Abstract: A transducer in an imaging optical system for generating optical contrasts in the near-field representation of topographies of an object by outcoupling evanescent waves from the underside of the transducer. The transducer comprises a substrate having a transparent plane-parallel protuberance corresponding to the field size of the imaging optical system and pointing toward the object. The specimen outcouples evanescent waves from an underside of the transducer, where the transducer underside is arranged in a focal plane of the imaging optical system.

Abstract: A method for controlling image recording includes actuating, using a control unit, equipment for the image recording. Image data of the recorded images is processed using a computer unit. Control commands for the image recording are combined to form a script. The script is transmitted from the computer unit to the control unit.

Abstract: The invention relates to a method for the individual adaptation of excitation intensities in a multiband fluorescence microscope with several excitation bands that are different in their spectrums and with associated fluorescence bands. The intensities of the individual fluorescence bands in the microscope image are determined and compared with standard intensity values greater than or equal to zero. For every excitation band that is assigned to a fluorescence intensity deviating from the standard intensity values a selective filter (23; 28, 29, 31, 32) is introduced into the illumination optical path. The transmission degree of the illumination optical path is variably adjusted in such a manner that by attenuating the excitation band the associated fluorescence intensity is adjusted to its standard intensity value.

Abstract: The present invention concerns a microscope and an illumination device for a microscope that ensure optimal illumination in the standard (10×-100×), scanning (1.6×-5×), and macro (1×-1.6×) ranges. The illumination system comprises only one condenser head that can be switched in or out and that can optimally illuminate the entire range from 1× to 100×, and a movably arranged focusing lens that ensures optimal adaptation of the illumination to the entrance pupil for all ranges.

Abstract: A microscope includes a light source, an illuminating optical system, an aperture device, and a spectral correction device. The light source includes a control device for controlling the intensity of light emitted by the light source. The illuminating optical system has a numerical aperture and illuminates a specimen. The aperture device is located in the illumination beam path and modifies the numerical aperture. The spectral correction device is located in the illumination beam path and corrects a change in the spectral intensity distribution of the light emitted by the light source so that the spectral intensity distribution of light directed onto the specimen remains substantially unchanged. Upon a change of the numerical aperture by the aperture device, the light source is controllable by the control device of the light source so that the light flux through the illuminating optical system remains substantially unchanged.

Abstract: A microscope with a viewing tube for visual observation of a specimen by an observer, with a control circuit for controlling electrical and/or electro-motor-driven microscope functions, and an illuminating device for illuminating the specimen to be observed is described. The control circuit is connected to a proximity sensor installed on the microscope, which responds to the presence of the observer to the viewing tube. The control circuit includes an adjustable time-delay logic element located in the control circuit for delaying switches of the microscope functions such that the microscope functions are switched after the observer is absent for a predetermined time period.

Abstract: A comparison optical system (1) comprising several image-acquiring optical subsystems is disclosed. A bridge (3) mechanically and optically connects the optical subsystems to one another. Each of the image-acquiring optical subsystems possesses an XYZ stage (8a, 8b), movable in motorized fashion, on which a sample to be examined is placed. Also provided is a control unit which moves the XYZ stages (8a, 8b), movable in motorized fashion, synchronously in all three spatial directions. The synchronous motion of the XYZ stages (8a, 8b) can be switched on and off by the user.

Abstract: In a polarizing interference microscope includes a light source, a polarizer, and an analyzer. An objective prism is arranged between the polarizer and analyzer. A birefringent compensation element is furthermore arranged in the immediate vicinity of the objective prism. A liquid crystal matrix element can be provided as the birefringent compensation element.

Abstract: A portable microscope and a microscope stage (10) for a portable microscope are disclosed. The microscope comprises a stand (4) that carries the adjustable-height microscope stage (10). The microscope stage (10) is constructed from a sample support part (38), a guide part (40), and a base (42). The base (42) of the microscope stage (10) carries an illumination module (39).

Abstract: The automated microscope system (30) comprises a box in which at least one control and power supply unit (34) is installed. The box is arranged physically separately from the microscope stand (32) and is connected to the microscope stand (32) with a cable (38). In one exemplary embodiment, a computer unit (36) is connected to the box that contains at least one control and power supply unit (34).

