Abstract: Apparatus and associated systems and methods may include one or more features for high speed transmission line structures that may substantially reduce signal degradation due to effects, such as dielectric loss, parasitic capacitance, cross-talk, and/or reflections. For example, one such feature may include a dielectric layer having a reduced thickness within at least a part of a region that extends between two conductors fabricated on a PCB (printed circuit board). In some embodiments, the dielectric layer may include a solder mask layer that is partially or substantially absent in the region between two coplanar conductors. In another embodiment, a substrate layer made of a dielectric material may include a trench in the region between the two conductors. Another such feature, for example, may include a conductor having vias spaced less than a quarter wavelength apart to substantially reduce resonance effects on propagating high frequency signals.

Abstract: A method for improving bandwidth of an oscilloscope involves, in preferred embodiments, the use of frequency up-conversion and down-conversion techniques. In an illustrative embodiment the technique involves separating an input signal into a high frequency content and a low frequency content, down-converting the high frequency content in the analog domain so that it may be processed by the oscilloscope's analog front end, digitizing the low frequency content and the down-converted high frequency content, and forming a digital representation of the received analog signal from the digitized low frequency content and high frequency content.

Abstract: A method and apparatus for correcting for deterministic jitter in a sequential sampling timebase. The value of a fine analog delay is held at a substantially constant nominal rate during a duration of a counting of a digital clock. A time difference between a trigger at which a fine analog delay starts measuring time and the occurrence of a digital pulse of a stable clock used to count a coarse delay is measured. An input waveform is sampled at a sample time having a nominal delay time. After sampling, a desired compensation time is provided for the sample of the input waveform in accordance with combinations of three independent variables defining a calibration table. The waveform is reconstructed by shifting a delay time of a sampled value of the input waveform from its nominal delay time in accordance with a value defined by the calibration table.

Abstract: In exemplary embodiments, a waveform processor system may update pixel state information as a function of current pixel state information (e.g., intensity, color) by comparing a randomized value to a set of predetermined threshold values that correspond to different permitted pixel states. In an illustrative example, each time a display screen is updated, the image may represent multiple (e.g., 2000) triggered sweeps of the waveform. For each triggered sweep, the waveform data is associated with specific pixels on the display screen. To determine how to update each pixel's state (e.g., brightness, color) for the next screen update, each waveform hit on a pixel may initiate a comparison between a randomized value (e.g., pseudorandom number) and the predetermined threshold value for the pixel's current pixel state. In some examples, the pixel state may be increased to the next level if the randomized value exceeds the predetermined threshold value.

Abstract: An apparatus and method for processing a data signal is provided. An acquisition unit of a test instrument acquires a data signal for a predetermined time. The data signal is stored in a memory of the test instrument and a clock recovery unit recovers a clock signal from the stored data signal. The stored data signal is sliced by a processor into a plurality of data segments of a predetermined length in accordance with the recovered clock signal.

Abstract: A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously. It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations.

Abstract: A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to the test and measurement apparatus and determining for a first predetermined time whether an input signal generates a trigger. Thereafter, a second trigger configuration is loaded to the test and measurement apparatus upon the conclusion of the first predetermined time and for a second predetermined time it is determined whether the input signal generates a trigger.

Abstract: A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of indicating one or more anomalies to be found, loading a first trigger configuration to the test and measurement apparatus and determining for a first predetermined time whether an input signal generates a trigger related to one or more of the one or more anomalies. A second trigger configuration is loaded to the test and measurement apparatus upon the conclusion of the first predetermined time, and for a second predetermined time it is determined whether the input signal generates a trigger related to one or more of the one or more anomalies.

Abstract: A method and apparatus for displaying information on a device acquiring data is provided. The method includes the steps of receiving an input data, generating a version of the received input data to be displayed in accordance with one or more display parameters and displaying the generated version of the received input data. A requested change in one or more display parameters is received and the requested change of the one or more display parameters is implemented on the displayed data. Processing continues on the further received input data in accordance with the requested change in the one or more display parameters and the display is ultimately updated with the processed further received input data.

