter, and a processor electrically connected to the memory and the communication circuit.

Abstract: An optical tracking system comprises a marker part, an image forming part, and a processing part. The marker part includes a pattern having particular information and a first lens which is spaced apart from the pattern and has a first focal length. The image forming part includes a second lens having a second focal length and an image forming unit which is spaced apart from the second lens and forms an image of the pattern by the first lens and the second lens. The processing part determines the posture of the marker part from a coordinate conversion formula between a coordinate on the pattern surface of the pattern and a pixel coordinate on the image of the pattern, and tracks the marker part by using the determined posture of the marker part. Therefore, the present invention can accurately track a marker part by a simpler and easier method.

Abstract: An optical tracking system and a method using the same capable of detecting an exact spatial position and a direction of a target regardless of the distance from the target to be calculated is disclosed. The optical tracking system and a method using the same according to an embodiment of the present invention has an effect of expanding an available area by detecting an exact spatial position and a direction of a target regardless of the distance from the target to be calculated, as well as, a system downsizing is also achieved by significantly reducing size of the marker unit compared with conventional system.

Abstract: A stereotactic surgery robot according to the present disclosure may include: a rotating unit that is configured to have a surgical instrument that is able to be attached thereto, and is configured to rotate the surgical instrument on at least one of two rotational axes according to an entry posture of the surgical instrument; a moving unit that is configured to move the rotating unit in the direction of at least one of three linear axes according to the position of a surgical target; and a surgical portion support unit that is configured to be connected to the moving unit, and is configured to be detachable with respect to an operating table, wherein the moving unit may move the rotating unit such that an intersection point of the two rotational axes matches the surgical target.

Abstract: A three-dimensional shape measurement apparatus includes main pattern illumination parts, main image-capturing parts and a control part. The main pattern illumination parts obliquely illuminate grating pattern light in different directions toward a measurement target. The main image-capturing parts obtain a grating pattern image of the measurement target by receiving reflection light of the grating pattern light illuminated from the main pattern illumination parts and obliquely reflected by the measurement target. The control part produces height data of the measurement target using grating pattern images of the measurement target, or produces height data of the measurement target using image positions of plane images for the measurement target and texture information of the measurement target. The control part employs a grating pattern illuminated on the measurement target as the texture information to produce height data of the measurement target.

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

Abstract: A stand includes first to fourth links, first to fourth joints, a front link, first to fifth extension links, and first to fourth extension joints. The first to fourth links are arranged in a parallelogram configuration, wherein the first and third links are arranged on opposite sides and the second and fourth joints are arranged in a diagonal direction. The front link extends from the first link. The first extension link is rotatably connected to the second joint. The second extension link is rotatably connected to the first extension joint. The third extension link is rotatably connected to the second extension joint. The fourth extension link is arranged between the third extension joint and the fourth extension joint. The fifth extension link is arranged between the first joint and the second extension joint. The first, fourth, and fifth extension links are in parallel with one another.

Abstract: A medical stand may include a first link, a second link parallel to the first link, a third link connected between one end of the first link and one end of the second link, a fourth link parallel to the third link and connected between the other end of the first link and the other end of the second link, a mounting arm extending from the other end of the first link, a variable balancing arm connected to at least one of the second link or the third link, a counterweight provided at a distal end of the variable balancing arm, a detector detecting a displacement of at least one of the first link, the second link, the third link, or the fourth link, and a controller generating the control signal to adjust the center-of-gravity position of the variable balancing arm in accordance with the displacement detected by the detector.

Abstract: A printed circuit board inspection apparatus obtains measurement shape information about each of a plurality of solder pastes printed on a first printed circuit board through a plurality of apertures and aperture shape information about each of the plurality of apertures, obtains probability values that a first solder paste printed through a first aperture of the plurality of apertures and each of a plurality of second solder pastes printed through second apertures other than the first aperture of the plurality of apertures have the measurement shape information when the first solder paste and the plurality of second solder pastes are printed on the first printed circuit board, by applying the measurement shape information and the aperture shape information to a machine-learning based model, and detects whether an anomaly in the first solder paste occurred based on the probability values.

Abstract: A printed circuit board inspection apparatus generates at least one image indicating whether an anomaly associated with a plurality of solder pastes printed on a first printed circuit board is detected, if an anomaly in at least one solder paste of the plurality of solder pastes is detected by using an image of the first printed circuit board, obtains at least one value indicating relevance between at least one fault type and the generated at least one image, using the machine-learning based model, and determines a fault type associated with the at least one solder paste in which the anomaly is detected from at least one fault type, based on the obtained at least one value.

Abstract: A method and an apparatus of inspecting a substrate with a component mounted thereon, which are capable of inspecting whether the component is properly mounted or not without additional setting or changing inspection condition, are provided. The method comprises measuring a three-dimensional shape by irradiating the pattern image toward the substrate through at least one illumination unit and by taking a reflected image through an imaging unit, extracting a shield region from the three-dimensional shape, and inspecting a component mounting defect in an area excluding the shield region in the three-dimensional shape.