Abstract: The present invention concerns an apparatus and a method for positioning an optical component, several optical components being arranged in a receiving device (1); the receiving device (1) being rotatable about an axis (3) or movable along a direction in such a way that an optical component is positionable and the receiving device (1) retainable in a retention position corresponding thereto; a coding device (4) having coding means (5, 9), and two detectors (6, 7) detecting the coding means (5, 9), being provided; the coding device (4) or the two detectors (6, 7) being associated with the receiving device (1); and the two detectors (6, 7) detecting coding means (5, 9) at spatially different points; and in order to achieve detection of the position of the receiving device (1) with reduced component complexity for the coding means (4, 5, 9) and detection means (6, 7) as well as a decreased manufacturing time associated therewith, is characterized in that the coding device (4) is embodied in such a way that on th

Abstract: A method for focusing on disk-shaped objects with patterned and unpatterned surfaces includes imaging of the patterned and unpatterned surfaces on a disk-shaped object for defect detection and defect classification by using various preset values of a focus regulation system to acquire the image sequence. At least one preset value is learned on the basis of an image sequence at least at one position in a substantially flat reference region of the surface of the disk-shaped object. A regulated adjustment is provided of a measurable distance from a carrier plane to a reference plane, wherein the carrier plane serves as a support for the disk-shaped objects. The distance is adjusted by applying the at least one preset value, which is overlaid on the regulation system, a focus state is evaluated by an image processor according to at least one rule, and the at least one preset value is ascertained therefrom.

Abstract: A microscope having a stand (3) and having a revolving nosepiece (1) rotatably articulated on the stand (3), the revolving nosepiece (1) having at least two receptacles (4) for one objective (2) each, and an objective (2) being deliverable into a beam path (5) of the microscope by the rotation of the revolving nosepiece (1), is configured, in the interest of easy association between an objective (2) and its position in the beam path (5) of the microscope, in such a way that one transponder (6) each is associated with the objective (2) or objectives (2), and a reading device (7) for communication with the transponder (6) is associated with the stand (3).

Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, a perforation with webs (26, 27, 28) is generated by means of a focused laser beam (7) along a cut line (25) enclosing the specimen region (23) of interest. The perforation has at least two webs (26, 27, 28) which interrupt the cut line (25) and join the specimen region (23) of interest to the surrounding specimen (4). In a second step, the webs (26, 27, 28) are broken with a single laser pulse of the defocused laser beam (7) directed onto the specimen region (23) of interest, thereby detaching the specimen region (23) of interest from the specimen (4).

Abstract: An auto focus method for a microscope (2), and a system for adjusting a focus for the microscope (2), are disclosed. The microscope (2) possesses a microscope stage (18) and an objective (16) located in a working position. A relative motion in the Z direction takes place between the microscope stage (18) and the objective. Images are read in by the camera (20) during the relative motion, and a microscope control device (4) and a computer (6) are provided for evaluation and determination of the focus position.

Abstract: The invention relates to an absorbent thin-film system made up of alternate metal and dielectric layers. With this system, color-neutral absorption results in the visual spectral region are obtained, as are a defined phase shift and a defined transmission. This film system is used for contrasting methods or contrasting systems in microscopy.

Abstract: An illumination device for a DUV microscope has an illumination beam path, proceeding from a DUV light source in which are arranged a condenser and a reflection filter system which generates a DUV wavelength band and comprises four reflection filters. At these, the illumination beam is reflected in each case at the same reflection angle &agr;, the illumination beam path extending coaxially in front of and behind the reflection filter system. According to the present invention, the reflection angle &agr;=30° and the DUV wavelength band &lgr;DUV+&Dgr;&lgr; has a half-value width of max. 20 nm and a peak with a maximum value S of more than 90% of the incoming light intensity. The resulting very narrow half-value width of the DUV wavelength band makes it possible for the DUV objectives of the DUV microscope to be very well-corrected.

Abstract: A measuring instrument (100) and a method for measuring features (19) on a substrate (9) are described. The measuring instrument (100) has a support element (15) that is provided opposite the substrate (9). Mounted on the support element (15) is a nonoptical measurement device (23) with which a measurement of the features (19) of the substrate (9) is performed under ambient air pressure. The nonoptical measurement device (23) can be configured, for example, as an AFM (24) or an electron beam lens (40). Furthermore, in addition to the nonoptical measurement device (23), an optical lens (10) can be provided that is used for rapid location and determination of the coarse position of features (19) on the substrate (9).

Abstract: A method and apparatus determines the position P of a structural element that is non-orthogonal relative to the coordinate axes (x, y) of a substrate. The structural element is imaged on a detector array of a CCD camera that has a reference point. With the aid of a measuring window that is rotated at an angle &thgr; to the substrate coordinate system, the position PIPC of one edge of the structural element is determined relative to the reference point. The position L of the reference point relative to the origin of the substrate coordinate system is determined from the angle &THgr; and the current measuring stage coordinates, so that for a particular position P, P=PIPC+L, where L=x·cos &thgr;y·sin &thgr;.

Abstract: The invention concerns a microscope having an image sensor (5) for recording the microscope images. The specimen (3) to be examined can be scanned by means of a stop (2) in the beam path of the illumination unit and a positioning unit which moves the specimen (3) or the stop (2). Opening the stop (2) or removing it from the beam path permits the entire image to be scanned with the image sensor (5).