Abstract: A probe for probing an electrical device under test is provided. The probe comprises a selectively positionable door defining a recessed compartment and a light source positioned within the recessed compartment. When the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened. When opened, the light source is reflected from a reflective surface of the door to illuminate a device being probed. The door may further comprise a magnifying element to allow for magnification of the area being probed by a user.

Abstract: A method and apparatus for displaying an acquired signal on an oscilloscope. The method comprises the steps of acquiring an analog signal, digitizing the analog signal and determining a plurality of samples generated by the digitizing that are to be represented by a same vertical pixel column on a display. Thereafter, a histogram of the values of the determined plurality of samples is generated, and a display characteristic of information displayed in the vertical pixel column is modified based upon the generated values of the histogram.

Abstract: A high-speed arbitrary waveform generator (AWG) that utilizes multiple digital-to-analog converters (D/A converters) and overcomes bandwidth limitations of individual D/A converters to produce high-speed waveforms.

Abstract: A high-speed arbitrary waveform generator (AWG) that utilizes multiple digital-to-analog converters (D/A converters) and overcomes bandwidth limitations of individual D/A converters to produce high-speed waveforms.

Abstract: Cascaded analyzer trace memories are described herein. According to one embodiment, the method comprises receiving a packet stream in a master analyzer and a slave analyzer, wherein the master analyzer includes a first trace memory, and wherein the slave includes a second trace memory. According to one embodiment, the method further comprises determining whether the first trace memory has been filled past a memory address. According to one embodiment, if the first trace memory has not been filled past the memory address, storing one or more packets of the packet stream in the first trace memory. In one embodiment, if the first trace memory has been filled past the memory address, performing the following operations: marking a location in the first trace memory, transmitting a signal to the slave analyzer, and storing one or more packets of the packet stream in the second trace memory.

Abstract: A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe head. The lossy dielectric device preferably includes a lossy dielectric material contained within a container. The container is positionable and securable substantially adjacent the transmission path to improve the curve of a frequency response. Preferably, the container is insulative, puncture resistant, and thin. In some preferred embodiments, a temporary or permanent connection mechanism is also included.

Abstract: A method and apparatus for determining a bit error rate. The method comprises the steps of acquiring a data signal by an acquisition unit of a test instrument for a predetermined period of time, and storing the data signal in a memory of the test instrument. A clock signal is recovered from the stored data signal, and in accordance therewith, the stored data signal is sliced into a plurality of data segments of a predetermined length. Each of said data segments is synchronized to a frame or predetermined pattern to determine a bit error rate thereof.

Abstract: A method and apparatus for digitizing a data signal, the method comprising the steps of receiving an input analog data signal, splitting the received input analog data signal into a plurality of split signals, and mixing at least one of the split signals with a predetermined periodic function with a predetermined frequency. The split signals are then digitized and combined mathematically to form a single output data stream that is a substantially correct representation of the original input signal.

Abstract: A method for correcting feed through signals for use with an oscilloscope employing Digital Bandwidth Interleaving is provided. The method comprises the steps of converting an original signal to a frequency other than an original frequency of the original signal, determining one or more feed through signals not converted with the original signal, providing an offsetting correction signal and combining the converted signal, the non-converted feed through signal, and the offsetting correction signal.

Abstract: A waveform processing system, and associated methods and apparatus, may include a common mode feedback compensation circuit to adjust a voltage supplied to a differential circuit so as to substantially reduce or eliminate signal distortion associated with thermal tails. In an illustrative example, a feedback circuit may control a supply voltage to maintain a common mode voltage at the collectors of the input transistors of a differential amplifier. For example, the feedback may compensate for component tolerances and/or temperature changes that may cause the cause the input transistors to operate away from a nominal constant power operating point. In some embodiments, the differential circuit and common mode feedback compensation circuit may be configured to substantially reduce thermal tail effects by controlling the supply voltage to maintain a substantially constant power condition for the input transistors.

Abstract: A digital signal processing system capable of compensating for frequency response variations and generating a response characteristic that complies with a provided specification. The system automatically generates digital filters to provide this compensation with almost any form of channel frequency response information and with user defined specifications. The capability of this system to trade-off noise performance, pulse response, and frequency response flatness in order to provide an optimized response is demonstrated. The system also provides feedback to the user on the final response characteristics.